constructed from four 128K x 8 SRAMs in SOJ packages
mounted on an epoxy laminate board with pins. Four chip se-
• High-density 4-megabit SRAM module
• 32-bit standard footprint supports densities from 16K
x 32 through 1M x 32
• High-speed CMOS SRAMs
—Access time of 15 ns
• Low active power
—2.6W (max.) at 20 ns
• SMD technology
• TTL-compatible inputs and outputs
• Low profile
—Max. height of 0.57 in.
• Small PCB footprint
—0.78 sq. in.
• Av ailable in SIMM, ZIP f ormat. SIMM suitable for vertical
or angled sockets.
Functional Description
The CYM1836 is a high-performance 4-megabit static RAM
lects (CS
the four bytes. Reading or writing can be executed on individual bytes or any combination of multiple bytes through proper
use of selects.
Writing to each byte is accomplished when the appropriate
Chip Select (CS
LOW. Data on the input/ outp ut pi ns (I/O ) is wri tte n into the
memory location specifi ed on the ad dre ss pins (A
A
Reading the device is accomplished by taking the Chip Select
(CS
these conditions, the contents of the memory location
specified on the address pins will appear on the data input/output pins (I/O).
The data input/output pins stay at the high-impedance state
when write enable is LOW or the appropriate chip selects are
HIGH.
Two pins (PD
ory density in applications where alternate versions of the
JEDEC-standa rd mod ule s can be inte rcha nged .
module organized as 128K words by 32 bits. This module is
Logic Block DiagramPin Configuration
−
PD
OPEN
0
−
PD
OPEN
−
A
A
0
16
OE
WE
CS
1
CS
2
CS
3
CS
4
1
17
128K x 8
SRAM
128K x 8
SRAM
128K x 8
SRAM
128K x 8
SRAM
I/O
4
I/O
4
I/O
4
I/O
4
1836–1
−
I/O
0
7
−
I/O
8
15
−
I/O
16
23
−
I/O
24
31
, CS2, CS3, CS4) are used to independently enable
1
) and Write Enable (WE) inputs are both
through
16
).
0
) LOW while Write Enable (WE) remains HIGH. Under
and PD1) are used to identify module mem-
0
ZIP/SIMM
Top View
GND
1
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40
42
44
46
48
50
52
54
56
58
60
62
64
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39
41
43
45
47
49
51
53
55
57
59
61
63
3
5
7
9
PD
I/O
I/O
I/O
I/O
A
A
A
I/O
I/O
I/O
I/O
GND
A
CS
CS
NC
OE
I/O
I/O
I/O
I/O
A
A
A
V
A
I/O
I/O
I/O
I/O
1836–2
1
8
9
10
11
0
1
2
12
13
14
15
15
2
4
24
25
26
27
3
4
5
CC
6
28
29
30
31
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
PD
I/O
I/O
I/O
I/O
V
CC
A
A
A
I/O
I/O
I/O
I/O
WE
A
CS
CS
A
GND
16
17
18
19
A
A
A
A
20
21
22
23
GND
0
0
1
2
3
7
8
9
4
5
6
7
14
1
3
16
10
11
12
13
Cypress Semiconductor Corporation
•3901 North First Street•San Jose•CA 95134•408-943-2600
February 15, 1999
CYM1836
Selection Guide
1836–151836–20 1836–251836–301836–351836–45
Maximum Access Time (ns)152025303545
Maximum Operating Current (mA)760480480480480480
Maximum Standby Current (mA)180100100100100100
Shaded area contains preliminary information.
Maximum Ratings
Operating Range
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .................................–55°C to +125°C
Commercial0°C to +70°C 5V ± 10%
Ambient Temperature with
Po wer Applied...............................................–10°C to +85°C
Supply Voltage to Ground Potential...............–0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State...............................................–0.5V to +7.0V
DC Input Voltage............................................–0.5V to +7.0V
Electrical Characteristics
Over the Operating Range
ParameterDescriptionTest Conditions
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
CC
I
SB1
I
SB2
Shaded area contains preliminary information.
Output HIGH VoltageVCC = Min., IOH = –4.0 mA2.42.4V
Output LOW VoltageVCC = Min., IOL = 8.0 mA0.40.4V
Input HIGH Voltage2.2V
Input LOW Voltage–0.50.8–0.50.8V
Input Load CurrentGND < VI < V
CC
Output Leakage CurrentGND < VO < VCC, Output Disabled–20+20–20+20µA
VCC Operating Supply CurrentVCC = Max., I
Automatic CS Power-Down
[1]
Current
Automatic CS Power-Down
[1]
Current
VCC = Max., CS > VIH,
Min. Duty Cycle = 100%
VCC = Max., CS > VCC – 0.2V,
> VCC – 0.2V or VIN < 0.2V
V
IN
= 0 mA, CS < V
OUT
Range
Ambient
TemperatureV
1836–20, 25,
1836–15
CC
30, 35, 45
2.2V
–20+20–20+20µA
IL
760480mA
180100mA
6028mA
CC
CC
UnitMin.Max.Min.Max.
V
Capacitance
[2]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
1. A pull-up resistor to V
2. Tested on a sample basis.
3. 20 pF on CS
CC
, 40 pF all others.
Input Capacitance
Output Capacitance15pF
on the CS input is required to keep the device deselected during VCC power-up, otherwise ISB will exceed values given.
[3]
TA = 25°C, f = 1 MHz,
= 5.0V
V
CC
40/20pF
2
AC Test Loads and Waveforms
CYM1836
Ω
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
Equivalent to:THÉ VENIN EQUIVALENT
OUTPUT
R1 481
OUTPUT
R2
Ω
167
Ω
255
INCLUDING
JIG AND
SCOPE
1.73V
30 pF
(a)(b)
5V
5 pF
R1 481
Ω
R2
255
1836–3
3.0V
GND
Ω
< 5ns< 5 ns
ALL INPUT PULSES
90%
10%
90%
10%
1836–4
3
CYM1836
Switching Characteristics
ParameterDescription
READ CYCLE
t
RC
t
AA
t
OHA
t
ACS
t
DOE
t
LZOE
t
HZOE
t
LZCS
t
HZCS
WRITE CYCLE
t
WC
t
SCS
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
Read Cycle Time152025303545ns
Address to Data
Valid
Output Hold from
Address Change
CS LOW to Data
Valid
OE LOW to Data
Valid
OE LOW to
Low Z
OE HIGH to High
Z
CS LOW to
[5]
Low Z
CS HIGH to High
[5, 6]
Z
[7]
Write Cycle Time152025303545ns
CS LOW to Write
End
Address Set-Up
to Write End
Address Hold
from Write End
Address Set-Up
to Write Start
WE Pulse Width121515182025ns
Data Set-Up to
Write End
Data Hold from
Write End
WE HIGH to Low Z333333ns
Over the Operating Range
[4]
1836–151836–201836–251836–301836–351836– 45
152025303545ns
333333ns
152025303545ns
788101215ns
000000ns
7810111215ns
333333ns
71010131518ns
121515182025ns
121515182025ns
000000ns
000000ns
71010131520ns
000000ns
UnitMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max.
t
HZWE
Shaded area contains preliminary information.
Notes:
4. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V , input pulse levels of 0 to 3.0V, and output loading of the specified
I
OL/IOH
5. At any given temperature and voltage condition, t
6. t
HZCS
7. The internal write time of the memory is defined by the overlap of CS
terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
WE LOW to High
[6]
Z
and 30-pF load capacitance.
and t
are specified with CL = 5 pF as in part (b) of AC Test Loads and Waveforms. Transition is measured ±500 mV from steady-state voltage.
HZWE
0608010015015018ns
HZCS
is less than t
for any given device. These parameters are guaranteed by design and not 100% tested.
LZCS
LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can
4
Switching Waveforms
CYM1836
Read Cycle No.1
ADDRESS
DATA OUT
Read Cycle No. 2
CS
OE
DATA OUT
[8, 9]
t
RC
t
t
OHA
AA
PREVIOUS DATA VALIDDATA VALID
[8, 10]
t
RC
t
ACS
t
DOE
t
LZOE
HIGH IMPEDANCE
t
LZCS
DATA VALID
t
HZOE
t
HZCS
1836–5
HIGH
IMPEDANCE
1836–6
Write Cycle No.1 (WE Controlled )
[7]
ADDRESS
CS
t
SA
WE
DATA IN
DATA
OUT
Notes:
8. WE
is HIGH for read cycle.
9. Device is continuously selected, CS = VIL and OE= VIL.
10. Address valid prior to or coincident with CS
DATA UNDEFINED
transition LOW.
t
SCS
t
AW
t
WC
DATA VALID
t
HZWE
t
PWE
t
HA
t
SD
t
HD
t
LZWE
HIGH IMPEDANCE
1836–7
5
CYM1836
Switching Waveforms
(continued)
Write Cycle No.2 (CS Controlled)
ADDRESS
CS
WE
DATA IN
OUT
DATA
Note:
11. If CS
goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.