• Pin-compatible and functionally equivalent to ZBT™
• Supports 250-MHz bus operations with zero wait states
— Available speed grades are 250, 200, and 166 MHz
• Internally self-timed output buffer control to eliminate
the need to use asynchronous OE
• Fully registered (inputs and outputs) for pipelined
operation
• Byte Write capability
• Single 3.3V power supply (VDD)
• 3.3V or 2.5V I/O power supply (V
• Fast clock-to-output times
— 2.8 ns (for 250-MHz device)
• Clock Enable (CEN
) pin to suspend operation
• Synchronous self-timed writes
• Available in lead-free 100-Pin TQFP package, lead-free
and non lead-free 119-Ball BGA package and 165-Ball
FBGA package
• IEEE 1149.1 JTAG-Compatible Boundary Scan
• Burst capability–linear or interleaved burst order
• “ZZ” Sleep Mode option and Stop Clock option
DDQ
)
Functional Description
[1]
The CY7C1354C and CY7C1356C are 3.3V, 256K x 36 and
512K x 18 Synchronous pipelined burst SRAMs with No Bus
Latency™ (NoBL™) logic, respectively. They are designed to
support unlimited true back-to-back Read/Write operations
with no wait states. The CY7C1354C and CY7C1356C are
equipped with the advanced (NoBL) logic requi red to enable
consecutive Read/Write operations with data being transferred on every clock cycle. This feature dramatically improves
the throughput of data in systems that require frequent
Write/Read transitions. The CY7C1354C and CY7C1356C are
pin compatible and functionally equivalent to ZBT devices.
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. All data outputs pass through
output registers controlled by the rising edge of the clock. The
clock input is qualified by the Clock Enable (CEN
) signal,
which when deasserted suspends operation and extends the
previous clock cycle.
Write operations are controlled by the Byte Write Selects
(BW
–BWd for CY7C1354C and BWa–BWb for CY7C1356C)
a
and a Write Enable (WE
) input. All writes are conducted with
on-chip synchronous self-timed write circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
, CE2, CE3) and an
1
) provide for easy bank
selection and output tri-state control. In order to avoid bus
contention, the output drivers are synchronously tri-stated
during the data portion of a write sequence.
Logic Block Diagram–CY7C1354C (256K x 36)
A0, A1, A
MODE
C
CLK
EN
ADV/LD
BW
a
BW
b
BW
c
BW
Note:
1. For best-practices recommendations, please refer to the Cypress application note System Design Guidelines on www.cypress.com.
d
WE
OE
CE1
CE2
CE3
ZZ
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
WRITE ADDRESS
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
READ LOGIC
SLEEP
CONTROL
ADV/LD
REGISTER 2
C
A1
D1D0Q1
A0
BURST
LOGIC
A1'
A0'
Q0
WRITE
DRIVERS
MEMORY
ARRAY
INPUT
REGISTER 1
O
S
U
T
E
P
N
U
T
S
E
R
E
G
A
I
M
S
T
P
E
S
R
S
E
E
REGISTER 0
INPUT
O
D
U
T
A
P
T
U
A
T
B
S
T
E
E
R
I
N
G
E
DQs
U
DQP
F
DQP
F
DQP
E
DQP
R
S
E
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05538 Rev . *G Revised September 14, 2006
[+] Feedback
a
b
C
Logic Block Diagram–CY7C1356C (512K x 18)
CY7C1354C
CY7C1356C
ADDRESS
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADV/LD
WRITE ADDRESS
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
READ LOGIC
Sleep
Control
C
REGISTER 2
A1
D1D0Q1
A0
BURST
LOGIC
A1'
A0'
Q0
WRITE
DRIVERS
MEMORY
ARRAY
INPUT
REGISTER 1
O
U
T
P
S
U
E
T
N
S
R
E
E
G
A
I
M
S
P
T
S
E
R
S
E
E
REGISTER 0
INPUT
O
U
T
P
D
U
A
T
T
A
B
DQs
U
S
F
T
E
E
R
I
N
G
E
DQP
F
DQP
E
R
S
E
CLK
A0, A1, A
MODE
C
EN
ADV/LD
BW
a
BW
b
WE
OE
CE1
CE2
CE3
ZZ
Selection Guide
250 MHz200 MHz166 MHzUnit
Maximum Access Time2.83.23.5ns
Maximum Operating Current250220180mA
Maximum CMOS Standby Current404040mA
MODEInput Strap Pin Mode Input. Selects the burst order of the device. T ied HIGH selects the interleaved burst order.
TDOJTAG serial
TDIJTAG serial input
TMST est Mode Select
TCKJTAG-ClockClock input to the JTAG circuitry.
V
DD
V
DDQ
V
SS
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
Address Inputs used to select one of the address locations. Sampled at the rising edge of
the CLK.
Byte Write Select Inputs, active LOW. Qualified with WE
Sampled on the rising edge of CLK. BW
BW
controls DQc and DQPc, BWd controls DQd and DQPd.
c
controls DQa and DQPa, BWb controls DQb and DQPb,
a
to conduct writes to the SRAM.
Write Enable Input, active LOW. Sampled on the ri sing edge of CLK if CEN is active LOW.
This signal must be asserted LOW to initiate a write sequence.
Advance/Load Input used to advance the on-chip address counter or load a new address.
When HIGH (and CEN
is asserted LOW) the internal burst counter is advanced. When LOW, a
new address can be loaded into the device for an access. After being deselected, ADV/LD
be driven LOW in order to load a new address.
Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN
Clock
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
CLK is only recognized if CEN
Chip Enable 1 Input, active LOW . Sampled on the rising edge of CLK. Used in conjunction with
CE
and CE3 to select/deselect the device.
2
Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction
with CE
and CE3 to select/deselect the device.
1
Chip Enable 3 Input, active LOW . Sampled on the rising edge of CLK. Used in conjunction with
CE
and CE2 to select/deselect the device.
1
is active LOW.
Output Enable, active LOW. Combined with the synchronous logic block inside the device to
Asynchronous
control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs.
When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE is masked during
the data portion of a Write sequence, during the first clock when emerging from a deselected
state and when the device has been deselected.
Input-
Synchronous
I/O-
Synchronous
Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the
SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN
deselect the device, CEN
can be used to extend the previous cycle when required.
Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered
by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by addresses during the previous clock rise of the Read cycle. The direction of the pins
is controlled by OE
as outputs. When HIGH, DQ
ically tri-stated during the data portion of a write sequence, during the first clock when emerging
and the internal control logic. When OE is asserted LOW, the pins can behave
–DQd are placed in a tri-state condition. The outputs are automat-
a
from a deselected state, and when the device is deselected, regardless of the state of OE.
I/O-
Synchronous
Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ
write sequences, DQP
, and DQPd is controlled by BWd.
BW
c
is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by
a
Pulled LOW selects the linear burst order. MODE should not change states during operation.
When left floating MODE will default HIGH, to an interleaved burst order.
Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK.
output
Synchronous
Serial data-In to the JTAG circuit. Sampled on the risi ng edge of TCK.
Synchronous
This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK.
Synchronous
Power Supply Power supply inputs to the core of the device.
I/O Power Supply Power supply for the I/O circuitry.
GroundGround for the device. Should be connected to ground of the system.
should
does not
During
[a:d].
.
Document #: 38-05538 Rev. *GPage 6 of 28
[+] Feedback
Pin Definitions (continued)
Pin NameI/O TypePin Description
NC–No connects. This pin is not connected to the die.
NC (18, 36,
72, 144, 288,
576, 1G)
ZZInput-
–These pins are not connected. They will be used for expansion to the 18M, 36M, 72M, 144M
288M, 576M and 1G densities.
ZZ “sleep” Input. This active HIGH input places the device in a non-time-critical “sleep”
Asynchronous
condition with data integrity preserved. For normal operation, this pin has to be LOW or left
floating. ZZ pin has an internal pull-down.
CY7C1354C
CY7C1356C
Functional Overview
The CY7C1354C and CY7C1356C are synchronous-pipelined
Burst NoBL SRAMs designed specifically to eliminate wait
states during Write/Read transitions. All synchronous inputs
pass through input registers controlled by the rising edge of
the clock. The clock signal is qualified with the Clock Enable
input signal (CEN
recognized and all internal states are maintained. All
synchronous operations are qualified with CEN
outputs pass through output registers controlled by the rising
edge of the clock. Maximum access delay from the clock rise
(t
) is 2.8 ns (250-MHz device).
CO
Accesses can be initiated by asserting all three Chip Enables
(CE
, CE2, CE3) active at the rising edge of the clock. If Clock
1
Enable (CEN
the address presented to the device will be latched. The
access can either be a Read or Write operation, depending on
the status of the Write Enable (WE
conduct Byte Write operations.
Write operations are qualified by the Write Enable (WE
Writes are simplified with on-chip synchronous self-timed
Write circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
All operations (Reads, Writes, and Deselects) are pipelined.
ADV/LD should be driven LOW once the device has been
deselected in order to load a new address for the next
operation.
Single Read Accesses
A read access is initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
signal WE
are ALL asserted active, (3) the Write Enable input
3
is deasserted HIGH, and (4) ADV/LD is asserted
LOW. The address presented to the address inputs is latched
into the address register and presented to the memory core
and control logic. The control logic determines that a read
access is in progress and allows the requested data to
propagate to the input of the output register. At the rising edge
of the next clock the requested data is allowed to propagate
through the output register and onto the data bus within 2.8 ns
(250-MHz device) provided OE
clock of the read access the output buffers are controlled by
OE
and the internal control logic. OE must be driven LOW in
order for the device to drive out the requested data. During the
second clock, a subsequent operation (Read/Write/Deselect)
can be initiated. Deselecting the device is also pipelined.
Therefore, when the SRAM is deselected at clock rise by one
of the chip enable signals, its output will tri-state following the
next clock rise.
). If CEN is HIGH, the clock signal is not
. All data
) is active LOW and ADV/LD is asserted LOW,
). BW
can be used to
[d:a]
). All
, CE2, CE3) and an
1
) simplify depth expansion.
is asserted LOW, (2) CE1, CE2,
is active LOW. After the first
Burst Read Accesses
The CY7C1354C and CY7C1356C have an on-chip burst
counter that allows the user the ability to supply a single
address and conduct up to four Reads without reasserting the
address inputs. ADV/LD
must be driven LOW in order to load
a new address into the SRAM, as described in the Single Read
Access section above. The sequence of the burst counter i s
determined by the MODE input signal. A LOW input on MODE
selects a linear burst mode, a HIGH selects an interleaved
burst sequence. Both burst counters use A0 and A1 in the
burst sequence, and will wrap around when incremented sufficiently. A HIGH input on ADV/LD
will increment the internal
burst counter regardless of the state of chip enables inputs or
WE. WE is latched at the beginning of a burst cycle. Therefore,
the type of access (Read or Write) is maintained throughout
the burst sequence.
Single Write Accesses
Write access are initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
is asserted LOW. The address presented to A0–A16 is loaded
are ALL asserted active, and (3) the Write signal WE
3
is asserted LOW, (2) CE1, CE2,
into the Address Register. The write signals are latched into
the Control Logic block.
On the subsequent clock rise the data lines are automatically
tri-stated regardless of the state of the OE
allows the external logic to present the data on DQ
(DQ
CY7C1356C). In addition, the address for the subsequent
a,b,c,d
/DQP
for CY7C1354C and DQ
a,b,c,d
input signal. This
and DQP
a,b
/DQP
a,b
for
access (Read/Write/Deselect) is latched into the address
register (provided the appropriate control signals are
asserted).
On the next clock rise the data presented to DQ
(DQ
CY7C1356C) (or a subset for byte write operations, see Write
a,b,c,d
/DQP
for CY7C1354C and DQ
a,b,c,d
a,b
and DQP
/DQP
a,b
for
Cycle Description table for details) inputs is latched into the
device and the Write is complete.
The data written during the Write operation is controlled by BW
(BW
signals. The CY7C1354C/CY7C1356C provides Byte Write
for CY7C1354C and BW
a,b,c,d
for CY7C1356C)
a,b
capability that is described in the Write Cycle Description table.
Asserting the Write Enable input (WE
Write Select (BW
) input will selectively write to only the desired
) with the selected Byte
bytes. Bytes not selected during a Byte Write operation will
remain unaltered. A synchronous self-timed write mechanism
has been provided to simplify the Write operations. Byte Write
capability has been included in order to greatly simplify
Read/Modify/Write sequences, which can be reduced to
simple Byte Write operations.
Document #: 38-05538 Rev. *GPage 7 of 28
[+] Feedback
CY7C1354C
CY7C1356C
Because the CY7C1354C and CY7C1356C are common I/O
devices, data should not be driven into the device while the
outputs are active. The Output Enable (OE) can be deasserted
HIGH before presenting data to the DQ
(DQ
CY7C1356C) inputs. Doing so will tri-state the output drivers.
As a safety precaution, DQ
CY7C1354C and DQ
automatically tri-stated during the data portion of a write cycle,
a,b,c,d
/DQP
for CY7C1354C and DQ
a,b,c,d
and DQP
/DQP
a,b
a,b
(DQ
a,b,c,d
for CY7C1356C) are
and DQP
/DQP
a,b
/DQP
a,b
a,b,c,d
for
for
regardless of the state of OE.
Burst Write Accesses
The CY7C1354C/CY7C1356C has an on-chip burst counter
that allows the user the ability to supply a single address and
conduct up to four WRITE operations without reasserting the
address inputs. ADV/LD
must be driven LOW in order to load
the initial address, as described in the Single Write Access
section above. When ADV/LD
quent clock rise, the chip enables (CE
WE
inputs are ignored and the burst counter is incremented.
The correct BW
CY7C1356C) inputs must be driven in each cycle of the burst
(BW
a,b,c,d
is driven HIGH on the subse-
, CE2, and CE3) and
1
for CY7C1354C and BW
a,b
for
write in order to write the correct bytes of data.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ
places the SRAM in a power conservation “sleep” mode. Two
mode. While in this mode, data integrity is guaranteed.
Accesses pending when entering the “sleep” mode are not
considered valid nor is the completion of the operation
guaranteed. The device must be deselected prior to entering
the “sleep” mode. CE
the duration of t
, CE2, and CE3, must remain inactive for
1
after the ZZ input returns LOW.
ZZREC
Interleaved Burst Address Table
(MODE = Floating or V
First
Address
A1,A0A1,A0A1,A0A1,A0
00011011
01001110
10110001
11100100
Second
Address
DD
)
Third
Address
Fourth
Address
Linear Burst Address Table (MODE = GND)
First
Address
A1,A0A1,A0A1,A0A1,A0
00011011
01101100
10110001
11000110
Second
Address
Third
Address
Fourth
Address
clock cycles are required to enter into or exit from this “sleep”
ZZ Mode Electrical Characteristics
ParameterDescriptionTest ConditionsMin.Max.Unit
I
DDZZ
t
ZZS
t
ZZREC
t
ZZI
t
RZZI
Truth Table
Deselect CycleNoneHLLXXXLL-HTri-State
Continue Deselect CycleNoneXLHXXXLL-HTri-State
Read Cycle (Begin Burst)ExternalLLLHXLLL-HData Out (Q)
Read Cycle (Continue Burst)NextXLHXXLLL-HData Out (Q)
NOP/Dummy Read (Begin Burst)ExternalLLLHXHLL-HTri-State
Dummy Read (Continue Burst)NextXLHXXHLL-HTri-State
Write Cycle (Begin Burst)ExternalLLLLLXLL-HData In (D)
Write Cycle (Continue Burst)NextXLHXLXLL-HData In (D)
ZZ active to sleep currentThis parameter is sampled2t
ZZ Inactive to exit sleep currentThis parameter is sampled0ns
[2, 3, 4, 5, 6, 7, 8]
Address
Operation
UsedCE ZZADV/LDWE BWxOECEN CLKDQ
CYC
CYC
ns
ns
ns
Notes:
2. X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE
Valid si gnifies that the desired Byte Write Selects are asserted, see Write Cycle Description table for details.
3. Write is defined by WE
4. When a write cycle is detected, all I/Os are tri-stated, even during Byte Writes.
5. The DQ and DQP pins are controlled by the current cycle and the OE
= H inserts wait states.
6. CEN
7. Device will power-up deselected and the I/Os in a tri-state condition, regardless of OE
is asynchronous and is not sampled with the clock rise. It is masked internally during write cycle s. During a read cycle DQs and DQPX = Tri-state when OE
8. OE
is inactive or when the device is deselected, and DQs = data when OE
and BWX. See Write Cycle Description table for details.
stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx =