• Available in 44-pin TSOP II, 400-mil SOJ, 48-ball FBGA
Functional Description
The CY7C1021CV33 is a high-performance CMOS static
RAM organized as 65,536 words by 16 bits. This device has
an automatic power-down feature that significantly reduces
power consumption when deselected.
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW. If Byte Low Enable
(CE
CY7C1021CV33
64K x 16 St atic RAM
) is LOW, then data from I/O pins (I/O1 through I/O8), is
(BLE
written into the location specified on the address pins (A
through A15). If Byte High Enable (BHE) is LOW, then data
from I/O pins (I/O
specified on the address pins (A
Reading from the device is accomplished by taking Chip
Enable (CE
Write Enable (WE
then data from the memory location specified by the address
pins will appear on I/O
LOW , then data from memory will app ear on I/O
the truth table at the end of this data sheet for a complete
description of Read and Write modes.
The input/output pins (I/O
high-impedance state when the device is deselected (CE
HIGH), the outp uts are d isabled (OE HIGH), the BHE and BLE
are disabled (BHE, BLE HIGH), or during a Write operation
LOW, and WE LOW).
(CE
The CY7C1021CV33 is available in standard 44-pin TSOP
Type II 400-mil-wide SOJ packages, as well as a 48-ball
FBGA.
through I/O16) is written into the location
9
through A15).
0
) and Output Enable (OE) LOW while forcing the
) HIGH. If Byte Low Enable (BLE) is LOW,
to I/O8. If Byte High Enable (BHE) is
1
through I/O16) are placed in a
1
to I/O16. See
9
0
Logic Block Diagram
DATA IN DRIVERS
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
ROW DECODER
64K x 16
RAM Array
512 X 2048
COLUMN DECODER
9
8
A
A
A10A11A
Selection Guide
Maximum Acces s Time
Maximum Operating Curre nt
Maximum CMOS Standby Current
Pin Configuration
SOJ / TSOP II
Top View
44
1
A
4
A
2
3
3
A
2
4
A
1
5
A
0
6
I/O
–I/O
1
8
SENSE AMPS
I/O9–I/O
16
BHE
WE
12
14
15
A13A
A
CE
OE
BLE
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
WE
A
A
A
A
NC
CE
CC
SS
7
1
8
2
9
3
10
4
11
12
13
5
14
6
15
7
16
8
17
18
15
19
14
20
13
21
12
22
CY7C1021CV33-8CY7C1021CV33-10 CY7C1021CV33-12 CY7C1021CV33-15 Unit
8 101215ns
95908580mA
5555mA
A
5
43
A
6
42
A
7
41
OE
40
BHE
39
BLE
38
I/O
16
37
I/O
15
36
I/O
14
35
I/O
13
34
V
SS
33
V
CC
32
I/O
12
31
I/O
11
30
I/O
10
29
I/O
9
28
NC
27
A
8
26
A
9
25
A
10
A
24
11
23
NC
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05132 Rev. *C Revised October 30, 2002
Pin Configuration
CY7C1021CV33
48-ball FBGA
(Top View)
1
2
4
3
5
6
BLE
I/O
I/O
V
SS
V
CC
I/O
I/O
NC
A
A
A
A
NC
A
A
A
A
NC
2
1
CE
I/O
I/O
I/O
I/O
WE
A
I/O
I/O
2
V
3
CC
V
4
I/O
5
I/O
NC
11
4
6
7
15
13
10
SS
A
B
0
C
1
D
E
F
6
G
7
H
A
OE
BHE
8
I/O
9
I/O
I/O
I/O
14
15
NC
A
0
A
3
A
10
5
NC
11
NC
12
A
14
13
A
12
A
9
8
Document #: 38-05132 Rev. *CPage 2 of 12
CY7C1021CV33
Maximum Ratings
(Above which the us efu l l ife may be impaired. For us er gui delines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High-Z State
[1]
DC Input Voltage
to Relative GND
CC
......................................–0.5V to VCC+0.5V
[1]
...................................–0.5V to VCC+0.5V
[1]
....–0.5V to +4.6V
Electrical Characteristics Over the Operating Range
1021CV33-8 1021CV33-10
2.42.4
–0.30.8−0.30.8–0.30.8–0.30.8V
−1+1−1+1–1+1–1+1µA
−1+1−1+1–1+1–1+1µA
IH
ParameterDescription
V
V
V
V
I
IX
I
OZ
I
OS
I
CC
I
SB1
OH
OL
IH
IL
Output HIGH
Voltage
Output LOW
Voltage
Input HIGH Voltage2.0V
Input LOW
[1]
Voltage
Input Load Current GND < VI < V
Output Leakage
Current
Output Short Circuit
[2]
Current
VCC Operating
Supply Current
Automatic CE
Power-Down
Current —TTL
Inputs
I
SB2
Automatic CE
Power-Down
Current —CMOS
Inputs
Test
Conditions
VCC = Min.,
I
= –4.0 mA
OH
VCC = Min.,
= 8.0 mA
I
OL
CC
GND < VI < VCC,
Output Disabled
VCC = Max.,
V
= GND
OUT
VCC = Max.,
I
= 0 mA,
OUT
f = f
MAX
= 1/t
RC
Max. VCC, CE > V
VIN > VIH or
VIN < VIL,
f = f
MAX
Max. VCC,
> VCC – 0.3V , VIN >
CE
– 0.3V,
V
CC
or VIN < 0.3V, f = 0
Current into Outputs (LOW).........................................20 mA
Latch-up Current......................................................>200 mA
Operating Range
RangeAmbient TemperatureV
Commercial0°C to +70°C 3.3V ± 10%
Industrial–40°C to +85°C3.3V ± 10%
1021CV33-12 1021CV33-15
2.42.4V
0.40.4
2.0V
CC
+ 0.3
+ 0.3
CC
2.0V
0.40.4V
2.0V
CC
+ 0.3
-300−300–300–300mA
95908580mA
15151515mA
55
55mA
CC
+ 0.3
CC
UnitMin.Max.Min.Max.Min.Max.Min.Max.
V
Capacitance
[3]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
1. V
(min.) = –2.0 V fo r pulse durati ons of l ess tha n 20 ns .
IL
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
3. Tested initially and after any design or process changes that may affect these parameters.
Input CapacitanceTA = 25°C, f = 1 MHz,
= 3.3V
V
Output Capacitance8pF
CC
8pF
Document #: 38-05132 Rev. *CPage 3 of 12
CY7C1021CV33
AC Test Loads and Waveforms
8-ns devices:
OUTPUT
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
3.0V
GND
Rise Time: 1 V/ns
Note:
4. AC characteristics (except High-Z) f or all 8-ns parts are tested using the load conditions shown in Figure (a). A ll other speeds are tested using the Thevenin
load shown in Figure (b). High-Z characteristics are tested for all speeds using the test load shown in Figure (d).
Z = 50
ALL INPUT PULSES
90%
10%
[4]
Ω
50Ω
1.5V
30 pF*
10-, 12-, 15-ns devices:
3.3V
OUTPUT
30 pF
(a)
High-Z characteristics:
3.3V
(c)
90%
10%
Fall Time: 1 V/ns
OUTPUT
5 pF
R 317Ω
R2
351Ω
(b)
R 317Ω
R2
351Ω
(d)
Document #: 38-05132 Rev. *CPage 4 of 12
CY7C1021CV33
Switching Characteristics
Over the Operating Range
[5]
1021CV33-81021CV33-10
1021CV33-121021CV33-15
ParameterDescription
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
[8]
t
PU
[8]
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Notes:
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.
6. At any given temperature and voltage condition, t
7. t
HZOE
8. This parameter is guaranteed by design and is not tested.
9. The internal Write time of the memory is defined by the overlap of CE
and the transition of these signals can terminate the Write. The inp ut data set-up and h old timing shou ld be referenced to t he leading edge of t he signal that term inates the Write .
Read Cycle Time8101215ns
Address to Data Valid8101215ns
Data Hold from Address Change3333ns
CE LOW to Data Valid8101215ns
OE LOW to Data Valid5567ns
OE LOW to Low-Z
OE HIGH to High-Z
CE LOW to Low-Z
CE HIGH to High-Z
[6]
[6]
[6, 7]
[6, 7]
0000ns
4567ns
3333ns
4567ns
CE LOW to Power-Up0000ns
CE HIGH to Power-Down8101215ns
Byte Enable to Data Valid5567ns
Byte Enable to Low-Z0000ns
Byte Disable to High-Z4567ns
[9]
Write Cycle Time8101215ns
CE LOW to Write End78910ns
Address Set-Up to Write End78910ns
Address Hold from Write End0000ns
Address Set-Up to Write Start0000ns
WE Pulse Width67810ns
Data Set-Up to Write End5568ns
Data Hold from Write End0000ns
WE HIGH to Low-Z
WE LOW to High-Z
[6]
[6, 7]
3333ns
4567ns
Byte Enable to End of Write6789ns
, t
HZBE
, t
HZCE
, and t
is less than t
are specified wi th a l oad cap acit ance o f 5 pF as in p art (d) of AC Te st Loa ds. Transition is mea sured ±500 mV from s teady- state volt age.
HZWE
HZCE
, t
LZCE
is less than t
HZOE
LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a Wri te,
LZOE
, and t
HZWE
is less than t
for any given device.
LZWE
UnitMin.Max.Min.Max.Min.Max.Min.Max.
Document #: 38-05132 Rev. *CPage 5 of 12
Switching Waveforms
CY7C1021CV33
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2
ADDRESS
CE
OE
BHE, BLE
DATA OUT
V
CC
SUPPLY
CURRENT
[10, 11]
t
RC
t
t
OHA
AA
PREVIOUS DATA VALIDDATA VALID
LZCE
PU
[11, 12 ]
t
ACE
t
DOE
t
LZOE
t
DBE
t
LZBE
t
RC
t
HZOE
DATA VALID
Controlled)
(OE
HIGH IMPEDANCE
t
t
50%
t
HZCE
t
HZBE
t
PD
50%
HIGH
IMPEDANCE
I
ICC
CC
I
ISB
SB
Notes:
10. Device is continuously selected. OE
is HIGH for Read cycle.
11. WE
12. Address valid prior to or coincident with CE transition LOW .
, CE, BHE and/or BHE = VIL.
Document #: 38-05132 Rev. *CPage 6 of 12
Switching Waveforms (continued)
CY7C1021CV33
Write Cycle No. 1 (CE Controlled)
ADDRESS
t
CE
WE
BHE, BLE
DATA I/O
SA
[13, 14]
t
AW
t
WC
t
SCE
t
PWE
t
BW
t
HA
t
SD
t
HD
Write Cycle No. 2 (BLEor BHE Controlled)
ADDRESS
t
,BLE
BHE
WE
CE
DATA I/O
Notes:
13. Data I/O is high impedance if OE
14. If CE
goes HIGH simultaneously wit h WE goin g HIGH, the outp ut remai ns in a hig h-impedanc e st ate.
CY7C1021CV33-10VIIndustrial
CY7C1021CV33-10ZCZ4444-lead TSOP Ty pe IICommercial
CY7C1021CV33-10ZIIndustrial
CY7C1021CV33-10BACBA48A48-ball FBGACommercial
CY7C1021CV33-10BAIIndustrial
CY7C1021CV33-12VIIndustrial
CY7C1021CV33-12ZCZ4444-lead TSOP Ty pe IICommercial
CY7C1021CV33-12ZIIndustrial
CY7C1021CV33-12BACBA48A48-ball FBGACommercial
CY7C1021CV33-12BAIIndustrial
CY7C1021CV33-15VIIndustrial
CY7C1021CV33-15ZCZ4444-lead TSOP Ty pe IICommercial
CY7C1021CV33-15ZIIndustrial
CY7C1021CV33-15BACBA48A48-ball FBGACommercial
CY7C1021CV33-15BAIIndustrial
Package
NamePackage Type
Operating
Range
Document #: 38-05132 Rev. *CPage 9 of 12
Package Diagrams
CY7C1021CV33
48-Ball (7.00 mm x 7.00 mm x 1.2 mm) FBGA BA48A
51-85096-*E
Document #: 38-05132 Rev. *CPage 10 of 12
ng so indemnifies Cypress Semiconductor against all charges.
Package Diagrams (continued)
CY7C1021CV33
44-Lead (400-Mil) Mo lded SOJ V3 4
51-85082-*B
44-pin TSOP II Z44
51-85087-*A
All products and company names mentioned in this document are the trademarks of their respective holders.