• Available in Pb-free 32-pin 400-Mil wide Molded SOJ and
32-pin TSOP II packages
Logic Block Diagram
Functional Description
[1]
The CY7C1019D is a high-performance CMOS static RAM
organized as 131,072 words by 8 bits. Easy memory
expansion is provided by an active LOW Chip Enable (CE
active LOW Output Enable (OE
), and tri-state drivers. This
), an
device has an automatic power-down feature that significantly
reduces power consumption when deselected. The eight input
and output pins (IO
through IO7) are placed in a
0
high-impedance state when:
• Deselected (CE HIGH)
• Outputs are disabled (OE
• When the write operation is active (CE
Write to the device by taking Chip Enable (CE
Enable (WE
) inputs LOW. Data on the eight IO pins (IO
HIGH)
LOW, an d WE LOW).
) and Write
through IO7) is then written into the location specified on the
address pins (A
through A16).
0
Read from the device by taking Chi p En ab l e (CE) and Output
Enable (OE
) LOW while forcing Write Enable (WE) HIGH.
Under these conditions, the contents of the memory location
specified by the address pins appears on the IO pins.
0
INPUT BUFFER
A
0
A
1
A
2
A
3
A
4
A
5
A
6
7
8
ROW DECODER
A
A
CE
WE
OE
Note
1. For guidelines on SRAM system design, please refer to the ‘System Design Guidelines’ Cypress application note, available on the internet at www.cypress.com.
128K x 8
ARRAY
COLUMN DECODER
9
12
10
A
A
14
11
A
A13A
A
A15A
SENSE AMPS
POWER
DOWN
16
IO
0
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
IO
7
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document #: 38-05464 Rev. *E Revised February 22, 2007
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Pin Configuration
CY7C1019D
SOJ/TSOPII
Top View
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A
A
A
A
OE
IO
IO
V
V
IO
IO
A
A
A
A
A
16
15
14
13
7
6
SS
CC
5
4
12
11
10
9
8
IO
IO
V
V
IO
IO
WE
A
A
A
A
CE
CC
SS
A
A
A
A
1
0
1
2
3
2
4
3
5
6
0
7
1
8
9
10
2
3
11
12
4
13
5
14
6
15
16
7
Selection Guide
–10 (Industrial)Unit
Maximum Access Time10ns
Maximum Operating Current80mA
Maximum Standby Current3mA
Document #: 38-05464 Rev. *EPage 2 of 11
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CY7C1019D
Maximum Ratings
Exceeding the maximum ratings may impair the useful life of
the device. These user guidelines are not tested.
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High-Z State
DC Input Voltage
to Relative GND
CC
[2]
...................................–0.5V to VCC + 0.5V
[2]
................................–0.5V to VCC + 0.5V
[2]
... –0.5V to +6.0V
Current into Outputs (LOW) ................................... ..... 20 mA
Still Air, soldered on a 3 × 4.5 inch,
four-layer printed circuit board
400-Mil
Wide SOJ
56.2962.22°C/W
38.1421.43°C/W
TSOP IIUnit
(Junction to Case)
[4]
ALL INPUT PULSES
90%
10%
(b)
90%
10%
Fall Time: ≤ 3 ns
OUTPUT
Z = 50
Ω
50Ω
1.5V
30 pF*
3.0V
GND
Rise Time: ≤ 3 ns
(a)
High-Z characteristics:
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
5 pF
R1 480Ω
R2
255Ω
(c)
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. AC characteristics (except High-Z) are tested using the load conditions shown in Figure (a). High-Z characteristics are test ed for all speeds using the test load
shown in Figure (c).
Document #: 38-05464 Rev. *EPage 4 of 11
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CY7C1019D
Switching Characteristics (Over the Operating Range)
ParameterDescription
Read Cycle
[6]
t
power
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
[9]
t
PU
[9]
t
PD
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
VCC(typical) to the first access100µs
Read Cycle Time10ns
Address to Data Valid10ns
Data Hold from Address Change3ns
CE LOW to Data Valid10ns
OE LOW to Data V alid5ns
OE LOW to Low Z0ns
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
[7, 8]
[8]
[7, 8]
CE LOW to Power-Up0ns
CE HIGH to Power-Down10ns
[10, 11]
Write Cycle Time10ns
CE LOW to Write End7ns
Address Set-Up to Write End7ns
Address Hold from Write End0ns
Address Set-Up to Write Start0ns
WE Pulse Width7ns
Data Set-Up to Write End6ns
Data Hold from Write End0ns
WE HIGH to Low Z
WE LOW to High Z
[8]
[7, 8]
[5]
–10 (Industrial)
MinMax
Unit
5ns
3ns
5ns
3ns
5ns
Notes
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
6. t
7. t
8. At any given temperature and voltage condition, t
9. This parameter is guaranteed by design and is not tested.
10.The internal write time of the memory is defined by the overlap of CE
11.The minimum write cycle time for Write Cycle no. 3 (WE
and 30-pF load capacitance.
I
OL/IOH
gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access can be performed.
POWER
, t
HZCE
, and t
HZOE
high impedance state.
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
are specified with a load capacitance of 5 pF as in (c) of “AC Test Loads and Waveforms
HZWE
is less than t
HZCE
controlled, OE LOW) is the sum of t
, t
LZCE
is less than t
HZOE
LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of
LZOE
, and t
HZWE
[4]
” on page 4. Transition is measured when the outputs enter a
is less than t
HZWE
and tSD.
for any given device.
LZWE
Document #: 38-05464 Rev. *EPage 5 of 11
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CY7C1019D
Data Retention Characteristics (Over the Operating Range)
ParameterDescriptionConditionsMinMaxUnit
V
DR
I
CCDR
[3]
t
CDR
[12]
t
R
Data Retention Waveform
Switching Waveforms
Read Cycle No. 1 (Address Transition Controlled)
VCC for Data Retention2.0V
Data Retention CurrentVCC = VDR = 2.0V, CE > VCC – 0.3V,
V
> VCC – 0.3V or VIN < 0.3V
IN
Chip Deselect to Data Retention Time0ns
Operation Recovery Timet
DATA RETENTION MODE
V
V
CC
t
CDR
CE
[13, 14]
DR
> 2V
4.5V4.5V
RC
t
R
3mA
ns
ADDRESS
DATA OUT
PREVIOUS DATA VALIDDATA VALID
Read Cycle No. 2 (OE Controlled)
ADDRESS
CE
OE
DATA OUT
V
CC
SUPPLY
CURRENT
HIGH IMPEDANCE
t
LZCE
t
PU
[14, 15]
t
ACE
t
LZOE
t
OHA
t
DOE
50%
tRC
RC
t
AA
t
RC
t
HZOE
t
DATA VALID
HZCE
t
PD
HIGH
IMPEDANCE
ICC
50%
ISB
Notes
12.Full device operation requires linear V
13.Device is continuously selected. OE
14.WE
is HIGH for Read cycle.
15.Address valid prior to or coincident with CE
ramp from V
CC
, CE = VIL.
DR
transition LOW.
to V
> 50 µs or st able at V
CC(min)
CC(min)
> 50 µs.
Document #: 38-05464 Rev. *EPage 6 of 11
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Switching Waveforms (continued)
Write Cycle No. 1 (CE
ADDRESS
CE
WE
DATA IO
Controlled)
[16, 17]
CY7C1019D
t
WC
t
SCE
t
SA
t
t
AW
t
PWE
SCE
t
SD
DATA VALID
t
HA
t
HD
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)
ADDRESS
t
SCE
CE
t
AW
t
SA
WE
OE
DATA IO
NOTE18
t
HZOE
[16, 17]
t
WC
t
PWE
t
SD
DATAINVALID
t
HA
t
HD
Notes
16.Data IO is high impedance if OE
17.If CE
goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
18.During this period the IOs are in the output state and input signals should not be applied.
= VIH.
Document #: 38-05464 Rev. *EPage 7 of 11
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Switching Waveforms (continued)
Write Cycle No. 3 (WE
ADDRESS
CE
Controlled, OE LOW)
[11, 17]
t
SCE
t
CY7C1019D
WC
t
HA
t
LZWE
t
HD
WE
DATA IO
NOTE18
t
AW
t
SA
t
HZWE
t
PWE
t
SD
DATA VALID
Truth Table
CEOEWEIO0–IO
7
HXXHigh ZPower-DownStandby (ISB)
LLHData OutReadActive (I
LXLData InWriteActive (ICC)
LHHHigh ZSelected, Outputs Disabled Active (ICC)