• Pin compatible and functionally equivalent to ZBT™
devices
• Internally self-timed output buffer control to eliminate
the need to use OE
• Byte Write capability
• 128K x 36 common I/O architecture
• 3.3V power supply (V
• 2.5V/3.3V I/O power supply (V
DD
)
)
DDQ
• Fast clock-to-output times
— 2.6 ns (for 250-MHz device)
• Clock Enable (CEN
) pin to suspend operation
• Synchronous self-timed writes
• Asynchronous output enable (OE
)
• Available in lead-free 100-Pin TQFP package, lead-free
and non-lead-free 119-Ball BGA package
• Burst Capability—linear or interleaved burst order
• “ZZ” Sleep mode option
agram
REGISTER 0
WRITE ADDRESS
REGISTER 1
ADDRESS
ADV/LD
C
WRITE ADDRESS
REGISTER 2
A1
D1
A0
D0
CLK
A0, A1, A
MODE
EN
C
BURST
LOGIC
Functional Description
[1]
The CY7C1350G is a 3.3V , 128K x 36 synchronous-pipelined
Burst SRAM designed specifically to support unlimited true
back-to-back Read/Write operations without the insertion of
wait states. The CY7C1350G is equipped with the advanced
No Bus Latency™ (NoBL™) logic required to enable consecutive Read/Write operations with data being transferred on
every clock cycle. This feature dramatically improves the
throughput of the SRAM, especially in systems that require
frequent Write/Read transitions.
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. All data outputs pass through
output registers controlled by the rising edge of the clock. The
clock input is qualified by the Clock Enable (CEN
which, when deasserted, suspends operation and extends the
previous clock cycle. Maximum access delay from the clock
rise is 2.6 ns (250-MHz device)
Write operations are controlled by the four Byte Write Select
(BW
conducted with on-chip synchronous self-timed write circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
) and a Write Enable (WE) input. All writes are
[A:D]
, CE2, CE3) and an
1
) provide for easy bank
selection and output tri-state control. In order to avoid bus
contention, the output drivers are synchronously tri-stated
during the data portion of a write sequence.
A1'
Q1
A0'
Q0
) signal,
Note:
1. For best-practices recommendations, please refer to the Cypress application note System Design Guidelines on www.cypress.com.
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05524 Rev. *F Revised July 5, 2006
ADV/LD
BW
BW
BW
O
S
U
T
E
P
N
U
T
S
WRITE REGISTRY
A
B
C
BW
D
WE
OE
CE1
CE2
CE3
ZZ
AND DATA COHERENCY
CONTROL LOGIC
READ LOGIC
SLEEP
CONTROL
WRITE
DRIVERS
MEMORY
ARRAY
INPUT
REGISTER 1
E
R
E
G
A
I
M
S
T
P
E
S
R
S
E
E
INPUT
REGISTER 0
O
D
U
T
A
P
T
U
A
T
B
S
U
T
F
E
F
E
E
R
R
S
I
E
N
G
E
DQs
DQP
DQP
DQP
DQP
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CY7C1350G
Selection Guide
250 MHz200 MHz166 MHz133 MHz100 MHzUnit
Maximum Access Time 2.62.83.54.04.5ns
Maximum Operating Current 325265240225205mA
Maximum CMOS Standby Current4040404040mA
CLKInput-ClockClock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN
CE
CE
CE
OE
1
2
3
Input-
Synchronous
Input-
Synchronous
Input-
Synchronous
Input-
Asynchronous
CEN
Input-
Synchronous
Address Inputs used to select one of the 128K address locations. Sampled at the rising edge
of the CLK. A
are fed to the two-bit burst counter.
[1:0]
Byte Write Inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on
the rising edge of CLK.
Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This
signal must be asserted LOW to initiate a write sequence.
Advance/Load Input. Used to advance the on-chip address counter or load a new address. When
HIGH (and CEN
address can be loaded into the device for an access. After being deselected, ADV/LD
is asserted LOW) the internal burst counter is advanced. When LOW, a new
should be
driven LOW in order to load a new address.
CLK is only recognized if CEN
is active LOW.
Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with
CE
and CE3 to select/deselect the device.
2
Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with
CE
and CE3 to select/deselect the device.
1
Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with
and CE2 to select/deselect the device.
CE
1
Output Enable, asynchronous input, active LOW. Combined with the synchronous logic block
inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to
behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE
is masked during the data portion of a write sequence, during the first clock when emerging from
a deselected state, when the device has been deselected.
Clock Enable Input, active LOW. When asserted LOW the Clock signal is recognized by the
SRAM. When deasserted HIGH the Clock signal is masked. Since deasserting CEN
deselect the device, CEN
can be used to extend the previous cycle when required.
does not
.
Document #: 38-05524 Rev. *FPage 3 of 15
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CY7C1350G
Pin Definitions (continued)
NameI/ODescription
ZZInput-
Asynchronous
DQsI/O-
Synchronous
DQP
[A:D]
I/O-
Synchronous
MODEInput
Strap pin
V
V
V
DD
DDQ
SS
Power SupplyPower supply inputs to the core of the device.
I/O Power Supply Power supply for the I/O circuitry.
GroundGround for the device.
NCNo Connects. Not internally connected to the die. 9M, 18M, 36M, 72M, 144M and 288M are
ZZ “sleep” Input. This active HIGH input places the device in a non-time critical “sleep” condition
with data integrity preserved.During normal operation, this pin has to be low or left floating. ZZ pin
has an internal pull-down.
Bidirectional Data I/O Lines. As inputs, they feed into an on-chip data register that is triggered
by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by the address during the clock rise of the read cycle. The direction of the pins is
controlled by OE
outputs. When HIGH, DQ
cally tri-stated during the data po rtion of a write sequence, during the first clock when emerging from
and the internal control logic. When OE is asserted LOW, the pins can behave as
and DQPX are placed in a tri-state condition. The outputs are automati-
s
a deselected state, and when the device is deselected, regardless of the state of OE.
Bidirectional Data Parity I/O Li nes. Functionally , these signals are identical to DQs. During write
sequences, DQP
is controlled by BW
[A:D]
correspondingly.
[A:D]
Mode Input. Selects the burst order of the device. When tied to GND selects linear burst
sequence. When tied to VDD or left floating selects interleaved burst sequence.
address expansion pins in this device and will be used as address pins in their respective densities.
Functional Overview
The CY7C1350G is a synchronous-pipelined Burst SRAM
designed specifically to eliminate wait states during
Write/Read transitions. All synchronous inputs pass through
input registers controlled by the rising edge of the clock. The
clock signal is qualified with the Clock Enable input signal
(CEN
). If CEN is HIGH, the clock signal is not recognized and
all internal states are maintained. All synchronous operations
are qualified with CEN. All data outputs pass through output
registers controlled by the rising edge of the clock. Maximum
access delay from the clock rise (t
device).
Accesses can be initiated by asserting all three Chip Enables
(CE1, CE2, CE3) active at the rising edge of the clock. If Clock
Enable (CEN
) is active LOW and ADV/LD is asserted LOW,
the address presented to the device will be latched. The
access can either be a read or write operation, depending on
the status of the Write Enable (WE
conduct Byte Write operations.
Write operations are qualified by the Write Enable (WE
writes are simplified with on-chip synchronous self-timed write
circuitry.
Three synchronous Chip Enables (CE
asynchronous Output Enable (OE
All operations (Reads, Writes, and Deselects) are pipelined.
ADV/LD
should be driven LOW once the device has been
deselected in order to load a new address for the next
operation.
Single Read Accesses
A read access is initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
signal WE
are ALL asserted active, (3) the Write Enable input
3
is deasserted HIGH, and (4) ADV/LD is asserted
is asserted LOW, (2) CE1, CE2,
LOW. The address presented to the address inputs is latched
into the Address Register and presented to the memory core
) is 2.6 ns (250-MHz
CO
). BW
can be used to
[A:D]
). All
, CE2, CE3) and an
1
) simplify depth expansion.
and control logic. The control logic determines that a read
access is in progress and allows the requested data to
propagate to the input of the output register. At the rising edge
of the next clock the requested data is allowed to propagate
through the output register and onto the data bus, provided OE
is active LOW. After the first clock of the read access the output
buffers are controlled by OE
and the internal control logic. OE
must be driven LOW in order for the device to drive out the
requested data. During the second clock, a subsequent
operation (Read/Write/Deselect) can be initiated. Deselecting
the device is also pipelined. Therefore, when the SRAM is
deselected at clock rise by one of the chip enable signals, its
output will tri-state following the next clock rise.
Burst Read Accesses
The CY7C1350G has an on-chip burst counter that allows the
user the ability to supply a single address and conduct up to
four Reads without reasserting the address inputs. ADV/LD
must be driven LOW in order to load a new address into the
SRAM, as described in the Single Read Access section above.
The sequence of the burst counter is determined by the MODE
input signal. A LOW input on MODE selects a linear burst
mode, a HIGH selects an interleaved burst sequence. Both
burst counters use A0 and A1 in the burst sequence, and will
wrap around when incremented sufficiently. A HIGH input on
ADV/LD
the state of chip enables inputs or WE
will increment the internal burst counter regardless of
. WE is latched at the
beginning of a burst cycle. Therefore, the type of access (Read
or Write) is maintained throughout the burst sequence.
Single Write Accesses
Write accesses are initiated when the following conditions are
satisfied at clock rise: (1) CEN
and CE
is asserted LOW. The address presented to the address inputs
are ALL asserted active, and (3) the Write signal WE
3
is asserted LOW, (2) CE1, CE2,
is loaded into the Address Register. The write signals are
latched into the Control Logic block.
Document #: 38-05524 Rev. *FPage 4 of 15
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CY7C1350G
On the subsequent clock rise the data lines are automatically
tri-stated regardless of the state of the OE
allows the external logic to present the data on DQs
DQP
(Read/Write/Deselect) is latched into the Address Register
. In addition, the address for the subsequent access
[A:D]
input signal. This
and
(provided the appropriate control signals are asserted).
On the next clock rise the data presented to DQs
(or a subset for Byte Write operations, see Write Cycle
and DQP
[A:D]
Description table for details) inputs is latched into the device
and the write is complete.
The data written during the Write operation is controlled by
BW
capability that is described in the Write Cycle Description table.
signals. The CY7C1350G provides byte write
[A:D]
Asserting the Write Enable input (WE) with the selected Byte
Write Select (BW
desired bytes. Bytes not selected during a Byte Write
) input will selectively write to only the
[A:D]
operation will remain unaltered. A synchronous self-timed
write mechanism has been provided to simplify the write
operations. Byte write capability has been included in order to
greatly simplify Read/Modify/Write sequences, which can be
reduced to simple byte write operations.
Because the CY7C1350G is a common I/O device, data
should not be driven into the device while the outputs are
active. The Output Enable (OE
before presenting data to the DQs
so will tri-state the output drivers. As a safety precaution, DQs
and DQP
portion of a write cycle, regardless of the state of OE
are automatically tri-stated during the data
[A:D]
) can be deasserted HIGH
and DQP
inputs. Doing
[A:D]
.
Burst Write Accesses
The CY7C1350G has an on-chip burst counter that allows the
user the ability to supply a single address and conduct up to
four Write operations without reasserting the address inputs.
ADV/LD
must be driven LOW in order to load the initial
address, as described in the Single Write Access section
above. When ADV/LD is driven HIGH on the subsequent clock
rise, the chip enables (CE
Truth Table
[2, 3, 4, 5, 6, 7, 8]
, CE2, and CE3) and WE inputs are
1
ignored and the burst counter is incremented. The correct
BW
in order to write the correct bytes of data.
inputs must be driven in each cycle of the burst write
[A:D]
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ
places the SRAM in a power conservation “sleep” mode. Two
clock cycles are required to enter into or exit from this “sleep”
mode. While in this mode, data integrity is guaranteed.
Accesses pending when entering the “sleep” mode are not
considered valid nor is the completion of the operation
guaranteed. The device must be deselected prior to entering
the “sleep” mode. CE
for the duration of t
, CE2, and CE3, must remain inactive
1
after the ZZ input returns LOW.
ZZREC
Interleaved Burst Address Table
(MODE = Floating or V
First Address
A1, A0
00011011
01001110
10110001
11100100
Second
Address
A1, A0
DD
)
Third
Address
A1, A0
Fourth
Address
A1, A0
Linear Burst Address Table (MODE = GND)
First Address
A1, A0
Address
A1, A0
00011011
01101100
10110001
11000110
Second
Third
Address
A1, A0
Fourth
Address
A1, A0
OperationAddress UsedCEZZADV/LD WE BWxOE CEN CLKDQ
Deselect CycleNoneHLLXXXLL-HTri-State
Continue Deselect CycleNoneXLHXXXLL-HTri-State
Read Cycle (Begin Burst)ExternalLLLHXLLL-HData Out (Q)
Read Cycle (Continue Burst)NextXLHXXLLL-HData Out (Q)
NOP/Dummy Read (Begin Burst)ExternalLLLHXHLL-HTri-State
Dummy Read (Continue Burst)NextXLHXXHLL-HTri-State
Write Cycle (Begin Burst)ExternalLLLLLXLL-HData In (D)
Write Cycle (Continue Burst)NextXLHXLXLL-HData In (D)
Notes:
2. X =”Don't Care.” H = Logic HIGH, L = Logic LOW. CE
signifies that the desired byte write selects are asserted, see Write Cycle Descript i on table for details.
3. Write is defined by BW
4. When a write cycle is detected, all DQs are tri-stated, even during byte writes.
5. The DQ and DQP pins are controlled by the current cycle and the OE
= H, inserts wait states.
6. CEN
7. Device will power-up deselected and the DQs in a tri-state condition, regardless of OE
is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle DQs and DQP
8. OE
OE
is inactive or when the device is deselected, and DQs and DQP
, and WE. See Write Cycle Descriptions table.
X
stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx = Valid
signal. OE is asynchronous and is not sampled with the clock.
.
= data when OE is active.
[A:D]
= tri-state when
[A:D]
Document #: 38-05524 Rev. *FPage 5 of 15
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