• Low power version (20V8L)
—55 mA max. commercial (15, 25 ns)
—65 mA max. military/industrial
(15, 25 ns)
• Standard version has low power
—90 mA max. commercial
(15, 25 ns)
—115 mA max. commercial (10 ns)
—130 mA max. military/industrial (15, 25 ns)
• CMOS Flash technology for electrical erasability and
reprogrammability
• User-programmable macrocell
—Output polarity control
—Individually selectable for registered or combinato-
rial operation
LogicBlock Diagram(PDIP/CDIP/QSOP)
GND11I
12
10
I
9
1098765 4321
I
8
I
7
I
6
• QSOP package availa ble
—10, 15, and 25 ns com’l version
—15, and 25 ns military/industrial versions
• High reliability
—Proven Flash technology
—100% programming and functional testing
Functional Description
The Cypress PALCE20V8 is a CMOS Flash Erasable second-generation programmable array logic device. It is implemented with the famili ar sum-of-product (AND-OR ) logic structure and the programmable macroce ll .
The PALCE20V8 is executed in a 24-pin 300-mil molded DIP,
a 300-mil c erdip, a 28-lead square ceramic lea dless chip carrier, a 28-lead square pl astic leaded ch ip carrier , and a 24-lea d
quarter size outline. The device provides up to 20 inputs and
8 outputs. The PALCE20V8 ca n be elec trical ly erase d and reprogrammed. The programmable macrocell enables the device to function as a superset to the familia r 24-pin PLDs such
as 20L8, 20R8, 20R6, 20R4.
The PALCE20V8 features 8 product terms per output and 40
input terms into the AN D array . The fi rst product term in a macrocell can be used eit her as an inter nal out put en abl e con tr ol
or as a data product term.
There are a total of 18 architecture bits in the PALCE20V8
macrocell; two are global bits that apply to all macrocells and
16 that apply locally, two bits per macrocell. The architecture
bits determine whether th e macrocell functions as a reg ister or
combinatorial wi th invert ing or no ninvertin g output. The outp ut
enable control c an come from an external pin o r internally fro m
a product term. The output can also be perma ne ntly ena ble d,
functioning as a dedicated output or permanently disabled,
functioning as a dedicated input. Feedback paths are selectable from either the input/output pin associated with the macrocell, the input/outpu t pin as so ci ated wi th an adj ac ent pin, or
from the macrocell register itself.
Power-Up Reset
All registers in the PALCE20V8 power-up to a logic LOW for
predictable system initialization. For each register, the associated output pin will be HIGH due to active-LOW outputs.
Electronic Signature
An electronic signature word is provided in the PALCE20V8
that consists of 64 bi ts of programmabl e memory that can co ntain user-defined data.
Security Bit
A security bit is provided that defeats the readback of the internal programmed pattern when the bit is programmed.
Low Power
The Cypress PALCE20V8 provides low-power operation
through the use of CMO S technology , and in creased testabilit y
with Flash reprogrammability.
Product Term Disable
Product Term Disabl e (PT D) fuses are included for e ach product term. The P TD fuses a llow each pro duct term to be individually disabled.
Input and I/O Pin Pull-Ups
The PALCE20V8 input and I/O pins have built-in active
pull-ups that will float unused inputs and I/Os to an active
HIGH state (logical 1). All unused inputs and three-stated I/O
pins should be connected to another active input, V
Ground to improve noise immunity and reduce I
CC
, or
CC
.
Document #: 38-03026 Rev. **Page 2 of 14
Configuration Table
CG
0
010Registered OutputRegistered Med PALs
011Combinatorial I/ORegistered Med PALs
100Combinatorial OutputSmall P A L s
101InputSmall P A L s
111Combinatorial I/O20L8 only
Macrocell
CG
1
CL0
x
Cell ConfigurationDevices Emulated
PALCE20V8
1
1
01X
0
CL0
CG
V
CC
CL1
x
x
1
CLK
CG1for pin 16 to 21 (DIP)
CG0for pin 15 and 22 (DIP)
Maximum Ratings
(Above which the useful life may be impai red. For user guidelines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12).................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State.....................................................−0.5V to +7.0V
DC Input Voltage.................................................−0.5V to +7.0V
1
1
OE
V
CC
QD
Q
100
0
1
01X
1
1
0
0
1
1
0
0
1
X
CL0
x
To
Adjacent
Macrocell
From
Adjacent
Pin
I/O
x
20V8–4
Output Current into Outputs (LOW).............................24 mA
DC Programming Voltage.............................................12.5V
Latch-Up Current.....................................................>200 mA
Operating Range
Range
Commercial0°C to +75°C 5V ±5%
Industrial−40°C to +85°C5V ±10%
[1]
Military
Note:
is the “instant on” case temperature.
1. T
A
Ambient
TemperatureV
CC
−55°C to +125°C 5V ±10%
Document #: 38-03026 Rev. **Page 3 of 14
PALCE20V8
Electrical Characteristics Ov er the Op erat ing Range
[2]
ParameterDescriptionTest ConditionsMin.Max.Unit
V
V
V
V
I
I
I
I
IH
IL
SC
CC
OH
OL
IH
IL
[5]
[4]
Output HIGH VoltageVCC = Min.,
= VIH or V
V
IN
Output LOW VoltageVCC = Min.,
= VIH or V
V
IN
IOH = −3.2 mACom’l2.4V
IL
IOH = −2 mAMil/Ind
IOL = 24 mACom’l0.5V
IL
IOL = 12 mAMil/Ind
Input HIGH LevelGuaranteed Input Logical HIG H Vo ltage for All Inputs
Input LOW LevelGuaranteed Input Logical LOW Voltage f or All Inputs
Input or I/O HIGH Leakage
Current
Input or I/O LOW Leakage
3.5V < VIN < V
CC
0V < VIN < VIN (Max.)−100µA
Current
Output Short Circuit Current VCC = Max., V
Operating Power Supply
NMinimum Reprogramm ing Cycle sNormal Programming Conditions100Cycles
Notes:
2. See the last page of this specification for Gro up A subgro up test in g infor ma ti on .
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
(Min.) is equal to −3.0V for pulse durations less than 20 ns.
IL
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Durati on of the sho rt circuit s hould not be more t han one secon d. V
caused by tester ground degrad ation.
7. Tested initially and after any design or process changes that may affect these parameters.
= 0.5V has been chosen to a void test problems
OUT
Document #: 38-03026 Rev. **Page 4 of 14
AC Test Loads and Waveforms
PALCE20V8
SpecificationS
tPD, t
t
PZX
t
PXZ
CO
, t
EA
, t
ER
Closed50 pF200Ω390Ω390Ω750Ω1.5V
Z ➧ H: Open
Z ➧ L: Closed
H ➧ Z: Open
L ➧ Z: Closed
3.0V
GND
1
2ns
≤
OUTPUT
ALL INPUT PULSES
90%
10%
≤ 2ns
20V8–5
TEST POINT
20V8–6
10%
90%
5V
S1
R1
R2
C
L
CommercialMilitary
C
L
1
R
2
R
1
R
Measured Output ValueR
2
1.5V
5 pFH ➧ Z: VOH − 0.5V
L ➧ Z: V
+ 0.5V
OL
Document #: 38-03026 Rev. **Page 5 of 14
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