The CY7C1021 is a high-performance CMOS static RAM organized as 65,536 word s by 16 bits . Thi s de vi ce has an au tomatic power-down feature that significantly reduces power
consumption when deselected.
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW. If Byte Low Enable
(CE
) is LOW, then data from I/O pins (I/O1 through I/O8), is
written into the location specified on the address pins (A
through A15). If Byte High Enable (BHE) is LOW, then data
from I/O pins (I/O
specified on the address pins (A
through I/O16) is written into the location
9
through A15).
0
Reading from the device is accomplished by taking Chip Enable (CE
) and Output Enable (OE) LOW while forcing the wr ite
enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then
data from the memory location specified by the address pins
will appear on I/O
then data from memory will appear on I/O9 to I/O16. See the
to I/O8. If Byte High Enable (BHE) is LOW,
1
truth table at the back of this data sheet for a com plete description of read and write modes.
The input/output pins (I/O
high-impedance state when the device is deselected (CE
through I/O16) are placed in a
1
HIGH), the outputs are disabled (OE HIGH), the BHE and BLE
are disabled (BHE, BLE HIGH), or during a write operation (CE
LOW, and WE LOW).
The CY7C1021 is available in standard 44-pin TSOP Type II
and 400-mil-wide SOJ packages.
0
Logic Block Diagram
DATA IN DRIVERS
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
ROW DECODER
COLUMN DECODER
8
A
A
64K x 16
RAM Array
512 X 2048
9
A10A11A
12
A13A
I/O
– I/O
1
8
SENSE AMPS
I/O9 – I/O
16
BHE
WE
14
15
A
CE
OE
BLE
Pin Configuration
SOJ / TSOP II
Top View
44
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
WE
A
A
A
A
NC
A
A
A
A
A
CE
CC
SS
15
14
13
12
1
4
2
3
3
2
4
1
5
0
6
7
1
8
2
9
3
10
4
11
12
13
5
14
6
15
7
16
8
17
18
19
20
21
22
A
5
43
A
6
42
A
7
41
OE
40
BHE
39
BLE
38
I/O
37
I/O
36
I/O
35
I/O
34
V
SS
33
V
CC
32
I/O
31
I/O
30
I/O
29
I/O
28
NC
27
A
8
26
A
9
25
A
10
A
24
11
23
NC
1021-2
16
15
14
13
12
11
10
9
Selection Guide
7C1021-107C1021-127C1021-157C1021-20
Maximum Access Time (ns)10121520
Maximum Operating Current (mA)Commercial220220220220
Maximum CMOS Standby Current (mA)Commercial5555
L0.50.50.50.5
Shaded areas contain preliminary information.
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05054 Rev. ** Revised August 24, 2001
CY7C1021
Maximum Ratings
(Above which the useful life may be im pai red. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High Z State
[1]
DC Input Voltage
to Relative GND
CC
......................................–0.5V to VCC+0.5V
[1]
..................................–0.5V to VCC+0.5V
[1]
....–0.5V to +7.0V
Electrical Characteristics Ov er the Op erat ing Range
Test Conditions7C1021-107C1021-127C1021-157C1021-20
ParameterDescription
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
I
CC
I
SB1
I
SB2
Shaded areas contain preliminary information.
Output HIGH Voltage VCC = Min.,
IOH = –4.0 mA
Output LOW Voltage VCC = Min.,
IOL = 8.0 mA
Input HIGH Voltage2.26.02.26.02.26.02.26.0V
[3]
[1]
GND < VI < VCC,
Output Disabled
VCC = Max.,
V
= GND
OUT
VCC = Max.,
I
= 0 mA,
OUT
f = f
MAX
Max. VCC,
> V
CE
VIN > VIH or
V
< VIL, f = f
IN
Max. VCC,
CE > VCC – 0.3V,
> VCC – 0.3V,
V
IN
< 0.3V, f=0
or V
IN
= 1/t
IH
CC
RC
MAX
L0.50.50.50.5mA
Input LOW Voltage
Input Load CurrentGND < VI < V
Output Leakage
Current
Output Short
Circuit Current
VCC Operating
Supply Current
Automatic CE
Power-Down Current
—TTL Inputs
Automatic CE
Power-Down Current
—CMOS Inputs
Current into Outputs (LOW)........................................20 mA
Latch-Up Current.....................................................>200 mA
Operating Range
Range
Temperature
Commercial0°C to +70°C 5V ± 10%
Industrial–40°C to +85°C5V ± 10%
2.42.42.42.4V
0.40.40.40.4V
−0.50.8–0.50.8–0.30.8–0.30.8V
−1+1–1+1–1+1–1+1µA
−1+1–1+1–5+5–5+5µA
−300–300–300–300mA
220220220200mA
40404040mA
5555mA
Ambient
[2]
V
CC
UnitMin.Max.Min.Max.Min.Max.Min.Max.
Capacitance
[4]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
(min.) = –2.0V for pulse durati ons of l ess than 2 0 ns.
1. V
IL
2. T
is the case temperature.
A
3. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
4. Tested initially and after any design or process changes that may affect these parameters.
Input CapacitanceTA = 25°C, f = 1 MHz,
= 5.0V
V
Output Capacitance8pF
CC
8pF
Document #: 38-05054 Rev. **Page 2 of 9
AC Test Loads and Wavefor ms
CY7C1021
(b)
R 481Ω
1021-3
1.73V
R2
255
3.0V
GND
Ω
< 3 ns< 3 ns
ALL INPUT PULSES
90%
10%
90%
10%
1021-4
R 481
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
Equivalent to:
30 pF
(a)
THÉVENIN
EQUIVALENT
Ω
R2
255
OUTPUT
Switching Characteristics
5V
OUTPUT
Ω
INCLUDING
JIG AND
SCOPE
[5]
Over the Operating Range
5 pF
167
30 pF
7C1021-107C1021-127C1021-157C1021-20
ParameterDescription
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
WRITE CYCLE
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Shaded areas contain preliminary information.
Notes:
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
OL/IOH
6. At any given temperature and voltage condition, t
7. t
HZOE
8. The internal write time of the memory is defined by the overlap of CE
and the transition of these sig nals can t erminate the writ e. The input data set-up and hold timing s hould be refere nced to the leading edge of the signal t hat terminates the write.
Read Cycle Time10121520ns
Address to Data Valid10121520ns
Data Hold from Address Change3333ns
CE LOW to D ata Valid10121520ns
OE LOW to Data Valid5679ns
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
[6]
[6, 7]
[6]
[6, 7]
0000ns
5679ns
3333ns
5679ns
CE LOW to Power-Up0000ns
CE HIGH to Power-Down10121520ns
Byte Enable to Data Valid5679ns
Byte Enable to Low Z0000ns
Byte Disable to High Z5679ns
[8]
Write Cycle Time10121520ns
CE LOW to Write End891012ns
Address Set-Up to Write End781012ns
Address Hold from Write End0000ns
Address Set-Up to Write Start0000ns
WE Pulse Width781012ns
Data Set-Up to Write End56810ns
Data Hold from Write End0000ns
WE HIGH to Low Z
WE LOW to High Z
[6]
[6, 7]
3333ns
5679ns
Byte Enable to End of Write78912ns
and 30-pF load c apacitan ce.
, t
, t
HZCE
, and t
HZWE
HZBE
are specified w ith a load ca pacit ance of 5 pF as in part (b ) of AC Test Loads . T ran sition is m easured ±500 mV from steady-state voltag e.
HZCE
is less than t
, t
LZCE
is less than t
HZOE
LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write,
LZOE
, and t
HZWE
is less than t
for any given device.
LZWE
UnitMin.Max.Min.Max.Min.Max.Min.Max.
Document #: 38-05054 Rev. **Page 3 of 9
Switching Waveforms
CY7C1021
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2
ADDRESS
CE
OE
BHE, BLE
DATA OUT
V
CC
SUPPLY
CURRENT
[9, 10]
t
RC
t
t
OHA
AA
PREVIOUS DATA VALIDDATA VALID
t
LZCE
t
PU
[10, 11]
t
ACE
t
DOE
t
LZOE
t
DBE
t
LZBE
t
RC
t
HZOE
DATA VALID
Controlled)
(OE
HIGH IMPEDANCE
50%
t
HZCE
t
HZBE
t
PD
50%
HIGH
IMPEDANCE
1021-6
1021-5
I
ICC
CC
I
ISB
SB
Notes:
9. Device is continuously selected. OE
10. WE
is HIGH for read cycle .
11. Address valid prior to or coincident with CE
, CE, BHE and/or BHE = VIL.
transition LOW .
Document #: 38-05054 Rev. **Page 4 of 9
Switching Waveforms (continued)
CY7C1021
Write Cycle No. 1 (CE
ADDRESS
CE
WE
BHE, BLE
DATA I/O
Controlled)
t
SA
[12, 13]
t
AW
t
WC
t
SCE
t
PWE
t
BW
t
HA
t
SD
t
HD
1021-7
Write Cycle No. 2 (BLEorBHE Controlled)
ADDRESS
t
,BLE
BHE
WE
CE
DATA I/O
Notes:
12. Data I/O is high impedance if OE
13. If CE
goes HIGH simultaneousl y with WE going HIGH, the o utput remains in a hig h-imped ance stat e.