The CY7C107B and CY7C1007B are high-performance
CMOS static RAMs organized as 1,048,576 words by 1 bit.
Easy memory expansion is provided by an active LOW Chip
Enable (CE
automatic power-down feature that reduces power consumption by more than 65% when deselected.
) and thre e-state driver s. These devices have an
Writing to the devices is accomplished by taking Chip Enable
) and Write Enab le (WE) inputs LOW . Da ta on the input pi n
(CE
) is written into the memory location specified on the ad-
(D
IN
dress pins (A
through A19).
0
Reading from the devices is accomp lishe d by takin g Chip Enable (CE
) LOW while Writ e Enable (WE) remains HIGH. Under
these conditions, the contents of the memory location specified by the address pi ns will appea r on t he data output ( D
pin.
The output pin (D
when the devic e is deselected (CE
operation (CE
and WE LOW).
) is placed in a high-impedance state
OUT
HIGH) or during a write
The CY7C107B is available in a standard 400-mil-wide SOJ;
the CY7C1007B is available in a standard 300-mil-wide SOJ.
LogicBlockDiagramPin Configuration
SOJ
A
A
A
A
A
A
NC
A
A
A
A
D
OUT
WE
GND
10
11
12
13
14
15
16
17
18
19
Top View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
D
IN
INPUT BUFFER
A
0
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
ROW DECODER
512x2048
ARRA
COLUMN
DECODER
Y
D
OUT
SENSE AMPS
POWER
DOWN
CE
V
CC
A
9
A
8
A
7
A
6
A
5
A
4
NC
A
3
A
2
A
1
A
0
D
IN
CE
107B-2
OUT
)
9
A
A10A11A
13
A12A14A16A
15
A17A18A
19
Selection Guide
7C107B-12
7C1007B-12
Maximum Access Time (ns)1215202535
Maximum Operating
Current (mA)
Maximum CMOS Standby
Current SB2 (mA)
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05030 Rev. ** Revised September 7, 2001
WE
107B-1
7C107B-15
7C1007B-15
7C107B-20
7C1007B-20
7C107B-25
7C1007B-25
7C107B-35
7C1007B-35
9080757060
22222
[+] Feedback
CY7C107B
CY7C1007B
Maximum Ratings
(Above which the useful life may be impaired. For user guid elines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High Z State
[1]
DC Input Voltage
Relative to GND
CC
.......................................−0.5 V to VCC + 0.5V
[1]
....................................−0.5V to VCC + 0.5V
[1]
.....−0.5V to +7.0V
Electrical Characteristics Ov er the Op erat ing Range
ParameterDescriptionTest Conditions
V
V
V
V
I
I
I
I
I
I
OH
OL
IH
IL
IX
OZ
OS
CC
SB1
SB2
Output HIGH
VCC = Min., IOH = −4.0 mA2.42.42.4V
Voltage
Output LOW
VCC = Min., IOL = 8.0 mA0.40.40.4V
Voltage
Input HIGH
Voltage
Input LOW
Voltage
[1]
Input Load CurrentGND < VI < V
Output Leakage
Current
Output Short
Circuit Current
[3]
VCC Operating
Supply Current
Automatic CE
Power-Down
Current— TTL Inputs
Automatic CE
Power-Down
Current—
CMOS Inputs
GND < VI < VCC,
Output D isab led
VCC = Max., V
VCC = Max.,
= 0 mA,
I
OUT
= 1/t
f = f
MAX
Max. V
V
IN
f = f
Max. V
CE
V
IN
VIN < 0.3V, f = 0
, CE > VIH,
CC
>V
or VIN < VIL,
IH
MAX
,
CC
> VCC – 0.3V ,
> VCC – 0.3V or
CC
= GND−300−300−300mA
OUT
RC
Current into Outputs (LOW)........................................ 20 mA
Static Discharge Voltage ...........................................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.....................................................>200 mA
Operating Range
Range
Temperature
Commercial0°C to +70°C 5V ± 10%
Industrial−40°C to +85°C 5V ± 10%
Ambient
7C107B-12
7C1007B-12
7C107B-15
7C1007B-15
Min.Max.Min.Max.Min.Max.Unit
2.2VCC+
0.3
2.2VCC+
0.3
−0.30.8−0.30.8−0.30.8V
−1+1−1+1−1+1µA
–5+5–5+5–5+5µA
908075mA
202020mA
222mA
[2]
7C107B-20
7C1007B-20
2.2VCC+
0.3
V
CC
V
Notes:
(min.) = –2.0V for pulse durations of less than 20 ns.
1. V
IL
2. T
is the “Instant On” case temperature.
A
3. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
Document #: 38-05030 Rev. **Page 2 of 9
[+] Feedback
Electrical Characteristics Over the Operating Range (continued)
CY7C107B
CY7C1007B
ParameterDescriptionTest Conditions
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
I
CC
I
SB1
I
SB2
Capacitance
Output HIGH
VCC = Min., IOH = −4.0 mA2.42.4V
Voltage
Output LOW VoltageVCC = Min., IOL = 8.0 mA0.40.4V
Input HIGH Voltage2.2V
Input LOW Voltage
Input Load CurrentGND < VI < V
Output Leakage
Current
Output Short
Circuit Current
VCC Operating
Supply Current
Automatic CE
Power-Down
Current—TTL Inputs
Automatic CE
Power-Down
Current—CMOS Inputs
[4]
[1]
CC
GND < VI < VCC,
Output Disabled
[3]
VCC = Max., V
OUT
VCC = Max.,
= 0 mA,
I
OUT
= 1/t
f = f
MAX
RC
Max. VCC, CE > VIH,
>VIH or VIN < VIL,
V
IN
f = f
MAX
Max. V
CE
V
IN
V
IN
,
CC
> VCC – 0.3V ,
> VCC – 0.3V or
< 0.3V , f = 0
7C107B-25
7C1007B-25
7C107B-35
7C1007B-35
Min.Max.Min.Max.Unit
+ 0.32.2V
CC
+ 0.3V
CC
−0.30.8−0.30.8V
−1+1−1+1µA
−5+5−5+5µA
= GND−300−300mA
7060mA
2020mA
22mA
ParameterDescriptionTest ConditionsMax.Unit
: Addr e ssesInput CapacitanceTA = 25°C, f = 1 MHz,
C
IN
CIN: Controls10pF
C
OUT
Note:
4. Tested initially and after any design or process changes that may affect these parameters.
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and out p ut lo ad i n g of t h e s p eci f ie d
I
OL/IOH
6. At any given temperature and voltage condition, t
7. t
HZCE
8. The internal write time of the memory is defined by the overlap of CE
signals can terminate the write . The input data set-up and hold timing shoul d be referenced to the leading edge of the sign al that terminates the wr ite.
Read Cycle Time1215202535ns
Address to Data Valid1215202535ns
Data Hold from Address
33333ns
Change
CE LOW to Data Valid1215202535ns
CE LOW to Low Z
CE HIGH to High Z
[6]
[6, 7]
33333ns
6781010ns
CE LOW to Power-Up00000ns
CE HIGH to Power-Down1215202535ns
[8]
Write Cycle Time1215202535ns
CE LOW to Write End1012152025ns
Address Set-Up to Write
1012152025ns
End
Address Hold from Write
00000ns
End
Address Set-Up to Write
00000ns
Start
WE Pulse Width1012152025ns
Data Set-Up to Write End78101520ns
Data Hold from Write End00000ns
WE HIGH to Low Z
WE LOW to High Z
and 30-pF load capacitance.
and t
are specified with a lo ad cap acitance of 5 pF as in pa rt (b) of AC Test Loads. Trans ition i s measur ed ±500 mV from steady-state volt age.
HZWE
[6]
[6, 7]
33333ns
6781010ns
is less than t
HZCE
and t
LZCE
LOW and WE LOW. CE and WE must be LOW to initiate a write, an d the transition of any of these
HZWE
is less than t
for any given d evice.
LZWE
Document #: 38-05030 Rev. **Page 4 of 9
[+] Feedback
Switching Waveforms
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2
ADDRESS
CE
[10, 11]
PREVIOUS DATA VALIDDATA VALID
[11, 12]
t
OHA
CY7C107B
CY7C1007B
t
RC
t
AA
107-6
t
RC
t
LZCE
DATA OUT
V
CC
SUPPLY
HIGH IMPEDANCE
t
PU
CURRENT
Write Cycle No. 1 (CE Controlled)
ADDRESS
CE
WE
DATA IN
t
ACE
t
HZCE
DATA VALID
t
PD
50%
[13]
t
WC
t
SA
t
AW
t
PWE
t
SCE
t
t
SD
t
HD
50%
HA
HIGH
IMPEDANCE
I
CC
I
SB
107-7
DATA VALID
DATA OUT
Notes:
9. No input may exceed V
10. Device is continuously selected, CE
11. WE
is HIGH for read cycle .
12. Address valid prior to or coi ncident with CE
HIGH IMPEDANCE
+ 0.5V .
CC
= VIL.
transition LOW.
Document #: 38-05030 Rev. **Page 5 of 9
107-8
[+] Feedback
Switching Waveforms (continued)
Write Cycle No. 2 (WE Controlled)
ADDRESS
CE
[13]
CY7C107B
CY7C1007B
t
WC
t
SCE
DATA IN
DATA OUT
Note:
13. If C E
t
t
SA
WE
DATA UNDEFINED
goes HIGH simultaneousl y with WE going HIGH, the o utput remai ns in a hig h-impedanc e stat e.