• Pin-compatible and functionally equivalent to ZBT™
• Supports 250-MHz bus operations with zero wait states
— Available speed grades are 250, 200 and 167 MHz
• Internally self-timed output buffer control to eliminate
the need to use asynchronous OE
• Fully registered (inputs and outputs) for pipelined
operation
• Byte Write capability
• 3.3V power supply
• 3.3V/2.5V I/O power supply
• Fast clock-to-output times
— 2.6 ns (for 250-MHz device)
• Clock Enable (CEN
) pin to suspend operation
• Synchronous self-timed writes
• CY7C1460AV33, CY7C1462AV33 available in
JEDEC-standard lead-free 100-pin TQFP, lead-free and
non-lead-free 165-ball FBGA package. CY7C1464AV33
available in lead-free and non-lead-free 209-ball FBGA
package
• IEEE 1149.1 JTAG-Compatible Boundary Scan
• Burst capability—linear or interleaved burst order
• “ZZ” Sleep Mode option and Stop Clock option
Logic Block Diagram-CY7C1460AV33 (1M x 36)
A0, A1, A
MODE
CLK
C
EN
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADV/LD
C
WRITE ADDRESS
REGISTER 2
A1
D1D0Q1
A0
BURST
LOGIC
Functional Description
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are
3.3V , 1M x 36/2M x 18/512K x72 Synchronous pipelined burst
SRAMs with No Bus Latency™ (NoBL™) logic, respectively.
They are designed to support unlimited true back-to-back
Read/Write operations with no wait states. The
CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are
equipped with the advanced (NoBL) logic requi red to enable
consecutive Read/Write operations with data being transferred on every clock cycle. This feature dramatically improves
the throughput of data in systems that require frequent
Write/Read transitions. The
CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are pin
compatible and functionally equivalent to ZBT devices.
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. All data outputs pass through
output registers controlled by the rising edge of the clock. The
clock input is qualified by the Clock Enable (CEN
which when deasserted suspends operation and extends the
previous clock cycle.
Write operations are controlled by the Byte Write Selects
–BWh for CY7C1464AV33, BWa–BWd for
(BW
a
CY7C1460AV33 and BW
Write Enable (WE
) input. All writes are conducted with on-chip
synchronous self-timed write circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
selection and output tri-state control. In order to avoid bus
contention, the output drivers are synchronously tri-stated
during the data portion of a write sequence.
A1'
A0'
Q0
–BWb for CY7C1462AV33) and a
a
, CE2, CE3) and an
1
) provide for easy bank
) signal,
O
S
U
T
E
P
N
U
T
INPUT
S
E
R
E
G
A
I
M
S
T
P
E
S
R
S
E
E
REGISTER 0
ADV/LD
BW
a
BW
b
BW
c
BW
d
WE
OE
CE1
CE2
CE3
ZZ
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
READ LOGIC
SLEEP
CONTROL
WRITE
DRIVERS
MEMORY
ARRAY
REGISTER 1
INPUT
O
D
U
T
A
P
T
U
A
T
B
S
T
E
E
R
I
N
G
E
DQs
U
DQP
F
DQP
F
DQP
E
DQP
R
S
E
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05353 Rev. *D Revised June 22, 2006
[+] Feedback
a
b
C
C
s
P
a
P
b
P
c
P
d
P
e
P
f
P
g
P
h
C
C
Logic Block Diagram-CY7C1462AV33 (2M x 18)
A0, A1, A
MODE
C
LK
EN
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADV/LD
C
WRITE ADDRESS
REGISTER 2
A1
D1D0Q1
A0
BURST
LOGIC
CY7C1460AV33
CY7C1462AV33
CY7C1464AV33
A1'
A0'
Q0
ADV/LD
BW
BW
a
b
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
WE
OE
CE1
CE2
CE3
ZZ
READ LOGIC
Sleep
Control
Logic Block Diagram-CY7C1464AV33 (512K x 72)
A0, A1, A
MODE
C
LK
EN
ADV/LD
BW
a
BW
b
BW
c
BW
d
BW
e
BW
f
BW
g
BW
h
WE
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
A1
A0
ADV/LD
C
WRITE ADDRESS
REGISTER 2
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
D1D0Q1
BURST
LOGIC
Q0
WRITE
DRIVERS
A1'
A0'
WRITE
DRIVERS
MEMORY
ARRAY
INPUT
REGISTER 1
E
MEMORY
ARRAY
INPUT
REGISTER 1
O
U
T
P
S
U
E
T
N
S
R
E
E
G
A
I
M
S
P
T
S
E
R
S
E
REGISTER 0
S
E
N
S
E
A
M
P
S
E
O
U
T
P
U
T
R
E
G
I
S
T
E
R
S
E
INPUT
D
A
T
A
S
T
E
E
R
I
N
G
INPUT
REGISTER 0
O
U
T
P
U
T
B
DQs
U
F
DQP
F
DQP
E
R
S
E
E
O
U
T
P
D
U
A
T
T
A
B
DQ
U
S
F
T
E
E
R
I
N
G
DQ
F
DQ
E
R
DQ
S
DQ
DQ
E
DQ
DQ
DQ
E
OE
CE1
CE2
CE3
ZZ
Selection Guide
READ LOGIC
Sleep
Control
250 MHz200 MHz167 MHzUnit
Maximum Access Time2.63.23.4ns
Maximum Operating Current475425375mA
Maximum CMOS Standby
Address Inputs used to select one of the address locations. Sampled at the rising
edge of the CLK.
Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM.
Sampled on the rising edge of CLK. BW
, BWc controls DQc and DQPc, BWd controls DQd and DQPd, BWe controls DQe and
DQP
b
DQP
, BWf controls DQf and DQPf, BWg controls DQg and DQPg, BWh controls DQh and
e
DQP
.
h
controls DQa and DQPa, BWb controls DQb and
a
Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active
LOW. This signal must be asserted LOW to initiate a write sequence.
Advance/Load Input used to advance the on-chip address coun ter or load a new
address. When HIGH (and CEN
is asserted LOW) the internal burst counter is advanced.
When LOW, a new address can be loaded into the device for an access. After being
deselected, ADV/LD should be driven LOW in order to load a new address.
[+] Feedback
CY7C1460AV33
CY7C1462AV33
CY7C1464AV33
Pin Definitions (continued)
Pin NameI/O TypePin Description
CLKInput-
Clock
CE
CE
CE
OE
1
2
3
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
Input-
Asynchronous
CEN
Input-
Synchronous
DQ
a
DQ
b
DQ
c
DQ
d
DQ
e
DQ
f
DQ
g
DQ
h
DQP
DQP
a,
DQPc,DQP
DQPe,DQP
DQPg,DQP
b,
d
f
h
I/O-
Synchronous
I/O-
Synchronous
MODEInput Strap PinMode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst
TDOJTAG serial output
Synchronous
TDIJTAG serial input
Synchronous
TMST est Mode Select
Synchronous
TCKJTAG-ClockClock input to the JTAG circuitry.
V
V
V
DD
DDQ
SS
Power SupplyPower supply inputs to the core of the device.
I/O Power Supply Power supply for the I/O circuitry.
GroundGround for the device. Should be connected to ground of the system.
NCN/ANo connects. This pin is not connected to the die.
NC/72MN/ANot connected to the die. Can be tied to any voltage level.
NC/144MN/ANot connected to the die. Can be tied to any voltage level.
NC/288MN/ANot connected to the die. Can be tied to any voltage level.
NC/576MN/ANot connected to the die. Can be tied to any voltage level.
NC/1GN/ANot connected to the die. Can be tied to any voltage level.
ZZInput-
Asynchronous
Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with
CEN
. CLK is only recognized if CEN is active LOW.
Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE
and CE3 to select/deselect the device.
2
Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in
conjunction with CE
and CE3 to select/deselect the device.
1
Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE
and CE2 to select/deselect the device.
1
Output Enable, active LOW . Combined with the synchronous logic block inside the device
to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as
outputs. When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE
masked during the data portion of a write sequence, during the first clock when emerging
from a deselected state and when the device has been deselected.
Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by
the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN
does not deselect the device, CEN
can be used to extend the previous cycle when required.
Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is
triggered by the rising edge of CLK. As outputs, they deliver the data contained in the
memory location specified by A
direction of the pins is controlled by OE
LOW, the pins can behave as outputs. When HIGH, DQ
condition. The outputs are automatically tri-stated during the data portion of a write
during the previous clock rise of the read cycle. The
X
and the internal control logic. When OE is asserted
–DQd are placed in a tri-state
a
sequence, during the first clock when emerging from a deselected state, and when the
device is deselected, regardless of the state of OE
Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ
During write sequences, DQP
controlled by BW
controlled by BW
, and DQPd is controlled by BWd, DQPe is controlled by BWe, DQPf is
c
, DQPg is controlled by BWg, DQPh is controlled by BWh.
f
is controlled by BWa, DQPb is controlled by BWb, DQPc is
a
.
[31:0]
order. Pulled LOW selects the linear burst order. MODE should not change states during
operation. When left floating MODE will default HIGH, to an interleaved burst order.
Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK.
Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK.
This pin controls the Test Access Port state machine. Sampled on the rising edge of
TCK.
ZZ “sleep” Input. This active HIGH input places the device in a non-time critical “sleep”
condition with data integrity preserved. During normal operation, this pin can be connected
or left floating. ZZ pin has an internal pull-down.
to V
SS
is
.
Document #: 38-05353 Rev. *DPage 6 of 27
[+] Feedback
CY7C1460AV33
CY7C1462AV33
CY7C1464AV33
Functional Overview
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are
synchronous-pipelined Burst NoBL SRAMs desig ned specifically to eliminate wait states during Write/Read transitions. All
synchronous inputs pass through input registers controlled by
the rising edge of the clock. The clock signal is qualified with
the Clock Enable input signal (CEN
). If CEN is HIGH, the clock
signal is not recognized and all internal states are maintained.
All synchronous operations are qualified with CEN. All data
outputs pass through output registers controlled by the rising
edge of the clock. Maximum access delay from the clock rise
(t
) is 2.6 ns (250-MHz device).
CO
Accesses can be initiated by asserting all three Chip Enables
(CE
, CE2, CE3) active at the rising edge of the clock. If Clock
1
Enable (CEN
) is active LOW and ADV/LD is asserted LOW,
the address presented to the device will be latched. The
access can either be a read or write operation, depending on
the status of the Write Enable (WE
conduct byte write operations.
Write operations are qualified by the Write Enable (WE
). BW
can be used to
[x]
). All
writes are simplified with on-chip synchronous self-timed write
circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
, CE2, CE3) and an
1
) simplify depth expansion.
All operations (Reads, Writes, and Deselects) are pipelined.
ADV/LD should be driven LOW once the device has been
deselected in order to load a new address for the next
operation.
Single Read Accesses
A read access is initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
signal WE
are ALL asserted active, (3) the Write Enable input
3
is deasserted HIGH, and (4) ADV/LD is asserted
is asserted LOW, (2) CE1, CE2,
LOW. The address presented to the address inputs is latched
into the Address Register and presented to the memory core
and control logic. The control logic determines that a read
access is in progress and allows the requested data to
propagate to the input of the output register. At the rising edge
of the next clock the requested data is allowed to propagate
through the output register and onto the data bus within 2.6 ns
(250-MHz device) provided OE
is active LOW. After the first
clock of the read access the output buffers are controlled by
OE
and the internal control logic. OE must be driven LOW in
order for the device to drive out the requested data. During the
second clock, a subsequent operation (Read/Write/Deselect)
can be initiated. Deselecting the device is also pipelined.
Therefore, when the SRAM is deselected at clock rise by one
of the chip enable signals, its output will tri-state following the
next clock rise.
Burst Read Accesses
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 have
an on-chip burst counter that allows the user the ability to
supply a single address and conduct up to four Reads without
reasserting the address inputs. ADV/LD
must be driven LOW
in order to load a new address into the SRAM, as described in
the Single Read Access section above. The sequence of the
burst counter is determined by the MODE input signal. A LOW
input on MODE selects a linear burst mode, a HIGH selects an
interleaved burst sequence. Both burst counters use A0 and
A1 in the burst sequence, and will wrap-around when incremented sufficiently. A HIGH input on ADV/LD
will increment
the internal burst counter regardless of the state of chip
enables inputs or WE
. WE is latched at the beginning of a burst
cycle. Therefore, the type of access (Read or Write) is
maintained throughout the burst sequence.
Single Write Accesses
Write access are initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
is asserted LOW. The address presented to the address inputs
are ALL asserted active, and (3) the write signal WE
3
is asserted LOW, (2) CE1, CE2,
is loaded into the Address Register. The write signals are
latched into the Control Logic block.
On the subsequent clock rise the data lines are automatically
tri-stated regardless of the state of the OE
allows the external logic to present the data on DQ
(DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33). In addition, the address for the subse-
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
input signal. This
and DQP
/DQP
a,b
a,b
quent access (Read/Write/Deselect) is latched into the
Address Register (provided the appropriate control signals are
asserted).
On the next clock rise the data presented to DQ
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 & DQ
a,b,c,d
(DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
CY7C1462AV33) (or a subset for byte write operations, see
for CY7C1464AV33,
a,b
/DQP
and DQP
a,b
for
Write Cycle Description table for details) inputs is latched into
the device and the write is complete.
The data written during the Write operation is controlled by BW
(BW
a,b,c,d,e,f,g,h
CY7C1460AV33 and BW
CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 provides
for CY7C1464AV33, BW
for CY7C1462AV33) signals. The
a,b
a,b,c,d
for
byte write capability that is described in the Write Cycle
Description table. Asserting the Write Enable input (WE
the selected Byte Write Select (BW
) input will selectively write
) with
to only the desired bytes. Bytes not selected during a byte
write operation will remain unaltered. A synchronous
self-timed write mechanism has been provided to simplify the
write operations. Byte write capability has been included in
order to greatly simplify Read/Modify/Write sequences, which
can be reduced to simple byte write operations.
Because the
CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 are
common I/O devices, data should not be driven into the device
while the outputs are active. The Output Enable (OE
deasserted HIGH before presenting data to the DQ
(DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33) inputs. Doing so will tri-state the output
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
drivers. As a safety precaution, DQ
(DQ
a,b,c,d,e,f,g,h
DQ
a,b,c,d
for CY7C1462AV33) are automatically tri-stated during the
/DQP
/DQP
a,b,c,d,e,f,g,h
for CY7C1460AV33 and DQ
a,b,c,d
for CY7C1464AV33,
data portion of a write cycle, regardless of the state of OE
) can be
and DQP
/DQP
a,b
and DQP
/DQP
a,b
a,b
a,b
.
Burst Write Accesses
The CY7C1460AV33/CY7C1462AV33/CY7C1464AV33 has
an on-chip burst counter that allows the user the ability to
supply a single address and conduct up to four WRITE operations without reasserting the address inputs. ADV/LD
must be
driven LOW in order to load the initial address, as described
in the Single Write Access section above. When ADV/LD
is
driven HIGH on the subsequent clock rise, the chip enables
(CE
, CE2, and CE3) and WE inputs are ignored and the burst
1
Document #: 38-05353 Rev. *DPage 7 of 27
[+] Feedback
CY7C1460AV33
CY7C1462AV33
CY7C1464AV33
counter is incremented. The correct BW (BW
CY7C1464AV33, BW
CY7C1462AV33) inputs must be driven in each cycle of the
for CY7C1460AV33 and BW
a,b,c,d
a,b,c,d,e,f,g,h
a,b
for
for
burst write in order to write the correct bytes of data.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ
places the SRAM in a power conservation “sleep” mode. Two
clock cycles are required to enter into or exit from this “sleep”
mode. While in this mode, data integrity is guaranteed.
Accesses pending when entering the “sleep” mode are not
considered valid nor is the completion of the operation
Interleaved Burst Address Table
(MODE = Floating or V
First
Address
Second
Address
DD
)
Third
Address
A1,A0A1,A0A1,A0A1,A0
00011011
01001110
10110001
11100100
Fourth
Address
guaranteed. The device must be deselected prior to e ntering
the “sleep” mode. CE
for the duration of t
ZZ active to sleep currentThis parameter is sampled2t
ZZ Inactive to exit sleep currentThis parameter is sampled0ns
[1, 2, 3, 4, 5, 6, 7]
Address
UsedCEZZADV/LDWEBW
OECENCLKDQ
x
NoneXLHXXXLL-HTri-State
ExternalLLLHXLLL-HData Out (Q)
NextXLHXXLLL-HData Out (Q)
ExternalLLLHXHLL-HTri-State
NextXLHXXHLL-HTri-State
CYC
CYC
ns
ns
ns
Notes:
1. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE
Valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details.
2. Write is defined by WE
3. When a write cycle is detected, all I/Os are tri-stated, even during byte writes.
4. The DQ and DQP pins are controlled by the current cycle and the OE
= H inserts wait states.
5. CEN
6. Device will power-up deselected and the I/Os in a tri-state condition, regardless of OE
is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles.During a read cycle DQs and DQPX = Tri-state when OE
7. OE
is inactive or when the device is deselected, and DQ
and BWX. See Write Cycle Description table for details.
stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx =
signal.
.
=data when OE is active.
s
Document #: 38-05353 Rev. *DPage 8 of 27
[+] Feedback
CY7C1460AV33
CY7C1462AV33
CY7C1464AV33
Truth Table
[1, 2, 3, 4, 5, 6, 7]
(continued)
Address
Operation
Write Cycle
UsedCEZZADV/LDWEBW
OECENCLKDQ
x
ExternalLLLLLXLL-HData In (D)
(Begin Burst)
Write Cycle
NextXLHXLXLL-HData In (D)
(Continue Burst)
NOP/WRITE ABORT
NoneLLLLHXLL-HTri-State
(Begin Burst)
WRITE ABORT
NextXLHXHXLL-HTri-State
(Continue Burst)
IGNORE CLOCK
CurrentXLXXXXHL-HEDGE
(Stall)
SLEEP MODENoneXHXXXXXXTri- State
Partial Write Cycle Description
Function (CY7C1460AV33)WEBW
[1, 2, 3, 8]
d
BW
c
BW
b
BW
a
ReadHXXXX
Write – No bytes writtenLHHHH
Write Byte a – (DQa and DQPa)LHHHL
Write Byte b – (DQb and DQPb)LHHLH
Write Bytes b, aLHHLL
Write Byte c – (DQc and DQPc)LHLHH
Write Bytes c, aLHLHL
Write Bytes c, bLHLLLH
Write Bytes c, b, aLHLLL
Write Byte d – (DQd and DQPd)LLHHH
Write Bytes d, aLLHHL
Write Bytes d, bLLHLH
Write Bytes d, b, aLLHLL
Write Bytes d, cLLLHH
Write Bytes d, c, aLLLHL
Write Bytes d, c, bLLLLH
Write All BytesLLLLL
Function (CY7C1462AV33)
[2,8]
WEBW
b
BW
a
ReadHxx
Write – No Bytes WrittenLHH
Write Byte a – (DQa and DQPa)LHL
Write Byte b – (DQb and DQPb)LLH
Write Both Bytes LLL
Function (CY7C1464AV33)
[2,8]
WEBW
x
ReadHx
Write – No Bytes WrittenLH
Write Byte X − (DQ
and DQP
x
x)
LL
Write All Bytes LAll BW = L
Note:
8. Table only lists a partial listing o f the byte write combinations. Any combination of B W
is valid. Appropriate write will be done based on which byte write is active.
[a:d]
Document #: 38-05353 Rev. *DPage 9 of 27
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