1. For guidelines on SRAM system design, refer to the “System Design Guidelines” Cypress application note, availa ble at www.cypress.com.
■ Pin and function compatible with CY7C1041CV33
■ High speed
❐ t
= 10 ns
AA
■ Low active power
❐ I
= 90 mA at 10 ns (industrial)
CC
■ Low CMOS standby power
❐ I
= 10 mA
SB2
■ 2.0V data retention
■ Automatic power down when deselected
■ TTL compatible inputs and outputs
■ Easy memory expansion with CE and OE features
■ Available in Pb-free 48-ball VFBGA, 44-pin (400-mil) molded
SOJ, and 44-pin TSOP II packages
Functional Description
The CY7C1041DV33
organized as 256K words by 16 bits. T o write to the device, take
Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte
LOW Enable (BLE
is written into the location specified on the address pins (A
). If Byte HIGH Enable (BHE) is LOW, then data from IO pins
A
17
(IO
to IO15) is written into the location specified on the address
8
pins (A
to A17).
0
To read from the device, take Chip Enable (CE
Enable (OE
BLE
) LOW while forcing the Write Enable (WE) HIGH. If
is LOW, then data from the memory location specified by
the address pins appears on IO
from memory appears on IO
page 9 for a complete description of read and write modes.
The input and output pins (IO
impedance state when the device is deselected (CE
outputs are disabled (OE
(BHE
, BLE HIGH), or during a write operation (CE LOW and WE
LOW).
The CY7C1041DV33 is available in a standard 44-pin 400-mil
wide SOJ and 44-pin TSOP II package with center power and
ground (revolutionary) pinout and a 48-ball fine-pitch ball g rid
array (FBGA) package.
[1]
is a high performance CMOS Static RAM
) is LOW, then data from IO pins (IO0 to IO7)
to
0
) and Output
to IO7. If BHE is LOW, then data
0
to IO15. See the Truth Table on
8
to IO15) are placed in a high
0
HIGH),
HIGH), BHE and BLE are disabled
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05473 Rev. *E Revised July 17, 2008
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CY7C1041DV33
Selection Guide
1
2
3
4
5
6
7
8
9
11
14
31
32
36
35
34
33
37
40
39
38
12
13
41
44
43
42
16
15
29
30
A
17
18
17
20
19
27
28
25
26
22
21
23
24
A
16
A
15
A
0
A
1
A
2
A
3
A
4
A
7
A
6
A
14
A
13
A
12
A
11
A
9
A
8
A
10
OE
BHE
BLE
CE
WE
IO
0
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
IO
7
IO
8
IO
9
IO
10
IO
11
IO
12
IO
13
IO
14
IO
15
V
CC
V
CC
V
SS
V
SS
NC
10
A
5
WE
V
CC
A
11
A
10
NC
A
6
A
0
A
3
CE
IO
2
IO
0
IO
1
A
4
A
5
IO
3
IO
5
IO
4
IO
6
IO
7
V
SS
A
9
A
8
OE
V
SS
A
7
IO
8
BHE
NC
A
17
A
2
A
1
BLE
V
CC
IO
9
IO
10
IO
11
IO
12
IO
13
IO
14
IO
15
A
15
A
14
A
13
A
12
NC
NC
NC
3
2
6
5
4
1
D
E
B
A
C
F
G
H
A
16
WE
V
CC
A
11
A
10
NC
A
6
A
0
A
3
CE
IO
10
IO
8
IO
9
A
4
A
5
IO
11
IO
13
IO
12
IO
14
IO
15
V
SS
A
9
A
8
OE
V
SS
A
7
IO
0
BHE
NC
A
17
A
2
A
1
BLE
V
CC
IO
2
IO
1
IO
3
IO
4
IO
5
IO
6
IO
7
A
15
A
14
A
13
A
12
NC
NC
NC
3
2
6
5
4
1
D
E
B
A
C
F
G
H
A
16
Notes
2. Automotive product information is Preliminary.
3. NC pins are not connected on the die.
4. Pinout 1 is compliant with CY7C1041CV33 and pinout 2 is JE DEC compliant . The diff erence betwe en the two is that the hig her and lower byte IOs (IO
[7:0]
and IO
[15:8]
balls) are swapped.
Description–10 (Industrial)–12 (Automotive)
Maximum Access Time1012ns
Maximum Operating Current90
95mA
Maximum CMOS Standby Current1015mA
[2]
Unit
Pin Configuration
Figure 1. 44-Pin SOJ/TSOP II
[3, 4]
Figure 2. 48-Ball VFBGA (Pinout 1)
Document #: 38-05473 Rev. *EPage 2 of 13
Figure 3. 48-Ball VFBGA (Pinout 2)
[3, 4]
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CY7C1041DV33
Maximum Ratings
Exceeding maximum ratings may shorten the us eful life of the
device. These user guidelines are not tested.
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied ............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High-Z State
DC Input Voltage
Relative to GND
CC
[5]
.................................. ..–0.3V to VCC +0.3V
[5]
................................–0.3V to VCC +0.3V
[5]
....–0.3V to +4.6V
DC Electrical Characteristics
Over the Operating Range
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
I
SB2
OH
OL
IH
IL
[5]
[5]
Output HIGH VoltageVCC = Min, IOH = –4.0 mA2.42.4V
Output LOW VoltageVCC = Min, IOL = 8.0 mA0.40.4V
Input HIGH Voltage2.0VCC + 0.32.0VCC + 0.3V
Input LOW Voltage–0.30.8–0.30.8V
Input Leakage CurrentGND < VI < V
Output Leakage
GND < V
Current
VCC Operating
VCC = Max, f = f
Supply Current
Automatic CE Power Down
Current—TTL Inputs
Automatic CE Power Down
Current—CMOS Inputs
Max VCC, CE > V
VIN > VIH or
< VIL, f = f
V
IN
Max VCC,
CE
> VCC – 0.3V,
V
> VCC – 0.3V,
IN
< 0.3V, f = 0
or V
IN
CC
< VCC, Output Disabled–1+1–1+1μA
OUT
= 1/tRC100 MHz90-mA
MAX
IH
MAX
Current into Outputs (LOW) ........................................20 mA
Latch Up Current.....................................................>200 mA
Operating Range
Range
Industrial–40°C to +85°C3.3V ± 0.3V10 ns
Automotive –40°C to +125°C3.3V ± 0.3V12 ns
83 MHz80
66 MHz70
40 MHz60
Ambient
Temperature
V
CC
Speed
–10 (Industrial)–12 (Automotive)
MinMaxMinMax
–1+1–1+1μA
95mA
85mA
75mA
2025mA
10
15mA
Unit
Note
5. Minimum voltage is –2.0V and V
(max) = VCC + 2V for pulse durations of less than 20 ns.
IH
Document #: 38-05473 Rev. *EPage 3 of 13
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CY7C1041DV33
Capacitance
90%
10%
3.0V
GND
90%
10%
ALL INPUT PULSES
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
Rise Time: 1 V/ns
Fall Time: 1 V/ns
30 pF*
OUTPUT
Z = 50Ω
50Ω
1.5V
(b)
(a)
3.3V
OUTPUT
5 pF
(c)
R 317Ω
R2
351Ω
High-Z Characteristics
10 ns device
Notes
6. Tested initially and after any design or process changes that may affect these parameters.
7. AC characteristics (except High-Z) are tested using the load conditions shown in AC Test Loads and Waveforms (a). High-Z characteristics are tested for all speeds
using the test load shown in (c).
Still Air, soldered on a 3 × 4.5 inch,
four layer printed circuit board
AC Test Loads and Waveforms
The AC test loads and waveform diagram follows.
[7]
FBGA
Package
SOJ
Package
TSOP II
Package
27.8957.9150.66°C/W
14.7436.7317.17°C/W
Unit
Document #: 38-05473 Rev. *EPage 4 of 13
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CY7C1041DV33
AC Switching Characteristics Over the Operating Range
Notes
8. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I
OL/IOH
and 30-pF load capacitance.
9. t
POWER
gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access is performed.
10.t
HZOE
, t
HZCE
, t
HZBE,
and t
HZWE
are specified with a load capacitance of 5 pF as in part (c) of AC Test Loads and Waveforms. Transition is measured when the outp uts enter
a high impedance state.
11.At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, t
HZBE
is less than t
LZBE
, and t
HZWE
is less than t
LZWE
for any given
device.
[8]
ParameterDescription
Read Cycle
[9]
t
power
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
[12, 13]
VCC(Typical) to the First Access100100μs
Read Cycle Time1012ns
Address to Data Valid1012ns
Data Hold from Address Change33ns
CE LOW to Data Valid1012ns
OE LOW to Data Valid56ns
OE LOW to Low-Z00ns
OE HIGH to High-Z
CE LOW to Low-Z
CE HIGH to High-Z
CE LOW to Power Up00ns
CE HIGH to Power Down1012ns
Byte Enable to Data Valid56ns
Byte Enable to Low-Z00ns
Byte Disable to High-Z66ns
Write Cycle Time1012ns
CE LOW to Write End78ns
Address Setup to Write End78ns
Address Hold from Write End00ns
Address Setup to Write Start00ns
WE Pulse Width78ns
Data Setup to Write End56ns
Data Hold from Write End00ns
WE HIGH to Low-Z
WE LOW to High-Z
Byte Enable to End of Write78ns
[10, 11]
[11]
[10, 11]
[11]
[10, 11]
–10 (Industrial)–12 (Automotive)
MinMaxMinMax
56ns
33ns
56ns
33ns
56ns
Unit
Document #: 38-05473 Rev. *EPage 5 of 13
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CY7C1041DV33
Data Retention Characteristics Over the Operating Range
3.0V3.0V
t
CDR
VDR> 2V
DATA RETENTION MODE
t
R
CE
V
CC
PREVIOUS DATA VALIDDATA VALID
t
RC
t
AA
t
OHA
ADDRESS
DATA OUT
Notes
12.The internal write time of the memory is defined by the overlap of CE
LOW and WE LOW. CE and WE must be LOW to initiate a write and the transition of either of
these signals can terminate the write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates the write.
13.The minimum write cycle time for Write Cycle No. 4 (WE
controlled, OE LOW) is the sum of t
HZWE
and tSD.
14.No input may exceed V
CC
+ 0.3V.
15.Full device operation requires linear V
CC
ramp from V
DR
to V
CC(min.)
> 50 μs or stable at V
CC(min.)
> 50 μs.
16.Device is continuously selected. OE
, CE, BHE, and BHE = VIL.
17.WE
is HIGH for read cycle.
ParameterDescriptionConditions
V
DR
I
CCDR
t
CDR
[15]
t
R
[6]
VCC for Data Retention2.0V
Data Retention CurrentVCC = VDR = 2.0V,
CE
> VCC – 0.3V,
> VCC – 0.3V or VIN < 0.3V
V
IN
Chip Deselect to Data Retention Time0ns
Operation Recovery Timet
Data Retention Waveform
Switching Waveforms
Figure 4. Read Cycle No. 1
[16, 17]
[14]
MinMaxUnit
Ind’l10mA
Auto15
RC
mA
ns
Document #: 38-05473 Rev. *EPage 6 of 13
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CY7C1041DV33
Switching Waveforms (continued)
50%
50%
DATA VALID
t
RC
t
ACE
t
DOE
t
LZOE
t
LZCE
t
PU
HIGH IMPEDANCE
t
HZOE
t
HZBE
t
PD
HIGH
OE
CE
ICCISB
IMPEDANCE
ADDRESS
DATA OUT
V
CC
SUPPLY
t
DBE
t
LZBE
t
HZCE
BHE, BLE
CURRENT
I
CC
I
SB
t
HD
t
SD
t
SCE
t
SA
t
HA
t
AW
t
PWE
t
WC
BW
DATAIO
ADDRESS
CE
WE
BHE, BLE
t
Notes
18.Address valid prior to or coincident with CE
transition LOW.
19.Data IO is high impedance if OE
or BHE and BLE = V
IH.
20.If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Figure 5. Read Cycle No. 2 (OE Controlled)
[17, 18]
Figure 6. Write Cycle No. 1 (CE Controlled)
Document #: 38-05473 Rev. *EPage 7 of 13
[19, 20]
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CY7C1041DV33
Switching Waveforms (continued)
t
HD
t
SD
t
BW
t
SA
t
HA
t
AW
t
PWE
t
WC
t
SCE
DATAIO
ADDRESS
BHE
,BLE
WE
CE
t
HD
t
SD
t
PWE
t
SA
t
HA
t
AW
t
SCE
t
WC
t
HZOE
DATAIN VALID
CE
ADDRESS
WE
DATA IO
OE
NOTE21
BHE,BLE
Note
21.During this period the IOs are in the output state and input signals should not be applied.
Figure 7. Write Cycle No. 2 (BLE or BHE Controlled)
Figure 8. Write Cycle No. 3 (WE Controlled, OE HIGH During Write)
LLHLLData OutData OutRead All BitsActive (I
LLHLHData OutHigh-ZRead Lower Bits OnlyActive (I
LLHHLHigh-ZData OutRead Upper Bits OnlyActive (I
LXLLLData InData InWrite All BitsActive (I
LXLLHData InHigh-ZWrite Lower Bits OnlyActive (I
LXLHLHigh-ZData InWrite Upper Bits OnlyActive (I
LHHXXHigh-ZHigh-ZSelected, Outputs DisabledActive (I
*A233729RKFSee ECN1.AC, DC parameters are modified as per EROS(Spec # 01-2165)
*B351117PCISee ECNChanged from Advance to Preliminary
*C446328NXRSee ECNConverted from Prelimi nary to Final
*D480177VKNSee ECNAdded -10BVI product ordering code in the Ordering Information table
*E2541850VKN/PYRS07/22/08Added -10BVJXI part
Submission
Date
Description of Change
2.Pb-free offering in the ‘Ordering information’
Removed 15 and 20 ns Speed bin
Corrected DC voltage (min) value in maximum ratings section from - 0.5 to
- 0.3V
Redefined I
(Com’l): Changed from 100, 80 and 67 mA to 90, 80 and 75 mA for 8, 10
I
CC
and 12ns speed bins respectively
I
(Ind’l): Changed from 80 and 67 mA to 90 and 85 mA for 10 and 12ns speed
CC
bins respectively
values for Com’l and Ind’l temperature ranges
CC
Added Static Discharge Voltage and latch-up current spec
Added V
Changed Note# 4 on AC Test Loads
)spec in Note# 2
IH(max
Changed reference voltage level for measurement of Hi-Z parameters from
±500 mV to ±200 mV
Added Data Retention Characteristics/Waveform and footnote # 11, 12
Added Write Cycle (WE
Controlled, OE HIGH During Write) Timing Diagram
Changed Package Diagram name from 44-Pin TSOP II Z44 to 44-Pin TSOP II
ZS44 and from 44-Pin (400-mil) Molded SOJ V34 to 44-Pin (400-mil) Molded
SOJ V44
Changed part names from Z to ZS in the Ordering Information Tabl e
Added 8 ns Product Information
Added Pin-Free Ordering Information
Shaded Ordering Information Table
Removed -8 speed bin
Removed Commercial Operating Range product information
Included Automotive Operating Range product information
Updated Thermal Resistance table
Updated footnote #8 on High-Z parameter measurement
Updated the ordering information and replaced Package Name column with
Package Diagram in the Ordering Information Table
Document #: 38-05473 Rev. *EPage 12 of 13
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CY7C1041DV33
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. T o find the office
closest to you, visit us at cypress.com/sales.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States co pyright la ws and inte rnatio na l tre aty prov isi ons. Cyp ress he reby g rant s to lice nsee a p erson al, no n-ex clusi ve, non-tra nsferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpo se of creating custom sof tware and or firm ware in support of licen see product to be use d only in conjunction with a Cypress
integrated circuit as specified in th e applicable agreement. Any reproductio n, modification, translation, co mpilation, o r representati on of this Sour ce Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the ap plicati on or u se o f any pr oduct o r circui t descri bed h erein. Cypr ess does not aut horize it s product s for use a s critical compo nent s in life-support systems whe re
a malfunction or failure may reasonab ly be expected to resu lt in significant injury t o the user. The inclusion of Cypress’ prod uct in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 38-05473 Rev. *ERevised July 17, 2008 Page 13 of 13
All product and company names mentioned in this document are the trademarks of their respective holders.
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