Cypress CY7C1462AV33, CY7C1460AV33, CY7C1464AV33 User Manual

CY7C1460AV33
a b c d
C
CY7C1462AV33 CY7C1464AV33
36-Mbit (1M x 36/2M x 18/512K x 72)
Pipelined SRAM with NoBL™ Architecture
Features
• Pin-compatible and functionally equivalent to ZBT™
• Internally self-timed output buffer control to eliminate the need to use asynchronous OE
• Fully registered (inputs and outputs) for pipelined operation
• Byte Write capability
• 3.3V power supply
• 3.3V/2.5V I/O power supply
• Fast clock-to-output times — 2.6 ns (for 250-MHz device)
• Clock Enable (CEN
) pin to suspend operation
• Synchronous self-timed writes
• CY7C1460AV33, CY7C1462AV33 available in JEDEC-standard lead-free 100-pin TQFP, lead-free and non-lead-free 165-ball FBGA package. CY7C1464AV33 available in lead-free and non-lead-free 209-ball FBGA package
• IEEE 1149.1 JTAG-Compatible Boundary Scan
• Burst capability—linear or interleaved burst order
• “ZZ” Sleep Mode option and Stop Clock option
Logic Block Diagram-CY7C1460AV33 (1M x 36)
A0, A1, A
MODE
CLK
C
EN
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADV/LD
C
WRITE ADDRESS
REGISTER 2
A1
D1D0Q1
A0
BURST LOGIC
Functional Description
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are
3.3V , 1M x 36/2M x 18/512K x72 Synchronous pipelined burst SRAMs with No Bus Latency™ (NoBL™) logic, respectively. They are designed to support unlimited true back-to-back Read/Write operations with no wait states. The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are equipped with the advanced (NoBL) logic requi red to enable consecutive Read/Write operations with data being trans­ferred on every clock cycle. This feature dramatically improves the throughput of data in systems that require frequent Write/Read transitions. The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are pin compatible and functionally equivalent to ZBT devices.
All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The clock input is qualified by the Clock Enable (CEN which when deasserted suspends operation and extends the previous clock cycle.
Write operations are controlled by the Byte Write Selects
–BWh for CY7C1464AV33, BWa–BWd for
(BW
a
CY7C1460AV33 and BW Write Enable (WE
) input. All writes are conducted with on-chip
synchronous self-timed write circuitry. Three synchronous Chip Enables (CE
asynchronous Output Enable (OE selection and output tri-state control. In order to avoid bus contention, the output drivers are synchronously tri-stated during the data portion of a write sequence.
A1' A0'
Q0
–BWb for CY7C1462AV33) and a
a
, CE2, CE3) and an
1
) provide for easy bank
) signal,
O
S
U T
E
P
N
U T
INPUT
S E
R E G
A
I
M
S T
P
E
S
R S
E
E
REGISTER 0
ADV/LD
BW
a
BW
b
BW
c
BW
d
WE
OE CE1 CE2 CE3
ZZ
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
READ LOGIC
SLEEP
CONTROL
WRITE
DRIVERS
MEMORY
ARRAY
REGISTER 1
INPUT
O
D
U T
A
P
T
U
A
T B
S T E E R
I N G
E
DQs
U
DQP
F
DQP
F
DQP
E
DQP
R S
E
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600 Document #: 38-05353 Rev. *D Revised June 22, 2006
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C
C
s P
a
P
b
P
c
P
d
P
e
P
f
P
g
P
h
C C
Logic Block Diagram-CY7C1462AV33 (2M x 18)
A0, A1, A
MODE
C
LK EN
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADV/LD
C
WRITE ADDRESS
REGISTER 2
A1
D1D0Q1
A0
BURST LOGIC
CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
A1' A0'
Q0
ADV/LD
BW BW
a
b
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
WE
OE CE1 CE2 CE3
ZZ
READ LOGIC
Sleep
Control
Logic Block Diagram-CY7C1464AV33 (512K x 72)
A0, A1, A
MODE
C
LK
EN
ADV/LD
BW
a
BW
b
BW
c
BW
d
BW
e
BW
f
BW
g
BW
h
WE
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
A1 A0
ADV/LD
C
WRITE ADDRESS
REGISTER 2
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
D1D0Q1
BURST LOGIC
Q0
WRITE
DRIVERS
A1'
A0'
WRITE
DRIVERS
MEMORY
ARRAY
INPUT
REGISTER 1
E
MEMORY
ARRAY
INPUT
REGISTER 1
O U T P
S
U
E
T
N S
R
E
E G
A
I
M
S
P
T
S
E R S
E
REGISTER 0
S E N S E
A
M
P S
E
O U T P U T
R E G
I S T E R S
E
INPUT
D A T A
S T E E R
I N G
INPUT
REGISTER 0
O U T P U T
B
DQs
U F
DQP
F
DQP
E R S
E
E
O U T P
D
U
A
T
T A
B
DQ
U
S
F
T E E R
I N G
DQ
F
DQ
E R
DQ
S
DQ DQ
E
DQ DQ DQ
E
OE CE1 CE2 CE3
ZZ
Selection Guide
READ LOGIC
Sleep
Control
250 MHz 200 MHz 167 MHz Unit
Maximum Access Time 2.6 3.2 3.4 ns Maximum Operating Current 475 425 375 mA Maximum CMOS Standby
Current
120 120 120 mA
Document #: 38-05353 Rev. *D Page 2 of 27
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Pin Configurations
a
100-pin TQFP Pinout
CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
DQPc
DQc
DQc
V
DDQ
V
DQc DQc
DQc DQc
V
SS
V
DDQ
DQc
DQc
NC
V
DD
NC
V
SS
DQd DQd
V
DDQ
V
SS
DQd DQd DQd
DQd
V
V
DDQ
DQd DQd
DQPd
1CE2
A
A
CE
BWd
BWc
3
CE
VDDV
SS
CLKWECEN
BWa
BWb
100999897969594939291908988878685848382
1 2 3 4 5
SS
6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
SS
26 27 28 29 30
CY7C1460AV33
(1M × 36)
31323334353637383940414243444546474849
OE
ADV/LD
A
A
A
A
81
DDQ SS
SS DDQ
SS
DD
DDQ SS
SS DDQ
NC NC NC
V
DDQ
V
NC
NC DQb DQb
V
SS
V
DDQ
DQb DQb
NC
V
DD
NC
V DQb DQb
V
DDQ
V DQb
DQb
DQPb
NC
V
V
DDQ
NC NC NC
SS
SS
SS
SS
DQPb
80
DQb
79
DQb
78
V
77
V
76
DQb
75
DQb
74
DQb
73
DQb
72
V
71
V
70
DQb
69
DQb
68
V
67
NC
66
V
65
ZZ
64
DQa
63
DQa
62
V
61
V
60
DQa
59
DQa
58
DQa
57
DQa
56
V
55
V
54
DQa
53
DQa
52
DQPa
51
50
1CE2
A
A
CE
100999897969594939291908988878685848382
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
31323334353637383940414243444546474849
bBWa
3
BW
NC
NC
VDDVSSCLKWECEN
CE
CY7C1462AV33
(2M × 18)
OE
ADV/LD
A
A
A
A
81
A
80
NC
79
NC
78
V
77
DDQ
V
SS
76
NC
75
DQP
74
DQa DQa V
SS
V
DDQ
DQa DQa V
SS
NC V
DD
ZZ DQa DQa V
DDQ
V
SS
DQa DQa NC NC V
SS
V
DDQ
NC NC NC
73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
50
AAA
MODE
0
A
A1A
NC/288M
NC/144M
SS
DD
V
V
NC/72M
AAA
A
A
A
A
A
A
AAA
MODE
1A0
A
NC/288M
NC/144M
AAA
A
A
DD
SS
V
V
A
NC/72M
A
A
Document #: 38-05353 Rev. *D Page 3 of 27
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Pin Configurations (continued)
234 5671
A B C
D E
F G H
J K
L M
N P
R
A
B
C
D
E
F G
H
J K L
M
N P
R
NC/576M
NC/1G
DQP
c
DQ
c
DQ
c
DQ
c
DQ
c
NC
DQ
d
DQ
d
DQ
d
DQ
d
DQP
d
NC/144M
MODE
NC/576M
NC/1G
NC NC
NC V NC NC
NC
DQ
b
DQ
b
DQ
b
DQ
b
DQP
b
NC/144M
MODE
A A
NC
DQ
c
DQ
c
DQ
c
DQ
c
NC
DQ
d
DQ
d
DQ
d
DQ
d
NC
NC/72M
A
2345671
A A
NC
DQ
b
DQ
b
DQ
b
DQ
b
NC NC NC NC
NC NC
NC/72M
A
CE
CE2 V V V V V
NC
V V V V V
CE
CE2
V V
V V V
NC
V V V V V
165-ball FBGA (15 x 17 x 1.4 mm) Pinout
CY7C1460AV33 (1M × 36)
DDQ DDQ
DDQ DDQ DDQ
DDQ DDQ DDQ DDQ DDQ
A A
DDQ DDQ
DDQ DDQ DDQ
DDQ DDQ DDQ DDQ DDQ
A A
BW
1
BW
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
A
A
BW
c
BW
d
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
TDI
TMS
CY7C1462AV33 (2M × 18)
BW
1
b
NC
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
A
A
NC
BW
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
TDI
TMS
CE
b
CLK
a
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
A1
CEN
3
WE
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
TDO TCKA0
CE
CLK
a
V
SS
V
SS SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
A1
CEN
3
WE
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
TDO TCKA0
CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
891011
A AADV/LD
OE A
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V V
V V V
V V V V V
A
A
DDQ DDQ
DDQ DDQ DDQ
NC
DDQ DDQ DDQ DDQ DDQ
A
A
A
NC DQP
DQ
b
DQ
b
DQ
b
DQ
b
NC
DQ
a
DQ
a
DQ
a
DQ
a
NC
A
891011
ADV/LD
OE
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD DD
V
DD
V
DD
V
DD
V
SS
A
A
A A
A
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
NC
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
A
A
A NC DQP NC NC NC NC
NC
DQ
a
DQ
a
DQ
a
DQ
a
NC
A
NC
NC
b
DQ
b
DQ
b
DQ
b
DQ
b
ZZ
DQ
a
DQ
a
DQ
a
DQ
a
DQP
a
NC/288M
AA
A NC
a
DQ
a
DQ
a
DQ
a
DQ
a
ZZ NCV NC NC
NC NC
NC/288M
AA
Document #: 38-05353 Rev. *D Page 4 of 27
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Pin Configurations (continued)
123456789 1110
DQg
A B C D E F G H J K L M N P R T U V W
DQg
DQg DQg DQPg
DQc
DQc
DQc
DQc
NC DQh
DQh DQh
DQh
DQPd
DQd DQd
DQd DQd
DQg
DQg
DQg DQg
DQPc
DQc
DQc DQc
DQc
NC
DQh DQh DQh
DQh DQPh
DQd
DQd DQd DQd
CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
209-ball FBGA (14 x 22 x 1.76 mm) Pinout
CY7C1464AV33 (512K x 72)
SS
DD
SS
CE
3
BWS
BWS
NC
V
V
SS
V
DDQ
V
V
DDQ
DDQ
SS
BWS
b
BWS
e
V
V V V
V V
NC
V
V
V
V V
DDQ
SS
DDQ
SS
DDQ
NC
V
V V
V V V
AA
CE
AA AA
BWS
c
BWS
h
V
SS
V
DDQ
V
SS
V
DDQ
V
SS
V
DDQ
CLK V
DDQ
V
SS
V
DDQ
V
SS
V
DDQ
V
SS
NC/144M
2
BWS
g
NC/576M
BWS
d
DDQ
SS
DDQ
SS
DDQ
DDQ
SS
DDQ
SS
DDQ
NC/1G
V
V V
V
NC
V
V
V
V V
NC
V
V V
V V NC MODE
A
NC/72M A NC/288M
AA
TMS
TDI TDO TCK
ADV/LD
V
V V
V V V
V V
V
V
V
NC
A NC NC
DD
SS
DD
DD
SS
DD
SS
DD
NC
DD
V
V
V
V
V
V
V NC
SS
DD
SS
DD
SS
DD
SS
DD
SS
DD
WE CE OE
V
DD
NC NC
NC NC
CEN
NC
NC
NC
ZZ V
DD
1
AA
A
AA
A1 A0
A
SS
DDQ
SS
DDQ
SS
DDQ
NC
DDQ
SS
DDQ
SS
DDQ
SS
DQb
DQb
f
DQb
a
DQb DQPf
DQf DQf
DQf
DQf NC
DQa DQa
DQa DQa
DQPa
DQe DQe
DQe DQe
DQb
DQb
DQb DQb
DQPb
DQf
DQf DQf
DQf
NC
DQa DQa DQa
DQa DQPe
DQe
DQe DQe DQe
Pin Definitions
Pin Name I/O Type Pin Description
A0 A1 A
BW
a
BW
b
BW
c
BW
d
BW
e
BW
f
BW
g
BW
h
WE Input-
ADV/LD
Document #: 38-05353 Rev. *D Page 5 of 27
Input-
Synchronous
Input-
Synchronous
Synchronous
Input-
Synchronous
Address Inputs used to select one of the address locations. Sampled at the rising edge of the CLK.
Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BW
, BWc controls DQc and DQPc, BWd controls DQd and DQPd, BWe controls DQe and
DQP
b
DQP
, BWf controls DQf and DQPf, BWg controls DQg and DQPg, BWh controls DQh and
e
DQP
.
h
controls DQa and DQPa, BWb controls DQb and
a
Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence.
Advance/Load Input used to advance the on-chip address coun ter or load a new address. When HIGH (and CEN
is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address.
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CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
Pin Definitions (continued)
Pin Name I/O Type Pin Description
CLK Input-
Clock
CE
CE
CE
OE
1
2
3
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
Input-
Asynchronous
CEN
Input-
Synchronous
DQ
a
DQ
b
DQ
c
DQ
d
DQ
e
DQ
f
DQ
g
DQ
h
DQP
DQP
a,
DQPc,DQP DQPe,DQP DQPg,DQP
b, d f h
I/O-
Synchronous
I/O-
Synchronous
MODE Input Strap Pin Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst
TDO JTAG serial output
Synchronous
TDI JTAG serial input
Synchronous
TMS T est Mode Select
Synchronous TCK JTAG-Clock Clock input to the JTAG circuitry. V V V
DD DDQ SS
Power Supply Power supply inputs to the core of the device.
I/O Power Supply Power supply for the I/O circuitry.
Ground Ground for the device. Should be connected to ground of the system. NC N/A No connects. This pin is not connected to the die. NC/72M N/A Not connected to the die. Can be tied to any voltage level.
NC/144M N/A Not connected to the die. Can be tied to any voltage level. NC/288M N/A Not connected to the die. Can be tied to any voltage level. NC/576M N/A Not connected to the die. Can be tied to any voltage level. NC/1G N/A Not connected to the die. Can be tied to any voltage level.
ZZ Input-
Asynchronous
Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN
. CLK is only recognized if CEN is active LOW.
Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE
and CE3 to select/deselect the device.
2
Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE
and CE3 to select/deselect the device.
1
Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE
and CE2 to select/deselect the device.
1
Output Enable, active LOW . Combined with the synchronous logic block inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE masked during the data portion of a write sequence, during the first clock when emerging from a deselected state and when the device has been deselected.
Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN
can be used to extend the previous cycle when required.
Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A direction of the pins is controlled by OE LOW, the pins can behave as outputs. When HIGH, DQ condition. The outputs are automatically tri-stated during the data portion of a write
during the previous clock rise of the read cycle. The
X
and the internal control logic. When OE is asserted
–DQd are placed in a tri-state
a
sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE
Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ During write sequences, DQP controlled by BW controlled by BW
, and DQPd is controlled by BWd, DQPe is controlled by BWe, DQPf is
c
, DQPg is controlled by BWg, DQPh is controlled by BWh.
f
is controlled by BWa, DQPb is controlled by BWb, DQPc is
a
.
[31:0]
order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating MODE will default HIGH, to an interleaved burst order.
Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK.
Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK.
This pin controls the Test Access Port state machine. Sampled on the rising edge of
TCK.
ZZ “sleep” Input. This active HIGH input places the device in a non-time critical “sleep” condition with data integrity preserved. During normal operation, this pin can be connected
or left floating. ZZ pin has an internal pull-down.
to V
SS
is
.
Document #: 38-05353 Rev. *D Page 6 of 27
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CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
Functional Overview
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are synchronous-pipelined Burst NoBL SRAMs desig ned specifi­cally to eliminate wait states during Write/Read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the Clock Enable input signal (CEN
). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (t
) is 2.6 ns (250-MHz device).
CO
Accesses can be initiated by asserting all three Chip Enables (CE
, CE2, CE3) active at the rising edge of the clock. If Clock
1
Enable (CEN
) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the Write Enable (WE conduct byte write operations.
Write operations are qualified by the Write Enable (WE
). BW
can be used to
[x]
). All writes are simplified with on-chip synchronous self-timed write circuitry.
Three synchronous Chip Enables (CE asynchronous Output Enable (OE
, CE2, CE3) and an
1
) simplify depth expansion. All operations (Reads, Writes, and Deselects) are pipelined. ADV/LD should be driven LOW once the device has been deselected in order to load a new address for the next operation.
Single Read Accesses
A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN and CE signal WE
are ALL asserted active, (3) the Write Enable input
3
is deasserted HIGH, and (4) ADV/LD is asserted
is asserted LOW, (2) CE1, CE2,
LOW. The address presented to the address inputs is latched into the Address Register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At the rising edge of the next clock the requested data is allowed to propagate through the output register and onto the data bus within 2.6 ns (250-MHz device) provided OE
is active LOW. After the first clock of the read access the output buffers are controlled by OE
and the internal control logic. OE must be driven LOW in order for the device to drive out the requested data. During the second clock, a subsequent operation (Read/Write/Deselect) can be initiated. Deselecting the device is also pipelined. Therefore, when the SRAM is deselected at clock rise by one of the chip enable signals, its output will tri-state following the next clock rise.
Burst Read Accesses
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 have an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four Reads without reasserting the address inputs. ADV/LD
must be driven LOW in order to load a new address into the SRAM, as described in the Single Read Access section above. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and will wrap-around when incre­mented sufficiently. A HIGH input on ADV/LD
will increment
the internal burst counter regardless of the state of chip enables inputs or WE
. WE is latched at the beginning of a burst cycle. Therefore, the type of access (Read or Write) is maintained throughout the burst sequence.
Single Write Accesses
Write access are initiated when the following conditions are satisfied at clock rise: (1) CEN and CE is asserted LOW. The address presented to the address inputs
are ALL asserted active, and (3) the write signal WE
3
is asserted LOW, (2) CE1, CE2,
is loaded into the Address Register. The write signals are latched into the Control Logic block.
On the subsequent clock rise the data lines are automatically tri-stated regardless of the state of the OE allows the external logic to present the data on DQ (DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33). In addition, the address for the subse-
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
input signal. This
and DQP
/DQP
a,b
a,b
quent access (Read/Write/Deselect) is latched into the Address Register (provided the appropriate control signals are asserted).
On the next clock rise the data presented to DQ
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 & DQ
a,b,c,d
(DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
CY7C1462AV33) (or a subset for byte write operations, see
for CY7C1464AV33,
a,b
/DQP
and DQP
a,b
for
Write Cycle Description table for details) inputs is latched into the device and the write is complete.
The data written during the Write operation is controlled by BW (BW
a,b,c,d,e,f,g,h
CY7C1460AV33 and BW CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 provides
for CY7C1464AV33, BW
for CY7C1462AV33) signals. The
a,b
a,b,c,d
for
byte write capability that is described in the Write Cycle Description table. Asserting the Write Enable input (WE the selected Byte Write Select (BW
) input will selectively write
) with
to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A synchronous self-timed write mechanism has been provided to simplify the write operations. Byte write capability has been included in order to greatly simplify Read/Modify/Write sequences, which can be reduced to simple byte write operations.
Because the CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are common I/O devices, data should not be driven into the device while the outputs are active. The Output Enable (OE deasserted HIGH before presenting data to the DQ (DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33) inputs. Doing so will tri-state the output
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
drivers. As a safety precaution, DQ (DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33) are automatically tri-stated during the
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
data portion of a write cycle, regardless of the state of OE
) can be
and DQP
/DQP
a,b
and DQP
/DQP
a,b
a,b
a,b
.
Burst Write Accesses
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four WRITE opera­tions without reasserting the address inputs. ADV/LD
must be driven LOW in order to load the initial address, as described in the Single Write Access section above. When ADV/LD
is driven HIGH on the subsequent clock rise, the chip enables (CE
, CE2, and CE3) and WE inputs are ignored and the burst
1
Document #: 38-05353 Rev. *D Page 7 of 27
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CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
counter is incremented. The correct BW (BW CY7C1464AV33, BW CY7C1462AV33) inputs must be driven in each cycle of the
for CY7C1460AV33 and BW
a,b,c,d
a,b,c,d,e,f,g,h
a,b
for
for
burst write in order to write the correct bytes of data.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep” mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation
Interleaved Burst Address Table (MODE = Floating or V
First
Address
Second
Address
DD
)
Third
Address
A1,A0 A1,A0 A1,A0 A1,A0
00 01 10 11 01 00 11 10 10 11 00 01
11 10 01 00
Fourth
Address
guaranteed. The device must be deselected prior to e ntering the “sleep” mode. CE for the duration of t
ZZREC
, CE2, and CE3, must remain inactive
1
after the ZZ input returns LOW.
Linear Burst Address Table (MODE = GND)
First
Address
Second
Address
Third
Address
Fourth
Address
A1,A0 A1,A0 A1,A0 A1,A0
00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10
ZZ Mode Electrical Characteristics
Parameter Description T est Conditi ons Min. Max. Unit
I
DDZZ
t
ZZS
t
ZZREC
t
ZZI
t
RZZI
Truth Table
Operation
Deselect Cycle None H LLXXXLL-H Tri-State Continue
Deselect Cycle Read Cycle
(Begin Burst) Read Cycle
(Continue Burst) NOP/Dummy Read
(Begin Burst) Dummy Read
(Continue Burst)
Sleep mode standby current ZZ > VDD − 0.2V 100 mA Device operation to ZZ ZZ > VDD 0.2V 2t ZZ recovery time ZZ < 0.2V 2t
CYC
ZZ active to sleep current This parameter is sampled 2t ZZ Inactive to exit sleep current This parameter is sampled 0 ns
[1, 2, 3, 4, 5, 6, 7]
Address
Used CE ZZ ADV/LD WE BW
OE CEN CLK DQ
x
None X L H X X X L L-H Tri-State
External L L L H X L L L-H Data Out (Q)
Next X L H X X L L L-H Data Out (Q)
External L L L H X H L L-H Tri-State
Next X L H X X H L L-H Tri-State
CYC
CYC
ns ns ns
Notes:
1. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE Valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details.
2. Write is defined by WE
3. When a write cycle is detected, all I/Os are tri-stated, even during byte writes.
4. The DQ and DQP pins are controlled by the current cycle and the OE
= H inserts wait states.
5. CEN
6. Device will power-up deselected and the I/Os in a tri-state condition, regardless of OE
is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles.During a read cycle DQs and DQPX = Tri-state when OE
7. OE is inactive or when the device is deselected, and DQ
and BWX. See Write Cycle Description table for details.
stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx =
signal.
.
=data when OE is active.
s
Document #: 38-05353 Rev. *D Page 8 of 27
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CY7C1460AV33 CY7C1462AV33 CY7C1464AV33
Truth Table
[1, 2, 3, 4, 5, 6, 7]
(continued)
Address
Operation
Write Cycle
Used CE ZZ ADV/LD WE BW
OE CEN CLK DQ
x
External L L L L L X L L-H Data In (D)
(Begin Burst) Write Cycle
Next X L H X L X L L-H Data In (D)
(Continue Burst) NOP/WRITE ABORT
None L L L L H X L L-H Tri-State
(Begin Burst) WRITE ABORT
Next X L H X H X L L-H Tri-State
(Continue Burst) IGNORE CLOCK
Current X L X X X X H L-H ­EDGE (Stall)
SLEEP MODE None X H X X X X X X Tri- State
Partial Write Cycle Description
Function (CY7C1460AV33) WE BW
[1, 2, 3, 8]
d
BW
c
BW
b
BW
a
Read H X X X X Write – No bytes written L H H H H Write Byte a – (DQa and DQPa) LHHHL Write Byte b – (DQb and DQPb)LHHLH Write Bytes b, a L H H L L Write Byte c – (DQc and DQPc)LHLHH Write Bytes c, a L H L H L Write Bytes c, b L H LL L H Write Bytes c, b, a L H L L L Write Byte d – (DQd and DQPd)LLHHH Write Bytes d, a L L H H L Write Bytes d, b LLHLH Write Bytes d, b, a L L H L L Write Bytes d, c L L L H H Write Bytes d, c, a L L L H L Write Bytes d, c, b L L L L H Write All Bytes L L L L L
Function (CY7C1462AV33)
[2,8]
WE BW
b
BW
a
Read Hxx Write – No Bytes Written L H H Write Byte a – (DQa and DQPa)LHL Write Byte b – (DQb and DQPb)LLH Write Both Bytes L L L
Function (CY7C1464AV33)
[2,8]
WE BW
x
Read Hx Write – No Bytes Written L H Write Byte X − (DQ
and DQP
x
x)
LL
Write All Bytes LAll BW = L
Note:
8. Table only lists a partial listing o f the byte write combinations. Any combination of B W
is valid. Appropriate write will be done based on which byte write is active.
[a:d]
Document #: 38-05353 Rev. *D Page 9 of 27
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