• 64 x 4 (CY7C401 and CY7C403)
64 x 5 (CY7C402 and CY7C404)
High-speed first-in fi rst-out memory (FI FO)
• Processed with high-speed CMOS for optimum
speed/power
• 25-MHz data rates
• 50-ns bubble-through time—25 MHz
• Expandable in word width and/or length
• 5-volt power supply ± 10% tolerance, both commercial
and milita ry
• Independent asynchronous inputs and outputs
• TTL-compatible interface
• Output enable function available on CY7C403 and
CY7C404
• Capable of withstanding greater than 2001V electrostatic discharge
• Pin compatible with MMI 67401A/67402A
Functional Description
The CY7C401 and CY7C403 are asynchronous first-in
first-out (FIFOs) organized as 64 four-bit words. The CY7C402
and CY7C404 are similar FIFOs organized as 64 five-bit
words. Both the CY7C403 and CY7C404 have an output enable (OE) function.
The devices accept 4- or 5-bit words at the data input (DI
DI
) under the control of the shift in (SI) input. The stored
n
words stack up at the output (DO
were entered. A read command on the shift out (SO) input
– DOn) in the order they
0
–
0
causes the next to last word to move to the output and all data
shifts down once in the stack. The input ready (IR) signal acts
as a flag to indicate when the input is ready to accept new data
(HIGH), to indicate when the FIFO is full (LOW), and to provide
a signal for a cascading. The output ready (OR) signal is a flag
to indicate the output contains valid data (HIGH), to indicate
the FIFO is empty (LOW), and to provide a signal for cascading.
Parallel expansion for wider words is accomplished by lo gically ANDing the IR and OR signals to form c omposite signals.
Serial e xpansion is accomplished by tying the data inputs of
one device to the data outputs of the previous device. The IR
pin of the receiving device is connected to the SO pi n of the
sending device, and the OR pin of the sending device is connected to the SI pin of the receiving device.
Reading and writing operations are completely asynchronous,
allowing the FIFO to be used as a buffer between two digital
machines of widely differing operating frequencies. The
25-MHz operation makes these FIFOs ideal for high-speed
communication and controller applications.
Logic Block DiagramPin Configurations
DI
DI
DI
DI
(DI4)
MR
DI
DI
DI
DI
NC
IR
SI
0
1
2
3
SI
0
1
2
DIP
1
2
3
CY7C401
4
CY7C403
5
6
7
8
LCC
321 19
4
5
CY7C401
6
CY7C403
7
8
910111213
16
15
14
13
12
11
10
C401–2
20
V
SO
OR
DO
DO
DO
DO
9
MR
18
17
16
15
14
C401–3
NC
OR
DO
DO
DO
CC
0
1
2
3
0
1
2
(CY7C402) NC
(CY7C404) OE
DI
DI
DI
DI
C401–1
(CY7C401) NC
(CY7C403) OE
OE
DO
0
DO
1
DO
2
DO
3
(DO4)
SO
OR
GND
DI
DI
DI
SI
IR
INPUT
CONTROL
LOGIC
0
1
DATAIN
2
3
MASTER
RESET
WRITEPOINTER
WRITE MULTIPLEXER
MEMORY
ARRAY
READ MULTIPLEXER
READ POINTER
OUTPUT
ENABLE
DATAIN
OUTPUT
CONTROL
LOGIC
IR
SI
DI
DI
DI
DI
DI
SI
0
1
2
3
1
2
3
4
0
5
1
6
2
7
3
8
4
9
321 19
4
5
CY7C402
6
CY7C404
7
8
910111213
DIP
CY7C402
CY7C404
LCC
20
18
17
16
15
14
13
12
11
10
C401–4
18
17
16
15
14
C401–5
Selectio n Guide
7C401/2–57C40X–107C40X–157C40X–25
Operating Frequency (MHz)5101525
Maximum Operating
Current (mA)
Commercial75757575
Military909090
OR
DO
DO
DO
DO
V
SO
OR
DO
DO
DO
DO
DO
MRGND
CC
0
1
2
3
4
0
1
2
3
Cypress Semiconductor Corporation•3901North First Street•San Jose•CA 95134•408-943- 2600
March 1986 – Revised April 1995
CY7C401/CY7C403
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Output Current, into Outputs (LOW)..................... ....... 20 mA
Static Discharge Voltage ...........................................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .....................................................>200 mA
Operating Range
CY7C402/CY7C404
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................–3.0V to +7.0V
Range
Commercial0°C to +70°C 5V ±10%
[1]
Military
Ambient
TemperatureV
–55°C to +125°C 5V ±10%
Power Dissipation............................... ...........................1.0W
Electrical Characteristics Over the Operating Range (Unless Otherwise Noted)
[2]
7C40X–10, 15, 25
ParameterDescrip tionTest ConditionsMin.Max.Unit
V
V
V
V
I
V
I
I
I
IX
OZ
OS
CC
OH
OL
IH
IL
CD
[3]
Output HIGH VoltageVCC = Min., IOH = –4.0 mA2.4V
Output LOW VoltageVCC = Min., IOL = 8.0 mA0.4V
Input HIGH Voltage2.06.0V
Input LOW Voltage–3.00.8V
Input Leakage CurrentGND ≤ VI ≤ V
Input Diode Clamp Voltage
Output Leakage CurrentGND ≤ V
Output Short Circuit Current
[3]
OUT
[4]
Output Disabled (CY7C403 and CY7C404)
VCC = Max., V
Power Supply CurrentVCC = Max., I
CC
≤ VCC, VCC = 5.5V
= GND–90mA
OUT
= 0 mACommercial75mA
OUT
–10+10µA
–50+50µA
Military90mA
CC
Capacitance
[5]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Notes:
1. T
is the “instant on” case temperature.
A
2. See the last page of this specification for Group A subgroup testing information.
3. The CMOS process does not provide a clamp diode. However, the FIFO is insensitive to –3V dc input levels and –5V undershoot pulses of less than 10 ns
(measured at 50% output).
4. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
5. Tested initially and after any design or process changes that may affect these parameters.
Input CapacitanceTA = 25°C, f = 1 MHz,
V
= 4.5V
Output Capacitance7pF
CC
5pF
2
CY7C401/CY7C403
CY7C402/CY7C404
AC Test Loads and Waveforms
ALL INPUT PULSES
and 30-pF load
OL/IOH
90%
90%
10%
is tested with 5-pF load capacitance as
HZOE
10%
[7]
30 pF
R1 437Ω
R2
272Ω
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
(a)(b)
Equivalent to: THÉ VENIN EQUIVALENT
OUTPUT1.73V
167Ω
C401–8
Switching Characteristics Over the Operating Range
5 pF
R1 437Ω
3.0V
R2
272Ω
C401–6C401–7
[2, 6]
GND
≤ 5ns≤ 5ns
7C401–5
Test
ParameterDescriptionMin. Max. Min. Max. Min. Max.Min.Max. Unit
f
O
t
PHSI
t
PLSI
t
SSI
t
HSI
t
DLIR
t
DHIR
t
PHSO
t
PLSO
t
DLOR
t
DHOR
t
SOR
t
HSO
t
BT
t
SIR
t
HIR
t
PIR
t
POR
t
PMR
t
DSI
t
DOR
t
DIR
t
LZMR
t
OOE
t
HZOE
Notes:
6. Test condition s assu me signa l tra nsit ion tim e of 5 ns or less, timin g refere nce levels o f 1.5V and output loading of the spe cifi ed I
capacitance, as in part (a) of AC Test Loads and Waveforms.
7. Commercial/Military
8. I/fO > t
9. t
SSI
10. t
SIR
11. All data outputs will be at LOW level after reset goes HIGH until data is entered into the FIFO.
12. HIGH-Z transitions are referenced to the steady-state VOH –500 mV and VOL +500 mV levels on the output. t
in part (b) of AC Test Loads and Waveforms.
Operating FrequencyNote 85101525MHz
SI HIGH Time20202011ns
SO LOW Time45302520ns
Data Set-Up to SINote 90000ns
Data Hold from SINote 960403020ns
Delay, SI HIGH to IR LOW75403521/22ns
Delay, SI LOW to IR HIGH75454028/30ns
SO HIGH Time20202011ns
SO LOW Time45252520ns
Delay, SO HIGH to OR LOW75403519/21ns
Delay, SO LOW to OR HIGH80554034/37ns
Data Set-Up to OR HIGH0000ns
Data Hold from SO LOW5555ns
Bubble-Through Time200109510651050/60ns
Data Set-Up to IRNote 105555ns
Data Hold from IRNote 1030303020ns
Input Ready Pulse HIGH20202015ns
Output Ready Pulse HIGH20202015ns
MR Pulse Width40302525ns
MR HIGH to SI HIGH40352510ns
MR LOW to OR LOW85403535ns
MR LOW to IR HIGH85403535ns
MR LOW to Output LOWNote 1150403525ns
Output Valid from OE LOW—353020ns
Output High Z from OE HIGHNote 12—302515ns
+ t
PHSI
and t
and t
, I/fO > t
DHIR
apply when memory is not full.
HSI
apply when memory is full, SI is high and minimum b ubble-t hr ough (tBT) conditions exist.
HIR
PHSO
+ t
DHOR
Conditions
7C402–5
7C40X–107 C40X–157C40X–25
3
CY7C401/CY7C403
Operational Description
Concept
Unlike traditional FIFOs, these devices are designed using a
dual-port memory, read and write pointer, and control logic.
The read and write pointers are incremented by the SO and SI
respectively. The availability of an empty space to shift in data
is indicated by the IR signal, while the presence of data at the
output is indicated by the OR signal. The conventional concept
of bubble-through is absent. Instead, the delay for input data
to appear at the output is the time required to move a pointer
and propagate an OR signal. The output enable (OE
provides the capability to OR tie multiple FIFOs together on
a common bus.
Resetting the FIFO
Upon power-up, the FIFO must be reset with a master reset
(MR) signal. This causes the FIFO to enter an empty condition
signified by the OR signal being LOW at the same time the IR
signal is HIGH. In this condition, the data outputs (DO
will be in a LOW state.
Shifting Data In
Data is shifted in on the rising edge of the SI signal. This loads
input data into the first word location of the FIFO. On the falling
edge of the SI signal, the write pointer is moved to the next
word position and the IR signal goes HIGH, indicating the
readiness to accept new data. If the FIFO is full, the IR will
remain LOW until a word of data is shifted out.
Shifting Data Out
Data is shifted out of the FIFO on the falling edge of the SO
signal. This causes the internal read pointer to be advanced to
the next word location. If data is present, valid d ata will a ppear
on the outputs and the OR signal will go HIGH. If data is not
present, the OR signal will stay LOW indicating the FIFO is
empty. Upon the rising edge of SO, the OR signal goes LOW.
The data outputs of the FIFO should be sampled with
edge-sensitive type D flip-f lops (or equivalent), using the SO
signal as the clock input to the flip-flop.
Bubble-Through
Two bubble-through conditions exist. The first is when the device is empty. After a word is shifted into an empty device, the
data propagates to the output. After a delay, the OR flag goes
HIGH, indicating valid data at the output.
The second bubble-through condition occurs when the device
is full. Shifting data out creates an empty location th at propagates to the input. After a delay, the IR flag goes HIGH. If the
SI signal is HIGH at this time, data on the input will be shifted
in.
Possible Minimum Pulse Width Violation at the Boundary
Conditions
If the handshaking signals IR and OR are not properly used to
generate the SI and SO signals, it is possible to violate the
minimum (effective) SI and SO positive pulse widths at the full
and empty boundaries.
When this violation occurs, the operation of the FIFO is unpredictable. It must then be reset, and all data is lost.
) signal
– DOn)
0
CY7C402/CY7C404
Application of the 7C403–25/7C404–25 at 25 MHz
Application of the CY7C403 or CY7C404 Cypress CMOS
FIFOs requires knowledge of characteristics that are not easily
specified in a datasheet, but which are necessary for reliable
operation under all conditions, so we will specify them here.
When an empty FIFO is filled with init ial information at maximum “shift in” SI f requency, followed by immediate shifting out
of the data also at maximum “shift out” SO frequency, the designer must be aware of a window of time which follows the
initial rising edge of the OR signal, d uring which time the SO
signal is not recognized. This condition exists only at
high-speed operation where more than one SO may be generated inside the prohibited window. This condition does not
inhibit the operation of the FIFO at full-frequency operation,
but rather delays the full 25-MHz operation until after the window has passed.
There are several implementation techniques for managing
the window so that all SO signals are recognized:
1. The first involves delaying SO operation such that it does
not occur in the critical window. This can be accomplished
by causing a fixed delay of 40 ns “initiated by the SI signal
only when the FIFO is empty” to inhibit or gate the SO activity. However, this requires that the SO operation be at
least temporarily synchronized with the input SI operation.
In synchronous applications this may well be possible and
a valid solution.
2. Another solution not uncommon in synchronous applications is to only begin sh ifting data out of th e FIFO when it is
more than half full. This is a common method of FIFO application, as earlier FIFOs could not be operated at maximum frequency wh en near full or empty. Although Cypress
FIFOs do not have this limitation, any system designed in
this manner will not encounter the window condition described above.
3. The window may also be managed b y not allowing the fi rst
SO sign al t o occu r until the window in question has passed.
This can be accomplished by delaying the SO 40 ns from
the rising edge of the initial OR signal. This however involves the requirement that this only occurs on the first occurrence of data being loaded into the FIFO from an empty
condition and therefore requires the knowledge of IR and
SI conditions as well as SO.
4. Handshaking with the OR signal is a third method of avoiding the window in question. With this technique the rising
edge of SO, or the fact that SO signal is HIGH, will cause
the OR signal to go LOW. The SO signal is not taken LOW
again, advancing the internal pointer to the next data, until
the OR signal goes LOW. This ensures that the SO pulse
that is initiated in the window will be automatically extended
long enough to be recognized.
5. There remains the decision as to what signal will be used
to latch the data from the output of the FIFO into the receiving source. The leading edge of the SO signal is most appropriate because data is guaranteed to be stable prior to
and after the SO leading edge for each FIFO. This is a
solution for any number of FIFOs in parallel.
Any of the above solutions will ensure the correct operation of
a Cypress FIFO at 25 MHz. The specific implemen tation is left
to the designer and is dependent on the specific application
needs.
4
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