Cypress CY8C20x66, CY8C20x46 User Manual

November 7, 2008
Errata Document for PSoC® CY8C20x46, CY8C20x66
CY8C20x46, CY8C20x66
This document describes the errata for the PSoC® CY8C20x46 and CY8C20x66. Details include errata trigger conditions, scope of impact, available workarounds, and silicon revision applicability . Compare this document to the device’s data sheet for a complete functional description. This document is not available on the external Cypress web site.
Contact your local Cypress Sales Representative if you have questions.
CY8C20x46 and CY8C20x66 Errata Summary
The following Errata items apply to the CY8C20x46 and CY8C20x66 data she et 001 -12696.
1. Latch-up susceptibility when maximum I/O sink current exceeded
n PROBLEM DEFINITION
P1[3], P1[6], and P1[7] pins are susceptible to latch-up when the I/O sink curr ent excee ds 25 m A per pin on these pins.
n PARAMETERS AFFECTED
LU – Latch-up Current. Per JESD78A, the maximum allowable latch-up current per pin is 100 mA. Cypress internal specification is 200 mA latch-up current limit.
n TRIGGER CONDITION(S)
Latch-up occurs when both of the following two conditions are met: A. The offending I/O is externally connected to a voltage higher than the I/O high state, ca using a current to
flow into the pin that exceeds 25 mA
B. A Port1 I/O adjacent (P1[1], P1[4] and P1[5] respectively) to the offending I/O is connected to a voltage
lower than the I/O low state, causing a signal that drops below Vss (signal undershoot), causing a current greater than 200 mA to flow out of the pin
n SCOPE OF IMPACT
The trigger conditions outlined above exceed the maximum ratings specified in the CY8C20x46 and CY8C20x66 datasheet 001-12696.
n WORKAROUND
Add a series resistor >300Ω to P1[3], P1[6], and P1[7] pins to restrict current to within latch-up limits.
n FIX STATUS
This issue will be corrected in the next new silicon revision.
The following Errata item applies only to the CY8C20666 and CY8C20066 parts on the Capsense Data sheet.
2. Does not meet USB 2.0 specification for D+ and D- rise/f all matching when supply voltage is under 3.3V
n PROBLEM DEFINITION
Rising to falling rate matching of the USB D+ and D- lines has a corner case at lower supply voltages, such as those under 3.3V.
n PARAMETERS AFFECTED
Rising to falling rate matching of the USB data lines.
n TRIGGER CONDITION(S)
Operating the VCC supply voltage at the low end of the chip’s specification (under 3.3V) may cause a missmatch in the rising to falling rate.
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134 408.943.2600
November 7, 2008 Document No. 001-32940 Re v . *C 1
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n SCOPE OF IMPACT
This condition does not affect USB communicat ions but could cause corner case issues with USB lines’ rise/fall matching specification. Signal integrity tests were run using the Cypress development kit for the part and excellent eye was observed with supply voltage of 3.15V.
Figure 1. Eye Diagram
n WORKAROUND
Avoid the trigger condition by using lower tolerance voltage regulators.
n FIX STATUS
This issue will be corrected in the next new silicon revision.
November 7, 2008 Document No. 001-32940 Rev. *C 2
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Document History Page
Document Title: Errata Document for: PSoC® CY8C20x46, CY8C20x66 Document Number: 001-32940
REV. ECN NO. Issue Date
** 1506743 Sept. 25, 2007 SFV First release. *A 1685823 Oct. 30, 2007 SFVTMP3 Minor formatting changes. *B 2507644 See ECN MNU/AESA Update the errata for revB krypton Silicon. Added part number
*C 2603185 See ECN DTB Update the errata for revB3 krypton Silicon. Added Latch-up and
Orig. of Change Description of Change
CY8C20x46. Updated document to current Errata template.
USB errata. Removed Higher Sleep Current errata and On Chip Debugger errata as solved by new silicon.
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Fax: 408-943-4730
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