Datasheet CY7C1021CV33-15VC, CY7C1021CV33-15BAI, CY7C1021CV33-15BAC, CY7C1021CV33-12ZI, CY7C1021CV33-12ZC Datasheet (Cypress Semiconductor)

...
Features
• Pin- and function-compatible with CY7C1021BV33
• High speed —t
= 8, 10, 12, and 15 ns
• CMOS for optimum speed/power
• Low active power —360 mW (max.)
• Data retention at 2.0V
• Automatic power-down when dese lec ted
• Independent control of upper and lower bits
• Available in 44-pin TSOP II, 400-mil SOJ, 48-ball FBGA
Functional Description
The CY7C1021CV33 is a high-performance CMOS static RAM organized as 65,536 words by 16 bits. This device has an automatic power-down feature that significantly reduces power consumption when deselected.
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW. If Byte Low Enable
(CE
CY7C1021CV33
64K x 16 St atic RAM
) is LOW, then data from I/O pins (I/O1 through I/O8), is
(BLE written into the location specified on the address pins (A through A15). If Byte High Enable (BHE) is LOW, then data from I/O pins (I/O specified on the address pins (A
Reading from the device is accomplished by taking Chip Enable (CE Write Enable (WE then data from the memory location specified by the address pins will appear on I/O LOW , then data from memory will app ear on I/O the truth table at the end of this data sheet for a complete description of Read and Write modes.
The input/output pins (I/O high-impedance state when the device is deselected (CE HIGH), the outp uts are d isabled (OE HIGH), the BHE and BLE are disabled (BHE, BLE HIGH), or during a Write operation
LOW, and WE LOW).
(CE The CY7C1021CV33 is available in standard 44-pin TSOP
Type II 400-mil-wide SOJ packages, as well as a 48-ball FBGA.
through I/O16) is written into the location
9
through A15).
0
) and Output Enable (OE) LOW while forcing the
) HIGH. If Byte Low Enable (BLE) is LOW,
to I/O8. If Byte High Enable (BHE) is
1
through I/O16) are placed in a
1
to I/O16. See
9
0
Logic Block Diagram
DATA IN DRIVERS
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
ROW DECODER
64K x 16
RAM Array
512 X 2048
COLUMN DECODER
9
8
A
A
A10A11A
Selection Guide
Maximum Acces s Time Maximum Operating Curre nt Maximum CMOS Standby Current
Pin Configuration
SOJ / TSOP II
Top View
44
1
A
4
A
2
3
3
A
2
4
A
1
5
A
0
6
I/O
I/O
1
8
SENSE AMPS
I/O9–I/O
16
BHE WE
12
14
15
A13A
A
CE OE
BLE
I/O I/O
I/O I/O
V
V I/O I/O I/O I/O
WE A A
A A
NC
CE
CC
SS
7
1
8
2
9
3
10
4
11 12 13
5
14
6
15
7
16
8
17 18
15
19
14
20
13
21
12
22
CY7C1021CV33-8 CY7C1021CV33-10 CY7C1021CV33-12 CY7C1021CV33-15 Unit
8 101215ns
95 90 85 80 mA
5555mA
A
5
43
A
6
42
A
7
41
OE
40
BHE
39
BLE
38
I/O
16
37
I/O
15
36
I/O
14
35
I/O
13
34
V
SS
33
V
CC
32
I/O
12
31
I/O
11
30
I/O
10
29
I/O
9
28
NC
27
A
8
26
A
9
25
A
10
A
24
11
23
NC
Cypress Semiconductor Corporation 3901 North First Street San Jose CA 95134 408-943-2600 Document #: 38-05132 Rev. *C Revised October 30, 2002
Pin Configuration
CY7C1021CV33
48-ball FBGA
(Top View)
1
2
4
3
5
6
BLE
I/O
I/O
V
SS
V
CC
I/O
I/O
NC
A
A
A
A
NC
A
A
A
A
NC
2
1
CE
I/O
I/O
I/O
I/O
WE
A
I/O
I/O
2
V
3
CC
V
4
I/O
5
I/O
NC
11
4
6
7
15
13
10
SS
A
B
0
C
1
D
E
F
6
G
7
H
A
OE
BHE
8
I/O
9
I/O
I/O
I/O
14
15
NC
A
0
A
3
A
10
5
NC
11
NC
12
A
14
13
A
12
A
9
8
Document #: 38-05132 Rev. *C Page 2 of 12
CY7C1021CV33
Maximum Ratings
(Above which the us efu l l ife may be impaired. For us er gui de­lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V DC Voltage Applied to Outputs
in High-Z State
[1]
DC Input Voltage
to Relative GND
CC
......................................–0.5V to VCC+0.5V
[1]
...................................–0.5V to VCC+0.5V
[1]
....–0.5V to +4.6V
Electrical Characteristics Over the Operating Range
1021CV33-8 1021CV33-10
2.4 2.4
0.3 0.8 −0.3 0.8 –0.3 0.8 0.3 0.8 V
1 +1 1+1–1 +1 1 +1 µA
1 +1 1+1–1 +1 1 +1 µA
IH
Parameter Description
V
V
V
V
I
IX
I
OZ
I
OS
I
CC
I
SB1
OH
OL
IH
IL
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage 2.0 V
Input LOW
[1]
Voltage Input Load Current GND < VI < V Output Leakage
Current Output Short Circuit
[2]
Current VCC Operating
Supply Current
Automatic CE Power-Down Current TTL Inputs
I
SB2
Automatic CE Power-Down Current CMOS Inputs
Test
Conditions
VCC = Min., I
= –4.0 mA
OH
VCC = Min.,
= 8.0 mA
I
OL
CC
GND < VI < VCC, Output Disabled
VCC = Max., V
= GND
OUT
VCC = Max., I
= 0 mA,
OUT
f = f
MAX
= 1/t
Max. VCC, CE > V VIN > VIH or VIN < VIL, f = f
MAX
Max. VCC,
> VCC – 0.3V , VIN >
CE
– 0.3V,
V
CC
or VIN < 0.3V, f = 0
Current into Outputs (LOW).........................................20 mA
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Latch-up Current......................................................>200 mA
Operating Range
Range Ambient Temperature V
Commercial 0°C to +70°C 3.3V ± 10% Industrial –40°C to +85°C 3.3V ± 10%
1021CV33-12 1021CV33-15
2.4 2.4 V
0.4 0.4
2.0 V
CC
+ 0.3
+ 0.3
CC
2.0 V
0.4 0.4 V
2.0 V
CC
+ 0.3
-300 300 –300 –300 mA
95 90 85 80 mA
15 15 15 15 mA
55
5 5 mA
CC
+ 0.3
CC
UnitMin. Max. Min. Max. Min. Max. Min. Max.
V
Capacitance
[3]
Parameter Description Test Conditions Max. Unit
C
IN
C
OUT
Notes:
1. V
(min.) = –2.0 V fo r pulse durati ons of l ess tha n 20 ns .
IL
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
3. Tested initially and after any design or process changes that may affect these parameters.
Input Capacitance TA = 25°C, f = 1 MHz,
= 3.3V
V
Output Capacitance 8 pF
CC
8 pF
Document #: 38-05132 Rev. *C Page 3 of 12
CY7C1021CV33
AC Test Loads and Waveforms
8-ns devices:
OUTPUT
* CAPACITIVE LOAD CONSISTS OF ALL COMPONENTS OF THE TEST ENVIRONMENT
3.0V
GND
Rise Time: 1 V/ns
Note:
4. AC characteristics (except High-Z) f or all 8-ns parts are tested using the load conditions shown in Figure (a). A ll other speeds are tested using the Thevenin load shown in Figure (b). High-Z characteristics are tested for all speeds using the test load shown in Figure (d).
Z = 50
ALL INPUT PULSES
90%
10%
[4]
50
1.5V
30 pF*
10-, 12-, 15-ns devices:
3.3V
OUTPUT
30 pF
(a)
High-Z characteristics:
3.3V
(c)
90%
10%
Fall Time: 1 V/ns
OUTPUT
5 pF
R 317
R2
351
(b)
R 317
R2
351
(d)
Document #: 38-05132 Rev. *C Page 4 of 12
CY7C1021CV33
Switching Characteristics
Over the Operating Range
[5]
1021CV33-8 1021CV33-10
1021CV33-12 1021CV33-15
Parameter Description
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
[8]
t
PU
[8]
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Notes:
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.
6. At any given temperature and voltage condition, t
7. t
HZOE
8. This parameter is guaranteed by design and is not tested.
9. The internal Write time of the memory is defined by the overlap of CE and the transition of these signals can terminate the Write. The inp ut data set-up and h old timing shou ld be referenced to t he leading edge of t he signal that term inates the Write .
Read Cycle Time 8 10 12 15 ns Address to Data Valid 8 10 12 15 ns Data Hold from Address Change 3 3 3 3 ns CE LOW to Data Valid 8 10 12 15 ns OE LOW to Data Valid 5 5 6 7 ns OE LOW to Low-Z OE HIGH to High-Z CE LOW to Low-Z CE HIGH to High-Z
[6]
[6]
[6, 7]
[6, 7]
000 0 ns
456 7 ns
333 3 ns
456 7 ns CE LOW to Power-Up 0 0 0 0 ns CE HIGH to Power-Down 8 10 12 15 ns Byte Enable to Data Valid 5 5 6 7 ns Byte Enable to Low-Z 0 0 0 0 ns Byte Disable to High-Z 4 5 6 7 ns
[9]
Write Cycle Time 8 10 12 15 ns CE LOW to Write End 7 8 9 10 ns Address Set-Up to Write End 7 8 9 10 ns Address Hold from Write End 0 0 0 0 ns Address Set-Up to Write Start 0 0 0 0 ns WE Pulse Width 6 7 8 10 ns Data Set-Up to Write End 5 5 6 8 ns Data Hold from Write End 0 0 0 0 ns WE HIGH to Low-Z WE LOW to High-Z
[6] [6, 7]
333 3 ns
456 7 ns Byte Enable to End of Write 6 7 8 9 ns
, t
HZBE
, t
HZCE
, and t
is less than t
are specified wi th a l oad cap acit ance o f 5 pF as in p art (d) of AC Te st Loa ds. Transition is mea sured ±500 mV from s teady- state volt age.
HZWE
HZCE
, t
LZCE
is less than t
HZOE
LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a Wri te,
LZOE
, and t
HZWE
is less than t
for any given device.
LZWE
UnitMin. Max. Min. Max. Min. Max. Min. Max.
Document #: 38-05132 Rev. *C Page 5 of 12
Switching Waveforms
CY7C1021CV33
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2
ADDRESS
CE
OE
BHE, BLE
DATA OUT
V
CC
SUPPLY
CURRENT
[10, 11]
t
RC
t
t
OHA
AA
PREVIOUS DATA VALID DATA VALID
LZCE PU
[11, 12 ]
t
ACE
t
DOE
t
LZOE
t
DBE
t
LZBE
t
RC
t
HZOE
DATA VALID
Controlled)
(OE
HIGH IMPEDANCE
t t
50%
t
HZCE
t
HZBE
t
PD
50%
HIGH
IMPEDANCE
I
ICC
CC
I
ISB
SB
Notes:
10. Device is continuously selected. OE is HIGH for Read cycle.
11. WE
12. Address valid prior to or coincident with CE transition LOW .
, CE, BHE and/or BHE = VIL.
Document #: 38-05132 Rev. *C Page 6 of 12
Switching Waveforms (continued)
CY7C1021CV33
Write Cycle No. 1 (CE Controlled)
ADDRESS
t
CE
WE
BHE, BLE
DATA I/O
SA
[13, 14]
t
AW
t
WC
t
SCE
t
PWE
t
BW
t
HA
t
SD
t
HD
Write Cycle No. 2 (BLEor BHE Controlled)
ADDRESS
t
,BLE
BHE
WE
CE
DATA I/O
Notes:
13. Data I/O is high impedance if OE
14. If CE
goes HIGH simultaneously wit h WE goin g HIGH, the outp ut remai ns in a hig h-impedanc e st ate.
SA
or BHE and/or BLE= VIH.
t
WC
t
BW
t
AW
t
PWE
t
SCE
t
SD
t
HA
t
HD
Document #: 38-05132 Rev. *C Page 7 of 12
Switching Waveforms (continued)
CY7C1021CV33
Write Cycle No. 3
ADDRESS
CE
WE
BHE
,BLE
DATA I/O
Truth Table
Controlled, LOW)
(WE
t
SA
t
AW
t
SCE
t
WC
t
BW
t
HZWE
t
PWE
t
HA
t
SD
t
HD
t
LZWE
CE OE WE BLE BHE I/O1–I/O
8
I/O9–I/O
16
Mode Power
H X X X X High-Z High-Z Power-down Standby (ISB)
L L H L L Data Out Data Out Read – All bits Active (ICC)
L H Data Out High-Z Read – Lower bits only Active (ICC) H L High-Z Data Out Read – Upper bits only Active (ICC)
L X L L L Data In Data In Write – All bits Active (ICC)
L H Data In High-Z Write – Low er bits only Active (ICC)
H L High-Z Data In Write – Uppe r bits only Active (ICC) L H H X X High-Z High-Z Selected, Outputs Disabled Active (ICC) L X X H H High-Z High-Z Selected, Outputs Disabled Active (ICC)
Document #: 38-05132 Rev. *C Page 8 of 12
CY7C1021CV33
Ordering Information
Speed
(ns) Ordering Code
8 CY7C1021CV33-8VC V34 44-lead (400-Mil) Molded SOJ Commercial
CY7C1021CV33-8ZC Z44 44-lead TSOP Ty pe II CY7C1021CV33-8BAC BA48A 48-ball FBGA
10 CY7C1021CV33-10VC V34 44-lead (400-Mil) Molded SOJ Commercial
CY7C1021CV33-10VI Industrial CY7C1021CV33-10ZC Z44 44-lead TSOP Ty pe II Commercial CY7C1021CV33-10ZI Industrial CY7C1021CV33-10BAC BA48A 48-ball FBGA Commercial CY7C1021CV33-10BAI Industrial
12 CY7C1021CV33-12VC V34 44-lead (400-Mil) Molded SOJ Commercial
CY7C1021CV33-12VI Industrial CY7C1021CV33-12ZC Z44 44-lead TSOP Ty pe II Commercial CY7C1021CV33-12ZI Industrial CY7C1021CV33-12BAC BA48A 48-ball FBGA Commercial CY7C1021CV33-12BAI Industrial
15 CY7C1021CV33-15VC V34 44-lead (400-Mil) Molded SOJ Commercial
CY7C1021CV33-15VI Industrial CY7C1021CV33-15ZC Z44 44-lead TSOP Ty pe II Commercial CY7C1021CV33-15ZI Industrial CY7C1021CV33-15BAC BA48A 48-ball FBGA Commercial CY7C1021CV33-15BAI Industrial
Package
Name Package Type
Operating
Range
Document #: 38-05132 Rev. *C Page 9 of 12
Package Diagrams
CY7C1021CV33
48-Ball (7.00 mm x 7.00 mm x 1.2 mm) FBGA BA48A
51-85096-*E
Document #: 38-05132 Rev. *C Page 10 of 12
ng so indemnifies Cypress Semiconductor against all charges.
Package Diagrams (continued)
CY7C1021CV33
44-Lead (400-Mil) Mo lded SOJ V3 4
51-85082-*B
44-pin TSOP II Z44
51-85087-*A
All products and company names mentioned in this document are the trademarks of their respective holders.
Document #: 38-05132 Rev. *C Page 11 of 12
© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than cir cuitry embodi ed in a Cypress S emiconductor product . Nor does it convey or imply any license un der patent or other righ ts. Cypre ss Semiconductor does not autho rize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doi
Document History Page
Document Title: CY7C1021CV33 64K x 16 Static RAM Document Number: 38-05132
REV. ECN NO.
** 109472 12/06/01 HGK New Data Sheet
*A 115044 05/08/02 HGK Ram7 version C4K x 16 Async.
*B 115808 06/25/02 HGK I
*C 120413 10/31/02 DFP Updated BGA pin E4 to NC.
Issue
Date
Orig. of
Change Description of Change
Remove Preliminary
and ICC values changed
SB1
CY7C1021CV33
Document #: 38-05132 Rev. *C Page 12 of 12
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