Cypress Semiconductor CYP15G0101DXB User Manual

Page 1
CYP15G0101DXB Evaluation
Board User’s Guide
Cypress Semiconductor Corporation 3901 North First Street San Jose, CA 95134 408-943-2600
August 12, 2003
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CYP15G0101DXB Evaluation Board User’s Guide
1. Overview ................................................................................................................................................................................. 5
2. Kit Contents ............................................................................................................................................................................ 5
3. Features of the CYP15G0101DXB ........................................................................................................................................ 5
4. Functional Description of CYP15G0101DXB ....................................................................................................................... 6
5. Board Layout, Photograph and Pin Descriptions ............................................................................................................... 8
6. Test Modes ........................................................................................................................................................................... 13
6.1 Adjusting Settings on the Board .......................................................................................................................................14
6.2 BIST Test Set-up .................................................................................................................................................................15
6.2.1 BIST Internal Loopback Mode ....................................................................................................................................... 15
6.2.1.1 Equipment Required .................................................................................................................................................... 15
6.2.1.2 Test Equipment Set-up .................................................................................................................................................16
6.2.1.3 Test Set-up ................................................................................................................................................................... 16
6.2.2 BIST External Loopback Mode ...................................................................................................................................... 18
6.2.2.1 Equipment Required .................................................................................................................................................... 18
6.2.2.2 Test Set-up ................................................................................................................................................................... 18
6.3 Parallel Data In – Parallel Data Out Mode .........................................................................................................................19
6.3.1 Encoded Mode ................................................................................................................................................................ 19
6.3.1.1 Equipment Required .................................................................................................................................................... 19
6.3.1.2 Test Set-up ................................................................................................................................................................... 19
6.3.1.3 Result Verification ....................................................................................................................................................... 20
6.3.2 Unencoded Mode (Parallel-In – Parallel-Out) ............................................................................................................... 20
6.3.2.1 Equipment Required .................................................................................................................................................... 20
6.3.2.2 Test Set-up ................................................................................................................................................................... 20
6.3.2.3 Result Verification ....................................................................................................................................................... 22
6.3.3 Operational Variations for Parallel-In–Parallel-Out Mode ........................................................................................... 22
6.3.3.1 Equipment Required .................................................................................................................................................... 22
6.3.3.2 Test Set-up and Result Verification ........................................................................................................................... 22
7. Schematic Diagram, PCB Layout, and Bill of Materials (BOM) ....................................................................................... 23
Appendix A. Schematic Diagram of CYP15G0101DXB Evaluation Board .......................................................................... 24
Appendix B. PCB Layout for CYP15G0101DXB Evaluation Board ..................................................................................... 30
Appendix C. Bill Of Materials (BOM) CYP15G0101DXB Evaluation Board ......................................................................... 39
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CYP15G0101DXB Evaluation Board User’s Guide
List of Figures
Figure 1. CYP15G0101DXB Transmitter Section Block Diagram .......................................................................................... 6
Figure 2. CYP15G0101DXB HOTLink II™ Block Diagram ...................................................................................................... 6
Figure 3. CYP15G0101DXB Receiver Section Block Diagram ............................................................................................... 7
Figure 4. CYP15G0101DXB-EVAL Skeletal View ..................................................................................................................... 8
Figure 5. Pin Description of CYP15G0101DXB-EVAL ............................................................................................................. 9
Figure 6. The BIST Mode Operation ....................................................................................................................................... 13
Figure 7. Control Switches for Test Set-up ........................................................................................................................... 14
Figure 8. Controlling REFCLK Settings ................................................................................................................................. 14
Figure 9. Controlling SWT1 Dip Switches Settings .............................................................................................................. 15
Figure 10. Controlling JT7 Pins Settings ............................................................................................................................... 15
Figure 11. Pictorial Representation of the Internal BIST Set-up ......................................................................................... 16
Figure 12. Signal on RXST1 when BIST is Successful ......................................................................................................... 17
Figure 13. The Eye Diagram through the Signal Analyzer ................................................................................................... 18
Figure 14. Coaxial Cable Connection for External BIST Mode ............................................................................................ 18
Figure 15. Generated Clock, Data and Control Signal from DG2020 .................................................................................. 19
Figure 16. Adding Two Framing Characters to Data Stream ............................................................................................... 22
Figure 17. CYP15G0101DXB-EVAL Top Level Schematics .................................................................................................. 25
Figure 18. CYP15G0101DXB-EVAL Terminated Transmitter & Receiver Blocks ............................................................... 26
Figure 19. CYP15G0101DXB-EVAL Terminated Control Signals Block .............................................................................. 27
Figure 20. CYP15G0101DXB-EVAL Transmit and Receive Clock Schematics .................................................................. 28
Figure 21. CYP15G0101DXB-EVAL Input Power Schematics .............................................................................................. 29
Figure 22. CYP15G0101DXB-EVAL Top Layout .................................................................................................................... 31
Figure 23. CYP15G0101DXB-EVAL Bottom Layout .............................................................................................................. 32
Figure 24. CYP15G0101DXB-EVAL Top Layer Silk Layout .................................................................................................. 33
Figure 25. CYP15G0101DXB-EVAL Bottom Layer Silk Layout ............................................................................................ 34
Figure 26. CYP15G0101DXB-EVAL Top Layer Solder Mask Layout ................................................................................... 35
Figure 27. CYP15G0101DXB-EVAL Bottom Layer Solder Mask Layout ............................................................................. 36
Figure 28. CYP15G0101DXB-EVAL Power Plane Layout ..................................................................................................... 37
Figure 29. CYP15G0101DXB-EVAL Ground Plane Layout ................................................................................................... 38
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CYP15G0101DXB Evaluation Board User’s Guide
List of Tables
Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board ............................................................... 10
Table 2. Description of Control Pins in JT7 ........................................................................................................................... 11
Table 3. The High, Mid, and Low Levels on JT32 .................................................................................................................. 15
Table 4. The Levels of Different Static Signals on JT7 for BIST Mode ............................................................................... 16
Table 5. Channel Enabling Controls ...................................................................................................................................... 17
Table 6. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Encoded) ............................................ 20
Table 7. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Unencoded) ........................................ 21
Table 8. Output Register Bit Assignments ............................................................................................................................ 21
Table 9. Input Register Bit Assignments ............................................................................................................................... 21
Table 10. Operation Specification of CYP15G0101DXB Eval Board ................................................................................... 23
Table 11. CYP15G0101DXB Eval Board Bill Of Materials ..................................................................................................... 40
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CYP15G0101DXB Evaluation Board User’s Guide
1. Overview
The CYP15G0101DXB single-channel HOTLink II™ Transceiver is a point-to-point or point-to-multipoint communications building block allowing the transfer of data over high-speed serial links at signaling speeds ranging from 195 to 1500 MBaud.
This document describes the operation and interface of the CYP15G0101DXB evaluation board. The evaluation board allows users to become familiar with the functionality of the CYP15G0101DXB. Figure 4 gives a skeletal view of the evaluation board.
2. Kit Contents
• CYP15G0101DXB evaluation board (CYP15G0101DXB-EVAL)
Dear Customer letter
• a CD containing
— CYP15G0101DXB data sheet
— CYP15G0101DXB-EVAL user’s guide
— HOTLink II application notes
— BSDL model
— CYP15G0101_EVAL.PDA.
3. Features of the CYP15G0101DXB
• Second-generation HOTLink® technology
•GbE-, FC-, ESCON-
• 8B/10B-coded or 10-bit unencoded
• Selectable parity check/generate
• Selectable input clocking options
• Selectable output clocking options
• MultiFrame™ receive framer provides alignment to
— Bit, byte, half-word, word, multi-word
— COMMA or Full K28.5 detect
— Single or multi-byte framer for byte alignment
— Low-latency option
• Skew alignment support for multiple bytes of offset
• Synchronous LVTTL parallel input interface
• Synchronous LVTTL parallel output interface
• 195-to-1500 MBaud serial signaling rate
• Internal PLLs with no external PLL components
• Dual differential PECL-compatible serial inputs
• Dual differential PECL-compatible serial outputs
• JTAG Boundary Scan
• Built In Self Testing (BIST) for at-speed link testing
• Link Quality Indicator
• Low power (1W typical)
• 100-ball BGA
•0.25µ BICMOS technology
®
, DVB-ASI-, SMPTE259-, and SMPTE292-compliant
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CYP15G0101DXB Evaluation Board User’s Guide
4. Functional Description of CYP15G0101DXB
Figure 2 shows the block diagram of CYP15G0101DXB, which has a pair of transmit and receive channels.
Figure 1 shows the transmitter section of CYP15G0101DXB.
TXRATE
SPDSEL
TXCLKO+ TXCLKO–
TXMODE[1:0]
TXCKSEL
TXPER
SCSEL
TXD[7:0]
TXOP
TXCT[1:0]
TXCLK
TXRST
PARCTL
TRANSMIT PLL
CLOCK MULTIPLIER
CHARACTER-RATE CLOCK
2
8
2
INPUT
HML
REGISTER
TRANSMIT
MODE
12
PHASE-ALIGN
BUFFER
BIT-RATE CLOCK
12
PARITY
BIST ENABLE
12
CHECK
LATCH
CHARACTER-RATE CLOCK
OUTPUT
4
8B/10B
BIST LFSR
10
ENABLE
LATCH
SHIFTER
PARITY CONTROL
BISTLE
BOE[7:0]
RBIST
OELE
8
OUT1+ OUT1–
OUT2+ OUT2–
TXLB
Figure 1. CYP15G0101DXB Transmitter Section Block Diagram
RXST[2:0]
TXCT[1:0]
TXD[7:0]
X10
Phase-Align Buffer
Encoder 8B/10B
RXD[7:0]
x11
Elasticity Buffer
Decoder 8B/10B
Framer
Serializer
TX
OUT1±
OUT2±
Deserializer
RX
IN1±
IN2±
Figure 2. CYP15G0101DXB HOTLink II™ Block Diagram
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Figure 3 shows the receive section of the CYP15G0101DXB. The serial data input passes through the framer (where the recovered bit stream is framed to framing character), the 10B/8B Decoder and the elasticity buffer.
RXLE
BOE[7:0]
CHARACTER RATE CLOCK
SDASEL
LPEN
INSEL
IN1+ IN1–
IN2+ IN2–
TXLBA
FRAMCHAR
RFEN
RFMODE
DECMODE
RXCKSEL
RXMODE
RXRATE
RBIST
RX-PLL Enable
L
ATCH
R
ECEIVE
S
IGNAL
M
ONITOR
C
LOCK
D
ATA
R
ECOVERY
PLL
PARITY CONTROL
&
SHIFTER
10B/8B
FRAMER
BIST
C
LOCK
S
ELECT
JTAG
B
OUNDARY
S
CAN
C
ONTROLLER
UFFER
B
LASTICITY
E
UTPUT
O
. .
2
Figure 3. CYP15G0101DXB Receiver Section Block Diagram
TMS
TCLK
TDI
TDO
LFI
8
EGISTER
3
R
RXD[7:0]
RXOP
RXST[2:0]
RXCLK+ RXCLK–
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5. Board Layout, Photograph and Pin Descriptions
Figure 4 shows the skeletal view of the CYP15G0101DX board.
Figure 4. CYP15G0101DXB-EVAL Skeletal View
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Figure 5 shows the different connectors and pins of the evaluation board for CYP15G0101DXB.
Figure 5. Pin Description of CYP15G0101DXB-EVAL
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Table 1 gives a brief description of the connectors of the evaluation board.
Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board
Connectors Signals Description
JT1, JT2 SERIN1+
JT3, JT4 SEROUT1+
JT7 RX and TX side Control
Signals
Power Supply
JT8 VCC Banana Jack
JT13 GND Banana Jack
DT1 Power On Indicator Indicates if the power supply is ON. The LED glows when the power supply goes
SMA Connectors for SERIN± (one pair per primary input)
• PECL compatible primary differential serial data inputs
• Routed through 50-ohm Impedance
• AC coupling capacitors present
• 100-ohm differential Load present
SMA connectors for SEROUT+ (one pair per primary output)
• CML compatible primary differential serial data outputs
• Routed through 50-ohm Impedance
• AC coupling capacitors present
Please refer to Table 2: Description of Control Pins in JT7 on page 11.
• +3.3 V DC
• Ground
ON.
JT11 JTAG Interface Note: For CYP15G0101DXB, there is no dedicated JTAG reset. The JTAG logic
will be reset on power-on.
JT10 TXD[7:0]
TXCT[1:0] TXOP
JT9 Clock Outputs and
Controls
LVTTL Input TXD[7:0]
• Transmit Data Input
• 50 Ohms Impedance terminated to 50 ohms load
TXCT[1:0]
• Transmit control signals
TXOP
• Transmit Path Odd parity
• TXPER
•RXCLK*
•RXCLK
•TXCLK
•XTAL_EN
— A shunt across this implies that the onboard crystal clock is disabled.
•XTAL_OUT
— A shunt across this implies that the crystal clock on the board is used as
REFCLK.
•REFCLK
— A shunt across this implies that external REFCLK is used. The external
REFCLK inputs are JT12 and JT14.
• REFCLK*
•TXCLKO
•TXCLKO*
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Table 1. Description of Connectors of the CYP15G0101DXB Evaluation Board (continued)
Connectors Signals Description
JT12 REFCLK External differential Reference clock. For single ended REFCLK input, apply an
JT14 REFCLK*
DT2 LFI LED Indicator
SWT1 BOE[1:0]
RXLE OELE BISTLE TRSTZ
JT5 Optical Controls Controls for optical modules
XT1 The optical Interface Options for small form factor pluggable (SFP) optical modules.
JT6 RXD[7:0]
RXST[2:0] RXOP
UT1 CYP15G0101DXB
LVTTL clock signal to REFCLK input in JT12.
BOE
• BIST, serial output, and receive channel enables.
• LVTTL Input
RXLE (Receive channel enable latch enable)
• Active HIGH
OELE (Serial output driver enable latch enable)
• Active HIGH
BISTLE (Transmit and Receive BIST Latch Enable)
• Active HIGH
TRSTZ
• Active LOW
LVTTL Output RXD[7:0]
• Receive Data output
RXST[2:0]
• Receive Parallel Status output
RXOP
• Receive Path Odd parity
Table 2 gives a detailed description of all the control pins in JT7.
Many of the static control signals are of 3-level select. This means that they operate at three voltage levels, which are termed as
• HIGH (Direct connection to V
CC
)
• MID (Open or allowed to float)
• LOW (Direct connection to V
, i.e., GND).
SS
In JT7 on the Eval board, these levels are implemented as follows:
• HIGH – Place a shunt across columns 1 and 2
• MID – Don’t place any shunt
• LOW – Place a shunt across columns 2 and 3.
Table 2. Description of Control Pins in JT7
Pin Name Characteristics
TXMODE0, TXMODE1
Transmit mode (two inputs) 3-Level Select
• Configure LL for Encoder bypass
• LM and LH are reserved for testing (we will be using LM in our tests)
• All other combinations along with the selection of SCSEL are for encoder control. (Please refer to the data sheet for more details.)
TXCKSEL Transmit Clock Select (1 input)
3-Level Select
• When L, REFCLK is used by all the input registers.
• When M or H, TXCLK is used.
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Table 2. Description of Control Pins in JT7 (continued)
Pin Name Characteristics
TXRATE LVTTL Input
• When H, the transmit PLL multiplies REFCLK by 20 to generate the bit rate clock.
• When L, the transmit PLL multiplies REFCLK by 10 to generate the bit rate clock.
SCSEL Special Character Select
LVTTL Input Used with the TXMODE[1:0] to
• Either encode special characters
• Or initiate a word sync sequence
TXRST* Transmit Clock Phase Align Buffer Reset
SPDSEL Serial Rate Select
SDASEL Signal Detect Amplitude Level Select
PARCTL Parity check/generate control
RXMODE Receive Operating Mode. This input selects one of two RXST channel status reporting
RXCKSEL Receive Clock Mode.
RFMODE Reframe Mode Select.
FRAMCHAR Framing Character Select.
Active LOW
• L: the Phase-Align Buffer is allowed to adjust its data transfer timing.
• H: the internal phase relationship between the TXCLK and the internal character-rate clock is fixed.
3-level select
• LOW = 195–400 MBd
• MID = 400–800 MBd
• HIGH = 800–1500 MBd
3-Level Select
• LOW = 140 mV peak-peak differential
• MID = 280 mV peak-peak differential
• HIGH = 420 mV peak-peak differential
3-Level Select
• LOW = Parity checking is disabled
• MID = If encoder/decoder is enabled, inputs are checked for odd parity
• HIGH = If encoder/decoder is enabled, inputs are checked for odd parity
modes.
• L: Status A selected
• M: Reserved for Test
• H: Status B selected
This input is interpreted only when DECMODE is not LOW.
3-Level Select
• L: Output register is clocked by REFCLK.
— RXCLK± presents a buffered/delayed form of REFCLK.
• M: Output register is clocked by the recovered clock.
— RXCLK+ follows the recovered clock as selected by RXRATE.
— The elasticity buffer is bypassed.
• H: Invalid State.
3-Level Select Please refer to the data sheet for CYP15G0101DXB for detailed information.
3-Level select. Please refer to the data sheet for CYP15G0101DXB for detailed information.
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Table 2. Description of Control Pins in JT7 (continued)
Pin Name Characteristics
DECMODE Decoder Mode Select.
3-Level Select
• L: Decoder bypassed
• M: Cypress decoder table for special code characters is used.
• H: Alternate decoder table for special code characters is used.
RXRATE Receive Clock Rate Select.
2-Level Select LVTTL Input
• L: RXCLK+ operates at the recovered channel clock rate
• H: RXCLK+ operates at HALF the recovered channel clock rate
LPEN All-Channel Loop-Back-Enable.
RFEN Reframe Enable for all channels.
INSEL Receive Input Channel Selector.
LVTTL Input Active HIGH. When HIGH
• Transmit serial data is internally routed to receive serial data
• All external serial data inputs are ignored
When LOW, the transmit data is not looped back to the receive side.
Active HIGH.
LVTTL Input.
• HIGH - IN1± input is passed into the CDR circuit
• LOW - IN2± input is passed into the CDR circuit
For example, if INSEL is selected as HIGH, IN1± input will be passed into the receiver.
6. Test Modes
The different test modes discussed in this document are as follows:
1. BIST mode
CYP15G0101DXB has the Built-In Self-Test (BIST) capability. The transmit and receive channel contain the BIST Pattern Generator and Checker respectively.
Figure 6 shows the BIST mode operation.
Ext. BIST
TX
BIST LFSR
RX
Int. BIST
Figure 6. The BIST Mode Operation
The modes described in this document are:
— BIST internal loopback mode
— BIST external loopback mode
BIST LFSR
Parallel Inputs Ignored
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2. Parallel Data In and Parallel Data Out mode
— Encoded Mode
— Unencoded Mode
The variations discussed in this document, for this mode are
— Parallel-In – Serial-Out Mode. (testing the transmit side)
— Different Clock Source (i.e., internal vs. external; different frequency mode, etc.)
The detailed description will be comprised of
— Equipment required (equipment, cable, etc.)
— Test Set-up
— Result Verification
— Operational Variations
6.1 Adjusting Settings on the Board
To successfully run any test, the REFCLK, SWT1(BOE[0:1]), JT7 and the REFCLK INT/EXT selector (JT9) on the board must be correctly configured. This section of the user guide gives some directions on how to read the settings on the board. Shown in Figure 7 is a review of the control switches that you may use in the test set-up.
JT7 pins (3-levels)
SWT1 dip switches
JT9
REFCLK INT/EXT selector
Figure 7. Control Switches for Test Set-up
To run the board either on the internal or the external clock, configure XTAL_EN, XTAL_OUT and REFCLK pins on JT9 shown in Figure 8 accordingly. Shunting XTAL_OUT routes the device clock input to the on-board crystal clock. Ensure the on-board clock is ON by removing any shunts on the XTAL_EN pins. Shunting REFCLK routes the device clock input to the external clock input. To switch from one clock mode to another, simply remove the shunt on the REFCLK pin and replace it onto the desired pin. Ensure the board does not run on both internal and external clock at the same time.
(Note: External clock input is located at JT12 or JT14. For single ended REFCLK apply an LVTTL clock signal to REFCLK input in JT12 and leave REFCLK*(JT14) input floating.)
shunt here to power down on-board crystal clock
shunt here for
internal clock
shunt here for
external clock
Figure 8. Controlling REFCLK Settings
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The 2-level dip switches on SWT1 are configured high or low as illustrated in Figure 9.
Push this side to set HIGH
Push this side to set LOW
Figure 9. Controlling SWT1 Dip Switches Settings
JT7 pins have 3-level inputs. Identify the column of the JT7 pins using column numbers on the silkscreen. A HIGH setting is achieved by placing a shunt across columns 1 and 2. A LOW setting is achieved by placing a shunt across columns 2 and 3. A MID setting is achieved when there is no shunt placed and the pins are left open. To change settings on a pin, remove the shunt from the original position and follow the instructions in Ta bl e 3. This is illustrated in Figure 10.
Row
number
Figure 10. Controlling JT7 Pins Settings
Table 3. The High, Mid, and Low Levels on JT32
Instruction
High Place a shunt across column 1 and 2
Mid Do not place any shunt
Low Place a shunt across column 2 and 3
6.2 BIST Test Set-up
6.2.1 BIST Internal Loopback Mode
6.2.1.1 Equipment Required
Equipment needed:
• CYP15G0101DXB-EVAL
• Instrument-grade power supply 1 Amp @ 3.3V
• Oscilloscope (500 MHz or better)
• Digital Signal Analyzer.
• Multimeter
Cable Needed:
• SMA-to-SMA coaxial cables
• Power supply cables.
LOW
MID
(no shunt)
HIGH
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6.2.1.2 Test Equipment Set-up
Figure 11 shows the test set-up of BIST. The signal analyzer in the diagram is optional.
Signal Analyzer
Oscilloscope
Input
Figure 11. Pictorial Representation of the Internal BIST Set-up
Ext Trigger
TXCLKO
RXST1
Input A
SEROUT
CYP15G0101DX
Evaluation Board
Input B
SEROUT*
3.3V GND
3.3V 1.0A
Power Supply
3.3V Gnd
6.2.1.3 Test Set-up
The intention of this set-up is to test CYP15G0101DXB in BIST mode.
Follow the procedure below for the test set-up.
1. Connect the clock input to the internal clock by placing a shunt across the XTAL_OUT on JT9.
2. Configure the JT7 pins using the following settings in Ta ble 4 by adjusting their shunt position:.
Table 4. The Levels of Different Static Signals on JT7 for BIST Mode
Signal Level Signal Level Signal Level
TXMODE0 LOW SPDSEL HIGH FRAMCHAR HIGH
TXMODE1 MID SDASEL LOW DECMODE HIGH
TXCKSEL LOW PARCTL LOW RXRATE LOW
TXRATE LOW RXMODE LOW LPEN HIGH
SCSEL LOW RXCKSEL LOW RFEN HIGH
TXRST* HIGH RFMODE MID INSEL HIGH
The values of the TXMODE[1:0] have been selected for TX Mode 3.
The FRAMECHAR value is HIGH to select K28.5 characters as the framing character.
RFMODE is set MID which means that the Cypress-mode multibyte framer is selected.
RFEN is HIGH which implies that the framer selected by the RFMODE is enabled.
Parity Generation is disabled as PARCTL is LOW.
LPEN is HIGH, which indicates that the internal loopback mode is enabled.
INSEL is HIGH, which means that the IN1+
3. Ensure that RXLE, OELE and BISTLE are all pushed to LOW and all BOEs to HIGH. (SWT1 – Red dip switches)
4. Check that TRSTZ* is pushed to HIGH. (the right most button of the SWT1)
5. Adjust the power supply to 3.3V and 1 amps limit.
6. Apply power on the board.
7. Verify that the power supply LED (DT1) is on.
are selected.
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8. Toggle TRSTZ* to LOW for a short moment and toggle to HIGH again, which will reset the board.
9. Push RXLE and OELE HIGH and BISTLE to LOW
10.Enable necessary transmit and receive channels by keeping the corresponding BOEs HIGH as shown in Tab le 5. To perform BIST, enable all channels.
Table 5. Channel Enabling Controls
BOE Input
BOE[1] OUT2± Transmit
BOE[0] OUT1± Receive Receive
11.Push RXLE and OELE to LOW. The corresponding transmit and receive channels should be enabled at this point.
12.At this point, the RXLE, OELE, and BISTLE will be closed (pushed LOW). Now pull the BISTLE HIGH.
13.Then close (LOW) the corresponding BOEs switches for those channels in which BIST is desired. To perform BIST, all the BOEs must set to LOW now. Please refer to Tab le 5 for details.
14.Push the BISTLE switch to LOW.
15.Verify that the LFI LED (DT2) for the corresponding channels are OFF while the power supply LED (DT1) is still on.
16.The board should already in BIST mode at this time. Verify the oscilloscope display on RXST1 matches with the waveform in Figure 12.
Output Controlled
(OELE)
BIST Channel Enable
(BISTLE)
Receive PLL Channel Enable
(RXLE)
X
Figure 12. Signal on RXST1 when BIST is Successful
17.Verify that RXST2 is always at logic-0 to indicate that there is no BIST error. RXST2 pin is next to the RXST1 pin.
18.With the completion of the above, BIST is successful. The following steps are optional.
19.Check the Serial Out in the BIST mode by following the procedure below.
• Change LPEN to LOW on the JT7. Notice that the LFI LED will go ON.
• Connect a pair of serial outputs (SEROUTx1/SEROUTx1*) to the digital signal analyzer using SMA cable.
• Trigger the signal analyzer by connecting a jumper-to-SMA cable from TXCLKO on JT9 to the trigger input on the analyzer.
• Verify on the signal analyzer that the eye diagram looks as shown in Figure 13. Make sure that the eye width is equal to 1-bit period.
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Figure 13. The Eye Diagram through the Signal Analyzer
6.2.2 BIST External Loopback Mode
6.2.2.1 Equipment Required
Equipment needed is the same as mentioned in Section 6.2.1.1 on page 15.
6.2.2.2 Test Set-up
Retain the initial set-up for the Internal BIST set-up as described in Section 6.2.1.3 and then follow the procedures below.
1. Before performing the test, loop a coaxial cable from INx1± to OUTx1± as shown in Figure 14.
2. Continue with the step 1 mentioned in Section 6.2.1.3.
3. Configure the JT32 pins using the same settings mentioned in step 2 of Section 6.2.1.3, except for the following change. Change LPEN from HIGH to LOW in Table 4.
4. Continue with all other subsequent steps in Section 6.2.1.3.
Figure 14. Coaxial Cable Connection for External BIST Mode
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6.3 Parallel Data In – Parallel Data Out Mode
The intention of this set-up is to test CYP15G0101DXB in parallel-in and parallel-out mode for encoded and unencoded data.
6.3.1 Encoded Mode
6.3.1.1 Equipment Required
Equipment needed:
• CYP15G0101DXB evaluation board
• Instrument-grade power supply 1 Amp @ 3.3V
• Parallel Data Generator: DG2020 from Tektronix (settings will be provided by Cypress)
• Logic Analyzer: TLA700 series from Tektronix or equivalent
• Multimeter.
Cable needed:
• Two SMA-to-SMA coaxial cables
• Power supply cables
• DG2020 cables with right connectors
• Logic Analyzer cables with right connectors.
6.3.1.2 Test Set-up
Follow the procedure below for the test set-up.
1. Load the file CYP15G0101_EVAL.PDA into the DG2020. If you are using your own data generator, use a similar waveform as shown in Figure 15.
REFCLK
(100 MHz.)
TXDATA(0.7)
[0:7]
00
01 55FE BF02 04 FF AA08 5510 FD20 DF40 AA80 0000 FFFB 7FF7 EF
TXCT0
Figure 15. Generated Clock, Data and Control Signal from DG2020
Note: The CYP15G0101_EVAL.PDA file will be included in the kit. The outputs of the DG2020 for this PDA file are mapped
to POD-A bits 0–11. The outputs may need to be remapped for particular test set-ups. Consult the users manual for setting up the DG2020.
2. Connect the TXDATA lines, i.e., TXDATA[7:0] of the data generator to JT10 TXD[7:0] in the proper order. Connect TXCT0 on the data generator to TXCT0 on JT10 on the board.
3. Ground TXCT1 and TXOP on JT10 on the board by shunting them.
4. On the JT9 place shunts across
• XTAL_EN (Pin 11 – Pin 12): The on-board crystal clock will be disabled.
• REFCLK (Pin 17 – Pin 18): The clock input to JT12 will be used as the clock for the board.
5. Connect the REFCLK output of the DG2020 to the REFCLK input on the board (JT12).
6. Connect the Logic Analyzer TLA700 to read the following receive data lines on JT6, RXD[7:0] and RXST[2:0].
7. Connect a clock input of the logic analyzer to RXCLK on JT9. The clocking of the logic analyzer needs to set to external. On the TLA 700 series logic analyzer this is done in the “SETUP” window. After selecting external clocking press the “MORE” button to customize your clock's settings. The clock definition needs to be changed to the clock input that you are using.
8. Configure the shunts on JT7 as listed on Table 6.
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Table 6. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Encoded)
Signal Level Signal Level Signal Level
TXMODE0 LOW SPDSEL HIGH FRAMCHAR HIGH
TXMODE1 MID SDASEL LOW DECMODE HIGH
TXCKSEL LOW PARCTL LOW RXRATE LOW
TXRATE LOW RXMODE LOW LPEN HIGH
SCSEL LOW RXCKSEL LOW RFEN HIGH
TXRST* HIGH RFMODE MID INSEL HIGH
The values of the TXMODE[1:0] have been selected for TX Mode 3.
The FRAMECHAR value is HIGH to select K28.5 characters as the framing character.
RFMODE is set MID which means that the Cypress-mode multibyte framer is selected.
RFEN is HIGH which implies that the framer selected by the RFMODE is enabled.
Parity Generation is disabled as PARCTL is LOW.
LPEN is HIGH, which indicates that the internal loopback mode is enabled.
INSEL is HIGH, which means that the IN1+
9. Adjust the voltage and current limit of the power supply to 3.3V and 1 Amp respectively.
10.Apply power to the board. Adjust the voltage across the banana jacks for power supply on the board to 3.3V. Verify that the power LED is ON.
11.Toggle TRSTZ* to LOW for a short moment and toggle to HIGH again, which will reset the board.
12.Push RXLE and OELE HIGH, and BISTLE to LOW
13.Enable necessary transmit and receive channels by keeping the corresponding BOEs HIGH as shown in Table 5.
14.Start transmitting the data from the DG2020. The format of the clock and the data should be as shown in Figure 15 as seen below. Make sure that the data is generated in repeat mode.
15.Press the RUN button on the logic analyzer TLA700. After it has acquired the data, stop the logic analyzer.
6.3.1.3 Result Verification
1. Compare the received data on the logic analyzer and the transmitted data from the DG2020. The data should be same as the transmitted data except for the cycle when TxCTC0 is 1, During this cycle the TXCT[1:0] signals tell the transmitter to ignore the parallel inputs and to send a K28.5 character. Thus in this cycle the receiver will output a K28.5 character, which is not what was presented at the transmitter.
are selected.
6.3.2 Unencoded Mode (Parallel-In – Parallel-Out)
6.3.2.1 Equipment Required
Equipment Needed is same as mentioned in Section 6.3.1.1 on page 19.
6.3.2.2 Test Set-up
Retain the test set-up as described in Section 6.3.1.2 on page 19. Now make the following changes to the set-up.
1. The shunts on JT7 should be placed in the following manner. The highlighted texts show the changes made to Table 6 on page 20.
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Table 7. The Levels of Static Signals on JT32 for Parallel In-Parallel Out Mode (Unencoded)
Signal Level Signal Level Signal Level
TXMODE0 LOW SPDSEL HIGH FRAMCHAR HIGH
TXMODE1 LOW SDASEL LOW DECMODE LOW
TXCKSEL LOW PARCTL LOW RXRATE LOW
TXRATE LOW RXMODE LOW LPEN HIGH
SCSEL LOW RXCKSEL MID RFEN HIGH
TXRST* HIGH RFMODE MID INSEL HIGH
The change of TXMODE[1] to LOW implies that the encoder is bypassed, i.e., the data now will be 10-bit instead of eight bits, or the data is considered as pre-encoded. The DECMODE is now LOW, which implies that the decoder is bypassed.
2. The output registers are assigned in a different sequence when the DECMODE is LOW, i.e., when the decoder is bypassed, than when the DECMODE is not equal to LOW. Table 8 shows the sequence in which the bits are arranged from LSB to MSB.
Table 8. Output Register Bit Assignments
Signal Name DECMODE = LOW DECMODE = MID or HIGH
RXST[2] COMDET RXST[2]
RXST[1] DOUT[0] RXST[1]
RXST[0] DOUT[1] RXST[0]
RXD[0] DOUT[2] RXD[0]
RXD[1] DOUT[3] RXD[1]
RXD[2] DOUT[4] RXD[2]
RXD[3] DOUT[5] RXD[3]
RXD[4] DOUT[6] RXD[4]
RXD[5] DOUT[7] RXD[5]
RXD[6] DOUT[8] RXD[6]
RXD[7] DOUT[9] RXD[7]
Note that when DECMODE is LOW, i.e,. the decoder is bypassed, the signal RXST[1] corresponds to the LSB of the 10-bit data. This is unlike when the decoder is not bypassed, and the signal RXD[0] corresponds to the LSB of the 8-bit data.
Similarly, when the DECMODE is LOW, the signal RXD[7] corresponds to the MSB of the 10-bit data. When the decoder is not bypassed, RXD[7] is the MSB of the 8-bit data.
This warrants the change in the way the data is viewed in the logic analyzer. The connector for the logic analyzer on the board needs to be reversed in order to see the right data that is being received and therefore, can be compared with the transmit data.
The input register bit assignments for the 10-bit unencoded data is shown in Ta bl e 9 . Note that TXD[0] corresponds to the LSB of the 10-bit value. TXCT[1] corresponds to the MSB of the 10-bit value.
Table 9. Input Register Bit Assignments
Signal Name Unencoded
TXD[0]
(LSB) DIN[0]
TXD[1] DIN[1]
TXD[2] DIN[2]
TXD[3] DIN[3]
TXD[4] DIN[4]
TXD[5] DIN[5]
TXD[6] DIN[6]
TXD[7] DIN[7]
TXCT[0] DIN[8]
TXCT[1]
(MSB) DIN[9]
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The DG2020 data pattern provided by Cypress does not contain any framing patterns for the unencoded mode. In order for HOTLink to frame the data properly, two consecutive K28.5’s need to be added to the DG2020 pattern.
This can be accomplished by extending the data pattern by two clock cycles. Add the two 10-bit K28-5 characters as shown in Figure 16.
REFCLK
TXCT [1:0],
TXDATA[7:0]
055
0AA
End of Previous
Data Stream
Figure 16. Adding Two Framing Characters to Data Stream
6.3.2.3 Result Verification
Follow the verification steps as mentioned in Section 6.3.1.3 on page 20.
055
17C
17C
Add These
Two Fram ing
Characters
6.3.3 Operational Variations for Parallel-In–Parallel-Out Mode
6.3.3.1 Equipment Required
Equipment needed is the same as mentioned in Section 6.3.1.1 on page 19.
6.3.3.2 Test Set-up and Result Verification
Following are a few variations that can be worked out with the present settings.
1. Parallel In – Serial Out Mode
Changes to the set-up described in Section 6.3.1.2 on page 19:
• Change LPEN to LOW on the JT7.
• Connect a pair of serial output to the digital signal analyzer using SMA cable.
• Trigger the signal analyzer by connecting a JT to SMA cable from TXCLKO on JT9 to the trigger input on the analyzer.
• Results Verification:
• Verify on the signal analyzer that the eye diagram looks perfect as in Figure 13 on page 18.
2. Different Clock Signal
The test set-up for using a TXCLK to latch the parallel data into the device instead of REFCLK, is similar to that of the parallel in parallel out mode described in Section 6.3.1.2 on page 19. The following are some of the changes that need to be made.
a.Changing the transmit clock select.
• By changing TXCKSEL on JT7 to MID, parallel data can be latched into the input registers by using TXCLK instead of the reference clock. Please refer to Table 2: Description of Control Pins in JT7 on page 11 to locate TXCLK signals in the board. A clock should be connected to TXCLK input and this clock must have identical frequency to REFCLK.
b.Once dataflow has started, move TXRST* jumper in JT7 from HIGH to LOW and then back to HIGH. This will reset the
phase align buffer to absorb the phase differences between the TxCLK and REFCLK.
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7. Schematic Diagram, PCB Layout, and Bill of Materials (BOM)
Figure 17 to Figure 21 in Appendix A shows the schematic diagram of the CYP15G0101DXB-EVAL.
Figure 22 to Figure 29 in Appendix B shows the PCB layout of each layer of the CYP15G0101DXB-EVAL.
The Bill of Materials (BOM) of the evaluation board is listed in Appendix C in Tab le 11.
Table 10.Operation Specification of CYP15G0101DXB Eval Board
Description Min. Max. Unit
Operating Voltage 3 3.3 V
Operating Current A
Operating Temperature 0 70 °C
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Appendix A. Schematic Diagram of CYP15G0101DXB Evaluation Board
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Figure 17. CYP15G0101DXB-EVAL Top Level Schematics
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Figure 18. CYP15G0101DXB-EVAL Terminated Transmitter & Receiver Blocks
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Figure 19. CYP15G0101DXB-EVAL Terminated Control Signals Block
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Figure 20. CYP15G0101DXB-EVAL Transmit and Receive Clock Schematics
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Figure 21. CYP15G0101DXB-EVAL Input Power Schematics
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Appendix B. PCB Layout for CYP15G0101DXB Evaluation Board
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Figure 22. CYP15G0101DXB-EVAL Top Layout
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Figure 23. CYP15G0101DXB-EVAL Bottom Layout
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Figure 24. CYP15G0101DXB-EVAL Top Layer Silk Layout
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Figure 25. CYP15G0101DXB-EVAL Bottom Layer Silk Layout
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Figure 26. CYP15G0101DXB-EVAL Top Layer Solder Mask Layout
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Figure 27. CYP15G0101DXB-EVAL Bottom Layer Solder Mask Layout
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Figure 28. CYP15G0101DXB-EVAL Power Plane Layout
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Figure 29. CYP15G0101DXB-EVAL Ground Plane Layout
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Appendix C. Bill Of Materials (BOM) CYP15G0101DXB Evaluation Board
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Table 11.CYP15G0101DXB Eval Board Bill Of Materials
Part Name Ref Des Manufacturer MAN_PN Qty
CAP-.1UF CB1,CB2,CB5,
CB6,CB7,CB8, CB9,CT1,CT6, CT7,CT8,CT9, CT10,CT11
CAP-SMDC0805V-2400PF CT2,CT3,CT4, CT5 DIELECTRIC LABORATO-
CAPPOL-10UF CB3,CB4,CB10 VISHAY 293D106X9010C2T 3
CLK_HCMOS-LCC197X295P4 UB1 Connor Winfield HSM923-125.00MHZ 1
CYP15G0101DXB_BGA100 UT1 CYPRESS CYP15G0101DXB 1
ECONORESET_SOT23 QT1 DALLAS DS1818R-10 1
ETHR1G_OXCVR-MSA_SFP XT1 STRATOS LIGHTWAVE 437-001 1
HEADER10-HDR100STR2X5 JT11 DIGIKEY MHB10K-ND 1
HEADER26-HDR100STR2X13 JT5,JT6,JT9,JT10 DIGIKEY S2011-13-ND 4
HEADER3X18-HDR100STR JT7 DIGIKEY S2011-18-ND 1
SHUNT DIGIKEY 929955-06 25
INDUCTOR-10UH LB1,LB2 VISHAY ILBB-0805 80 25% 2
JACK-BASE-CONJBANANA JT8,JT13 DIGIKEY J147-ND 2
LED-N/A DT1,DT2 DIGIKEY 67-1316-ND 2
RES0402-0 RT51,RT52,RT57 VISHAY CRCW0402000RT2 3
RES0402-100 RB5,RB9,RB12,
RB15,RB17,RT1, RT2,RT5,RT9, RT12,RT14,RT15, RT18,RT20,RT25, RT29,RT30,RT31, RT34,RT35,RT36, RT39,RT41,RT44, RT48,RT58,RT61, RT70,RT71,RT82, RT83
RES0402-1M RT8,RT13,RT19,
RT23, RT24,RT26
RES0402-267 RB13,RB14,RB18,
RT6,RT7,RT16, RT17,RT27,RT28, RT37,RT38,RT45, RT46,RT47,RT54, RT56,RT59,RT60, RT63,RT65,RT67, RT69,RT73,RT75, RT77,RT79,RT81
RES0402-365 RB10,RB11,RB16,
RT3,RT4,RT10, RT11,RT21,RT22, RT32,RT33,RT40, RT42,RT43,RT49, RT50,RT53,RT55, RT62,RT64,RT66, RT68,RT72,RT74, RT76,RT78,RT80
RES0402-4.7K RB1-RB4,RB6-RB8 VISHAY CRCW0402472JRT2 7
RES0402-390 RT84-RT87 VISHAY CRCW0402391JRT2 4
Vishay VJ0805Y104KXJAT 14
C08BLBB1X5UX 4
RIES
VISHAY CRCW04021000FB02 31
VISHAY CRCW0402106JRT2 6
VISHAY CRCW04022670FB02 27
VISHAY CRCW04023650FB02 27
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Table 11.CYP15G0101DXB Eval Board Bill Of Materials (continued)
Part Name Ref Des Manufacturer MAN_PN Qty
SMA_THRU-SMA_TH_VERT JT1-JT4,JT12,JT14 DIGIKEY ARFX1231-ND 6
SWITCH_DIP8 SWT1 GRAYHILL 76SB08S 1
ZENER-5.1V DT3 DIGIKEY 1N4733ADICT-ND 1
ESCON is a registered trademark of IBM. HOTLink is a registered trademark and HOTLink II and MultiFrame are trademarks of Cypress. All product and company names mentioned in this document may be the trademarks of their respective holders.
UG001_B approved kkv 08/12/03
© Cypress Semiconductor Corporation, 2001. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
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