CY7C1024DV33
3-Mbit (128K X 24) Static RAM
Features
Logic Block Diagram
COLUMN
DECODER
ROW DECODER
SENSE AMPS
INPUT BUFFER
128K x 24
ARRAY
I/O0 – I/O
23
OE
CE1, CE2, CE
3
WE
CONTROL LOGIC
A
(9:0)
A
(16:10)
■
High speed
❐
tAA = 10 ns
■
Low active power
❐
ICC = 175 mA at 10 ns
■
Low CMOS standby power
❐
I
= 25 mA
SB2
■
Operating voltages of 3.3 ± 0.3V
■
2.0V data retention
■
Automatic power down when deselected
■
TTL compatible inputs and outputs
■
Easy memory expansion with CE1, CE2, and CE3 features
■
Available in Pb-free standard 119-ball PBGA
Functional Description
The CY7C1024DV33 is a high performance CMOS static RAM
organized as 128K words by 24 bits. This device has an
automatic power down feature that significantly reduces power
consumption when deselected.
To write to the device, enable the chip (CE
and CE
LOW), while forcing the Write Enable (WE) input LOW.
3
T o read from the device, enable the chip by taking CE
HIGH, and CE3 LOW while forcing the Output Enable (OE) LOW
and the Write Enable (WE
) HIGH. See the Truth Table on page
7 for a complete description of Read and Write modes.
The 24 I/O pins (I/O
state when the device is deselected (CE
CE
HIGH) or when the output enable (OE) is HIGH during a
3
write operation. (CE
LOW).
to I/O23) are placed in a high impedance
0
LOW, CE2 HIGH, CE3 LOW, and WE
1
LOW, CE2 HIGH,
1
LOW, CE
1
HIGH, CE2 LOW, or
1
2
Cypress Semiconductor Corporation • 198 Champion Court • San Jose,CA 95134-1709 • 408-943-2600
Document Number: 001-08353 Rev. *C Revised November 6, 2008
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Selection Guide
1 2 3 4 5 6 7
A NCAAAAANC
B NC A A CE
1
AANC
C I/O
12
NC CE
2
NC CE
3
NC I/O
0
D I/O
13
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
1
E I/O
14
V
SS
V
DD
V
SS
V
DD
V
SS
I/O
2
F I/O
15
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
3
G I/O
16
V
SS
V
DD
V
SS
V
DD
V
SS
I/O
4
H I/O
17
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
5
J NC V
SS
V
DD
V
SS
V
DD
V
SS
NC
K I/O
18
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
6
L I/O
19
V
SS
V
DD
V
SS
V
DD
V
SS
I/O
7
M I/O
20
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
8
N I/O
21
V
SS
V
DD
V
SS
V
DD
V
SS
I/O
9
P I/O
22
V
DD
V
SS
V
SS
V
SS
V
DD
I/O
10
R I/O
23
NC NC NC NC NC I/O
11
T NC A A WE AANC
U NC A A OE AANC
Note
1. NC pins are not connected on the die.
Description –10 Unit
Maximum Access Time 10 ns
Maximum Operating Current 175 mA
Maximum CMOS Standby Current 25 mA
Pin Configuration
Figure 1. 119-Ball PBGA Top View
[1]
Document Number: 001-08353 Rev. *C Page 2 of 9
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Maximum Ratings
Notes
2. V
IL
(min) = –2.0V and VIH(max) = VCC + 2V for pulse durations of less than 20 ns.
3. CE
refers to a combination of CE1, CE2, and CE3. CE is LOW when CE1, CE3 are LOW and CE2 is HIGH. CE is HIGH when CE1 is HIGH, or CE2 is LOW, or CE3 is HIGH.
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
DC Input Voltage
Current into Outputs (LOW) ..................... ... ................20 mA
Static Discharge Voltage............................................>2001V
(MIL-STD-883, Method 3015)
Latch Up Current.....................................................>200 mA
Power Applied ............................................ –55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High Z State
Relative to GND
CC
[2]
...................................–0.5V to VCC + 0.5V
[2]
....–0.5V to +4.6V
Operating Range
DC Electrical Characteristics
Over the Operating Range
Parameter Description Test Conditions
V
V
V
V
I
I
I
I
I
OH
OL
IH
IL
IX
OZ
CC
SB1
SB2
[2]
Output HIGH Voltage VCC = Min, IOH = –4.0 mA 2.4 V
Output LOW Voltage VCC = Min, IOL = 8.0 mA 0.4 V
Input HIGH Voltage 2.0 VCC + 0.3 V
Input LOW Voltage –0.3 0.8 V
Input Leakage Current GND < VI < V
Output Leakage Current GND < V
VCC Operating Supply
Current
Automatic CE Power Down
Current —TTL Inputs
Automatic CE Power Down
Current — CMOS Inputs
VCC = Max, f = f
I
= 0 mA CMOS levels
OUT
Max VCC, CE > V
VIN > VIH or VIN < VIL, f = f
Max VCC, CE > VCC – 0.3V,
> VCC – 0.3V, or VIN < 0.3V, f = 0
V
IN
CC
< VCC, output disabled –1 +1 μA
OUT
= 1/t
MAX
RC
IH
MAX
[2]
...............................–0.5V to VCC + 0.5V
Range
Ambient
T emperature
V
CC
Industrial –40°C to +85°C3.3V ± 0.3V
[3]
–10
Min Max
Unit
–1 +1 μA
175 mA
30 mA
25 mA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions Max Unit
C
C
IN
OUT
Input Capacitance TA = 25°C, f = 1 MHz, VCC = 3.3V 8 pF
I/O Capacitance 10 pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions
Θ
Θ
Thermal Resistance
JA
(Junction to Ambient)
Thermal Resistance
JC
(Junction to Case)
Still air, soldered on a 3 × 4.5 inch,
four layer printed circuit board
Document Number: 001-08353 Rev. *C Page 3 of 9
119-Ball
PBGA
20.31 °C/W
8.35 °C/W
Unit
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