■ 72-Mbit Density (8M x 8, 8M x 9, 4M x 18, 2M x 36)
■ 333 MHz Clock for High Bandwidth
■ 2-word Burst for reducing Address Bus Frequency
■ Double Data Rate (DDR) Interfaces
(data transferred at 666 MHz) at 333 MHz
■ Two Input Clocks (K and K) for precise DDR Timing
❐ SRAM uses rising edges only
■ Two Input Clocks for Output Data (C and C) to minimize Clock
Skew and Flight Time mismatches
■ Echo Clocks (CQ and CQ) simplify Data Capture in High Speed
Systems
■ Synchronous Internally Self-timed Writes
■ DDR-II operates with 1.5 Cycle Read Latency when DOFF is
asserted HIGH
■ Operates similar to DDR-I Device with 1 Cycle Read Latency
when DOFF
■ 1.8V Core Power Supply with HSTL Inputs and Outputs
■ Variable Drive HSTL Output Buffers
■ Expanded HSTL Output Voltage (1.4V–V
❐ Supports both 1.5V and 1.8V IO supply
■ Available in 165-Ball FBGA Package (13 x 15 x 1.4 mm)
■ Offered in both Pb-free and non Pb-free Packages
■ JTAG 1149.1 compatible Test Access Port
■ Phase Locked Loop (PLL) for Accurate Data Placement
is asserted LOW
DD
)
The CY7C1516KV18, CY7C1527KV18, CY7C1518KV18, and
CY7C1520KV18 are 1.8V Synchronous Pipelined SRAM
equipped with DDR-II architecture. The DDR-II consists of an
SRAM core with advanced synchronous peripheral circuitry and
a 1-bit burst counter. Addresses for read and write are latched
on alternate rising edges of the input (K) clock. Write data is
registered on the rising edges of both K and K
driven on the rising edges of C and C
edge of K and K
if C/C are not provided. Each address location
if provided, or on the rising
. Read data is
is associated with two 8-bit words in the case of CY7C1516KV18
and two 9-bit words in the case of CY7C1527KV18 that burst
sequentially into or out of the device. The burst counter always
starts with a “0” internally in the case of CY7C1516KV18 and
CY7C1527KV18. On CY7C1518KV18 and CY7C1520KV18, the
burst counter takes in the least significant bit of the external
address and bursts two 18-bit words in the case of
CY7C1518KV18 and two 36-bit words in the case of
CY7C1520KV18 sequentially into or out of the device.
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs D) are tightly matched to the two
output echo clocks CQ/CQ
, eliminating the need for separately
capturing data from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
All synchronous inputs pass through input registers controlled by
the K or K
registers controlled by the C or C
input clocks. All data outputs pass through output
(or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
CInput ClockPositive Input Clock for Output Data. C is used in conjunction with C
C
KInput ClockPositive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device
K
,
0
1
,
0
,
1
,
2
3
Input OutputSynchronous
Data Input Output Signals. Inputs are sampled on the rising edge of K and K clocks during valid write
operations. These pins drive out the requested data when the read operation is active. Valid data is driven
out on the rising edge of both the C and C
mode. When read access is deselected, Q
CY7C1516KV18 − DQ
CY7C1527KV18 − DQ
CY7C1518KV18 − DQ
CY7C1520KV18 − DQ
[7:0]
[8:0]
[17:0]
[35:0]
clocks during read operations or K and K when in single clock
are automatically tristated.
[x:0]
Synchronous Load. This input is brought LOW when a bus cycle sequence is defined. This definition
Synchronous
Input-
Synchronous
includes address and read/write direction. All transactions operate on a burst of 2 data.
Nibble Write Select 0, 1 − Active LOW(CY7C1516KV18 Only). Sampled on the rising edge of the K
and K
clocks during write operations. Used to select which nibble is written into the device during the
current portion of the write operations. Nibbles not written remain unaltered.
NWS0 controls D
All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select
and NWS1 controls D
[3:0]
[7:4]
.
ignores the corresponding nibble of data and it is not written into the device.
Input-
Synchronous
Byte Write Select 0, 1, 2, and 3 − Active LOW. Sampled on the rising edge of the K and K clocks during
write operations. Used to select which byte is written into the device during the current portion of the write
operations. Bytes not written remain unaltered.
CY7C1527KV18 − BWS
CY7C1518KV18 − BWS0 controls D
CY7C1520KV18 − BWS0 controls D
.
D
[35:27]
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
controls D
0
[8:0]
and BWS1 controls D
[8:0]
, BWS1 controls D
[8:0]
[17:9].
, BWS2 controls D
[17:9]
and BWS3 controls
[26:18]
ignores the corresponding byte of data and it is not written into the device.
Address Inputs. These address inputs are multiplexed for both read and write operations. Internally, the
Synchronous
device is organized as 8M x 8 (2 arrays each of 4M x 8) for CY7C1516KV18 and 8M x 9 (2 arrays each
of 4M x9) for CY7C1527KV18, 4M x 18 (2 arrays each of 2M x 18) for CY7C1518KV18, and 2M x 36 (2
arrays each of 1M x 36) for CY7C1520KV18.
CY7C1516KV18 – Since the least significant bit of the address internally is a “0,” only 22 external address
inputs are needed to access the entire memory array.
CY7C1527KV18 – Since the least significant bit of the address internally is a “0,” only 22 external address
inputs are needed to access the entire memory array.
CY7C1518KV18 – A0 is the input to the burst counter. These are incremented in a linear fashion internally.
22 address inputs are needed to access the entire memory array.
CY7C1520KV18 – A0 is the input to the burst counter. These are incremented in a linear fashion internally.
21 address inputs are needed to access the entire memory array. All the address inputs are ignored when
the appropriate port is deselected.
Input-
Synchronous
Synchronous Read or Write Input. When LD is LOW, this input designates the access type (read when
R/W
is HIGH, write when R/W is LOW) for loaded address. R/W must meet the setup and hold times
around edge of K.
to clock out the read data from
the device. C and C
can be used together to deskew the flight times of various devices on the board back
to the controller. See application example for further details.
Input ClockNegative Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C
can be used together to deskew the flight times of various devices on the board back
to the controller. See application example for further details.
and to drive out data through Q
edge of K.
when in single clock mode. All accesses are initiated on the rising
[x:0]
Input ClockNegative Input Clock Input. K is used to capture synchronous data being presented to the device and
CQOutput Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
for output data (C) of the DDR-II. In the single clock mode, CQ is generated with respect to K. The timing
for the echo clocks is shown in the AC Timing table.
CQ
ZQInputOutput Impedance Matching Input. This input is used to tune the device outputs to the system data bus
DOFF
TDOOutputTDO for JTAG.
TCKInputTCK Pin for JTAG.
TDIInputTDI Pin for JTAG.
TMSInputTMS Pin for JTAG.
NCN/ANot Connected to the Die. Can be tied to any voltage level.
NC/144MInputNot Connected to the Die. Can be tied to any voltage level.
NC/288MInputNot Connected to the Die. Can be tied to any voltage level.
V
REF
V
DD
V
SS
V
DDQ
Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
InputPLL Turn Off − Active LOW. Connecting this pin to ground turns off the PLL inside the device. The timing
Input-
Reference
Power Supply Power supply Inputs to the Core of the Device.
GroundGround for the Device.
Power Supply Power Supply Inputs for the Outputs of the Device.
for output data (C
for the echo clocks is shown in the AC Timing table.
impedance. CQ, CQ, and Q
between ZQ and ground. Alternatively, this pin can be connected directly to V
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
in the PLL turned off operation differs from those listed in this data sheet. For normal operation, this pin
is connected to a pull up through a 10 KΩ or less pull up resistor. The device behaves in DDR-I mode
when the PLL is turned off. In this mode, the device can be operated at a frequency of up to 167 MHz
with DDR-I timing.
Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
) of the DDR-II. In the single clock mode, CQ is generated with respect to K. The timing
output impedance are set to 0.2 x RQ, where RQ is a resistor connected
The CY7C1516KV18, CY7C1527KV18, CY7C1518KV18, and
CY7C1520KV18 are synchronous pipelined Burst SRAMs
equipped with a DDR interface, which operates with a read
latency of one and a half cycles when DOFF
When DOFF
pin is set LOW or connected to VSS the device
behaves in DDR-I mode with a read latency of one clock cycle.
Accesses are initiated on the rising edge of the positive input
clock (K). All synchronous input timing is referenced from the
rising edge of the input clocks (K and K
referenced to the rising edge of the output clocks (C/C
when in single clock mode).
All synchronous data inputs (D
controlled by the rising edge of the input clocks (K and K
synchronous data outputs (Q
controlled by the rising edge of the output clocks (C/C
) pass through input registers
[x:0]
) pass through output registers
[x:0]
when in single clock mode).
All synchronous control (R/W, LD, BWS
input registers controlled by the rising edge of the input clock (K).
CY7C1518KV18 is described in the following sections. The
same basic descriptions apply to CY7C1516KV18,
CY7C1527KV18, and CY7C1520KV18.
Read Operations
The CY7C1518KV18 is organized internally as a two arrays of
2M x 18. Accesses are completed in a burst of 2 sequential 18-bit
data words. Read operations are initiated by asserting R/W
HIGH and LD LOW at the rising edge of the positive input clock
(K). The address presented to address inputs is stored in the
read address register and the least significant bit of the address
is presented to the burst counter. The burst counter increments
the address in a linear fashion. Following the next K clock rise,
the corresponding 18-bit word of data from this address location
is driven onto the Q
On the subsequent rising edge of C the next 18-bit data word
using C as the output timing reference.
[17:0]
from the address location generated by the burst counter is
driven onto the Q
the rising edge of the output clock (C or C
. The requested data is valid 0.45 ns from
[17:0]
single clock mode, 200 MHz, 250 MHz, and 300 MHz device). To
maintain the internal logic, each read access must be allowed to
complete. Read accesses can be initiated on every rising edge
of the positive input clock (K).
When read access is deselected, the CY7C1518KV18 first
completes the pending read transactions. Synchronous internal
circuitry automatically tristates the output following the next rising
edge of the positive output clock (C). This enables for a transition
between devices without the insertion of wait states in a depth
expanded memory.
Write Operations
Write operations are initiated by asserting R/W LOW and LD
LOW at the rising edge of the positive input clock (K). The
address presented to address inputs is stored in the write
address register and the least significant bit of the address is
presented to the burst counter. The burst counter increments the
address in a linear fashion. On the following K clock rise, the data
presented to D
is latched and stored into the 18-bit write
[17:0]
pin is tied HIGH.
) and all output timing is
, or K/K
). All
, or K/K
) inputs pass through
[0:X]
, or K and K when in
data register, provided BWS
subsequent rising edge of the Negative Input Clock (K
mation presented to D
register, provided BWS
of data are then written into the memory array at the specified
[17:0]
[1:0]
are both asserted active. On the
[1:0]
) the infor-
is also stored into the write data
are both asserted active. The 36 bits
location. Write accesses can be initiated on every rising edge of
the positive input clock (K). Doing so pipelines the data flow such
that 18 bits of data can be transferred into the device on every
rising edge of the input clocks (K and K
).
When the write access is deselected, the device ignores all
inputs after the pending write operations have been completed.
Byte Write Operations
Byte write operations are supported by the CY7C1518KV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS
, which are sampled with each set of 18-bit data words.
BWS
1
Asserting the appropriate Byte Write Select input during the data
and
0
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature is used to simplify
read, modify, or write operations to a byte write operation.
Single Clock Mode
The CY7C1518KV18 is used with a single clock that controls
both the input and output registers. In this mode, the device
recognizes only a single pair of input clocks (K and K
) that control
both the input and output registers. This operation is identical to
the operation if the device had zero skew between the K/K and
C/C
clocks. All timing parameters remain the same in this mode.
To use this mode of operation, the user must tie C and C
HIGH
at power on. This function is a strap option and not alterable
during device operation.
DDR Operation
The CY7C1518KV18 enables high-performance operation
through high clock frequencies (achieved through pipelining) and
DDR mode of operation. The CY7C1518KV18 requires a single
No Operation (NOP) cycle during transition from a read to a write
cycle. At higher frequencies, some applications may require a
second NOP cycle to avoid contention.
If a read occurs after a write cycle, address and data for the write
are stored in registers. The write information must be stored
because the SRAM cannot perform the last word write to the
array without conflicting with the read. The data stays in this
register until the next write cycle occurs. On the first write cycle
after the read(s), the stored data from the earlier write is written
into the SRAM array. This is called a posted write.
If a read is performed on the same address on which a write is
performed in the previous cycle, the SRAM reads out the most
current data. The SRAM does this by bypassing the memory
array and reading the data from the registers.
Depth Expansion
Depth expansion requires replicating the LD control signal for
each bank. All other control signals can be common between
banks as appropriate.
An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and V
driver impedance. The value of RQ must be 5x the value of the
intended line impedance driven by the SRAM. The allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175Ω and 350Ω
output impedance is adjusted every 1024 cycles upon power up
to account for drifts in supply voltage and temperature.
to allow the SRAM to adjust its output
SS
, with V
=1.5V. The
DDQ
Echo Clocks
Echo clocks are provided on the DDR-II to simplify data capture
on high speed systems. Two echo clocks are generated by the
DDR-II. CQ is referenced with respect to C and CQ is referenced
with respect to C
. These are free running clocks and are synchronized to the output clock of the DDR-II. In single clock mode, CQ
is generated with respect to K and CQ is generated with respect
to K
. The timing for the echo clocks is shown in the Switching
Characteristics on page 23.
Application Example
Figure 1 shows two DDR-II used in an application.
Figure 1. Application Example
PLL
These chips use a PLL that is designed to function between
120 MHz and the specified maximum clock frequency. During
power up, when the DOFF is tied HIGH, the PLL is locked after
20 μs of stable clock. The PLL can also be reset by slowing or
stopping the input clock K and K
However, it is not necessary to reset the PLL to lock to the
desired frequency. The PLL automatically locks 20 μs after a
stable clock is presented. The PLL may be disabled by applying
ground to the DOFF pin. When the PLL is turned off, the device
behaves in DDR-I mode (with one cycle latency and a longer
access time).
for a minimum of 30 ns.
Document Number: 001-00437 Rev. *EPage 9 of 30
[+] Feedback
Loading...
+ 21 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.