Cypress Semiconductor CY7C1316CV18, CY7C1318CV18, CY7C1320CV18, CY7C1916CV18 Specification Sheet

18-Mbit DDR-II SRAM 2-Word

Burst Architecture

CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Features

Functional Description

■ 18-Mbit density (2M x 8, 2M x 9, 1M x 18, 512K x 36)

■ 267 MHz clock for high bandwidth

■ 2-word burst for reducing address bus frequency

■ Double Data Rate (DDR) interfaces

(data transferred at 534 MHz) at 267 MHz

■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only

■ Two input clocks for output data (C and C) to minimize clock

skew and flight time mismatches

■ Echo clocks (CQ and CQ) simplify data capture in high-speed

systems

■ Synchronous internally self-timed writes

■ DDR-II operates with 1.5 cycle read latency when the DLL is

enabled

■ Operates similar to a DDR-I device with 1 cycle read latency in

DLL off mode

■ 1.8V core power supply with HSTL inputs and outputs

■ Variable drive HSTL output buffers

■ Expanded HSTL output voltage (1.4V–V

■ Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)

■ Offered in both Pb-free and non Pb-free packages

■ JTAG 1149.1 compatible test access port

■ Delay Lock Loop (DLL) for accurate data placement

DD

)

The CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and
CY7C1320CV18 are 1.8V Synchronous Pipelined SRAMs
equipped with DDR-II architecture. The DDR-II consists of an
SRAM core with advanced synchronous peripheral circuitry and
a one-bit burst counter. Addresses for read and write are latched
on alternate rising edges of the input (K) clock. Write data is
registered on the rising edges of both K and K
driven on the rising edges of C and C
edge of K and K

if C/C are not provided. Each address location

if provided, or on the rising

. Read data is

is associated with two 8-bit words in the case of CY7C1316CV18
and two 9-bit words in the case of CY7C1916CV18 that burst
sequentially into or out of the device. The burst counter always
starts with a ‘0’ internally in the case of CY7C1316CV18 and
CY7C1916CV18. For CY7C1318CV18 and CY7C1320CV18,
the burst counter takes in the least significant bit of the external
address and bursts two 18-bit words (in the case of
CY7C1318CV18) of two 36-bit words (in the case of
CY7C1320CV18) sequentially into or out of the device.

Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs, D) are tightly matched to the two
output echo clocks CQ/CQ

, eliminating the need to capture data
separately from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.

All synchronous inputs pass through input registers controlled by
the K or K
registers controlled by the C or C

input clocks. All data outputs pass through output

(or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.

Configurations

CY7C1316CV18 – 2M x 8
CY7C1916CV18 – 2M x 9
CY7C1318CV18 – 1M x 18
CY7C1320CV18 – 512K x 36

Selection Guide

Description 267 MHz 250 MHz 200 MHz 167 MHz Unit

Maximum Operating Frequency 267 250 200 167 MHz
Maximum Operating Current x8 775 705 575 490 mA

Cypress Semiconductor Corporation • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600
Document Number: 001-07160 Rev. *E Revised June 18, 2008

x9 780 710 580 490
x18 805 730 600 510
x36 855 775 635 540

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CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Logic Block Diagram (CY7C1316CV18)

Write
Reg

Write
Reg

CLK

A

(19:0)

Gen.

K

K

Control

Logic

Address

Register

Read Add. Decode

Read Data Reg.

R/W

Output

Logic

Reg.

Reg.

Reg.

8

16

8

NWS

[1:0]

V

REF

Write Add. Decode

8

20

C

C

8

LD

Control

R/W

DOFF

1M x 8 Array

1M x 8 Array

8

DQ

[7:0]

8

CQ
CQ

Write
Reg

Write
Reg

CLK

A

(19:0)

Gen.

K

K

Control

Logic

Address

Register

Read Add. Decode

Read Data Reg.

R/W

Output

Logic

Reg.

Reg.

Reg.

9

18

9

BWS

[0]

V

REF

Write Add. Decode

9

20

C

C

9

LD

Control

R/W

DOFF

1M x 9 Array

1M x 9 Array

9

DQ

[8:0]

9

CQ
CQ

Logic Block Diagram (CY7C1916CV18)

Document Number: 001-07160 Rev. *E Page 2 of 29

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CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Logic Block Diagram (CY7C1318CV18)

Write

Reg

Write
Reg

CLK

A

(19:0)

Gen.

K

K

Control

Logic

Address

Register

Read Add. Decode

Read Data Reg.

R/W

Output

Logic

Reg.

Reg.

Reg.

18

36

18

BWS

[1:0]

V

REF

Write Add. Decode

18

20

C

C

18

LD

Control

Burst

Logic

A0

A

(19:1)

R/W

DOFF

512K x 18 Array

512K x 18 Array

19

18

DQ

[17:0]

18

CQ
CQ

Write

Reg

Write
Reg

CLK

A

(18:0)

Gen.

K

K

Control

Logic

Address

Register

Read Add. Decode

Read Data Reg.

R/W

Output

Logic

Reg.

Reg.

Reg.

36

72

36

BWS

[3:0]

V

REF

Write Add. Decode

36

19

C

C

36

LD

Control

Burst

Logic

A0

A

(18:1)

R/W

DOFF

256K x 36 Array

256K x 36 Array

18

36

DQ

[35:0]

36

CQ
CQ

Logic Block Diagram (CY7C1320CV18)

Document Number: 001-07160 Rev. *E Page 3 of 29

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CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Pin Configuration

Note

1. NC/36M, NC/72M, NC/144M, and NC/288M are not connected to the die and can be tied to any voltage level.

The pin configuration for CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and CY7C1320CV18 follow.

165-Ball FBGA (13 x 15 x 1.4 mm) Pinout

CY7C1316CV18 (2M x 8)

1 2 3 4 5 6 7 8 9 10 11

A CQ NC/72M A R/W NWS

1

B NC NC NC A NC/288M K NWS
C NC NC NC V
D NC NC NC V
E NC NC DQ4 V
F NC NC NC V
G NC NC DQ5 V
H DOFF V

REF

V

DDQ

V

J NC NC NC V
K NC NC NC V
L NC DQ6 NC V
M NC NC NC V
N NC NC NC V

SS

SS
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

SS

SS

AAAVSSNC NC NC

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

AAAVSSNC NC NC

P NC NC DQ7 A A C A A NC NC NC
R TDO TCK A A A C AAATMSTDI

K NC/144M LD A NC/36M CQ

0

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

ANCNCDQ3

V

SS

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

SS

[1]

NC NC NC
NC NC DQ2
NC NC NC
NC NC NC

V

DDQ

V

REF

NC DQ1 NC
NC NC NC
NC NC DQ0
NC NC NC

ZQ

CY7C1916CV18 (2M x 9)

1 2 3 4 5 6 7 8 9 10 11

A CQ NC/72M A R/W NC K NC/144M LD A NC/36M CQ
B NC NC NC A NC/288M K BWS
C NC NC NC V
D NC NC NC V
E NC NC DQ4 V
F NC NC NC V
G NC NC DQ5 V
H DOFF V

REF

V

DDQ

V

J NC NC NC V
K NC NC NC V
L NC DQ6 NC V
M NC NC NC V
N NC NC NC V

SS

SS
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

SS

SS

AAAVSSNC NC NC

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

AAAVSSNC NC NC

0

ANCNCDQ3

V
V
V
V
V
V
V

V

DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

V

SS

SS

NC NC NC
NC NC DQ2
NC NC NC
NC NC NC

V

DDQ

V

REF

NC DQ1 NC
NC NC NC
NC NC DQ0
NC NC NC

ZQ

P NC NC DQ7 A A C A A NC NC DQ8
R TDO TCK A A A C AAATMSTDI

Document Number: 001-07160 Rev. *E Page 4 of 29

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CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Pin Configuration (continued)

The pin configuration for CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and CY7C1320CV18 follow.

165-Ball FBGA (13 x 15 x 1.4 mm) Pinout

CY7C1318CV18 (1M x 18)

1 2 3 4 5 6 7 8 9 10 11

A CQ NC/72M A R/W BWS

1

B NC DQ9 NC A NC/288M K BWS
C NC NC NC V
D NC NC DQ10 V
E NC NC DQ11 V
F NC DQ12 NC V
G NC NC DQ13 V
H DOFF V

REF

V

DDQ

V

J NC NC NC V
K NC NC DQ14 V
L NC DQ15 NC V
M NC NC NC V
N NC NC DQ16 V

SS

SS
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

SS

SS

AA0AVSSNC DQ7 NC

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

AAAVSSNC NC NC

P NC NC DQ17 A A C A A NC NC DQ0
R TDO TCK A A A C AAATMSTDI

K NC/144M LD A NC/36M CQ

0

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

ANCNCDQ8

V

SS

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

DDQ

V

SS

[1]

NC NC NC
NC NC DQ6
NC NC DQ5
NC NC NC

V

DDQ

V

REF

NC DQ4 NC
NC NC DQ3
NC NC DQ2
NC DQ1 NC

ZQ

CY7C1320CV18 (512K x 36)

1 2 3 4 5 6 7 8 9 10 11

A CQ NC/144M NC/36M R/W BWS
B NC DQ27 DQ18 A BWS
C NC NC DQ28 V
D NC DQ29 DQ19 V
E NC NC DQ20 V
F NC DQ30 DQ21 V
G NC DQ31 DQ22 V
H DOFF V

REF

V

DDQ

V

J NC NC DQ32 V
K NC NC DQ23 V
L NC DQ33 DQ24 V
M NC NC DQ34 V
N NC DQ35 DQ25 V

SS

SS
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

SS

SS

AA0AVSSNC DQ17 DQ7

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

AAAVSSNC NC DQ10

2
3

K BWS

LD A NC/72M CQ

1

KBWS0ANCNCDQ8

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

SS

V

DD

V

DD

V

DD

V

DD

V

DD

V

SS

V

SS

V
V
V
V
V
V
V

V

DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ

V

SS

SS

NC NC DQ16
NC DQ15 DQ6
NC NC DQ5
NC NC DQ14

V

DDQ

V

REF

ZQ
NC DQ13 DQ4
NC DQ12 DQ3
NC NC DQ2
NC DQ11 DQ1

P NC NC DQ26 A A C A A NC DQ9 DQ0
R TDO TCK A A A C AAATMSTDI

Document Number: 001-07160 Rev. *E Page 5 of 29

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CY7C1318CV18, CY7C1320CV18

Pin Definitions

Pin Name IO Pin Description

DQ

[x:0]

LD Input-

NWS
NWS

BWS
BWS
BWS
BWS

A, A0 Input-

R/W Input-

C Input Clock Positive Input Clock for Output Data. C is used in conjunction with C

C

K Input Clock Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device

K

,

0
1

,

0

,

1

,

2
3

Input Output­Synchronous

Data Input Output Signals. Inputs are sampled on the rising edge of K and K clocks during valid write
operations. These pins drive out the requested data during a read operation. Valid data is driven out on
the rising edge of both the C and C
When read access is deselected, Q
CY7C1316CV18 − DQ
CY7C1916CV18 − DQ
CY7C1318CV18 − DQ
CY7C1320CV18 − DQ

[7:0]
[8:0]
[17:0]
[35:0]

clocks during read operations or K and K when in single clock mode.

are automatically tri-stated.

[x:0]

Synchronous Load. This input is brought LOW when a bus cycle sequence is defined. This definition

Synchronous

Input-

Synchronous

includes address and read/write direction. All transactions operate on a burst of 2 data.
Nibble Write Select 0, 1 − Active LOW (CY7C1316CV18 only). Sampled on the rising edge of the K

and K

clocks during write operations. Used to select which nibble is written into the device during the
current portion of the write operations. Nibbles not written remain unaltered.
NWS0 controls D

and NWS1 controls D

[3:0]

[7:4]

.

All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select
ignores the corresponding nibble of data and it is not written into the device.

Input-

Synchronous

Byte Write Select 0, 1, 2, and 3 − Active LOW. Sampled on the rising edge of the K and K clocks during
write operations. Used to select which byte is written into the device during the current portion of the Write
operations. Bytes not written remain unaltered.
CY7C1916CV18 − BWS
CY7C1318CV18 − BWS0 controls D
CY7C1320CV18 − BWS0 controls D

.

D

[35:27]

controls D

0

[8:0]

and BWS1 controls D

[8:0]

, BWS1 controls D

[8:0]

[17:9].

, BWS2 controls D

[17:9]

and BWS3 controls

[26:18]

All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
ignores the corresponding byte of data and it is not written into the device.

Address Inputs. These address inputs are multiplexed for both read and write operations. Internally, the

Synchronous

device is organized as 2M x 8 (2 arrays each of 1M x 8) for CY7C1316CV18 and 2M x 9 (2 arrays each
of 1M x 9) for CY7C1916CV18, 1M x 18 (2 arrays each of 512K x 18) for CY7C1318CV18, and 512K x
36 (2 arrays each of 256K x 36) for CY7C1320CV18.

CY7C1316CV18 – Because the least significant bit of the address internally is a ‘0’, only 20 external
address inputs are needed to access the entire memory array.

CY7C1916CV18 – Because the least significant bit of the address internally is a ‘0’, only 20 external
address inputs are needed to access the entire memory array.

CY7C1318CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
20 address inputs are needed to access the entire memory array.

CY7C1320CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
19 address inputs are needed to access the entire memory array. All the address inputs are ignored when
the appropriate port is deselected.

Synchronous Read/Write Input. When LD is LOW, this input designates the access type (read when

Synchronous

R/W

is HIGH, write when R/W is LOW) for the loaded address. R/W must meet the setup and hold times

around the edge of K.

to clock out the read data from

the device. C and C

can be used together to deskew the flight times of various devices on the board back

to the controller. See Application Example on page 9 for more information.

Input Clock Negative Input Clock for Output Data. C is used in conjunction with C to clock out the read data from

the device. C and C

can be used together to deskew the flight times of various devices on the board back

to the controller. See Application Example on page 9 for more information.

and to drive out data through Q
edge of K.

when in single clock mode. All accesses are initiated on the rising

[x:0]

Input Clock Negative Input Clock Input. K is used to capture synchronous data being presented to the device and

to drive out data through Q

when in single clock mode.

[x:0]

Document Number: 001-07160 Rev. *E Page 6 of 29

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CY7C1318CV18, CY7C1320CV18

Pin Definitions (continued)

Pin Name IO Pin Description

CQ Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock

for output data (C) of the DDR-II. In single clock mode, CQ is generated with respect to K. The timing for
the echo clocks is shown in Switching Characteristics on page 23.

CQ

ZQ Input Output Impedance Matching Inpu t. This input is used to tune the device outputs to the system data bus

DOFF

TDO Output TDO for JTAG.
TCK Input TCK Pin for JTAG.
TDI Input TDI Pin for JTAG.
TMS Input TMS Pin for JTAG.
NC N/A Not Connected to the Die. Can be tied to any voltage level.
NC/36M N/A Not Connected to the Die. Can be tied to any voltage level.
NC/72M N/A Not Connected to the Die. Can be tied to any voltage level.
NC/144M N/A Not Connected to the Die. Can be tied to any voltage level.
NC/288M N/A Not Connected to the Die. Can be tied to any voltage level.
V

REF

V

DD

V

SS

V

DDQ

Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock

Input DLL Turn Off − Active LOW. Connecting this pin to ground turns off the DLL inside the device. The timing

Input-

Reference

Power Supply Power Supply Inputs to the Core of the Device.

Ground Ground for the Device.

Power Supply Power Supply Inputs for the Outputs of the Device.

for output data (C
the echo clocks is shown in Switching Characteristics on page 23.

impedance. CQ, CQ, and Q
between ZQ and ground. Alternatively, this pin can be connected directly to V
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.

in the DLL turned off operation is different from that listed in this data sheet. For normal operation, this
pin can be connected to a pull up through a 10 KΩ or less pull up resistor. The device behaves in DDR-I
mode when the DLL is turned off. In this mode, the device can be operated at a frequency of up to 167
MHz with DDR-I timing.

Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.

) of the DDR-II. In single clock mode, CQ is generated with respect to K. The timing for

output impedance are set to 0.2 x RQ, where RQ is a resistor connected

[x:0]

, which enables the

DDQ

Document Number: 001-07160 Rev. *E Page 7 of 29

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CY7C1316CV18, CY7C1916CV18
CY7C1318CV18, CY7C1320CV18

Functional Overview

The CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and
CY7C1320CV18 are synchronous pipelined Burst SRAMs
equipped with a DDR interface, which operates with a read
latency of one and half cycles when DOFF
When DOFF

pin is set LOW or connected to VSS the device

behaves in DDR-I mode with a read latency of one clock cycle.
Accesses are initiated on the rising edge of the positive input

clock (K). All synchronous input timing is referenced from the
rising edge of the input clocks (K and K
referenced to the rising edge of the output clocks (C/C
when in single clock mode).

All synchronous data inputs (D
controlled by the rising edge of the input clocks (K and K
synchronous data outputs (Q
controlled by the rising edge of the output clocks (C/C

) pass through input registers

[x:0]

) pass through output registers

[x:0]

when in single-clock mode).
All synchronous control (R/W, LD, BWS

input registers controlled by the rising edge of the input clock (K).
CY7C1318CV18 is described in the following sections. The

same basic descriptions apply to CY7C1316CV18,
CY7C1916CV18, and CY7C1320CV18.

Read Operations

The CY7C1318CV18 is organized internally as two arrays of
512K x 18. Accesses are completed in a burst of two sequential
18-bit data words. Read operations are initiated by asserting
R/W

HIGH and LD LOW at the rising edge of the positive input
clock (K). The address presented to address inputs is stored in
the read address register and the least significant bit of the
address is presented to the burst counter. The burst counter
increments the address in a linear fashion. Following the next K
clock rise, the corresponding 18-bit word of data from this
address location is driven onto Q
timing reference. On the subsequent rising edge of C the next

[17:0]

18-bit data word from the address location generated by the
burst counter is driven onto Q

0.45 ns from the rising edge of the output clock (C or C

when in single clock mode, 200 MHz and 250 MHz device). To

K

. The requested data is valid

[17:0]

maintain the internal logic, each read access must be allowed to
complete. Read accesses can be initiated on every rising edge
of the positive input clock (K).

The CY7C1318CV18 first completes the pending read transac­tions, when read access is deselected. Synchronous internal
circuitry automatically tri-states the output following the next
rising edge of the positive output clock (C). This enables a
seamless transition between devices without the insertion of wait
states in a depth expanded memory.

Write Operations

Write operations are initiated by asserting R/W LOW and LD
LOW at the rising edge of the positive input clock (K). The
address presented to address inputs is stored in the write
address register and the least significant bit of the address is
presented to the burst counter. The burst counter increments the
address in a linear fashion. On the following K clock rise the data
presented to D
data register, provided BWS
subsequent rising edge of the negative input cl ock (K

is latched and stored into the 18-bit write

[17:0]

are both asserted active. On the

[1:0]

pin is tied HIGH.

) and all output timing is

, or K/K

). All

, or K/K

) inputs pass through

[0:X]

, using C as the output

, or K and

) the infor-

mation presented to D
register , provided BWS
of data are then written into the memory array at the specified

is also stored into the write data

[17:0]

are both asserted active. The 36 bits

[1:0]

location. Write accesses can be initiated on every rising edge of
the positive input clock (K). This pipelines the data flow such that
18 bits of data can be transferred into the device on every rising
edge of the input clocks (K and K

).

When Write access is deselected, the device ignores all inputs
after the pending write operations are completed.

Byte Write Operations

Byte write operations are supported by the CY7C1 318CV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS0 and
BWS

, which are sampled with each set of 18-bit data words.

1

Asserting the appropriate Byte Write Select input during the data
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature can be used to
simplify read/modify/write operations to a byte write operation.

Single Clock Mode

The CY7C1318CV18 can be used with a single clock that
controls both the input and output registers. In this mode the
device recognizes only a single pair of input clocks (K and K) that
control both the input and output registers. This operation is
identical to the operation if the device had zero skew between
the K/K

and C/C clocks. All timing parameters remain the same

in this mode. T o use this mode of operation, tie C and C

HIGH at
power on. This function is a strap option and not alterable during
device operation.

DDR Operation

The CY7C1318CV18 enables high-performance operation
through high clock frequencies (achieved through pipelining) and
double data rate mode of operation. The CY7C1318CV18
requires a single No Operation (NOP) cycle when transitioning
from a read to a write cycle. At higher frequencies, some appli­cations may require a second NOP cycle to avoid contention.

If a read occurs after a write cycle, address and data for the write
are stored in registers. The write information must be stored
because the SRAM cannot perform the last word write to the
array without conflicting with the read. The data stays in this
register until the next write cycle occurs. On the first write cycle
after the read(s), the stored data from the earlier write is written
into the SRAM array. This is called a posted write.

If a read is performed on the same address on which a write is
performed in the previous cycle, the SRAM reads out the most
current data. The SRAM does this by bypassing the memory
array and reading the data from the registers.

Depth Expansion

Depth expansion requires replicating the LD control signal for
each bank. All other control signals can be common between
banks as appropriate.

Programmable Impedance

An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and V

to enable the SRAM to adjust its output

SS

Document Number: 001-07160 Rev. *E Page 8 of 29

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CY7C1318CV18, CY7C1320CV18

driver impedance. The value of RQ must be 5x the value of the

Vterm = 0.75V

Vterm = 0.75V

R = 50ohms

R = 250ohms

LD# C C#R/W#

DQ
A

K

LD# C C#R/W#

DQ
A

K

SRAM#1

SRAM#2

R = 250ohms

BUS

MASTER

(CPU

or

ASIC)

DQ

Addresses

Cycle Start#

R/W#

Return CLK

Source CLK
Return CLK#
Source CLK#

Echo Clock1/Echo Clock#1
Echo Clock2/Echo Clock#2

ZQ

CQ/CQ#

K#

ZQ

CQ/CQ#

K#

intended line impedance driven by the SRAM. The allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175Ω and 350Ω
output impedance is adjusted every 1024 cycles at power up to

, with V

=1.5V. The

DDQ

account for drifts in supply voltage and temperature.

Echo Clocks

Echo clocks are provided on the DDR-II to simplify data capture
on high-speed systems. Two echo clocks are generated by the
DDR-II. CQ is referenced with respect to C and CQ
with respect to C

. These are free running clocks and are synchro-

is referenced

nized to the output clock of the DDR-II. In the single clock mode,
CQ is generated with respect to K and CQ
respect to K

. The timing for the echo clocks is shown in Switching

is generated with

Characteristics on page 23.

Application Example

Figure 1 shows two DDR-II used in an application.

Figure 1. Application Example

DLL

These chips use a Delay Lock Loop (DLL) that is designed to
function between 120 MHz and the specified maximum clock
frequency. During power up, when the DOFF is tied HIGH, the
DLL is locked after 1024 cycles of stable clock. The DLL can also
be reset by slowing or stopping the input clocks K and K
minimum of 30 ns. However, it is not necessary to reset the DLL
to lock it to the desired frequency. The DLL automatically locks
1024 clock cycles after a stable clock is presented. The DLL may
be disabled by applying ground to the DOFF pin. When the DLL
is turned off, the device behaves in DDR-I mode (with one cycle
latency and a longer access time). For information refer to the
application note DLL Considerations in QDRII™/DDRII.

for a

Document Number: 001-07160 Rev. *E Page 9 of 29

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CY7C1318CV18, CY7C1320CV18

Truth Table

Notes

2. X = “Don’t Care,” H = Logic HIGH, L = Logic LOW, ↑

represents rising edge.

3. Device powers up deselected with the outputs in a tri-state condition.

4. On CY7C1318CV18 and CY7C1320CV18, “A1” represents address loca tion latched by the devices when tra nsaction was initiate d and “A2” represent s the addresses
sequence in the burst. On CY7C1316CV18 and CY7C1916CV18, “A1” represents A + ‘0’ and “A2” represents A + ‘1’.

5. “t” represents the cycle at which a read/write operation is started. t + 1 and t + 2 are the first and second clock cycles succeeding the “t” clock cycle.

6. Data inputs are registered at K and K

rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode.

7. It is recommended that K = K

and C = C = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging

symmetrically.

8. Is based on a write cycle that was initiated in accordance with the Write Cycle Descriptions table. NWS

0

, NWS1, BWS0, BWS1, BWS2, and BWS3 can be altered on

different portions of a write cycle, as long as the setup and hold requirements are achieved.

The truth table for the CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and CY7C1320CV18 follows .

Operation K LD R/W DQ DQ

Write Cycle:

L-H L L D(A1) at K(t + 1) ↑ D(A2) at K
Load address; wait one cycle;
input write data on consecutive K and K

Read Cycle:

rising edges.

L-H L H Q(A1) at C(t + 1)↑ Q(A2) at C(t + 2) ↑
Load address; wait one and a half cycle;
read data on consecutive C

and C rising edges.
NOP: No Operation L-H H X High-Z High-Z
Standby: Clock Stopped Stopped X X Previous State Previous State

[2, 3, 4, 5, 6, 7]

(t + 1) ↑

Burst Address Table

(CY7C1318CV18, CY7C1320CV18)

First Address (External) Second Address (Internal)

X..X0 X..X1
X..X1 X..X0

Write Cycle Descriptions

The write cycle description table for CY7C1316CV18 and CY7C1318CV18 follows.

BWS0/
NWS

0

BWS1/

NWS

K

1

K

Comments

L L L–H – During the data portion of a write sequence :

CY7C1316CV18 − both nibbles (D
CY7C1318CV18 − both bytes (D

) are written into the device,

[7:0]

) are written into the device.

[17:0]

L L – L-H During the data portion of a write sequence :

CY7C1316CV18 − both nibbles (D
CY7C1318CV18 − both bytes (D

) are written into the device,

[7:0]

) are written into the device.

[17:0]

L H L–H – During the data portion of a write sequence :

CY7C1316CV18 − only the lower nibble (D
CY7C1318CV18 − only the lower byte (D

[3:0]

) is written into the device, D

[8:0]

L H – L–H During the data portion of a write sequence :

CY7C1316CV18 − only the lower nibble (D
CY7C1318CV18 − only the lower byte (D

[3:0]

) is written into the device, D

[8:0]

H L L–H – During the data portion of a write sequence :

CY7C1316CV18 − only the upper nibble (D
CY7C1318CV18 − only the upper byte (D

[7:4]

[17:9]

H L – L–H Durin g the data portion of a write sequence :

CY7C1316CV18 − only the upper nibble (D
CY7C1318CV18 − only the upper byte (D

[7:4]

[17:9]

H H L–H – No data is written into the devices during this portion of a write operation.
H H – L–H No data is written into the devices during this portion of a write operation.

[2, 8]

) is written into the device, D

) is written into the device, D

) is written into the device, D

) is written into the device, D

) is written into the device, D

) is written into the device, D

remains unaltered.

[7:4]

remains unaltered.

[17:9]

remains unaltered.

[7:4]

remains unaltered.

[17:9]

remains unaltered.

[3:0]

remains unaltered.

[8:0]

remains unaltered.

[3:0]

remains unaltered.

[8:0]

Document Number: 001-07160 Rev. *E Page 10 of 29

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Write Cycle Descriptions

The write cycle description table for CY7C1916CV18 follows.

[2, 8]

BWS

L L–H – During the data portion of a write sequence, the single byte (D
L – L–H During the data portion of a write sequence, the single byte (D

K K Comments

0

) is written into the device.

[8:0]

) is written into the device.

[8:0]

H L–H – No data is written into the device during this portion of a write operation.
H – L–H No data is written into the device during this portion of a write operation.

Write Cycle Descriptions

The write cycle description table for CY7C1320CV18 follows.

BWS0BWS1BWS2BWS3K K Comments

LLLLL–H–During the data portion of a write sequence, all four bytes (D

the device.

LLLL–L–HDuring the data portion of a write sequence, all four bytes (D

the device.

L H H H L–H – During the data portion of a write sequence, only the lower byte (D

into the device. D

L H H H – L–H During the data portion of a write sequence, only the lower byte (D

into the device. D

H L H H L–H – During the data portion of a write sequence, only the byte (D

the device. D

H L H H – L–H During the data portion of a write sequence, only the byte (D

the device. D

H H L H L–H – During the data portion of a write sequence, only the byte (D

the device. D

H H L H – L–H During the data portion of a write sequence, only the byte (D

the device. D

H H H L L–H – During the data portion of a write sequence, only the byte (D

the device. D

H H H L – L–H During the data portion of a write sequence, only the byte (D

the device. D
HHHHL–H–No data is written into the device during this portion of a write operation.
HHHH–L–HNo data is written into the device during this portion of a write operation.

[2, 8]

[35:9]

[35:9]

and D

[8:0]

and D

[8:0]

and D

[17:0]

and D

[17:0]

remains unaltered.

[26:0]

remains unaltered.

[26:0]

remains unaltered.

remains unaltered.

remains unaltered.

[35:18]

remains unaltered.

[35:18]

remains unaltered.

[35:27]

remains unaltered.

[35:27]

[35:0]

[35:0]

[17:9]

[17:9]

[26:18]

[26:18]

[35:27]

[35:27]

) are written into

) are written into

) is written

[8:0]

) is written

[8:0]

) is written into

) is written into

) is written into

) is written into

) is written into

) is written into

Document Number: 001-07160 Rev. *E Page 11 of 29

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CY7C1318CV18, CY7C1320CV18

IEEE 1149.1 Serial Boundary Scan (JTAG)

These SRAMs incorporate a serial boundary scan Test Access
Port (TAP) in the FBGA p ackage. This part is fully compliant with
IEEE Standard #1149.1-2001. The TAP operates using JEDEC
standard 1.8V IO logic levels.

Disabling the JTAG Feature

It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are inter­nally pulled up and may be unconnected. They may alternatively
be connected to V
unconnected. Upon power up, the device comes up in a reset
state, which does not interfere with the operation of the device.

Test Access Port—Test Clock

The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.

Test Mode Select (TMS)

The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The pin is pulled up inter­nally, resulting in a logic HIGH level.

Test Data-In (TDI)

The TDI pin is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. For information on
loading the instruction register, see the TAP Controller State

Diagram on page 14. TDI is internally pulled up and can be

unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) on any register.

Test Data-Out (TDO)

The TDO output pin is used to serially clock data out from th e
registers. The output is active, depending upon the current state
of the TAP state machine (see Instruction Codes on page 17).
The output changes on the falling edge of TCK. TDO is
connected to the least significant bit (LSB) of any register.

Performing a TAP Reset

A Reset is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This Reset does not affect the operation of th e
SRAM and can be performed while the SRAM is operating. At
power up, the TAP is reset internally to ensure that TDO comes
up in a high-Z state.

TAP Registers

Registers are connected between the TDI and TDO pins to scan
the data in and out of the SRAM test circuitry. Only one register
can be selected at a time through the instruction registers. Data
is serially loaded into the TDI pin on the rising edge of TCK. Data
is output on the TDO pin on the falling edge of TCK.

through a pull up resistor. TDO must be left

DD

Instruction Register

Three-bit instructions can be serially loaded into the instructi on
register. This register is loaded when it is placed between the TDI
and TDO pins, as shown in TAP Controller Block Diagram on
page 15. Upon power up, the instruction register i s loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state, as described
in the previous section.

When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.

Bypass Register

To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between TDI
and TDO pins. This enables shifting of data through the SRAM
with minimal delay. The bypass register is set LOW (V
the BYPASS instruction is executed.

Boundary Scan Register

The boundary scan register is connected to all of th e input and
output pins on the SRAM. Several No Connect (NC) pins are also
included in the scan register to reserve pins for higher density
devices.

The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
pins when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.

The Boundary Scan Order on page 18 shows the order in which
the bits are connected. Each bit corresponds to one of the bumps
on the SRAM package. The MSB of the register is connected to
TDI, and the LSB is connected to TDO.

Identification (ID) Register

The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
information described in Identification Register Definitions on
page 17.

) when

SS

TAP Instruction Set

Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Instruction

Codes on page 17. Three of these instructions are listed as

RESERVED and must not be used. The other five instructions
are described in detail below.

Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO pins. To execute
the instruction once it is shifted in, the TAP controller must be
moved into the Update-IR state.

Document Number: 001-07160 Rev. *E Page 12 of 29

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IDCODE

The IDCODE instruction loads a vendor-specific, 32-bit code into
the instruction register. It also places the instruction register
between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
power up or whenever the TAP controller is supplied a
Test-Logic-Reset state.

SAMPLE Z

The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High-Z state until the next command is supplied during the
Update IR state.

SAMPLE/PRELOAD

SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.

The user must be aware that the TAP controller clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
during the Capture-DR state, an input or output undergoes a
transition. The TAP may then try to capture a signal while in
transition (metastable state). This does not harm the device, but
there is no guarantee as to the value that is captured.
Repeatable results may not be possible.

To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (t
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK

Once the data is captured, it is possible to shift out the data by
putting the T AP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.

and tCH). The SRAM clock input might not be captured

CS

captured in the boundary scan register.

PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.

The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, while the data
captured is shifted out, the preloaded data can be shifted in.

BYPASS

When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.

EXTEST

The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.

EXTEST OUTPUT BUS TRI-ST ATE

IEEE Standard 1149.1 mandates that the T AP controller be able
to put the output bus into a tri-state mode.

The boundary scan register has a special bit located at bit #47.
When this scan cell, called the “extest output bus tri-state,” is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a
High-Z condition.

This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is pre-set HIGH to enable
the output when the device is powered up, and also when the
T AP controller is in the Test-Logic-Reset state.

Reserved

These instructions are not implemented but are reserved for
future use. Do not use these instructions.

Document Number: 001-07160 Rev. *E Page 13 of 29

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TAP Controller State Diagram

TEST-LOGIC
RESET

TEST-LOGIC/
IDLE

SELECT
DR-SCAN

CAPTURE-DR

SHIFT-DR

EXIT1-DR

PAUSE-DR

EXIT2-DR

UPDA TE-DR

1

0

1

1

0

1

0

1

0

0

0

1

1

1

0

1

0

1

0

0

0

1

0

1

1

0

1

0

0

1

1

0

SELECT
IR-SCAN

CAPTURE-IR

SHIFT-IR

EXIT1-IR

PAUSE-IR

EXIT2-IR

UPDA TE-IR

Note

9. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.

The state diagram for the TAP controller follows.

[9]

Document Number: 001-07160 Rev. *E Page 14 of 29

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TAP Controller Block Diagram

0

012..29

3031

Boundary Scan Register

Identification Register

012..

.

.106

012

Instruction Register

Bypass Register

Selection
Circuitry

Selection
Circuitry

TA P Controller

TDI

TDO

TCK
TMS

Notes

10.These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics Table.

11.Overshoot: V

IH

(AC) < V

DDQ

+ 0.85V (Pulse width less than t

CYC

/2), Undershoot: VIL(AC) > −1.5V (Pulse width less than t

CYC

/2).

12.All Voltage referenced to Ground.

TAP Electrical Characteristics

Over the Operating Range

Parameter Description Test Conditions Min Max Unit

V

OH1

V

OH2

V

OL1

V

OL2

V

IH

V

IL

I

X

Output HIGH Voltage I
Output HIGH Voltage I
Output LOW Voltage IOL = 2.0 mA 0.4 V
Output LOW Voltage IOL = 100 μA0.2V
Input HIGH Voltage 0.65VDDV
Input LOW Voltage –0.3 0.35V
Input and Output Load Current GND ≤ VI ≤ V

[10, 11, 12]

= −2.0 mA 1.4 V

OH

= −100 μA1.6 V

OH

DD

–5 5 μA

+ 0.3 V

DD

DD

V

Document Number: 001-07160 Rev. *E Page 15 of 29

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TAP AC Switching Characteristics

t

TL

t

TH

(a)

TDO

C

L

= 20 pF

Z

0

= 50

Ω

GND

0.9V

50

Ω

1.8V

0V

ALL INPUT PULSES

0.9V

Test Clock

Test Mode Select

TCK

TMS

Test Data In
TDI

Test Data Out

t

TCYC

t

TMSH

t

TMSS

t

TDIS

t

TDIH

t

TDOV

t

TDOX

TDO

Notes

13.t

CS

and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.

14.Test conditions are specified using the load in TAP AC Test Conditions. t

R/tF

= 1 ns.

Over the Operating Range

Parameter Description Min Max Unit

t

TCYC

t

TF

t

TH

t

TL

TCK Clock Cycle Time 50 ns
TCK Clock Frequency 20 MHz
TCK Clock HIGH 20 ns
TCK Clock LOW 20 ns

Setup Times

t

TMSS

t

TDIS

t

CS

TMS Setup to TCK Clock Rise 5 ns
TDI Setup to TCK Clock Rise 5 ns
Capture Setup to TCK Rise 5 ns

Hold Times

t

TMSH

t

TDIH

t

CH

TMS Hold after TCK Clock Rise 5 ns
TDI Hold after Clock Rise 5 ns
Capture Hold after Clock Rise 5 ns

Output Times

t

TDOV

t

TDOX

TCK Clock LOW to TDO Valid 10 ns
TCK Clock LOW to TDO Invalid 0 ns

[13, 14]

TAP Timing and Test Conditions

Figure 2 shows the TAP timing and test conditions.

Figure 2. TAP Timing and Test Conditions

[14]

Document Number: 001-07160 Rev. *E Page 16 of 29

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Identification Register Definitions

Instruction Field

Revision Number
(31:29)

Cypress Device ID
(28:12)

Cypress JEDEC ID
(11:1)

ID Register
Presence (0)

CY7C1316CV18 CY7C1916CV18 CY7C1318CV18 CY7C1320CV18

000 000 000 000 Version number.

11010100010000101 11010100010001101 11010100010010101 11010100010100101 Defines the type of

00000110100 00000110100 00000110100 00000110100 Allows unique

1111Indicates the

Value

Description

SRAM.

identification of
SRAM vendor.

presence of an ID
register.

Scan Register Sizes

Register Name Bit Size

Instruction 3
Bypass 1
ID 32
Boundary Scan 107

Instruction Codes

Instruction Code Description

EXTEST 000 Captures the input and output ring contents.
IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO.

This operation does not affect SRAM operation.

SAMPLE Z 010 Captures the input and output contents. Places the boundary scan register between TDI and

TDO. Forces all SRAM output drivers to a High-Z state.
RESERVED 011 Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD 100 Captures the input and output ring contents. Places the boundary scan register between TDI

RESERVED 101 Do Not Use: This instruction is reserved for future use.
RESERVED 110 Do Not Use: This instruction is reserved for future use.
BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM

and TDO. Does not affect the SRAM operation.

operation.

Document Number: 001-07160 Rev. *E Page 17 of 29

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Boundary Scan Order

Bit # Bump ID Bit # Bump ID Bit # Bump ID Bit # Bump ID

0 6R 28 10G 56 6A 84 2J
16P299G575B853K
2 6N 30 11F 58 5A 86 3J
3 7P 31 11G 59 4A 87 2K
47N329F605C881K
5 7R 33 10F 61 4B 89 2L
6 8R 34 11E 62 3A 90 3L
7 8P 35 10E 63 1H 91 1M
8 9R 36 10D 64 1A 92 1L

9 11P 37 9E 65 2B 93 3N
10 10P 38 10C 66 3B 94 3M
11 10N 39 11D 67 1C 95 1N
12 9P 40 9C 68 1B 96 2M
13 10M 41 9D 69 3D 97 3P
14 11N 42 11B 70 3C 98 2N
15 9M 43 11C 71 1D 99 2P
16 9N 44 9B 72 2C 100 1P
17 11L 45 10B 73 3E 101 3R
18 11M 46 11A 74 2D 102 4R
19 9L 47 Internal 75 2E 103 4P
20 10L 48 9A 76 1E 104 5P
21 11K 49 8B 77 2F 105 5N
22 10K 50 7C 78 3F 106 5R
23 9J 51 6C 79 1G
24 9K 52 8A 80 1F
25 10J 53 7A 81 3G
26 11J 54 7B 82 2G
27 11H 55 6B 83 1J

Document Number: 001-07160 Rev. *E Page 18 of 29

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Power Up Sequence in DDR-II SRAM

~

~

DDR-II SRAMs must be powered up and initialized in a
predefined manner to prevent undefined operations.

Power Up Sequence

■ Apply power and drive DOFF either HIGH or LOW (all other

inputs can be HIGH or LOW).

❐ Apply V
❐ Apply V
❐ Drive DOFF HIGH.

■ Provide stable DOFF (HIGH), power, and clock (K, K) for 1024

cycles to lock the DLL.

before V

DD
DDQ

K

before V

.

DDQ

or at the same time as V

REF

.

REF

Figure 3. Power Up Waveforms

DLL Constraints

■ DLL uses K clock as its synchronizing input. The input must

have low phase jitter, which is specified as t

■ The DLL functions at frequencies down to 120 MHz.

■ If the input clock is unstable and the DLL is enabled, then the

DLL may lock onto an incorrect frequency, causing unstable
SRAM behavior. T o avoid this, provide1024 cycles stable clock
to relock to the desired clock frequency.

~

KC Var

.

K

~

Unstable Clock

> 1024 Stable clock

Start Normal
Operation

/

Clock Start

/

V

V

DDQDD

(Clock Starts after Stable)

/

V

V

DDQDD

DOFF

V

V

DD

DDQ

Stable (< +/- 0.1V DC per 50ns )

Fix High (or tie to V

DDQ

)

Document Number: 001-07160 Rev. *E Page 19 of 29

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CY7C1318CV18, CY7C1320CV18

Maximum Ratings

Notes

15.Power up: assumes a linear ramp from 0V to V

DD

(min) within 200 ms. During this time V

IH

< V

DD

and V

DDQ

< VDD.

16.Outputs are impedance controlled. I

OH

= –(V

DDQ

/2)/(RQ/5) for values of 175Ω < RQ < 350Ω.

17.Outputs are impedance controlled. I

OL

= (V

DDQ

/2)/(RQ/5) for values of 175Ω < RQ < 350Ω.

18.V

REF

(min) = 0.68V or 0.46V

DDQ

, whichever is larger, V

REF

(max) = 0.95V or 0.54V

DDQ

, whichever is smaller.

19.The operation current is calculated with 50% read cycle and 50% write cycle.

Exceeding maximum ratings may impair the useful life of th e
device. These user guidelines are not tested.

Storage Temperature .................................–65°C to +150°C

Ambient Temperature with Power Applied..–55°C to +125°C

Supply Voltage on VDD Relative to GND........–0.5V to +2.9V

Supply Voltage on V

DC Applied to Outputs in High-Z.........–0.5V to V

DC Input Voltage

Relative to GND.......–0.5V to +V

DDQ

[11]

..............................–0.5V to VDD + 0.3V

DDQ

DD

+ 0.3V

Electrical Characteristics

Current into Outputs (LOW) ........................................20 mA

Static Discharge Voltage (MIL-STD-883, M 3015).... >2001V

Latch up Current............................................... ...... >200 mA

Operating Range

Range

Temperature (TA) V

Commercial 0°C to +70°C 1.8 ± 0.1V 1.4V to
Industrial –40°C to +85°C

Ambient

DD

[15]

V

DDQ

V

DD

[15]

DC Electrical Characteristics

Over the Operating Range

[12]

Parameter Description Test Conditions Min Typ Max Unit

V

DD

V

DDQ

V

OH

V

OL

V

OH(LOW)

V

OL(LOW)

V

IH

V

IL

I

X

I

OZ

V

REF

[19]

I

DD

Power Supply Voltage 1.7 1.8 1.9 V
IO Supply Voltage 1.4 1.5 V
Output HIGH Voltage Note 16 V
Output LOW Voltage Note 17 V
Output HIGH Voltage I

= −0.1 mA, Nominal Impedance V

OH

Output LOW Voltage IOL = 0.1 mA, Nominal Impedance V
Input HIGH Voltage V

/2 – 0.12 V

DDQ

/2 – 0.12 V

DDQ

– 0.2 V

DDQ

SS

+ 0.1 V

REF

Input LOW Voltage –0.3 V
Input Leakage Current GND ≤ VI ≤ V
Output Leakage Current GND ≤ VI ≤ V
Input Reference Voltage
VDD Operating Supply V

[18]

Typical Value = 0.75V 0.68 0.75 0.95 V

= Max,

DD

I

= 0 mA,

OUT

f = f

MAX

= 1/t

DDQ

Output Disabled −5 5 μA

DDQ,

267 MHz (x8) 775 mA

(x9) 780

CYC

(x18) 805

−5 5 μA

DD

/2 + 0.12 V

DDQ

/2 + 0.12 V

DDQ

DDQ

0.2 V
+ 0.3 V

DDQ

– 0.1 V

REF

(x36) 855

250 MHz (x8) 705 mA

(x9) 710
(x18) 730
(x36) 775

200 MHz (x8) 575 mA

(x9) 580
(x18) 600
(x36) 635

167 MHz (x8) 490 mA

(x9) 490
(x18) 510
(x36) 540

V

V

Document Number: 001-07160 Rev. *E Page 20 of 29

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Electrical Characteristics (continued)

DC Electrical Characteristics

Over the Operating Range

[12]

Parameter Description Test Conditions Min Typ Max Unit

I

SB1

Automatic Power Down
Current

Max VDD,
Both Ports Deselected,
V

≥ VIH or VIN ≤ VIL

IN

MAX

= 1/t

CYC,

f = f
Inputs Static

267 MHz (x8) 305 mA

(x9) 305
(x18) 315
(x36) 330

250 MHz (x8) 300 mA

(x9) 300
(x18) 300
(x36) 320

200 MHz (x8) 285 mA

(x9) 285
(x18) 290
(x36) 300

167 MHz (x8) 280 mA

(x9) 280
(x18) 285
(x36) 295

AC Electrical Characteristics

Over the Operating Range

[11]

Parameter Description Test Conditions Min Typ Max Unit

V

IH

V

IL

Input HIGH Voltage V

+ 0.2 – – V

REF

Input LOW Voltage – – V

– 0.2 V

REF

Document Number: 001-07160 Rev. *E Page 21 of 29

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Capacitance

1.25V

0.25V

R = 50Ω

5pF

INCLUDING

JIG AND

SCOPE

ALL INPUT PULSES

Device

R

L

= 50Ω

Z

0

= 50Ω

V

REF

= 0.75V

V

REF

= 0.75V

[20]

0.75V

Under
Test

0.75V

Device
Under
Test

OUTPUT

0.75V

V

REF

V

REF

OUTPUT

ZQ

ZQ

(a)

Slew Rate = 2 V/ns

RQ =
250

Ω

(b)

RQ =
250

Ω

Note

20.Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, V

REF

= 0.75V, RQ = 250Ω, V

DDQ

= 1.5V, input pulse

levels of 0.25V to 1.25V, and output loading of the specified I

OL/IOH

and load capacitance shown in (a) of AC Test Loads and Waveforms.

Tested initially and after any design or process change that may affect these parameters.

Parameter Description Test Conditions Max Unit

C

Input Capacitance TA = 25°C, f = 1 MHz, VDD = 1.8V, V

IN

C

CLK

C

O

Clock Input Capacitance 6 pF
Output Capacitance 7pF

= 1.5V 5 pF

DDQ

Thermal Resistance

Tested initially and after any design or process change that may affect these parameters.

Parameter Description Test Conditions

Θ

Θ

Thermal Resistance

JA

(Junction to Ambient)
Thermal Resistance

JC

(Junction to Case)

Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.

Figure 4. AC Test Loads and Waveforms

165 FBGA

Package

18.7 °C/W

4.5 °C/W

Unit

Document Number: 001-07160 Rev. *E Page 22 of 29

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Switching Characteristics

Notes

21.When a part with a maximum frequency above 167 MHz is operating at a lower clock frequency, it requires th e input timings of the freque ncy range in which it is being
operated and outputs data with the output timings of that fre quency range.

22.This part has an internal voltage regulator; t

POWER

is the time that the power is supplied above V

DD

minimum initially before a read or write operation can be initiated.

23.For DQ2 data signal on CY7C1916CV18 device, t

SD

is 0.5 ns for 200 MHz, 250 MHz, and 267 MHz frequencies.

Over the Operating Range

[20, 21]

Cypress

Parameter

t

POWER

t

CYC

t

KH

t

KL

t

KHKH

t

KHCH

Setup Times

t

SA

t

SC

t

SCDDR

[23]

t

SD

Hold Times

t

HA

t

HC

t

HCDDR

t

HD

Consortium

Parameter

t

KHKH

t

KHKL

t

KLKH

t

KHKH

t

KHCH

t

AVKH

t

IVKH

t

IVKH

t

DVKH

t

KHAX

t

KHIX

t

KHIX

t

KHDX

Description

Unit

Min Max Min Max Min Max Min Max

267 MHz 250 MHz 200 MHz 167 MHz

VDD(Typical) to the First Access

[22]

1–1–1–1–ms
K Clock and C Clock Cycle Time 3.75 8.4 4.0 8.4 5.0 8.4 6.0 8.4 ns
Input Clock (K/K and C/C) HIGH 1.5 – 1.6 – 2.0 – 2.4 – ns
Input Clock (K/K and C/C) LOW 1.5 – 1.6 – 2.0 – 2.4 – ns
K Clock Rise to K Clock Rise and C to C Rise

1.68 – 1.8 – 2.2 – 2.7 – ns

(rising edge to rising edge)
K/K Clock Rise to C/C Clock Rise

0.00 1.68 0.00 1.8 0.00 2.2 0.00 2.7 ns

(rising edge to rising edge)

Address Setup to K Clock Rise 0.3 – 0.5 – 0.6 – 0.7 – ns
Control Setup to K Clock Rise (LD, R/W) 0.3 – 0.5 – 0.6 – 0.7 – ns
Double Data Rate Control Setup to Clock (K/K)

Rise (BWS
D

[X:0]

, BWS1, BWS2, BWS3)

0

Setup to Clock (K and K) Rise 0.3 – 0.35 – 0.4 – 0.5 – ns

0.3 – 0.35 – 0.4 – 0.5 – ns

Address Hold after K Clock Rise 0.3 – 0.5 – 0.6 – 0.7 – ns
Control Hold after K Clock Rise (LD, R/W) 0.3 – 0.5 – 0.6 – 0.7 – ns
Double Data Rate Control Hold after Clock (K/K)

Rise (BWS
D

[X:0]

, BWS1, BWS2, BWS3)

0

Hold after Clock (K/K) Rise 0.3 – 0.35 – 0.4 – 0.5 – ns

0.3 – 0.35 – 0.4 – 0.5 – ns

Document Number: 001-07160 Rev. *E Page 23 of 29

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Switching Characteristics (continued)

Notes

24.These parameters are extrapolated from the input timing parameters (t

KHKH

- 250 ps, where 250 ps is the internal jitter. An input jitter of 200 ps (t

KC Var

) is already

included in the t

KHKH

). These parameters are only guaranteed by design and are not tested in production.

25.t

CHZ

, t

CLZ

are specified with a load capacitance of 5 pF as in (b) of AC Test Loads and Waveforms. Transitio n i s measured ±100 mV from steady-state voltage.

26.At any voltage and temperature t

CHZ

is less than t

CLZ

and t

CHZ

less than tCO.

Over the Operating Range

[20, 21]

Cypress

Parameter

Consortium

Parameter

Output Times

t

CO

t

DOH

t

CCQO

t

CQOH

t

CQD

t

CQDOHtCQHQX

t

CQH

t

CQHCQHtCQHCQH

t

CHZ

t

CLZ

t

CHQV

t

CHQX

t

CHCQV

t

CHCQX

t

CQHQV

t

CQHCQL

t

CHQZ

t

CHQX1

DLL Timing

t

KC Var

t

KC lock

t

KC ResettKC Reset

t

KC Var

t

KC lock

Description

Unit

Min Max Min Max Min Max Min Max

267 MHz 250 MHz 200 MHz 167 MHz

C/C Clock Rise (or K/K in single clock mode) to

– 0.45 – 0.45 – 0.45 – 0.50 ns
Data Valid

Data Output Hold after Output C/C Clock Rise

–0.45 – –0.45 – –0.45 – –0.50 – ns

(Active to Active)
C/C Clock Rise to Echo Clock Valid – 0.45 – 0.45 – 0.45 – 0.50 ns
Echo Clock Hold after C/C Clock Rise –0.4 5 – –0.45 – –0.45 – –0.50 – ns
Echo Clock High to Data Valid – 0.27 – 0.30 – 0.35 – 0.40 ns
Echo Clock High to Data Invalid –0.27 – –0.30 – –0.35 – –0.40 – ns
Output Clock (CQ/CQ) HIGH
CQ Clock Rise to CQ Clock Rise

(rising edge to rising edge)
Clock (C/C) Rise to High-Z

(Active to High-Z)

[25, 26]

Clock (C/C) Rise to Low-Z

[24]

[24]

[25, 26]

1.43 – 1.55 – 1.95 – 2.45 – ns

1.43 – 1.55 – 1.95 – 2.45 – ns

– 0.45 – 0.45 – 0.45 – 0.50 ns

–0.45 – –0.45 – –0.45 – –0.50 – ns

Clock Phase Jitter – 0.20 – 0.20 – 0.20 – 0.20 ns
DLL Lock Time (K, C) 1024 – 1024 – 1024 – 1024 – Cycles
K Static to DLL Reset 30–30–30–30– ns

Document Number: 001-07160 Rev. *E Page 24 of 29

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Switching Waveforms

Notes

27.Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0 + 1.

28.Outputs are disabled (High-Z) one clock cycle after a NOP.

29.In this example, if address A4 = A3, then data Q40 = D30 and Q41 = D31. Write data is forwarded imme diately as read resu lts. This note applies to t he whole diagram.

Figure 5. Read/Write/Deselect Sequence

[27, 28, 29]

R/W

DQ

LD

NOP

1

K

t

KH

K

A

C

t

KHCH

READ READREAD NOP NOP WRITEWRITE

2345678 910

A1

t

KHKH

t

CLZ

t

CO

Q00 Q11Q01 Q10

t

CQDOH

t

DOH

t

CQD

A2

t

CHZ

A3

t

HD

t

SD

D20

t

t

KH

KL

A4

t

SD

D21 D30

t

CYC

t

HD

t

D31

KHKH

Q40

t

t

t

SA

KL

SC

A0

t

HC

t

HA

t

CYC

t

KHCH

Q41

C#

t

CCQO

t

CQH

t

CQHCQH

DON’T CARE

UNDEFINED

CQ

CQ#

t

CQOH

t

CCQO

t

CQOH

Document Number: 001-07160 Rev. *E Page 25 of 29

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Ordering Information

Not all of the speed, package and temperature ranges are ava ilable. Please contact your local sales representative or
visit www.cypress.com for actual products offered.

Speed

(MHz)

267 CY7C1316CV18-267BZC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Commercial

CY7C1916CV18-267BZC
CY7C1318CV18-267BZC
CY7C1320CV18-267BZC
CY7C1316CV18-267BZXC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-267BZXC
CY7C1318CV18-267BZXC
CY7C1320CV18-267BZXC
CY7C1316CV18-267BZI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Industrial
CY7C1916CV18-267BZI
CY7C1318CV18-267BZI
CY7C1320CV18-267BZI
CY7C1316CV18-267BZXI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-267BZXI
CY7C1318CV18-267BZXI
CY7C1320CV18-267BZXI

250 CY7C1316CV18-250BZC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Commercial

CY7C1916CV18-250BZC
CY7C1318CV18-250BZC
CY7C1320CV18-250BZC
CY7C1316CV18-250BZXC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-250BZXC
CY7C1318CV18-250BZXC
CY7C1320CV18-250BZXC
CY7C1316CV18-250BZI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Industrial
CY7C1916CV18-250BZI
CY7C1318CV18-250BZI
CY7C1320CV18-250BZI
CY7C1316CV18-250BZXI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-250BZXI
CY7C1318CV18-250BZXI
CY7C1320CV18-250BZXI

Ordering Code

Package
Diagram

Package Type

Operating

Range

Document Number: 001-07160 Rev. *E Page 26 of 29

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Ordering Information (continued)

Not all of the speed, package and temperature ranges are ava ilable. Please contact your local sales representative or
visit www.cypress.com for actual products offered.

Speed

(MHz)

200 CY7C1316CV18-200BZC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Commercial

CY7C1916CV18-200BZC
CY7C1318CV18-200BZC
CY7C1320CV18-200BZC
CY7C1316CV18-200BZXC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-200BZXC
CY7C1318CV18-200BZXC
CY7C1320CV18-200BZXC
CY7C1316CV18-200BZI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Industrial
CY7C1916CV18-200BZI
CY7C1318CV18-200BZI
CY7C1320CV18-200BZI
CY7C1316CV18-200BZXI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-200BZXI
CY7C1318CV18-200BZXI
CY7C1320CV18-200BZXI

167 CY7C1316CV18-167BZC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Commercial

CY7C1916CV18-167BZC
CY7C1318CV18-167BZC
CY7C1320CV18-167BZC
CY7C1316CV18-167BZXC 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-167BZXC
CY7C1318CV18-167BZXC
CY7C1320CV18-167BZXC
CY7C1316CV18-167BZI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Industrial
CY7C1916CV18-167BZI
CY7C1318CV18-167BZI
CY7C1320CV18-167BZI
CY7C1316CV18-167BZXI 51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
CY7C1916CV18-167BZXI
CY7C1318CV18-167BZXI
CY7C1320CV18-167BZXI

Ordering Code

Package
Diagram

Package Type

Operating

Range

Document Number: 001-07160 Rev. *E Page 27 of 29

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Package Diagram

A

1

PIN 1 CORNER

15.00±0.10

13.00±0.10

7.00

1.00

Ø0.50 (165X)

Ø0.25MCAB

Ø0.05 M C

B

A

0.15(4X)

0.35±0.06

SEATING PLANE

0.53±0.05

0.25 C

0.15 C

PIN 1 CORNER

TOP VIEW

BOTTOM VIEW

2345678910

10.00

14.00

B

C

D

E

F

G

H

J

K

L

M

N

11

1110986754321

P

R

P

R

K

M

N

L

J

H

G

F

E

D

C

B

A

A

15.00±0.10

13.00±0.10

B

C

1.00

5.00

0.36

-0.06
+0.14

1.40 MAX.

SOLDER PAD TYPE : NON-SOLDER MASK DEFINED (NSMD)

NOTES :

PACKAGE WEIGHT : 0.475g

JEDEC REFERENCE : MO-216 / DESIGN 4.6C

PACKAGE CODE : BB0AC

51-85180-*A

Figure 6. 165-Ball FBGA (13 x 15 x 1.4 mm), 51-85180

Document Number: 001-07160 Rev. *E Page 28 of 29

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Document History Page

Document Title: CY7C1316CV18/CY7C1916CV18/CY7C1318CV18/CY7C1320CV18, 18-Mbit DDR-II SRAM 2-Word
Burst Architecture
Document Number: 001-07160

Rev. ECN No.

Submission

Date

** 433284 See ECN NXR New data sheet

*A 462615 See ECN NXR Changed t

*B 503690 See ECN VKN Minor change: Moved data sheet to web
*C 1523383 See ECN VKN/AESA Converted from preliminary to final

*D 2507747 See ECN VKN/PYRS Changed Ambient Temperature with Power Applied from “–10°C to +85°C” to “–55°C

*E 2518624 See ECN NXR/PYRS Changed JTAG ID (31:29) from 001 to 000

Orig. of
Change

Description of Change

and t

from 10 ns to 5 ns and changed t

TH

Characteristics table

from 40 ns to 20 ns, changed t

TL

from 20 ns to 10 ns in TAP AC Switching

TDOV

TMSS

, t

TDIS

, tCS, t

TMSH

Modified Power-Up waveform

Updated Logic Block diagram
Removed 300 MHz and 278 MHz speed bins
Added 267 MHz speed bin
Updated I
Changed DLL minimum operating frequency from 80MHz to 120MHz
Changed t
Modified footnotes 20 and 28

specs

DD/ISB

max spec to 8.4ns

CYC

to +125°C” in the “Maximum Ratings“ on page 20
Updated power up sequence waveform and its description
Added footnote #19 related to I
Changed Θ

spec from 28.51 to 18.7; Changed Θ

JA

DD

spec from 5.91 to 4.5

JC

, t

TDIH

, t

CH

Sales, Solutions, and Legal Information

Worldwide Sales and Design Support

Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. T o find the office
closest to you, visit us at cypress.com/sales.

Products

PSoC psoc.cypress.com
Clocks & Buffers clocks.cypress.com
Wireless wireless.cypress.com
Memories memory.cypress.com
Image Sensors image.cypress.com

© Cypress Semiconductor Corporation, 2006-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used
for medical, life support, life sa vin g, critical control or safety applications, unless pursuant to an express written agreem ent with Cypress. Furthermore, Cypress does not a uthor i ze i ts products for use
as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support
systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.

Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States co pyright la ws and inte rnatio na l tre aty prov isi ons. Cyp ress he reby g rant s to lice nsee a p erson al, no n-ex clusi ve, non-tra nsferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpo se of creating custom sof tware and or firm ware in support of licen see product to be use d only in conjunction with a Cypress
integrated circuit as specified in th e applicable agreement. Any reproductio n, modification, translation, co mpilation, o r representati on of this Sour ce Code except as specified above is prohibited without
the express written permission of Cypress.

Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO , THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the ap plicati on or u se o f any pr oduct o r circui t descri bed h erein. Cypr ess does not aut horize it s product s for use a s critical compo nent s in life-support systems whe re
a malfunction or failure may reasonab ly be expected to resu lt in significant injury t o the user. The inclusion of Cypress’ prod uct in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.

Use may be limited by and subject to the applicable Cypress software license agreement.

PSoC Solutions

General psoc.cypress.com/solutions
Low Power/Low Voltage psoc.cypress.com/low-power
Precision Analog psoc.cypress.com/precision-analog
LCD Drive psoc.cypress.com/lcd-drive
CAN 2.0b psoc.cypress.com/can
USB psoc.cypress.com/usb

Document Number: 001-07160 Rev. *E Revised June 18, 2008 Page 29 of 29

QDR RAMs and Quad Data Rate RAMs comprise a new family of products developed by Cypress, IDT, NEC, Renesas, and Samsung. All product and company names mentioned in this document
are the trademarks of their respective holders.

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