1. SOIC package is available only in 55 ns speed bin.
2. For best practice recommendations, refer to the Cypress application note “System Design Guidelines” at http://www.cypress.com.
A
0
IO
0
IO
7
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
A
9
SENSE AMPS
POWER
DOWN
CE
WE
OE
A
13
A
14
A
15
A16A
17
ROW DECODER
COLUMN DECODER
512K x 8
ARRAY
INPUT BUFFER
A
10
A
11
A
12
A
18
■ Very high speed: 45 ns
❐ Wide voltage range: 2.20V to 3.60V
■ Temperature ranges
❐ Industrial: –40°C to +85°C
❐ Automotive-A: –40°C to +85°C
■ Pin compatible with CY62148DV30
■ Ultra low standby power
❐ Typical standby current: 1 μA
❐ Maximum standby current: 7 μA (Industrial)
■ Ultra low active power
❐ Typical active current: 2 mA at f = 1 MHz
■ Easy memory expansion with CE, and OE features
■ Automatic power down when deselected
■ CMOS for optimum speed and power
■ Available in Pb-free 36-ball VFBGA, 32-pin TSOP II and 32-pin
SOIC
[1]
packages
Logic Block Diagram
Functional Description
The CY62148EV30
organized as 512K words by 8 bits. This device features
advanced circuit design to provide ultra low active current. This
is ideal for providing More Battery Life™ (MoBL
applications such as cellular telephones. The device also has an
automatic power down feature that significantly reduces power
consumption. Placing the device into standby mode reduces
power consumption by more than 99 percent when deselected
(CE
HIGH). The eight input and output pins (IO0 through IO7) are
placed in a high impedance state when the device is deselected
(CE HIGH), the outputs are disabled (OE HIGH), or during a write
operation (CE
To write to the device, take Chip Enable (CE
(WE
) inputs LOW. Data on the eight IO pins (IO0 through IO7) is
then written into the location specified on the address pins (A
through A18).
To read from the device, take Chip Enable (CE
Enable (OE
) LOW while forcing Write Enable (WE) HIGH. Under
these conditions, the contents of the memory location specified
by the address pins appear on the IO pins.
[2]
is a high performance CMOS static RAM
LOW and WE LOW).
®
) in portable
) and Write Enable
) and Output
0
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05576 Rev. *G Revised August 4, 2008
[+] Feedback
MoBL® CY62148EV30
Pin Configuration
A
15
V
CC
A
13
A
12
A
5
NC
WE
A
7
IO
4
IO
5
A
4
IO
6
IO
7
V
ss
A
11
A
10
A
1
V
SS
IO
0
A
2
A
8
A
6
A
3
A
0
V
cc
IO
1
IO
2
IO
3
A
17
A
18
A
16
CE
OE
A
9
A
14
D
E
B
A
C
F
G
H
NC
36-Ball VFBGA Pinout
Top View
1
2
3
4
5
6
7
8
9
10
11
14
31
32
12
13
16
15
29
30
21
22
19
20
27
28
25
26
17
18
23
24
32-Pin SOIC/TSOP II Pinout
Top Vi ew
A
17
A
16
A
15
A
14
A
13
A
12
A
11
A
10
A
9
A
8
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
IO
0
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
IO
7
V
SS
V
CC
A
18
WE
OE
CE
Notes
3. NC pins are not connected on the die.
4. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
CC
= V
CC(typ)
, TA = 25°C.
Product Portfolio
[1, 3]
Power Dissipation
ProductRangeVCC Range (V)
MinTyp
[4]
MaxTyp
Speed
(ns)
Operating ICC (mA)
f = 1 MHzf = f
[4]
MaxTyp
[4]
max
MaxTyp
Standby I
(µA)
[4]
Max
CY62148EV30LL VFBGAInd’l2.23.03.64522.5152017
TSOP II Ind’l/Auto-A
SOICInd’l2.23.03.65522.5152017
SB2
Document #: 38-05576 Rev. *GPage 2 of 12
[+] Feedback
MoBL® CY62148EV30
Maximum Ratings
Notes
5. V
IL(min)
= –2.0V for pulse durations less than 20 ns.
6. V
IH(max)
= V
CC
+ 0.75V for pulse durations less than 20 ns.
7. Full device AC operation assumes a minimum of 100 μs ramp time from 0 to V
CC(min)
and 200 μs wait time after V
CC
stabilization.
8. Under DC conditions the device meets a V
IL
of 0.8V (for VCC range of 2.7V to 3.6V) and 0.6V (for VCC range of 2.2V to 2.7V). However, in dynamic conditions
Input LOW voltage applied to the device must not be higher than 0.6V and 0.4V for the above ranges. This is applicable to SOIC package only. Please refer to
AN13470 for details.
9. Only chip enable (CE
) must be HIGH at CMOS level to meet the I
SB2
/ I
CCDR
spec. Other inputs can be left floating.
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature.................................. –65°C to +150°C
Ambient Temperature with
Power Applied .............................................. 55°C to +125°C
Supply Voltage to Ground
Potential..........................................–0.3V to V
DC Voltage Applied to Outputs
in High-Z State
[5, 6]
........................–0.3V to V
CC(max)
CC(max)
+ 0.3V
+ 0.3V
Electrical Characteristics (Over the Operating Range)
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
I
SB2
OH
OL
IH
IL
[9]
Output HIGH
Vol tage
Output LOW
Vol tage
Input HIGH
Vol tage
Input LOW
Vol tage
Input Leakage
Current
Output Leakage
Current
VCC Operating
Supply Current
Automatic CE
Power Down
Current — CMOS
Inputs
Automatic CE
Power Down
Current — CMOS
Inputs
IOH = –0.1 mA2.02.0V
= –1.0 mA, V
I
OH
> 2.70V 2.42.4V
CC
IOL = 0.1 mA0.40.2V
IOL = 2.1 mA, V
V
= 2.2V to 2.7V1.8V
CC
> 2.70V0.40.4V
CC
VCC= 2.7V to 3.6V2.2V
V
= 2.2V to 2.7V For VFBGA and
CC
TSOP II package
For SOIC package–0.30.4
= 2.7V to 3.6V For VFBGA and
V
CC
TSOP II package
For SOIC package–0.30.6
GND < VI < V
CC
GND < VO < VCC, Output Disabled–1+1–1+1μA
f = f
= 1/t
max
f = 1 MHz22.522.5
CE > V
V
IN
f = f
f = 0 (OE
– 0.2V,
CC
> V
– 0.2V, VIN < 0.2V
CC
(Address and Data Only),
max
and WE), V
RC
VCC = V
I
OUT
CC(max),
= 0 mA,
CMOS levels
= 3.60V
CC
CE > VCC – 0.2V,
V
> VCC – 0.2V or VIN < 0.2V,
IN
f = 0, V
= 3.60V
CC
DC Input Voltage
[5, 6]
.....................–0.3V to V
CC(max)
+ 0.3V
Output Current into Outputs (LOW)............................. 20 mA
Latch up Current.....................................................> 200 mA
Operating Range
ProductRange
Ambient
Temperature
CY62148EV30Ind’l/Auto-A –40°C to +85°C 2.2V to 3.6V
- 45 (Ind’l/Auto-A)- 55
Min Typ
[4]
MaxMin Typ
+ 0.3V 1.8V
CC
+ 0.3V 2.2V
CC
[1]
[4]
Max
+ 0.3VV
CC
+ 0.3VV
CC
–0.30.6V
[8]
–0.30.8V
[8]
–1+1–1+1μA
15201520mA
1717μA
1717μA
V
Unit
CC
V
[7]
Document #: 38-05576 Rev. *GPage 3 of 12
[+] Feedback
MoBL® CY62148EV30
Capacitance (For All packages)
V
CC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUTV
Equivalent to:THEVENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
V
CC(min)
V
CC(min)
t
CDR
VDR> 1.5V
DATA RETENTION MODE
t
R
V
CC
CE
Notes
10. Tested initially and after any design or process changes that may affect these parameters.
11. Full device AC operation requires linear V
CC
ramp from V
DR
to V
CC(min)
> 100 μs or stable at V
CC(min)
> 100 μs.
[10]
ParameterDescriptionTest ConditionsMaxUnit
C
C
IN
OUT
Input CapacitanceTA = 25°C, f = 1 MHz,
= V
V
CC
Output Capacitance10pF
CC(typ)
10pF
Thermal Resistance
[10]
ParameterDescriptionTest Conditions
Θ
Θ
Thermal Resistance
JA
(Junction to Ambient)
Thermal Resistance
JC
(Junction to Case)
Still Air, soldered on a 3 x 4.5 inch,
two-layer printed circuit board
AC Test Loads and Waveforms
Parameters2.50V3.0VUnit
R1166671103Ω
R2153851554Ω
R
TH
V
TH
8000645Ω
1.201.75V
VFBGA
Package
TSOP II
Package
SOIC
Package
7275.1355°C/W
8.868.9522°C/W
Unit
Data Retention Characteristics (Over the Operating Range)
ParameterDescriptionConditionsMinTyp
V
DR
I
CCDR
t
CDR
[11]
t
R
[10]
VCC for Data Retention1.5V
[9]
Data Retention CurrentVCC = 1.5V, CE > VCC – 0.2V,
> VCC – 0.2V or VIN <
V
IN
0.2V
Chip Deselect to Data Retention Time0ns
Operation Recovery Timet
Data Retention Waveform
Document #: 38-05576 Rev. *GPage 4 of 12
Ind’l/Auto-A0.87μA
[4]
MaxUnit
RC
ns
[+] Feedback
MoBL® CY62148EV30
Switching Characteristics
Notes
12. Test Conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less (1 V/ns), timing reference levels of V
CC(typ)
/2, input
pulse levels of 0 to V
CC(typ)
, and output loading of the specified IOL/IOH as shown in the “AC Test Loads and Waveforms” on page 4.
13. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any given device.
14. t
HZOE
, t
HZCE
, and t
HZWE
transitions are measured when the output enter a high impedance state.
15. The internal write time of the memory is defined by the overlap of WE
, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can
terminate a write by going INACTIVE. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
(Over the Operating Range)
ParameterDescription
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
[15]
[12]
Read Cycle Time4555ns
Address to Data Valid4555ns
Data Hold from Address Change1010ns
CE LOW to Data Valid4555ns
OE LOW to Data Valid2225ns
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
CE LOW to Power Up00ns
CE HIGH to Power Up4555ns
Write Cycle Time4555ns
CE LOW to Write End3540ns
Address Setup to Write End3540ns
Address Hold from Write End00ns
Address Setup to Write Start00ns
WE Pulse Width3540ns
Data Setup to Write End2525ns
Data Hold from Write End00ns
WE LOW to High Z
WE HIGH to Low Z
[13]
[13, 14]
[13]
[13, 14]
[13, 14]
[13]
- 45 (Ind’l/Auto-A)- 55
[1]
Unit
MinMaxMinMax
55ns
1820ns
1010ns
1820ns
1820ns
1010ns
Document #: 38-05576 Rev. *GPage 5 of 12
[+] Feedback
MoBL® CY62148EV30
Switching Waveforms
PREVIOUS DATA VALIDDATA VALID
RC
t
AA
t
OHA
tRC
ADDRESS
DATA OUT
50%
50%
DATA VALID
t
RC
t
ACE
t
DOE
t
LZOE
t
LZCE
t
PU
HIGH IMPEDANCE
t
HZOE
t
HZCE
t
PD
IMPEDANCE
I
CC
I
SB
HIGH
ADDRESS
CE
DATA OUT
V
CC
SUPPLY
CURRENT
OE
DATA VALID
t
HD
t
SD
t
PWE
t
SA
t
HA
t
AW
t
SCE
t
WC
t
HZOE
ADDRESS
CE
WE
DATA IO
OE
NOTE
21
Notes
16. Device is continuously selected. OE
, CE = VIL.
17. WE
is HIGH for read cycles.
18. Address valid before or similar to CE
transition LOW.
19. Data IO is high impedance if OE
= VIH.
20. If CE
goes HIGH simultaneously with WE HIGH, the output remains in high impedance state.
21. During this period, the IOs are in output state. Do not apply input signals.
*A247373See ECNSYTChanged from Advance Information to Preliminary
*B414807See ECNZSDChanged from Preliminary information to Final
*C464503See ECNNXRIncluded Automotive Range in product offering
*D833080See ECNVKNAdded footnote 8
*E890962See ECNVKNRemoved Automotive part and its related information
Orig. of
Change
Description of Change
Moved Product Portfolio to Page 2
Changed V
Changed I
Changed typo in Data Retention Characteristics (t
Changed t
Changed t
45 ns Speed Bin
Changed t
Speed Bin
Changed t
Speed Bin
stabilization time in footnote #7 from 100 μs to 200 μs
CC
from 2.0 μA to 2.5 μA
CCDR
from 6 ns to 10 ns for both 35 ns and 45 ns Speed Bin
OHA
, t
HZOE
from 25 to 30 ns for 35 ns Speed Bin and 40 to 35 ns for 45 ns
SCE
HZCE
from 12 to 15 ns for 35 ns Speed Bin and 15 to 18 ns for
HZWE
from 12 to 18 ns for 35 ns Speed Bin and 15 to 22 ns for 45 ns
Changed tSD from 15 to 18 ns for 35 ns Speed Bin and 20 to 22 ns for
45 ns Speed Bin
Changed t
Changed Ordering Information to include Pb-Free Packages
from 15 to 18 ns for 35 ns Speed Bin
DOE
Changed the address of Cypress Semiconductor Corporation on Page #1 from
“3901 North First Street” to “198 Champion Court”
Removed 35ns Speed Bin
Removed “L” version of CY62148EV30
Changed ball C3 from DNU to NC.
Removed the redundant footnote on DNU.
Changed ICC (max) value from 2 mA to 2.5 mA and ICC (Typ) value from
1.5 mA to 2 mA at f=1 MHz
Changed I
Changed I
μA to 7 μA.
(Typ) value from 12 mA to 15 mA at f = f
CC
SB1
and I
Typ values from 0.7 μA to 1 μA and Max values from 2.5
SB2
Changed the AC test load capacitance value from 50pF to 30pF.
Changed I
Added I
Changed t
CCDR
Changed t
Changed t
Changed t
Changed t
Updated the package diagram 36-pin VFBGA from *B to *C
from 2.5 μA to 7 μA.
CCDR
typical value.
from 3 ns to 5 ns
LZOE
and t
LZCE
HZCE
PWE
from 22 ns to 25 ns.
SD
LZWE
from 22 ns to 18 ns
from 30 ns to 35 ns.
from 6 ns to 10 ns
Added 32-pin SOIC package diagram and pin diagram
Updated the ordering information table and replaced the Package Name column
with Package Diagram.
Updated Thermal Resistance table
Updated the Ordering Information
Added V
spec for SOIC package
IL
Added footnote 2 related to SOIC package
Added footnote 9 related to I
Added AC values for 55 ns Industrial-SOIC range
spec from 0.4V to 0.2V for SOIC package at IOL = 0.1 mA
OL
Changed V
Updated footnote 8
spec from 0.6V to 0.4V for SOIC package at VCC = 2.2V to 2.7V
IL
Made footnote 9 applicable for both I
SB2
and I
CCDR
*G254857508/05/08NXRAdded Auto-A information.
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
Products
PSoCpsoc.cypress.com
Clocks & Buffersclocks.cypress.com
Wirelesswireless.cypress.com
Memoriesmemory.cypress.com
Image Sensorsimage.cypress.com
PSoC Solutions
Generalpsoc.cypress.com/solutions
Low Power/Low Voltagepsoc.cypress.com/low-power
Precision Analog psoc.cypress.com/precision-analog
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Sou rce Code and derivative works for the sole purpose of cr eating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 38-05576 Rev. *GRevised August 4, 2008Page 12 of 12
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All product and company names mentioned in this document are the
trademarks of their respective holders. All products and company names mentioned in this document may be the trademarks of their respective holders.
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