The CY7C1019B/1019 1B is a h igh -pe rform an ce CMO S static
RAM organized as 131,072 words by 8 bits. Easy memory
expansion is pro vided by an a ctive LOW Chip En able (CE
active LOW Output Enable (OE
), and three-state d rivers . This
), an
device has an automa tic powe r-down feature th at signifi cantly
reduces power consumption when deselected.
ogic Block Diagram
INPUT BUFFER
A
0
A
1
A
2
A
3
A
CE
WE
OE
4
A
5
A
6
A
A
ROW DECODER
7
8
512 x 256 x 8
ARRAY
COLUMN
DECODER
9
10
A
A
A11A13A
SENSE AMPS
POWER
DOWN
14
15
12
16
A
A
A
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW . Dat a on the eight I/O
(CE
pins (I/O
fied on the address pins (A
through I/O7) is then written into the location speci-
0
through A16).
0
Reading from the device is accomplished by taking Chip
Enable (CE
Enable (WE
) and Output Enabl e (OE) LO W while forcing W rite
) HIGH. Under these conditions, the contents of
the memory locatio n spec ified by the add ress pi ns will a ppe ar
on the I/O pins.
The eight input/output pins (I/O
high-impedance state when the device is deselected (CE
through I/O7) are placed in a
0
HIGH), the outputs are disabled (OE HIGH), or during a wr ite
operation (CE
LOW, and WE LOW).
The CY7C1019B/10191B is available in standard 32-pin
TSOP Type II and 400-mil-wide SOJ packages. Customers
should use part number CY7C10191B when ordering parts
with 10 ns t
.
t
AA
, and CY7C1019B when ordering 12 and 15 ns
AA
Configurations
Pin
/ TSOPII
SOJ
Top View
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A
A
A
A
OE
I/O
I/O
V
V
I/O
I/O
A
A
A
A
A
16
15
14
13
7
6
SS
CC
5
4
12
11
10
9
8
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
A
1
0
A
1
2
A
3
2
A
4
I/O
I/O
V
V
I/O
I/O
WE
CE
CC
SS
A
A
A
A
3
5
6
0
7
1
8
9
10
2
3
11
12
4
13
5
14
6
15
16
7
0
1
2
3
4
5
6
7
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05026 Rev. *A Revised August 13, 2002
CY7C1019B/
CY7C10191B
Selection Guide
7C10191B-107C1019B-127C1019B-15
Maximum Access Time (ns)101215
Maximum Operating Current (mA)150140130
Maximum Standby Current (mA)101010
L−11
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Current into Outputs (LOW) ........................................20 mA
Stat ic Disc ha rge Voltage..... ...... ..... ...... ......................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.....................................................>200 mA
Operating Range
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High Z State
[1]
DC Input Voltage
to Relative GND
CC
....................................–0.5V to VCC + 0.5V
[1]
.................................–0.5V to VCC + 0.5V
[1]
....–0.5V to +7.0V
Range
Commercial0°C to +70°C 5V ± 10%
Industrial–40°C to +85°C 5V ± 10%
Ambient
Temperature
[2]
V
CC
Electrical Characteristics Ov er the Op erat ing Range
7C10191B-107C1019B-127C1019B-15
ParameterDescriptionMin.Max.Min.Max.Min.Max.Unit
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
OH
OL
IH
IL
Output HIGH VoltageVCC = Min.,
Output LOW VoltageVCC = Min.,
Input HIGH Voltage2.2V
Input LOW Voltage
[1]
Input Load CurrentGND < VI < V
Output Leakage
Current
VCC Operating
Supply Current
Automatic CE
Power-Down Current
—TTL Inputs
I
SB2
Automatic CE
Power-Down Current
—CMOS Inputs
Capacitance
[3]
Test Conditions
= – 4.0 mA
I
OH
= 8.0 mA
I
OL
CC
GND < VI < VCC,
Output Disabled
VCC = Max.,
I
= 0 mA,
OUT
f = f
MAX
= 1/t
RC
Max. VCC, CE > V
VIN > VIH or
< VIL, f = f
V
IN
MAX
Max. VCC,
> VCC – 0.3V,
CE
VIN > VCC – 0.3V,
< 0.3V, f = 0
or V
IN
2.42.42.4V
0.40.40.4V
CC
+ 0.3
2.2V
CC
+ 0.3
2.2V
+ 0.3
CC
–0.30.8–0.30.8–0.30.8V
–1+1–1+1–1+1µA
–5+5–5+5–5+5µA
150140130mA
IH
404040mA
L20 20 20
101010mA
L−11
V
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
1. V
(min.) = –2.0V for pulse d uratio ns of less t han 20 ns.
IL
is the “Instant On” case t emperat ure.
2. T
A
3. Tested initially and after any design or process changes that may affect these parameters.
Input CapacitanceTA = 25°C, f = 1 MHz,
Output Capacitance8pF
VCC = 5.0V
6pF
Document #: 38-05026 Rev. *APage 2 of 9
AC Test Loads and Waveforms
CY7C1019B/
CY7C10191B
5V
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
Equivalent to:VENIN EQUIVALENT
OUTPUT
Switching Characteristics
R1 480Ω
(a)
THÉ
167Ω
OUTPUT
R2
255Ω
[4]
Over the Operating Range
5V
INCLUDING
JIG AND
SCOPE
1.73V
5 pF
R1 480Ω
(b)
R2
255Ω
3.0V
GND
≤ 3 ns≤ 3 ns
ALL INPUT PULSES
90%
10%
90%
10%
7C10191B-107C1019B-127C1019B-15
ParameterDescriptionMin.Max.Min.Max.Min.Max.Unit
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
OL/IOH
5. t
HZOE
6. At any give n temperature and voltag e condition, t
7. The internal write time of the me mory i s defi ned by the ov erla p of CE
signals can termin ate th e write. The inpu t dat a s et-up a nd hold t imin g should be ref erenced to the leadi ng edge of the s ignal t h at termi nates t he write .
8. The minimum write cycle time for Write Cycle no. 3 (WE
Read Cycle Time101215ns
Address to Data Valid10121 5ns
Data Hold from Address Change333ns
CE LOW to Data Valid101215ns
OE LOW to Data Valid567ns
OE LOW to Low Z000ns
[6]
[5, 6]
[5, 6]
567ns
333ns
567ns
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
CE LOW to Power-Up000ns
CE HIGH to Power-Down101215ns
[7, 8]
Write Cycle Time101215ns
CE LOW to Write End8910ns
Address Set-Up to Write End7810ns
Address Hold from Write End000ns
Address Set-Up to Write Start000ns
WE Pulse Width7810ns
Data Set-Up to Write End568ns
Data Hold from Write End000ns
WE HIGH to Low Z
WE LOW to High Z
and 30-pF load cap acit ance.
, t
HZCE
, and t
are specified w ith a l oad c apac itanc e of 5 pF as i n pa rt (b) of AC Test Loa ds. T r ansiti on is mea sured ±500 mV from steady- sta te vol tage.
HZWE
[6]
[5, 6]
333ns
is less than t
HZCE
controlled, OE LOW) is the sum of t
, t
LZCE
HZOE
LOW and WE LOW. CE an d WE mus t be LOW to initiate a write , and the transiti on of any of these
567ns
is less than t
LZOE
, and t
HZWE
is less than t
HZWE
and tSD.
for any given device.
LZWE
Document #: 38-05026 Rev. *APage 3 of 9
CY7C1019B/
CY7C10191B
Data Retention Characte ristics Over the Operating Range (L Version Only)
ParameterDescriptionConditionsMin.Max.Unit
V
DR
I
CCDR
t
CDR
t
R
[3]
VCC for Data RetentionNo input may exceed VCC + 0.5V
Data Retention Current300µA
Chip Deselect to Data Retention Time0ns
Operation Recovery Time200µs
Data Retention Waveform
V
CC
CE
t
CDR
= VDR = 2.0V,
V
CC
> VCC – 0.3V,
CE
> VCC – 0.3V or VIN < 0.3V
V
IN
DATA RETENTION MODE
VDR> 2V
2.0V
3.0V3.0V
t
R
Switching Waveforms
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2 (OE Controlled)
ADDRESS
CE
OE
DATA OUT
V
CC
SUPPLY
CURRENT
[9, 10]
PREVIOUS DATA VALIDDATA VALID
HIGH IMPEDAN CE
t
LZCE
t
PU
[10, 11]
t
ACE
t
LZOE
t
OHA
t
DOE
50%
t
RC
t
AA
t
RC
t
HZOE
t
DATA VALID
HZCE
t
PD
50%
HIGH
IMPEDANCE
ICC
ISB
Notes:
9. Device is continuously selected. OE
is HIGH for read cycle .
10. WE
11. Address valid prior to or coincident with CE transiti on LOW.
, CE = VIL.
Document #: 38-05026 Rev. *APage 4 of 9
Switching Waveforms (continued)
CY7C1019B/
CY7C10191B
Write Cycle No. 1 (CE
Controlled)
[12, 13]
ADDRESS
CE
t
SA
t
AW
WE
DATA I/O
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)
ADDRESS
t
WC
[12, 13]
t
WC
t
PWE
t
SCE
t
SCE
t
SD
DATA VALID
t
HA
t
HD
t
SCE
CE
t
AW
t
SA
t
PWE
WE
OE
t
SD
DATA I/O
Notes:
12. Data I/O is high impedance if OE
13. If CE
14. During this period the I/Os are in the output state and input signals should not be applied.
goes HIGH simultaneous ly with WE going HIGH , the outpu t remains in a high-im pedance state .