Cypress Semiconductor CY7C1019B-15ZI, CY7C1019B-15ZC, CY7C1019B-15VC, CY7C1019B-12ZC, CY7C1019B-12VC Datasheet

...
C1019V33
CY7C1019B/
CY7C10191B
128K x 8 St atic RAM
Features
= 10, 12, 15 ns
AA
• CMOS for optimum speed/power
• Center power/ground pinout
• Automatic power-down when deselected
• Easy memory expansion with CE
and OE options
• Functionally equivalent to CY7C1019
Functional Description
The CY7C1019B/1019 1B is a h igh -pe rform an ce CMO S static RAM organized as 131,072 words by 8 bits. Easy memory expansion is pro vided by an a ctive LOW Chip En able (CE active LOW Output Enable (OE
), and three-state d rivers . This
), an
device has an automa tic powe r-down feature th at signifi cantly reduces power consumption when deselected.
ogic Block Diagram
INPUT BUFFER
A
0
A
1
A
2
A
3
A
CE
WE
OE
4
A
5
A
6
A A
ROW DECODER
7 8
512 x 256 x 8
ARRAY
COLUMN
DECODER
9
10
A
A
A11A13A
SENSE AMPS
POWER
DOWN
14
15
12
16
A
A
A
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW . Dat a on the eight I/O
(CE pins (I/O fied on the address pins (A
through I/O7) is then written into the location speci-
0
through A16).
0
Reading from the device is accomplished by taking Chip Enable (CE Enable (WE
) and Output Enabl e (OE) LO W while forcing W rite
) HIGH. Under these conditions, the contents of the memory locatio n spec ified by the add ress pi ns will a ppe ar on the I/O pins.
The eight input/output pins (I/O high-impedance state when the device is deselected (CE
through I/O7) are placed in a
0
HIGH), the outputs are disabled (OE HIGH), or during a wr ite operation (CE
LOW, and WE LOW).
The CY7C1019B/10191B is available in standard 32-pin TSOP Type II and 400-mil-wide SOJ packages. Customers should use part number CY7C10191B when ordering parts with 10 ns t
.
t
AA
, and CY7C1019B when ordering 12 and 15 ns
AA
Configurations
Pin
/ TSOPII
SOJ
Top View
32 31
30 29
28 27 26 25 24 23 22 21 20 19 18
17
A A A
A OE
I/O I/O
V V I/O I/O
A A
A A
A
16 15 14
13
7 6
SS CC
5 4
12 11
10 9
8
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
A
1
0
A
1
2
A
3
2
A
4
I/O I/O
V V
I/O I/O
WE
CE
CC
SS
A A A
A
3
5 6
0
7
1
8 9 10
2 3
11 12
4
13
5
14
6
15 16
7
0
1
2
3
4
5
6
7
Cypress Semiconductor Corporation 3901 North First Street San Jose CA 95134 408-943-2600 Document #: 38-05026 Rev. *A Revised August 13, 2002
CY7C1019B/
CY7C10191B
Selection Guide
7C10191B-10 7C1019B-12 7C1019B-15
Maximum Access Time (ns) 10 12 15 Maximum Operating Current (mA) 150 140 130 Maximum Standby Current (mA) 10 10 10
L 1 1
Maximum Ratings
(Above which the useful life may be impaired. For user guide­lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Current into Outputs (LOW) ........................................20 mA
Stat ic Disc ha rge Voltage..... ...... ..... ...... ......................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.....................................................>200 mA
Operating Range
Power Applied.............................................–55°C to +125°C
Supply Voltage on V DC Voltage Applied to Outputs
in High Z State
[1]
DC Input Voltage
to Relative GND
CC
....................................–0.5V to VCC + 0.5V
[1]
.................................–0.5V to VCC + 0.5V
[1]
....–0.5V to +7.0V
Range
Commercial 0°C to +70°C 5V ± 10% Industrial –40°C to +85°C 5V ± 10%
Ambient
Temperature
[2]
V
CC
Electrical Characteristics Ov er the Op erat ing Range
7C10191B-10 7C1019B-12 7C1019B-15
Parameter Description Min. Max. Min. Max. Min. Max. Unit
V
V
V
V I
IX
I
OZ
I
CC
I
SB1
OH
OL
IH
IL
Output HIGH Voltage VCC = Min.,
Output LOW Voltage VCC = Min.,
Input HIGH Voltage 2.2 V
Input LOW Voltage
[1]
Input Load Current GND < VI < V Output Leakage
Current VCC Operating
Supply Current
Automatic CE Power-Down Current TTL Inputs
I
SB2
Automatic CE Power-Down Current CMOS Inputs
Capacitance
[3]
Test Conditions
= – 4.0 mA
I
OH
= 8.0 mA
I
OL
CC
GND < VI < VCC, Output Disabled
VCC = Max., I
= 0 mA,
OUT
f = f
MAX
= 1/t
RC
Max. VCC, CE > V VIN > VIH or
< VIL, f = f
V
IN
MAX
Max. VCC,
> VCC – 0.3V,
CE VIN > VCC – 0.3V,
< 0.3V, f = 0
or V
IN
2.4 2.4 2.4 V
0.4 0.4 0.4 V
CC
+ 0.3
2.2 V
CC
+ 0.3
2.2 V + 0.3
CC
0.3 0.8 0.3 0.8 0.3 0.8 V
1+1–1+1–1+1µA5+5–5+5–5+5µA
150 140 130 mA
IH
40 40 40 mA
L20 20 20
10 10 10 mA
L 11
V
Parameter Description Test Conditions Max. Unit
C
IN
C
OUT
Notes:
1. V
(min.) = –2.0V for pulse d uratio ns of less t han 20 ns.
IL
is the Instant On case t emperat ure.
2. T
A
3. Tested initially and after any design or process changes that may affect these parameters.
Input Capacitance TA = 25°C, f = 1 MHz, Output Capacitance 8 pF
VCC = 5.0V
6pF
Document #: 38-05026 Rev. *A Page 2 of 9
AC Test Loads and Waveforms
CY7C1019B/
CY7C10191B
5V
OUTPUT
30 pF
INCLUDING JIG AND SCOPE
Equivalent to: VENIN EQUIVALENT
OUTPUT
Switching Characteristics
R1 480
(a)
THÉ
167
OUTPUT
R2
255
[4]
Over the Operating Range
5V
INCLUDING JIG AND SCOPE
1.73V
5 pF
R1 480
(b)
R2
255
3.0V
GND
3 ns 3 ns
ALL INPUT PULSES
90%
10%
90%
10%
7C10191B-10 7C1019B-12 7C1019B-15
Parameter Description Min.Max.Min.Max.Min.Max.Unit
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I
OL/IOH
5. t
HZOE
6. At any give n temperature and voltag e condition, t
7. The internal write time of the me mory i s defi ned by the ov erla p of CE signals can termin ate th e write. The inpu t dat a s et-up a nd hold t imin g should be ref erenced to the leadi ng edge of the s ignal t h at termi nates t he write .
8. The minimum write cycle time for Write Cycle no. 3 (WE
Read Cycle Time 10 12 15 ns Address to Data Valid 10 12 1 5 ns Data Hold from Address Change 3 3 3 ns CE LOW to Data Valid 101215ns OE LOW to Data Valid 5 6 7 ns OE LOW to Low Z 0 0 0 ns
[6]
[5, 6]
[5, 6]
567ns
333ns
567ns
OE HIGH to High Z CE LOW to Low Z CE HIGH to High Z CE LOW to Power-Up 0 0 0 ns CE HIGH to Power-Down 10 12 15 ns
[7, 8]
Write Cycle Time 10 12 15 ns CE LOW to Write End 8 9 10 ns Address Set-Up to Write End 7 8 10 ns Address Hold from Write End 0 0 0 ns Address Set-Up to Write Start 0 0 0 ns WE Pulse Width 7 8 10 ns Data Set-Up to Write End 5 6 8 ns Data Hold from Write End 0 0 0 ns WE HIGH to Low Z WE LOW to High Z
and 30-pF load cap acit ance.
, t
HZCE
, and t
are specified w ith a l oad c apac itanc e of 5 pF as i n pa rt (b) of AC Test Loa ds. T r ansiti on is mea sured ±500 mV from steady- sta te vol tage.
HZWE
[6] [5, 6]
333ns
is less than t
HZCE
controlled, OE LOW) is the sum of t
, t
LZCE
HZOE
LOW and WE LOW. CE an d WE mus t be LOW to initiate a write , and the transiti on of any of these
567ns
is less than t
LZOE
, and t
HZWE
is less than t
HZWE
and tSD.
for any given device.
LZWE
Document #: 38-05026 Rev. *A Page 3 of 9
CY7C1019B/
CY7C10191B
Data Retention Characte ristics Over the Operating Range (L Version Only)
Parameter Description Conditions Min. Max. Unit
V
DR
I
CCDR
t
CDR
t
R
[3]
VCC for Data Retention No input may exceed VCC + 0.5V Data Retention Current 300 µA Chip Deselect to Data Retention Time 0 ns Operation Recovery Time 200 µs
Data Retention Waveform
V
CC
CE
t
CDR
= VDR = 2.0V,
V
CC
> VCC – 0.3V,
CE
> VCC – 0.3V or VIN < 0.3V
V
IN
DATA RETENTION MODE
VDR> 2V
2.0 V
3.0V3.0V t
R
Switching Waveforms
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2 (OE Controlled)
ADDRESS
CE
OE
DATA OUT
V
CC
SUPPLY
CURRENT
[9, 10]
PREVIOUS DATA VALID DATA VALID
HIGH IMPEDAN CE
t
LZCE
t
PU
[10, 11]
t
ACE
t
LZOE
t
OHA
t
DOE
50%
t
RC
t
AA
t
RC
t
HZOE
t
DATA VALID
HZCE
t
PD
50%
HIGH
IMPEDANCE
ICC ISB
Notes:
9. Device is continuously selected. OE is HIGH for read cycle .
10. WE
11. Address valid prior to or coincident with CE transiti on LOW.
, CE = VIL.
Document #: 38-05026 Rev. *A Page 4 of 9
Switching Waveforms (continued)
CY7C1019B/
CY7C10191B
Write Cycle No. 1 (CE
Controlled)
[12, 13]
ADDRESS
CE
t
SA
t
AW
WE
DATA I/O
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)
ADDRESS
t
WC
[12, 13]
t
WC
t
PWE
t
SCE
t
SCE
t
SD
DATA VALID
t
HA
t
HD
t
SCE
CE
t
AW
t
SA
t
PWE
WE
OE
t
SD
DATA I/O
Notes:
12. Data I/O is high impedance if OE
13. If CE
14. During this period the I/Os are in the output state and input signals should not be applied.
goes HIGH simultaneous ly with WE going HIGH , the outpu t remains in a high-im pedance state .
NOTE 14
= VIH.
t
HZOE
DATAINVALID
t
HA
t
HD
Document #: 38-05026 Rev. *A Page 5 of 9
Switching Waveforms (continued)
CY7C1019B/
CY7C10191B
Write Cycle No. 3 (WE
ADDRESS
CE
WE
DATA I/O
NOTE
Controlled, OE LOW)
t
SA
14
t
HZWE
[13]
t
AW
t
SCE
t
WC
t
PWE
t
SD
DATA VALID
t
HA
t
LZWE
t
HD
Truth Table
CE OE WE I/O0–I/O
7
H X X High Z Power-Down Standby (ISB) X X X High Z Power-Down Standby (ISB)
L L H Data Out Read Active (ICC) L X L Data In Write Active (ICC) L H H High Z Selected, Outputs Disabled Active (ICC)
Mode Power
Ordering Information
Speed
(ns) Ordering Code
10 CY7C10191B-10VC V33 32-Lead 400-Mil Molded SOJ Commercial 12 CY7C1019B-12VC V33 32-Lead 400-Mil Molded SOJ Commercial
CY7C1019B-12ZC ZS32 32-Lead TSOP Type II Commercial
15 CY7C1019B-15VC V33 32-Lead 400-Mil Molded SOJ Commercial
CY7C1019B-15VI V33 32-Lead 400-Mil Molded SOJ Industrial CY7C1019B-15ZC ZS32 32-Lead TSOP Type II Commercial CY7C1019B-15ZI ZS32 32-Lead TSOP Type II Industrial
Document #: 38-05026 Rev. *A Page 6 of 9
Package
Name Pa cka ge Type
Operating
Range
Package Diagrams
CY7C1019B/
CY7C10191B
32-Lead (400-Mil) Molded SOJ V33
51-85033-*B
51-85033-A
Document #: 38-05026 Rev. *A Page 7 of 9
ng so indemnifies Cypress Semiconductor against all charges.
Package Diagrams (continued)
CY7C1019B/
CY7C10191B
32-Lead
TSOP II ZS32
All product or company names mentioned in this document may be the trademarks of their respective holders.
51-85095
Document #: 38-05026 Rev. *A Page 8 of 9
© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than cir cuitry embodi ed in a Cypress S emiconductor product . Nor does it convey or imply any license un der patent or other righ ts. Cypre ss Semiconductor does not autho rize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doi
CY7C1019B/
CY7C10191B
Document Title: CY7C1019B/CY7C10191B 128K x 8 Static RAM Document Number: 38-05026
REV. ECN NO. Issue Date Orig. of Change Description of Change
** 109949 09/25/01 SZV Change from Spec number: 38-01115 to 38-05026
*A 1161 70 08/14/02 HGK 1. SOJ (400-mil) pa ckage outline replacing inc orrect
SOJ package
2. Pin for pin compatible with CY7C1019
3. Industrial package s added to Ordering Informat ion
Document #: 38-05026 Rev. *A Page 9 of 9
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