• True dual-ported memory cells which all ow simultaneous access of the same memory location
• Two Flow-Through/Pipelined devices
—4K x 18 organization (CY7C09349AV)
—8K x 18 organization (CY7C09359AV)
• Three Modes
—Flow-Through
—Pipelined
—Burst
• Pipelined outpu t mode on both ports allo ws fast 83-MHz
operation
• 0.35-micron CMOS for optimum speed/power
v
Logic Block Diagram
• High-speed clock to data access 9 and 12 ns (max.)
• 3.3V Low operating power
—A cti ve = 135 mA ( typi cal)
— Standby = 10 µA (typical)
• Fully synchronous int erf ace for easier operation
• Burst counters increment addresses internally
— Shorten cycle times
—Minimize bus noise
—Supported in Flow-Through and Pi peli ned m odes
• Dual Chip Enables f or easy depth expansi on
• Upper and lower byte controls for bus matching
• Aut omatic power-down
• Commercial and Industrial temperature ranges
Available in 100-pin TQFP
•
R/W
L
UB
L
CE
0L
CE
1L
LB
L
OE
L
FT/Pipe
I/O9L–I/O
I/O0L–I/O
A
CLK
ADS
CNTEN
CNTRST
L
17L
8L
[1][1]
0L–A11/12L
L
L
L
12/13
L
0/1
9
9
1
0
0/1
1b
0b 1a 0a
ba
Counter/
Address
Register
Decode
I/O
Control
True Dual-Ported
RAM Array
I/O
Control
0/1
1b
0b1a0a
ba
Counter/
Address
Register
Decode
1
0
0/1
9
9
12/13
R/W
CE
CE
FT/Pipe
I/O9R–I/O
I/O0R–I/O
A0R–A
11/12R
CLK
ADS
CNTEN
CNTRST
UB
LB
OE
R
R
0R
1R
R
R
R
17R
8R
R
R
R
R
Notes:
1. A
for 4K; A0–A12 for 8K devices.
0–A11
For the most recent informati on, visit the Cypress web site at www .cypress. com
Cypress Semiconductor Corporation
•3901 North First Street•San Jose•CA 95134•408-943-2600
Nove mber 13, 2000
CY7C09349AV
CY7C09359AV
Functional Description
A HIGH on CE
down the internal circu itry to reduce the static power consu mpThe CY7C09349AV and CY7C09359AV are high-speed 3.3V
synchronous CMOS 4K and 8K x 18 dual-port static RAMs.
Two ports are provide d, permitt ing i ndependent , si mul taneous
access for rea ds and writes to an y lo catio n in memory.
[2]
Registers on contr ol, addr ess, a nd data lin es allo w f o r mini mal setup and hold times . In pipelined out put mode, dat a is registere d
for decr ease d cycle t ime . Cloc k to dat a v ali d t
lined). Flow-through mode can also be used to bypass the
= 9 ns (pipe-
CD2
pipelined output register to eliminate access latency. In flowthrough mode data will be available t
dress is clocked into the device. Pipelined output or flowthrough mode is selected via the FT
= 18 ns after the ad-
CD1
/Pipe pin.
Each port contains a burs t co unter on the i nput address r egister. The internal write pulse width is indep endent of the LOWto-HIGH tra nsition of the clock signal . The internal write pulse
is self-t imed to allow the sho rtest possible cycle t ime s.
tion. The use of multiple Chip Enables allows easier banking
of multiple chips for depth expansion configurations. In the
pipelined mode, one cycle is required with CE
HIGH to reactivate the outputs.
Counter enabl e inputs are pro vided to sta ll the oper ation of the
address input an d utilize the internal address gener ated by t he
internal counter for fast interleaved memor y applications. A
port’s burst counter is loaded with the port’s Address Strobe
(ADS
the address counter will increment on each LOW-to-HIGH
transition of that port’s clock signal. This will read/write one
word from/into ea ch su cces siv e addres s locat ion unt il CNTEN
is deasserted. The counter can address the entire memory
array an d will loop back to the start. Counter Reset (CNTRST
is used to reset the burst counter.
All parts are available in 100-pin Thin Quad Plastic Flatpack
(TQFP) packages.
Note:
2. When simultaneously writing to the same location, final value cannot be guaranteed.
or LOW on CE1 for one clock cy cle will power
0
LOW and CE
0
). When the port’s Count Enable (CNTEN) is asserted,
Max Access Time (ns) (Clock to Data, Pipelined)912
Typical Operating Current I
Typical Standby Current for I
Typical Standby Current for I
Shaded areas contain advance information.
Note:
3. This pin is NC for CY7C09349AV.
(mA)135115
CC
(mA) (Both Ports TTL Level)2020
SB1
(µA) (Both P orts CMOS Lev el)10 µA10 µA
SB3
3
CY7C09349AV
CY7C09359AV
-12
Pin Definitions
Left PortRight PortDescription
A0L–A
12L
ADS
L
CE0L,CE
CLK
L
CNTEN
L
CNTRST
I/O0L–I/O
LB
L
UB
L
OE
L
R/W
L
FT/PIPE
GNDGround Input.
NCNo Connect.
V
CC
L
1L
L
17L
A0R–A
12R
ADS
R
CE0R,CE
CLK
R
CNTEN
CNTRST
I/O0R–I/O
LB
R
UB
R
OE
R
R/W
R
FT/PIPE
Address Inputs (A0–A
for 4K, A0–A
11
for 8K devices).
12
Address Strobe I nput. Used as an addr ess qualifier . This signal should be ass erted LOW during
normal read or write transactions. Asserting this signal LOW also loads the burst address
counter with data present on the I/O pins.
Chip Enable Inpu t. To select ei ther the left or right port, both CE0 AND CE1 must be asserted
1R
to their active states (C E
≤ VIL and CE1 ≥ VIH).
0
Clock Signal. This input can be free running or strobed. Maximum clock input rate is f
R
Counter Enable In put. Asserting this signal LOW increments the b urst address coun ter of it s
respectiv e port on each rising edge of CLK. CNTEN
LOW.
Counter Reset Input. Asserting thi s signal LO W resets t he burs t address count er of its res pec-
R
tive port to zero. CNTRST
Data Bus Input/Output (I/O0–I/O15 for x16 devi c es).
17R
is not disab led by asserting ADS or CNTEN.
Lower Byte Select Input. Asserting this signal LOW enables read and write oper ations to the
lower byte (I/O
the LB
and OE signals m ust be asserted to driv e out put dat a on the l ower b yte of the dat a pi ns.
–I/O8 for x18, I/O0–I/O7 for x16) of the memory arra y. For read oper ations both
0
Upper Byte Select Input. Same function as LB, but to the upper byte (I/O
Output Enable Input. Thi s signal must be ass erted LOW to enable t he I/O data pins during read
operations.
Read/Write Enable Input. This signal is asserted LOW to write to the dual port memory array.
For read operations, assert this pin HIGH.
Flow-Through/ Pipelined Select Input. For flow-through mode operation, assert this pin LOW.
R
For pipelined mode operation, assert this pin HIGH.
Power Input.
CY7C09349AV
CY7C09359AV
.
MAX
is disab led if ADS or CNTRST are as serted
8/9L
–I/O
15/17L
).
Maximum Ratings
(Abov e which the useful life may be impair ed. For user guidelines, not tested.)
Storage Temperature ............ .. .......... ... ...... –65
Ambient Temperature with
Power Applied .............................................–55
Supply Voltage to Gr o u nd Potent ia l ..... ......... . –0.5V to +4.6V
DC Voltage Applied to
Outputs in High Z State ...........................–0.5V to V
DC Input Voltage......................................–0.5V to V
Notes:
4. Industrial parts are available in CY7C09359AV only.
°
C to +150°C
°
C to +125°C
+0.5V
CC
+0.5V
CC
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage .......... ............ ............ .........>2001V
Latch-Up Current .....................................................>200 mA
Operating Range
Range
Commercial0°C to +70°C 3.3V ± 300 mV
Industrial
[4]
Ambient
TemperatureV
CC
–40°C to +85°C 3.3V ± 300 mV
4
CY7C09349AV
CY7C09359AV
Electrical Characteristics
Over the Operating Range
ParameterDescription
V
V
V
V
I
I
I
I
I
I
OH
OL
IH
IL
OZ
CC
SB1
SB2
SB3
SB4
Output HIGH Voltage (V
Output LOW Voltage (V
CC
= Min., I
CC
= Min., I
Input HIGH Voltage2.02.0V
Input LOW Voltage0.80.8V
Output Leakage Current–1010–1010µA
Operating Current (V
I
= 0 mA) Outputs Disabled
OUT
Standby Current (Both Ports TTL
[5]
Level)
CEL & CER ≥ VIH, f =f
CC
= Max.,
Standby Current (One Port TTL Lev el)
CE
≥ VIH, f =f
R
Standby Current (Bot h Ports CMOS
[5]
Level)
Standby Current (One Port CMOS
[5]
Level)
MAX
CEL & CER ≥ V
– 0.2V, f = 0
CC
CEL | CER ≥ VIH, f = f
MAX
MAX
CY7C09349AV
CY7C09359AV
-9-12
Min.Typ.Max.Min.Typ.Max.
= –4.0 mA)2.42.4V
OH
= +4.0 mA)0.40.4V
OH
Com’l.135230115180mA
Ind.
[4]
155250mA
Com’l.20752070mA
[5]
CEL |
[4]
Ind.
Com’l.9515585140mA
[4]
Ind.
3080mA
95150mA
Com’l.1050010500µA
Ind.
[4]
10500µA
Com’l.8511575100mA
Ind.
[4]
85110mA
Unit
Capacitance
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Note:
5. CE
and CER are internal signals. To select either the left or right port, both CE0 AND CE1 must be asserted to their active states (CE0 ≤ VIL and CE1 ≥ VIH).
L
Input CapacitanceTA = 25°C, f = 1 MHz,
V
= 3.3V
Output Capacitance10pF
CC
10pF
5
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