■ Available in Pb-free 32-pin 400-Mil wide Molded SOJ, 32-pin
and OE options
TSOP II and 48-ball VFBGA packages
The CY7C1019DV33 is a high-performance CMOS static RAM
organized as 131,072 words by 8 bits. Easy memory expansion
is provided by an active LOW Chip Enable (CE), an active LOW
Output Enable (OE
), and three-state drivers. This device has an
automatic power-down feature that significantly reduces power
consumption when deselected.
Writing to the device is accomplished by taking Chip Enable (CE)
and Write Enable (WE
(I/O
through I/O7) is then written into the location specified on
0
the address pins (A
) inputs LOW. Data on the eight I/O pins
through A16).
0
Reading from the device is accomplished by taking Chip Enable
(CE
) and Output Enable (OE) LOW while forcing Write Enable
) HIGH. Under these conditions, the contents of the memory
(WE
location specified by the address pins will appear on the I/O pins.
The eight input/output pins (I/O
high-impedance state when the device is deselected (CE
the outputs are disabled (OE
LOW, and WE LOW).
(CE
through I/O7) are placed in a
0
HIGH),
HIGH), or during a write operation
The CY7C1019DV33 is available in Pb-free 32-pin 400-Mil wide
Molded SOJ, 32-pin TSOP II and 48-ball VFBGA packages.
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document Number: 38-05481 Rev. *F Revised October 20, 2011
= VCC + 1 V for pulse durations of less than 5 ns.
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 C to +150 C
Ambient Temperature with
Power Applied ......................................... –55 C to +125 C
Supply Voltage on
V
to Relative GND
CC
DC Voltage Applied to Outputs
in High Z State
[2]
...............................–0.3 V to +4.6 V
[2]
................................–0.3 V to VCC + 0.3 V
Electrical Characteristics
Over the Operating Range
DC Input Voltage
[2]
............................–0.3 V to VCC + 0.3 V
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ..........................> 2001 V
Latch-up Current .................................................... > 200 mA
Operating Range
RangeAmbient TemperatureV
CC
Industrial–40 C to +85 C 3.3 V 0.3 V10 ns
Speed
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
I
SB2
OH
OL
IH
IL
Output HIGH voltageMin VCC, IOH = –4.0 mA2.4–V
Output LOW voltageMin VCC, IOL = 8.0 mA–0.4V
Input HIGH voltage2.0V
Input LOW voltage
Input leakage currentGND < VIN < V
Output leakage currentGND < V
VCC operating supply currentVCC = Max, I
Automatic CE power-down
current – TTL inputs
Automatic CE power-down
current – CMOS inputs
[2]
CC
< VCC, output disabled–1+1A
IN
= 0 mA,
OUT
MAX
= 1/t
RC
f = f
Max VCC, CE > VIH,
V
> VIH or VIN < VIL, f = f
IN
Max VCC, CE > VCC – 0.3 V,
V
> VCC – 0.3 V or VIN < 0.3 V, f = 0
IN
MAX
-10 (Industrial)
MinMax
+ 0.3V
CC
Unit
–0.30.8V
–1+1A
100 MHz–60mA
83 MHz–55mA
66 MHz–45mA
40 MHz–30mA
–10mA
–3mA
Document Number: 38-05481 Rev. *F Page 4 of 16
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Page 5
CY7C1019DV33
Capacitance
90%
10%
3.0 V
GND
90%
10%
ALL INPUT PULSES
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
Rise Time: 1 V/ns
Fall Time: 1 V/ns
30 pF*
OUTPUT
Z = 50
50
1.5V
(b)
(a)
3.3 V
OUTPUT
5 pF
(c)
R1 317
R2
351
High-Z characteristics:
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. AC characteristics (except High Z) are tested using the load conditions shown in Figure 3 (a). High Z characteristics are tested for all speeds using the test load shown
in Figure 3 (c).
Parameter
C
IN
C
OUT
[3]
DescriptionTest ConditionsMaxUnit
Input CapacitanceTA = 25 °C, f = 1 MHz, VCC = 3.3 V8pF
Output Capacitance8pF
Thermal Resistance
Parameter
JA
JC
[3]
DescriptionTest Conditions32-pin SOJ32-pin TSOP II 48-ball VFBGA Unit
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
AC Test Loads and Waveforms
Figure 3. AC Test Loads and Waveforms
Still Air, soldered on a 3 × 4.5
inch, four-layer printed circuit
board
56.2962.2236C/W
38.1421.439C/W
[4]
Document Number: 38-05481 Rev. *F Page 5 of 16
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Page 6
CY7C1019DV33
Switching Characteristics
Notes
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V.
6. t
POWER
gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access can be performed.
7. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any given device.
8. t
HZOE
, t
HZCE
, and t
HZWE
are specified with a load capacitance of 5 pF as in Figure 3 on page 5 (c). Transition is measured when the outputs enter a high impedance state.
9. This parameter is guaranteed by design and is not tested.
10. The internal write time of the memory is defined by the overlap of CE
LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of these signals
can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
11. The minimum write cycle time for Write Cycle no. 3 (WE
controlled, OE LOW) is the sum of t
HZWE
and tSD.
Over the Operating Range
Parameter
Read Cycle
[6]
t
power
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
[9]
t
PU
[9]
t
PD
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
[5]
Description
-10 (Industrial)
MinMax
Unit
VCC(typical) to the first access100–s
Read cycle time10–ns
Address to data valid–10ns
Data hold from address change3–ns
CE LOW to data valid–10ns
OE LOW to data valid–5ns
OE LOW to low Z
OE HIGH to high Z
CE LOW to low Z
CE HIGH to high Z
[7]
[7]
[7, 8]
[7, 8]
0–ns
–5ns
3–ns
–5ns
CE LOW to power-up0–ns
CE HIGH to power-down–10ns
[10, 11]
Write cycle time10–ns
CE LOW to write end8–ns
Address set-up to write end8–ns
Address hold from write end0–ns
Address set-up to write start0–ns
WE pulse width7–ns
Data set-up to write end5–ns
Data hold from write end0–ns
WE HIGH to low Z
WE LOW to high Z
[7]
[7, 8]
3–ns
–5ns
Document Number: 38-05481 Rev. *F Page 6 of 16
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Page 7
CY7C1019DV33
Data Retention Characteristics
3.0 V3.0 V
t
CDR
V
DR
> 2 V
DATA RETENTION MODE
t
R
CE
V
CC
PREVIOUS DATA VALIDDATA OUT VALID
RC
t
AA
t
OHA
tRC
ADDRESS
DATA I/O
Notes
12. Tested initially and after any design or process changes that may affect these parameters.
13. Full device operation requires linear V
CC
ramp from V
DR
to V
CC(min.)
> 50 s or stable at V
CC(min.)
> 50 s.
14. Device is continuously selected. OE
, CE = VIL.
15. WE
is HIGH for Read cycle.
Over the Operating Range
ParameterDescriptionConditionsMinMaxUnit
V
DR
I
CCDR
t
CDR
[13]
t
R
[12]
VCC for data retention2.0–V
Data retention currentVCC = VDR = 2.0 V, CE > VCC – 0.3 V,
*F341634210/20/2011TAVAUpdated Functional Description (Removed the Note “For guidelines on SRAM
Orig. of
Change
Description of Change
Pb-free Offering in Ordering Information
Added T
Shaded Ordering Information
Removed Commercial Operating range
Removed 8 ns speed bin
Added I
Added 48-ball VFBGA package
Updated Thermal Resistance table
Updated Ordering Information table
Changed Overshoot spec from VCC + 2 V to VCC + 1 V in footnote #3
Updated Package Diagrams.
system design, please refer to the ‘System Design Guidelines’ Cypress
application note, available on the internet at www.cypress.com.” and its
reference in Functional Description).
Updated Electrical Characteristics.
Updated Switching Waveforms.
Updated Package Diagrams.
Added Acronyms and Units of Measure.
Updated in new template.
Spec in Switching Characteristics table
power
values for the frequencies 83 MHz, 66 MHz and 40 MHz
CC
Document Number: 38-05481 Rev. *F Page 15 of 16
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Page 16
CY7C1019DV33
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Sou rce Code and derivative works for the sole purpose of cr eating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05481 Rev. *F Revised October 20, 2011Page 16 of 16
All products and company names mentioned in this document may be the trademarks of their respective holders.
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