Cypress CY7C1546V18, CY7C1557V18, CY7C1548V18, CY7C1550V18 User Manual

72-Mbit DDR-II+ SRAM 2-Word Burst
Architecture (2.0 Cycle Read Latency)
CY7C1546V18, CY7C1557V18 CY7C1548V18, CY7C1550V18

Features

Note
1. The QDR consortium specification for V
DDQ
is 1.5V + 0.1V . The Cyp ress QDR devices exceed th e QDR consort ium sp ecificatio n and ar e cap able o f support ing V
DDQ
= 1.4V to VDD.

Functional Description

72-Mbit density (8M x 8, 8M x 9, 4M x 18, 2M x 36)
2-word burst for reducing address bus frequency
Double Data Rate (DDR) interfaces
(data transferred at 750 MHz) at 375 MHz
Available in 2.0 clock cycle latency
Two input clocks (K and K) for precise DDR timingSRAM uses rising edges only
Echo clocks (CQ and CQ) simplify data capture in high-speed
systems
Data valid pin (QVLD) to indicate valid data on the output
Synchronous internally self-timed writes
Core V
HSTL inputs and variable drive HSTL output buffers
Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)
Offered in both Pb-free and non Pb-free packages
JTAG 1149.1 compatible test access port
Delay Lock Loop (DLL) for accurate data placement
= 1.8V ± 0.1V; IO V
DD
= 1.4V to V
DDQ
DD
[1]

Configurations

The CY7C1546V18, CY7C1557V18, CY7C1548V18, and CY7C1550V18 are 1.8V Synchronous Pipelined SRAM equipped with DDR-II+ architecture. The DDR-II+ consists of an SRAM core with advanced synchronous peripheral circuitry. Addresses for read and write are latched on alternate rising edges of the input (K) clock. Write data is registered on the rising edges of both K and K of both K and K
. Read data is driven on the rising edges
. Each address location is associated with two 8-bit words (CY7C1546V18), 9-bit words (CY7C1557V18), 18-bit words (CY7C1548V18), or 36-bit words (CY7C 1550V18) that burst sequentially into or out of the device.
Asynchronous inputs include an output impedance matching input (ZQ). Synchronous data outputs (Q, sharing the same physical pins as the data inputs, D) are tightly matched to the two output echo clocks CQ/CQ
, eliminating the need for separately capturing data from each individual DDR SRAM in the system design.
All synchronous inputs pass through input registers controlled by the K or K registers controlled by the K or K
input clocks. All data outputs pass through output
input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
With Read Cycle Latency of 2.0 cycles:
CY7C1546V18 – 8M x 8 CY7C1557V18 – 8M x 9 CY7C1548V18 – 4M x 18 CY7C1550V18 – 2M x 36

Selection Guide

Maximum Operating Frequency 375 333 300 MHz Maximum Operating Current x8 1300 1200 1100 mA
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600 Document Number: 001-06550 Rev. *E Revised March 11, 2008
Description 375 MHz 333 MHz 300 MHz Unit
x9 1300 1200 1100 x18 1300 1200 1100 x36 1300 1200 1100
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Logic Block Diagram (CY7C1546V18)

CLK
A
(21:0)
Gen.
K
K
Control
Logic
Address Register
Read Add. Decode
Read Data Reg.
R/W
DQ
[7:0]
Output
Logic
Reg.
Reg.
Reg.
8
8
16
8
NWS
[1:0]
V
REF
Write Add. Decode
8
8
LD
Control
22
4M x 8 Array
4M x 8 Array
Write Reg
Write Reg
CQ CQ
R/W
DOFF
QVLD
8
CLK
A
(21:0)
Gen.
K
K
Control
Logic
Address Register
Read Add. Decode
Read Data Reg.
R/W
DQ
[8:0]
Output
Logic
Reg.
Reg.
Reg.
9
9
18
9
BWS
[0]
V
REF
Write Add. Decode
9
9
LD
Control
22
4M x 9 Array
4M x 9 Array
Write Reg
Write Reg
CQ CQ
R/W
DOFF
QVLD
9

Logic Block Diagram (CY7C1557V18)

Document Number: 001-06550 Rev. *E Page 2 of 28
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Logic Block Diagram (CY7C1548V18)

CLK
A
(20:0)
Gen.
K
K
Control
Logic
Address Register
Read Add. Decode
Read Data Reg.
R/W
DQ
[17:0]
Output
Logic
Reg.
Reg.
Reg.
18
18
36
18
BWS
[1:0]
V
REF
Write Add. Decode
18
18
LD
Control
21
2M x 18 Array
2M x 18 Array
Write Reg
Write Reg
CQ CQ
R/W
DOFF
QVLD
18
CLK
A
(19:0)
Gen.
K
K
Control
Logic
Address Register
Read Add. Decode
Read Data Reg.
R/W
DQ
[35:0]
Output
Logic
Reg.
Reg.
Reg.
36
36
72
36
BWS
[3:0]
V
REF
Write Add. Decode
36
36
LD
Control
20
1M x 36 Array
1M x 36 Array
Write Reg
Write Reg
CQ CQ
R/W
DOFF
QVLD
36

Logic Block Diagram (CY7C1550V18)

Document Number: 001-06550 Rev. *E Page 3 of 28
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Pin Configuration

Note
2. NC/144M and NC/288M are not connected to the die and can be tied to any voltage level.
The pin configuration for CY7C1546V18, CY7C1557V18, CY7C1548V18, and CY7C1550V18 follow.

165-Ball FBGA (15 x 17 x 1.4 mm) Pinout

CY7C1546V18 (8M x 8)
1 2 3 4 5 6 7 8 9 10 11
A CQ AAR/WNWS
1
B NC NC NC A NC/288M K NWS C NC NC NC V D NC NC NC V E NC NC DQ4 V F NC NC NC V G NC NC DQ5 V H DOFF V
REF
V
DDQ
V
J NC NC NC V K NC NC NC V L NC DQ6 NC V M NC NC NC V N NC NC NC V
SS
SS DDQ DDQ DDQ DDQ DDQ DDQ DDQ
SS
SS
AAAVSSNC NC NC
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
AAAVSSNC NC NC
P NC NC DQ7 A A QVLD A A NC NC NC R TDOTCKAAANCAAATMSTDI
K NC/144M LD AACQ
0
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
ANCNCDQ3
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
[2]
NC NC NC NC NC DQ2 NC NC NC NC NC NC
V
DDQ
V
REF
NC DQ1 NC NC NC NC NC NC DQ0 NC NC NC
ZQ
CY7C1557V18 (8M x 9)
1 2 3 4 5 6 7 8 9 10 11
A CQ AAR/WNC K NC/144M LD AACQ B NC NC NC A NC/288M K BWS C NC NC NC V D NC NC NC V E NC NC DQ4 V F NC NC NC V G NC NC DQ5 V H DOFF V
REF
V
DDQ
V
J NC NC NC V K NC NC NC V L NC DQ6 NC V M NC NC NC V N NC NC NC V
SS
SS DDQ DDQ DDQ DDQ DDQ DDQ DDQ
SS
SS
AAAVSSNC NC NC
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
AAAVSSNC NC NC
0
ANCNCDQ3
V V V V V V V
V
DDQ DDQ DDQ DDQ DDQ DDQ DDQ
V
SS
SS
NC NC NC NC NC DQ2 NC NC NC NC NC NC
V
DDQ
V
REF
NC DQ1 NC NC NC NC NC NC DQ0 NC NC NC
ZQ
P NC NC DQ7 A A QVLD A A NC NC DQ8 R TDOTCKAAANCAAATMSTDI
Document Number: 001-06550 Rev. *E Page 4 of 28
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Pin Configuration (continued)
The pin configuration for CY7C1546V18, CY7C1557V18, CY7C1548V18, and CY7C1550V18 follow.
165-Ball FBGA (15 x 17 x 1.4 mm) Pinout
CY7C1548V18 (4M x 18)
1 2 3 4 5 6 7 8 9 10 11
A CQ AAR/WBWS
1
B NC DQ9 NC A NC/288M K BWS C NC NC NC V D NC NC DQ10 V E NC NC DQ11 V F NC DQ12 NC V G NC NC DQ13 V H DOFF V
REF
V
DDQ
V
J NC NC NC V K NC NC DQ14 V L NC DQ15 NC V M NC NC NC V N NC NC DQ16 V
SS
SS DDQ DDQ DDQ DDQ DDQ DDQ DDQ
SS
SS
ANCAVSSNC DQ7 NC
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
AAAVSSNC NC NC
P NC NC DQ17 A A QVLD A A NC NC DQ0 R TDOTCKAAANCAAATMSTDI
K NC/144M LD AACQ
0
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
ANCNCDQ8
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
[2]
NC NC NC NC NC DQ6 NC NC DQ5 NC NC NC
V
DDQ
V
REF
NC DQ4 NC NC NC DQ3 NC NC DQ2 NC DQ1 NC
ZQ
CY7C1550V18 (2M x 36)
1 2 3 4 5 6 7 8 9 10 11
A CQ NC/144M A R/W BWS B NC DQ27 DQ18 A BWS C NC NC DQ28 V D NC DQ29 DQ19 V E NC NC DQ20 V F NC DQ30 DQ21 V G NC DQ31 DQ22 V H DOFF V
REF
V
DDQ
V
J NC NC DQ32 V K NC NC DQ23 V L NC DQ33 DQ24 V M NC NC DQ34 V N NC DQ35 DQ25 V
SS
SS DDQ DDQ DDQ DDQ DDQ DDQ DDQ
SS
SS
ANCAVSSNC DQ17 DQ7
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
AAAVSSNC NC DQ10
2 3
K BWS
LD AACQ
1
KBWS0ANCNCDQ8
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
V V V V V V V
V
DDQ DDQ DDQ DDQ DDQ DDQ DDQ
V
SS
SS
NC NC DQ16 NC DQ15 DQ6 NC NC DQ5 NC NC DQ14
V
DDQ
V
REF
ZQ NC DQ13 DQ4 NC DQ12 DQ3 NC NC DQ2 NC DQ11 DQ1
P NC NC DQ26 A A QVLD A A NC DQ9 DQ0 R TDOTCKAAANCAAATMSTDI
Document Number: 001-06550 Rev. *E Page 5 of 28
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Pin Definitions

Pin Name IO Pin Description
DQ
[x:0]
Input and
Output
Synchronous
LD Input
Synchronous
NWS
, NWS1Input
BWS BWS
0
BWS
,
0
, BWS
2
Synchronous
,
1
Synchronous
3
Input
Data Input or Output Signals. Inputs are sampled on the rising edge of K and K
clocks during valid write operations. These pins drive out the requested data during a read operation. Valid data is driven out on the rising edge of both the K and K deselected, Q CY7C1546V18 DQ CY7C1557V18 DQ CY7C1548V18 DQ CY7C1550V18 DQ
are automatically tri-stated.
[x:0]
[7:0] [8:0] [17:0] [35:0]
clocks during read operations. When read access is
Synchronous Load. Sampled on the rising edge of the K clock. This input is brought LOW when a bus cycle sequence is defined. This definition includes address and read or write direction. All trans­actions operate on a burst of 2 data. LD must meet the setup and hold times around edge of K.
Nibble Write Select 0, 1 Active LOW (CY7C1546V18 only). Sampled on the rising edge of the K
clocks during write operations. Used to select the nibble that is written into the device during
and K the current portion of the write operations. Nibbles not written remain unaltered. NWS
controls D
0
and NWS1 controls D
[3:0]
[7:4]
.
All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select ignores the corresponding nibble of data and does not write into the device.
Byte Write Select 0, 1, 2, an d 3 Active LOW. Sampled on the rising edge of the K and K clocks during write operations. Used to select the byte written into the device during the current portion of the write operations. Bytes not written remain unaltered. CY7C1557V18 BWS CY7C1548V18 BWS0 controls D CY7C1550V18 BWS0 controls D controls D
[35:27]
.
controls D
0
[8:0]
and BWS1 controls D
[8:0]
, BWS1 controls D
[8:0]
[17:9].
, BWS2 controls D
[17:9]
[26:18]
and BWS3
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select ignores the corresponding byte of data and does not write into the device.
A Input
Synchronous
Address Inputs. Sampled on the rising edge of the K clock during active read and write operations. These address inputs are multiplexed for both read and write operations. Internally, the device is organized as 8M x 8 (2 arrays each of 4M x 8) for CY7C1546V18, 8M x 9 (2 arrays each of 4M x 9) for CY7C1557V18, 4M x 18 (2 arrays each of 2M x 18) for CY7C1548V18, and 2M x 36 (2 arrays each of 1M x 36) for CY7C1550V18.
R/W
Input
Synchronous
Synchronous Read or Write Input. When LD is LOW, this input designates the access type (read when R/W
is HIGH, write when R/W is LOW) for loaded address. R/W must meet the setup and hold
times around edge of K.
QVLD Valid output
indicator
K Input
Clock
K
Input
Clock
Valid Outp ut Indicator. The Q V alid indicates valid output data. QVLD is edge aligned with CQ and CQ
.
Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device and to drive out data through Q edge of K.
when in single clock mode. All accesses are initiated on the rising
[x:0]
Negative Input Clock Input. K is used to capture synchronous data presented to the device and to drive out data through Q
when in single clock mode.
[x:0]
CQ Clock Output Synchronous Echo Clock Outputs. This is a free running clock and is synchronized to the input
clock (K) of the DDR-II+. The timing for the echo clocks is shown in Switching Characteristics on page 23.
CQ
Clock Output
Synchronous Echo Clock Outputs. This is a free running clock and is synchronized to the input clock (K) of the DDR-II+. The timing for the echo clocks is shown in Switching Characteristics on page 23.
Document Number: 001-06550 Rev. *E Page 6 of 28
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Pin Definitions (continued)
Pin Name IO Pin Description
ZQ Input Output Impedance Matching Input. This input is used to tune the device outputs to the system data
bus impedance. CQ, CQ connected between ZQ and ground. Alternatively, this pin is connected directly to V the minimum impedance mode. This pin is not connected directly to GND or left unconnected.
DOFF Input DLL Turn Off Active LOW . Connecting this pin to ground turns off the DLL inside the device. The
timing in the DLL turned off operation is different from that listed in this datasheet. For normal operation, this pin is connected to a pull up through a 10 Kohm or less pull up resistor. The device behaves in DDR-I mode when the DLL is turned off. In this mode, the device is operated at a frequency of up to 167 MHz with DDR-I timing.
TDO Output TDO for JTAG. TCK Input TCK Pin for JTAG. TDI Input TDI Pin for JTAG. TMS Input TMS Pin for JTAG. NC N/A Not Connected to the Die. Is tied to any voltage level. NC/72M N/A Not Connected to the Die. Is tied to any voltage level. NC/144M N/A Not Connected to the Die. Is tied to any voltage level. NC/288M N/A Not Connected to the Die. Is tied to any voltage level.
, and Q
output impedance are set to 0.2 x RQ, where RQ is a resistor
[x:0]
and enables
DDQ
V
V V V
REF
DD
SS
DDQ
Input
Reference
Power Supply Power Supply Inputs to the Core of the Device.
Ground Ground for the Device.
Power Supply Power Supply Inputs for the Outputs of the Device.
Reference Voltage Input. Static input is used to set the reference level for HSTL inputs, outputs, and AC measurement points.
Document Number: 001-06550 Rev. *E Page 7 of 28
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Functional Overview

The CY7C1546V18, CY7C1557V18, CY7C1548V18, and CY7C1550V18 are synchronous pipelined Burst SRAMs equipped with a DDR interface.
Accesses are initiated on the rising edge of the positive input clock (K). All synchronous input and output timing is referenced from the rising edge of the input clocks (K and K).
All synchronous data inputs (D controlled by the rising edge of the input clocks (K and K synchronous data outputs (Q controlled by the rising edge of the input clocks (K and K
All synchronous control (R/W, LD, NWS pass through input registers controlled by the rising edge of the input clock (K).
CY7C1548V18 is described in the following sections. The same basic descriptions apply to CY7C1546V18, CY7C1557V18, and CY7C1550V18.

Read Operations

The CY7C1548V18 is organized internally as two arrays of 2M x
18. Accesses are completed in a burst of two sequential 18-bit data words. Read operations are initiated by asserting R/W HIGH and LD LOW at the rising edge of the positive input clock (K). The address presented to the address inputs is stored in the read address register. Following the next two K clock rise, the corresponding 18-bit word of data from this address location is driven onto the Q the subsequent rising edge of K driven onto the Q the rising edge of the input clock (K and K
using K as the output timing reference. On
[17:0]
. The requested data is valid 0.45 ns from
[17:0]
internal logic, each read access must be allowed to complete. Read accesses can be initiated on every rising edge of the positive input clock (K).
When read access is deselected, the CY7C1548V18 first completes the pending read transactions. Synchronous internal circuitry automatically tri-states the output following the next rising edge of the positive input clock (K). This enables a seamless transition between devices without the insertion of wait states in a depth expanded memory.

Write Operations

Write operations are initiated by asserting R/W LOW and LD LOW at the rising edge of the positive input clock (K). The address presented to address inputs is stored in the write address register. On the following K clock rise, the data presented to D data register, provided BWS subsequent rising edge of the negative input clock (K mation presented to D register, provided BWS of data are then written into the memory array at the specified location. Write accesses can be initiated on every rising edge of
is latched and stored into the 18-bit write
[17:0]
[17:0]
[1:0]
) pass through input registers
[x:0]
) pass through output registers
[x:0]
BWS
[x:0],
[x:0]
). All
).
) inputs
, the next 18-bit data word is
). To maintain the
are both asserted active. On the
[1:0]
), the infor-
is also stored into the write data
are both asserted active. The 36 bits
the positive input clock (K). Doing so pipelines the data flow such that 18 bits of data is transferred into the device on every rising edge of the input clocks (K and K
).
When the write access is deselected, the device ignores all inputs after the pending write operations are completed.

Byte Write Operations

Byte write operations are supported by the CY7C1548V18. A write operation is initiated as described in the Write Operations section. The bytes that are written are determined by BWS
, which are sampled with each set of 18-bit data words.
BWS
1
Asserting the appropriate Byte Write Select input during the data
and
0
portion of a write latches the data being presented and writes it into the device. Deasserting the Byte Write Select input during the data portion of a write enables the data stored in the device for that byte to remain unaltered. This feature can be used to simplify read, modify, or write operations to a byte write operation.

Double Date Rate Operation

The CY7C1548V18 enables high-performance operation through high clock frequencies (achieved through pipelining) and DDR mode of operation. The CY7C1548V18 requires a minimum of two No Operation (NOP) cycle during transition from a read to a write cycle. At higher frequencies, some applications require third NOP cycle to avoid contention.
If a read occurs after a write cycle, address and data for the write are stored in registers. The write information is stored because the SRAM cannot perform the last word write to the array without conflicting with the read. The data stays in this register until the next write cycle occurs. On the first write cycle after the read(s), the stored data from the earlier write is written into the SRAM array. This is called a Posted write.
If a read is performed on the same address on which a write is performed in the previous cycle, the SRAM reads out the most current data. The SRAM does this by bypassing the memory array and reading the data from the registers.

Depth Expansion

Depth expansion requires replicating the LD control signal for each bank. All other control signals can be common between banks as appropriate.

Programmable Impedance

An external resistor, RQ, must be connected between the ZQ pin on the SRAM and V driver impedance. The value of RQ must be 5x the value of the intended line impedance driven by the SRAM. The allowable range of RQ to guarantee impedance matching with a tolerance of ±15% is between 175Ω and 350Ω output impedance is adjusted every 1024 cycles upon power up to account for drifts in supply voltage and temperature.
to allow the SRAM to adjust its output
SS
, with V
=1.5V. The
DDQ
Document Number: 001-06550 Rev. *E Page 8 of 28
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Echo Clocks

Echo clocks are provided on the DDR-II+ to simplify data capture on high-speed systems. Two echo clocks are generated by the DDR-II+. CQ is referenced with respect to K and CQ is refer­enced with respect to K
. These are free-running clocks and are synchronized to the input clock of the DDR-II+. The timing for the echo clocks is shown in Switching Characteristics on page 23.

Valid Data Indicator (QVLD)

QVLD is provided on the DDR-II+ to simplify data capture on high speed systems. The QVLD is generated by the DDR-II+ device along with data output. This signal is also edge aligned with the echo clock and follows the timing of any data pin. This signal is asserted half a cycle before valid data arrives.

Application Example

Figure 1 shows two DDR-II+ used in an application.
Figure 1. Application Example
DLL
These chips use a Delay Lock Loop (DLL) that is designed to function between 120 MHz and the specified maximum clock frequency. The DLL may be disabled by applying ground to the DOFF
pin. When the DLL is turned off, the device behaves in DDR-I mode (with 1.0 cycle latency and a longer access time). For more information, refer to the application note, “DLL Consid­erations in QDRII/DDRII/QDRII+/DDRII+”. The DLL can also be reset by slowing or stopping the input clocks K and K minimum of 30ns. However, it is not necessary to reset the DLL to lock to the desired frequency. During Power-up, when the DOFF
is tied HIGH, the DLL gets locked after 2048 cycles of stable clock.
for a
BUS
MASTER
(CPU or ASIC)
Echo Clock1/Echo Clock1 Echo Clock2/Echo Clock2
Addresses
Cycle Start
R/W Source CLK Source CLK
DQ
DQ A
SRAM#1
LD R/W
ZQ
CQ/CQ
K
K
R = 250ohms
DQ A
SRAM#2
LD R/W
ZQ
CQ/CQ
K
K
R = 250ohms
Document Number: 001-06550 Rev. *E Page 9 of 28
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