■ 18-Mbit density (2M x 8, 2M x 9, 1M x 18, 512K x 36)
■ 267 MHz clock for high bandwidth
■ 2-word burst for reducing address bus frequency
■ Double Data Rate (DDR) interfaces
(data transferred at 534 MHz) at 267 MHz
■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■ Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
■ Echo clocks (CQ and CQ) simplify data capture in high-speed
systems
■ Synchronous internally self-timed writes
■ DDR-II operates with 1.5 cycle read latency when the DLL is
enabled
■ Operates similar to a DDR-I device with 1 cycle read latency in
DLL off mode
■ 1.8V core power supply with HSTL inputs and outputs
■ Variable drive HSTL output buffers
■ Expanded HSTL output voltage (1.4V–V
■ Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)
■ Offered in both Pb-free and non Pb-free packages
■ JTAG 1149.1 compatible test access port
■ Delay Lock Loop (DLL) for accurate data placement
DD
)
The CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and
CY7C1320CV18 are 1.8V Synchronous Pipelined SRAMs
equipped with DDR-II architecture. The DDR-II consists of an
SRAM core with advanced synchronous peripheral circuitry and
a one-bit burst counter. Addresses for read and write are latched
on alternate rising edges of the input (K) clock. Write data is
registered on the rising edges of both K and K
driven on the rising edges of C and C
edge of K and K
is associated with two 8-bit words in the case of CY7C1316CV18
and two 9-bit words in the case of CY7C1916CV18 that burst
sequentially into or out of the device. The burst counter always
starts with a ‘0’ internally in the case of CY7C1316CV18 and
CY7C1916CV18. For CY7C1318CV18 and CY7C1320CV18,
the burst counter takes in the least significant bit of the external
address and bursts two 18-bit words (in the case of
CY7C1318CV18) of two 36-bit words (in the case of
CY7C1320CV18) sequentially into or out of the device.
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs, D) are tightly matched to the two
output echo clocks CQ/CQ
separately from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
All synchronous inputs pass through input registers controlled by
the K or K
registers controlled by the C or C
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
if C/C are not provided. Each address location
, eliminating the need to capture data
input clocks. All data outputs pass through output
if provided, or on the rising
(or K or K in a single clock
. Read data is
Configurations
CY7C1316CV18 – 2M x 8
CY7C1916CV18 – 2M x 9
CY7C1318CV18 – 1M x 18
CY7C1320CV18 – 512K x 36
Selection Guide
Description267 MHz250 MHz200 MHz167 MHzUnit
Maximum Operating Frequency 267250200167MHz
Maximum Operating Current x8775705575490mA
x9780710580490
x18805730600510
x36855775635540
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document Number: 001-07160 Rev. *E Revised June 18, 2008
CInput ClockPositive Input Clock for Output Data. C is used in conjunction with C
C
KInput ClockPositive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device
K
,
0
1
,
0
,
1
,
2
3
Input OutputSynchronous
Data Input Output Signals. Inputs are sampled on the rising edge of K and K clocks during valid write
operations. These pins drive out the requested data during a read operation. Valid data is driven out on
the rising edge of both the C and C
When read access is deselected, Q
CY7C1316CV18 − DQ
CY7C1916CV18 − DQ
CY7C1318CV18 − DQ
CY7C1320CV18 − DQ
[7:0]
[8:0]
[17:0]
[35:0]
clocks during read operations or K and K when in single clock mode.
are automatically tri-stated.
[x:0]
Synchronous Load. This input is brought LOW when a bus cycle sequence is defined. This definition
Synchronous
Input-
Synchronous
includes address and read/write direction. All transactions operate on a burst of 2 data.
Nibble Write Select 0, 1 − Active LOW(CY7C1316CV18 only). Sampled on the rising edge of the K
and K
clocks during write operations. Used to select which nibble is written into the device during the
current portion of the write operations. Nibbles not written remain unaltered.
NWS0 controls D
and NWS1 controls D
[3:0]
[7:4]
.
All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select
ignores the corresponding nibble of data and it is not written into the device.
Input-
Synchronous
Byte Write Select 0, 1, 2, and 3 − Active LOW. Sampled on the rising edge of the K and K clocks during
write operations. Used to select which byte is written into the device during the current portion of the Write
operations. Bytes not written remain unaltered.
CY7C1916CV18 − BWS
CY7C1318CV18 − BWS0 controls D
CY7C1320CV18 − BWS0 controls D
.
D
[35:27]
controls D
0
[8:0]
and BWS1 controls D
[8:0]
, BWS1 controls D
[8:0]
[17:9].
, BWS2 controls D
[17:9]
and BWS3 controls
[26:18]
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
ignores the corresponding byte of data and it is not written into the device.
Address Inputs. These address inputs are multiplexed for both read and write operations. Internally, the
Synchronous
device is organized as 2M x 8 (2 arrays each of 1M x 8) for CY7C1316CV18 and 2M x 9 (2 arrays each
of 1M x 9) for CY7C1916CV18, 1M x 18 (2 arrays each of 512K x 18) for CY7C1318CV18, and 512K x
36 (2 arrays each of 256K x 36) for CY7C1320CV18.
CY7C1316CV18 – Because the least significant bit of the address internally is a ‘0’, only 20 external
address inputs are needed to access the entire memory array.
CY7C1916CV18 – Because the least significant bit of the address internally is a ‘0’, only 20 external
address inputs are needed to access the entire memory array.
CY7C1318CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
20 address inputs are needed to access the entire memory array.
CY7C1320CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
19 address inputs are needed to access the entire memory array. All the address inputs are ignored when
the appropriate port is deselected.
Synchronous Read/Write Input. When LD is LOW, this input designates the access type (read when
Synchronous
R/W
is HIGH, write when R/W is LOW) for the loaded address. R/W must meet the setup and hold times
around the edge of K.
to clock out the read data from
the device. C and C
can be used together to deskew the flight times of various devices on the board back
to the controller. See Application Example on page 9 for more information.
Input ClockNegative Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C
can be used together to deskew the flight times of various devices on the board back
to the controller. See Application Example on page 9 for more information.
and to drive out data through Q
edge of K.
when in single clock mode. All accesses are initiated on the rising
[x:0]
Input ClockNegative Input Clock Input. K is used to capture synchronous data being presented to the device and
CQOutput Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
for output data (C) of the DDR-II. In single clock mode, CQ is generated with respect to K. The timing for
the echo clocks is shown in Switching Characteristics on page 23.
CQ
ZQInputOutput Impedance Matching Inpu t. This input is used to tune the device outputs to the system data bus
DOFF
TDOOutputTDO for JTAG.
TCKInputTCK Pin for JTAG.
TDIInputTDI Pin for JTAG.
TMSInputTMS Pin for JTAG.
NCN/ANot Connected to the Die. Can be tied to any voltage level.
NC/36MN/ANot Connected to the Die. Can be tied to any voltage level.
NC/72MN/ANot Connected to the Die. Can be tied to any voltage level.
NC/144MN/ANot Connected to the Die. Can be tied to any voltage level.
NC/288MN/ANot Connected to the Die. Can be tied to any voltage level.
V
REF
V
DD
V
SS
V
DDQ
Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
InputDLL Turn Off − Active LOW. Connecting this pin to ground turns off the DLL inside the device. The timing
Input-
Reference
Power Supply Power Supply Inputs to the Core of the Device.
GroundGround for the Device.
Power Supply Power Supply Inputs for the Outputs of the Device.
for output data (C
the echo clocks is shown in Switching Characteristics on page 23.
impedance. CQ, CQ, and Q
between ZQ and ground. Alternatively, this pin can be connected directly to V
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
in the DLL turned off operation is different from that listed in this data sheet. For normal operation, this
pin can be connected to a pull up through a 10 KΩ or less pull up resistor. The device behaves in DDR-I
mode when the DLL is turned off. In this mode, the device can be operated at a frequency of up to 167
MHz with DDR-I timing.
Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
) of the DDR-II. In single clock mode, CQ is generated with respect to K. The timing for
output impedance are set to 0.2 x RQ, where RQ is a resistor connected
The CY7C1316CV18, CY7C1916CV18, CY7C1318CV18, and
CY7C1320CV18 are synchronous pipelined Burst SRAMs
equipped with a DDR interface, which operates with a read
latency of one and half cycles when DOFF
When DOFF
pin is set LOW or connected to VSS the device
behaves in DDR-I mode with a read latency of one clock cycle.
Accesses are initiated on the rising edge of the positive input
clock (K). All synchronous input timing is referenced from the
rising edge of the input clocks (K and K
referenced to the rising edge of the output clocks (C/C
when in single clock mode).
All synchronous data inputs (D
controlled by the rising edge of the input clocks (K and K
synchronous data outputs (Q
controlled by the rising edge of the output clocks (C/C
) pass through input registers
[x:0]
) pass through output registers
[x:0]
when in single-clock mode).
All synchronous control (R/W, LD, BWS
input registers controlled by the rising edge of the input clock (K).
CY7C1318CV18 is described in the following sections. The
same basic descriptions apply to CY7C1316CV18,
CY7C1916CV18, and CY7C1320CV18.
Read Operations
The CY7C1318CV18 is organized internally as two arrays of
512K x 18. Accesses are completed in a burst of two sequential
18-bit data words. Read operations are initiated by asserting
R/W
HIGH and LD LOW at the rising edge of the positive input
clock (K). The address presented to address inputs is stored in
the read address register and the least significant bit of the
address is presented to the burst counter. The burst counter
increments the address in a linear fashion. Following the next K
clock rise, the corresponding 18-bit word of data from this
address location is driven onto Q
timing reference. On the subsequent rising edge of C the next
[17:0]
18-bit data word from the address location generated by the
burst counter is driven onto Q
0.45 ns from the rising edge of the output clock (C or C
when in single clock mode, 200 MHz and 250 MHz device). To
K
. The requested data is valid
[17:0]
maintain the internal logic, each read access must be allowed to
complete. Read accesses can be initiated on every rising edge
of the positive input clock (K).
The CY7C1318CV18 first completes the pending read transactions, when read access is deselected. Synchronous internal
circuitry automatically tri-states the output following the next
rising edge of the positive output clock (C). This enables a
seamless transition between devices without the insertion of wait
states in a depth expanded memory.
Write Operations
Write operations are initiated by asserting R/W LOW and LD
LOW at the rising edge of the positive input clock (K). The
address presented to address inputs is stored in the write
address register and the least significant bit of the address is
presented to the burst counter. The burst counter increments the
address in a linear fashion. On the following K clock rise the data
presented to D
data register, provided BWS
subsequent rising edge of the negative input cl ock (K
is latched and stored into the 18-bit write
[17:0]
are both asserted active. On the
[1:0]
pin is tied HIGH.
) and all output timing is
, or K/K
). All
, or K/K
) inputs pass through
[0:X]
, using C as the output
, or K and
) the infor-
mation presented to D
register , provided BWS
of data are then written into the memory array at the specified
is also stored into the write data
[17:0]
are both asserted active. The 36 bits
[1:0]
location. Write accesses can be initiated on every rising edge of
the positive input clock (K). This pipelines the data flow such that
18 bits of data can be transferred into the device on every rising
edge of the input clocks (K and K
).
When Write access is deselected, the device ignores all inputs
after the pending write operations are completed.
Byte Write Operations
Byte write operations are supported by the CY7C1 318CV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS0 and
BWS
, which are sampled with each set of 18-bit data words.
1
Asserting the appropriate Byte Write Select input during the data
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature can be used to
simplify read/modify/write operations to a byte write operation.
Single Clock Mode
The CY7C1318CV18 can be used with a single clock that
controls both the input and output registers. In this mode the
device recognizes only a single pair of input clocks (K and K) that
control both the input and output registers. This operation is
identical to the operation if the device had zero skew between
the K/K
and C/C clocks. All timing parameters remain the same
in this mode. T o use this mode of operation, tie C and C
HIGH at
power on. This function is a strap option and not alterable during
device operation.
DDR Operation
The CY7C1318CV18 enables high-performance operation
through high clock frequencies (achieved through pipelining) and
double data rate mode of operation. The CY7C1318CV18
requires a single No Operation (NOP) cycle when transitioning
from a read to a write cycle. At higher frequencies, some applications may require a second NOP cycle to avoid contention.
If a read occurs after a write cycle, address and data for the write
are stored in registers. The write information must be stored
because the SRAM cannot perform the last word write to the
array without conflicting with the read. The data stays in this
register until the next write cycle occurs. On the first write cycle
after the read(s), the stored data from the earlier write is written
into the SRAM array. This is called a posted write.
If a read is performed on the same address on which a write is
performed in the previous cycle, the SRAM reads out the most
current data. The SRAM does this by bypassing the memory
array and reading the data from the registers.
Depth Expansion
Depth expansion requires replicating the LD control signal for
each bank. All other control signals can be common between
banks as appropriate.
Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and V
driver impedance. The value of RQ must be 5x the value of the
Vterm = 0.75V
Vterm = 0.75V
R = 50ohms
R = 250ohms
LD#C C#R/W#
DQ
A
K
LD#C C#R/W#
DQ
A
K
SRAM#1
SRAM#2
R = 250ohms
BUS
MASTER
(CPU
or
ASIC)
DQ
Addresses
Cycle Start#
R/W#
Return CLK
Source CLK
Return CLK#
Source CLK#
Echo Clock1/Echo Clock#1
Echo Clock2/Echo Clock#2
ZQ
CQ/CQ#
K#
ZQ
CQ/CQ#
K#
intended line impedance driven by the SRAM. The allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175Ω and 350Ω
output impedance is adjusted every 1024 cycles at power up to
, with V
=1.5V. The
DDQ
account for drifts in supply voltage and temperature.
Echo Clocks
Echo clocks are provided on the DDR-II to simplify data capture
on high-speed systems. Two echo clocks are generated by the
DDR-II. CQ is referenced with respect to C and CQ
with respect to C
. These are free running clocks and are synchro-
is referenced
nized to the output clock of the DDR-II. In the single clock mode,
CQ is generated with respect to K and CQ
respect to K
. The timing for the echo clocks is shown in Switching
is generated with
Characteristics on page 23.
Application Example
Figure 1 shows two DDR-II used in an application.
Figure 1. Application Example
DLL
These chips use a Delay Lock Loop (DLL) that is designed to
function between 120 MHz and the specified maximum clock
frequency. During power up, when the DOFF is tied HIGH, the
DLL is locked after 1024 cycles of stable clock. The DLL can also
be reset by slowing or stopping the input clocks K and K
minimum of 30 ns. However, it is not necessary to reset the DLL
to lock it to the desired frequency. The DLL automatically locks
1024 clock cycles after a stable clock is presented. The DLL may
be disabled by applying ground to the DOFF pin. When the DLL
is turned off, the device behaves in DDR-I mode (with one cycle
latency and a longer access time). For information refer to the
application note DLL Considerations in QDRII™/DDRII.
for a
Document Number: 001-07160 Rev. *EPage 9 of 29
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