The CY62256V is a high-performance CMOS static RAM organized as 32,768 words by 8 bits. Easy memory expansion
is provided by an active LOW chip enable (CE
) and active
consumption by 98% when deselected. The CY62256V is in
the standard 450-mil-wid e (300-mil b ody width) SOI C, TSOP,
and reverse TSOP packages.
An active LOW write enable signal (WE
ing/reading operation of the memory . When CE
are both LOW, data on the eight data input/output pins (I/O
throug h I /O7) is written into the memory location addressed by
the address present on the address pins (A
Reading the device is accomplished by selecting the device
and enabling the outputs, CE
and OE active LOW, while WE
remains inactive or HIGH. Under these conditions, the contents of the location addressed by the information on address
pins is present on t he eight data input/output pins.
The input/output pins remain in a high-impedance state unle ss
the chip is selected, outputs are enabled, and write enable
(WE
) is HIGH. A die coat is used to ensure alpha immunity.
Logic Block Dia gramPin Configurations
SOIC
Top View
A
1
5
A
2
6
A
3
7
A
4
8
A
5
9
A
6
10
A
7
11
A
8
A
A
I/O
I/O
I/O
GND
12
9
13
10
14
11
0
12
1
13
2
14
CE
WE
OE
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
0
1
2
3
4
5
6
7
INPUT BUFFER
A
10
A
9
A
8
A
7
A
6
A
5
A
4
A
3
A
2
512x512
Y
ARRA
COLUMN
DECODER
POWER
DOWN
) controls the writ-
and WE inputs
through A14).
0
V
28
CC
27
WE
26
A
4
A
25
3
24
A
2
23
A
1
22
OE
A
21
0
20
CE
19
I/O
I/O
I/O
I/O
I/O
7
6
5
4
3
C62256V–2
18
17
16
15
0
C62256V–1
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
March 1996 – Revised May 1996
Pin Configurations (continued)
22
OE
A
23
1
A
24
2
A
25
3
A
26
4
CC
A
A
A7
A
A
A
A
A7
A
A
CC
A
A
A
A
OE
27
28
1
5
2
6
3
4
8
5
9
6
10
7
11
7
11
6
10
5
9
4
8
3
2
6
1
5
28
27
26
4
25
3
24
2
23
1
22
WE
V
A
A
A
A
V
WE
PRELIMINARY
TSOP
Top View
TSOP Reversed
Top View
21
20
19
18
17
16
15
14
13
12
11
10
9
8
8
9
10
11
12
13
14
15
16
17
18
19
20
21
A
0
CE
I/O
7
I/O
6
I/O
5
I/O
4
I/O
3
GND
I/O
2
I/O
1
I/O
0
A
14
A
13
A
12
C62256V–3
A
12
A
13
A
14
I/O
0
I/O
1
I/O
2
GND
I/O
3
I/O
4
I/O
5
I/O
6
I/O
7
CE
A
0
C62256V–4
CY62256V
Selection G uide
CY62256V-55CY62256V-70
Maximum Access Time (ns)5570
Maximum Operati ng Current (mA)5050
L5050
LL3030
Maximum Standby Current (µA)500500
L5050
LL55
Shaded area contains advanced information.
[1]
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied...................................................0°C to +70°C
Supply Voltage to Ground Potential
(Pin 28 to Pin 14).............. ......................... ..........− 0.5V to +4.6V
DC Voltage Applied to Outputs
in High Z State
[1]
....................................... −0.5V to VCC + 0.5V
DC Input Voltage
Output Current into Outputs (LOW)............................. 20 mA
Input LOW Voltage−0.50.8−0.50.8V
Input Load CurrentGND < VI < V
CC
Output Leakage CurrentGND < VO < VCC, Output
−1+1−1+1µA
−5+5−5+5µA
Disabled
Output Short Circuit
[2]
Current
VCC Operating Supply
Current
Automatic CE
Power-Down Current—
TTL Inputs
Automatic CE
Power-Down Current—
CMOS Inputs
VCC = Max., V
= GND−200−200mA
OUT
VCC = Max.,
I
= 0 mA,
OUT
f = f
= 1/t
MAX
RC
Max. VCC, CE > VIH,
V
> VIH or
IN
V
< VIL, f = f
IN
MAX
Max. VCC,
CE
> VCC - 0.3V
V
> VCC - 0.3V
IN
or V
< 0.3V, f = 0
IN
5050mA
L5050mA
LL3030mA
55mA
L33mA
LL11mA
500500µA
L5050µA
LL55µA
V
Capacitance
[3]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
3. Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
Input CapacitanceTA = 25°C, f = 1 MHz,
V
= 3.0V
CC
Output Capacitance8pF
6pF
3
PRELIMINARY
Data Retention Characteristics (Over the Operating Range)
ParameterDescriptionConditions
V
DR
I
CCDR
[3]
t
CDR
[3]
t
R
Data Retention Waveform
V
CC
CE
VCC for Data Ret ention2.0V
Data Retention CurrentVCC = VDR = 3.0V ,
CE
L20µ A
LL5µA
> VCC - 0.3V ,
V
> VCC - 0.3V or
IN
V
< 0.3 V
IN
Chip Deselect to Data
Retention Time
Operation Recovery Timet
DATA RETENTION MOD E
VDR> 2V
t
CDR
CY62256V
[4]
Min.Max.Unit
200µA
0ns
RC
3.0V3.0V
t
R
ns
C62256V–7
Switching Characteristics Over the Operating Range
[5]
CY62256V-55CY62256V- 70
ParameterDescripti onMin.Max.Min.Max.Unit
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Shaded area contains advanced information.
Notes:
4. No input may exceed V
5. Test conditions assume signal transition time of 5 ns or less timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
and 100-pF load c apacita nce.
OL/IOH
6. At any given temperature and voltage condition, t
7. t
HZOE
, t
HZCE
, and t
Read Cycle Time5570ns
Address to Data Val id5570ns
Data Hold from Address Change33ns
CE LOW to Data Valid5570ns
OE LOW to Data Valid2535ns
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
[6]
[6, 7]
[6]
[6, 7]
33ns
2025ns
33ns
2025ns
CE LOW to Power-Up00ns
CE HIGH to Power-Down5570ns
+0.3V.
CC
is less than t
are specified with CL = 5 pF as in p art (b) of AC Test Loads. T rans ition is measur ed ±500 mV f rom st eady-stat e voltage.
HZWE
HZCE
LZCE
, t
HZOE
is less tha n t
LZOE
, and t
HZWE
is less than t
for any given dev ice.
LZWE
4
PRELIMINARY
CY62256V
Switching Characteristics Over the Operating Range
[5]
(continued)
CY62256V-55CY62256V- 70
ParameterDescripti onMin.Max.Min.Max.Unit
WRITE CYCLE
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
Shaded area contains advanced information.
[8,9]
Write Cycle Time5570ns
CE LOW to Write End4560ns
Address Set-Up to Write End4560ns
Address Hold from Write End00ns
Address Set-Up to Write Start00ns
WE Pulse Width4050ns
Data Set-Up to Write End2530ns
Data Hold from Write End00ns
WE LOW to High Z
WE HIGH to Low Z
[6, 7]
[6]
2025ns
33ns
Switching Waveforms
Read Cycle No.1
[10, 11]
t
RC
ADDRESS
t
OHA
[10, 11][10, 11]
t
AA
DATA OUTPREVIOUS DATA VALID
Read Cycle No. 2
CE
[11, 12]
t
ACE
t
RC
OE
t
DOE
t
t
LZCE
, CE = VIL.
LZOE
50%
DATA VALID
LOW and WE LOW. Both signal s must be LOW to initiate a write and eith er signal can ter minate
and tSD.
HZWE
DATA OUT
V
CC
SUPPLY
HIGH IMPEDANCE
t
PU
CURRENT
Notes:
8. The internal write time of the memory is defined by the overlap of CE
a write by going HIGH. The data i np ut set-up and hol d timing shoul d be refe renced to the rising ed ge of the s ignal t hat te rminat es the w rite.
9. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of t
10. Device is co ntinuously selected. OE
11. WE
is HIGH for r ead cycle.
12. Address valid prior to or coincident with CE transition LOW.
DATA VALID
t
HZOE
t
HZCE
t
C62256V–8
HIGH
IMPEDANCE
PD
ICC
50%
ISB
C62256V–9
5
PRELIMINARY
Switching Waveforms (continued)
Write Cycle No.1 (WE Controlled)
ADDRESS
CE
[8, 13, 14]
t
CY62256V
WC
t
WE
SA
OE
DATA I/O
NOTE 15
t
Write Cycle No. 2 (CE Controlled)
ADDRESS
CE
WE
DATA I/O
HZOE
[8, 13, 14]
t
SA
t
AW
t
PWE
t
SD
t
HA
t
HD
DATAINVALID
C62256V–10
t
WC
t
SCE
t
AW
t
SD
t
HA
t
HD
DATAINVALID
C62256V–11
Write Cycle No. 3 (WE Controlled, OE LOW)
[ 9, 14]
t
WC
ADDRESS
CE
t
AW
t
WE
DATA I/O
Notes:
13. Data I/O is high impedance if OE
14. If CE
15. During this period, the I/Os are in output state and input signals should not be applied.
goes HIGH simultaneously with WE HIGH, the output r emains in a high -impeda nce state.