■ Ultra low standby power
❐ Typical standby current: 1 μA
❐ Maximum standby current: 7 μA
■ Ultra low active power
❐ Typical active current: 2 mA at f = 1 MHz
■ Easy memory expansion with CE and OE features
■ Automatic power down when deselected
■ CMOS for optimum speed and power
■ Available in Pb-free 44-pin TSOP II package
Functional Description
The CY62146E is a high performance CMOS static RAM
organized as 256K words by 16 bits. This device features
advanced circuit design to provide ultra low active current. It is
ideal for providing More Battery Life™ (MoBL
cations such as cellular telephones. The device also has an
automatic power down feature that reduces power consumption
when addresses are not toggling. Placing the device into standby
®
) in portable appli-
mode reduces power consumption by more than 99% when
deselected (CE
) are placed in a high impedance state when:
IO
15
■ Deselected (CE HIGH)
■ Outputs are disabled (OE HIGH)
■ Both Byte High Enable and Byte Low Enable are disabled
(BHE
, BLE HIGH)
■ Write operation is active (CE LOW and WE LOW)
To write to the device, take Chip Enable (CE
(WE
) inputs LOW. If Byte Low Enable (BLE) is LOW, then data
from IO pins (IO
specified on the address pins (A
Enable (BHE
HIGH). The input and output pins (IO0 through
) and Write Enable
through IO7) is written into the location
0
) is LOW, then data from IO pins (IO8 through IO15)
through A17). If Byte High
0
is written into the location specified on the address pins (A
through A17).
To read from the device, take Chip Enable (CE
Enable (OE
Byte Low Enable (BLE
) LOW while forcing the Write Enable (WE) HIGH. If
) is LOW, then data from the memory
location specified by the address pins appea rs on IO
Byte High Enable (BHE
appears on IO
of read and write modes.
to IO15. See Table 1 for a complete description
8
) is LOW, then data from memory
) and Output
to IO7. If
0
For best practice recommendations, refer to the Cypress
application note AN1064, SRAM System Guidelines.
0
Cypress Semiconductor Corporation•198 Champion Court•San Jose, CA 95134-1709•408-943-2600
Document Number: 001-07970 Rev. *D Revised February 01, 2008
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CY62146E MoBL
®
Pin Configuration
1
2
3
4
5
6
7
8
9
11
14
31
32
36
35
34
33
37
40
39
38
12
13
41
44
43
42
16
15
29
30
A
5
18
17
20
19
27
28
25
26
22
21
23
24
A
6
A
7
A
4
A
3
A
2
A
1
A
0
A
15
A
16
A
8
A
9
A
10
A
11
A
13
A
14
A
12
OE
BHE
BLE
CE
WE
IO
0
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
IO
7
IO
8
IO
9
IO
10
IO
11
IO
12
IO
13
IO
14
IO
15
V
CC
V
CC
V
SS
V
SS
NC
10
A
17
Notes
1. NC pins are not connected on the die.
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
CC
= V
CC(typ)
, TA = 25°C.
Figure 1. 44-Pin TSOP II (Top View)
[1]
Product Portfolio
ProductRange
VCC Range (V)
MinTyp
[2]
MaxTyp
CY62146ELLInd’l/Auto-A4.55.05.54522.5152017
Document Number: 001-07970 Rev. *DPage 2 of 11
Speed
(ns)
Power Dissipation
Operating ICC, (mA)
f = 1 MHzf = f
[2]
MaxTyp
[2]
max
MaxTyp
Standby, I
(μA)
[2]
SB2
Max
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CY62146E MoBL
®
Maximum Ratings
Notes
3. V
IL
(min) = –2.0V for pulse durations less than 20 ns for I < 30 mA.
4. V
IH
(max) = VCC + 0.75V for pulse durations less than 20 ns.
5. Full Device AC operation assumes a minimum of 100 μs ramp time from 0 to V
CC
(min) and 200 μs wait time after VCC stabilization.
6. Only chip enable (CE
) and byte enables (BHE and BLE) is tied to CMOS levels to meet the I
SB2
/ I
CCDR
spec. Other inputs are left floating.
Exceeding maximum ratings may impair the useful life of th e
device. These user guidelines are not tested.
Storage Temperature.................................. –65°C to +150°C
Ambient Temperature with
Power Applied ............................................–55°C to +125°C
DC Input Voltage
Output Current into Outputs (LOW).............................20 mA
Latch up Current............................................... .......>200 mA
Operating Range
Supply Voltage to Ground Potential..................–0.5V to 6.0V
DC Voltage Applied to Outputs
in High-Z State
[3, 4]
..........................................–0.5V to 6.0V
Electrical Characteristics
Over the Operating Range
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB2
OH
OL
IH
IL
[6]
Output HIGH VoltageIOH = –1.0 mA2.4V
Output LOW VoltageIOL = 2.1 mA0.4V
Input HIGH Voltage4.5 < VCC < 5.52.2V
Input LOW Voltage4.5 < VCC < 5.5–0.50.8V
Input Leakage Current GND < VI < V
CC
Output Leakage Current GND < VO < VCC, Output Disabled–1+1μA
VCC Operating Supply
Current
Automatic CE Power
down Current — CMOS
f = f
= 1/t
max
RC
f = 1 MHz22.5
CE
> VCC – 0.2V, VIN > VCC – 0.2V or VIN < 0.2V,
f = 0, V
CC
V
=
CC(max)
VCC = V
I
OUT
Inputs
[3, 4]
.......................................–0.5V to 6.0V
DeviceRange
Ambient
Temperature
[5]
V
CC
CY62146ELLInd’l/Auto-A –40°C to +85°C 4.5V–5.5V
45 ns (Ind’l/Auto-A)
[2]
Max
+ 0.5V
CC
UnitMinTyp
–1+1μA
CCmax
1520mA
= 0 mA, CMOS levels
17μA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
ParameterDescriptionTest ConditionsMaxUnit
C
C
IN
OUT
Input CapacitanceTA = 25°C, f = 1 MHz,
V
= V
CC
Output Capacitance10pF
CC(typ)
10pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
ParameterDescriptionTest ConditionsTSOP IIUnit
Θ
Θ
Thermal Resistance
JA
(Junction to Ambient)
Thermal Resistance
JC
(Junction to Case)
Still Air, soldered on a 3 × 4.5 inch, two layer
printed circuit board
77°C/W
13°C/W
Document Number: 001-07970 Rev. *DPage 3 of 11
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CY62146E MoBL
®
Figure 2. AC Test Loads and Waveforms
VCC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUTV
Equivalent to:THÉ VENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
TH
Notes
7. T ested initially and after any design or process changes that may affect these parameters.
8. Full device operation requires linear V
CC
ramp from V
DR
to V
CC(min)
> 100 μs or stable at V
CC(min)
> 100 μs.
V
CC(min)
V
CC(min)
t
CDR
VDR> 2.0V
DATA RETENTION MODE
t
R
V
CC
CE
Parameters5.0VUnit
R11800Ω
R2990Ω
R
TH
V
TH
639Ω
1.77V
Data Retention Characteristics
Over the Operating Range
ParameterDescriptionConditionsMinTyp
V
DR
I
CCDR
t
CDR
[8]
t
R
[7]
VCC for Data Retention2V
[6]
Data Retention Current
= 2V, CE > VCC – 0.2V,
V
CC
VIN > VCC – 0.2V or VIN < 0.2V
Chip Deselect to Data
0ns
Retention Time
Operation Recovery Timet
RC
[2]
MaxUnit
17μA
ns
Figure 3. Data Retention Waveform
Document Number: 001-07970 Rev. *DPage 4 of 11
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CY62146E MoBL
®
Switching Characteristics
Notes
9. T est conditions for all p arameters other than tri-st ate paramet ers assume signal transi tion time of 3 ns (1V/ns) or le ss, timing reference le vels of 1.5V, input pulse levels
of 0 to 3V, and output loading of the specified I
OL/IOH
as shown in AC Test Loads and Waveforms on page 4.
10.AC timing parameters are subject to byte enable signals (BHE
or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.
11.At any temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZBE
is less than t
LZBE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any device.
12.t
HZOE
, t
HZCE
, t
HZBE
, and t
HZWE
transitions are measured when the outputs enter a high-impedance state.
13.The internal write time of the memory is defined by the overlap of WE
, CE = VIL, BHE, BLE or both = VIL. All signals must be active to initiate a write and any of th ese
signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
Over the Operating Range
ParameterDescription
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
BW
t
SD
t
HD
t
HZWE
t
LZWE
Read Cycle Time45ns
Address to Data Valid45ns
Data Hold from Address Change10ns
CE LOW to Data Valid45ns
OE LOW to Data Valid22ns
OE LOW to LOW-Z
OE HIGH to High-Z
CE LOW to Low-Z
CE HIGH to High-Z
CE LOW to Power Up0ns
CE HIGH to Power Down45ns
BLE/BHE LOW to Data Valid22ns
BLE/BHE LOW to Low-Z
BLE/BHE HIGH to HIGH-Z
[13]
Write Cycle Time45ns
CE LOW to Write End35ns
Address Setup to Write End35ns
Address Hold from Write End0ns
Address Setup to Write Start0ns
WE Pulse Width35ns
BLE/BHE LOW to Write End35ns
Data Setup to Write End25ns
Data Hold from Write End0ns
WE LOW to High-Z
WE HIGH to Low-Z
*A684343See ECNVKNAdded Preliminary Auto motive-A Information
*B925501See ECNVKNAdded footnote #8 related to I
*C1045260See ECNVKNConverted Automotive-A specs from preliminary to final
*D2073548See ECNVKN/AESA Corrected typo in the Data Retention Waveform and removed its irrelevant
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States co pyright la ws and inte rnatio na l tre aty prov isi ons. Cyp ress he reby g rant s to lice nsee a p erson al, no n-ex clusi ve, non-tra nsferable license to copy, use, modify , create de rivative works of ,
and compile the Cypress Source Code and derivative works for the sole purpo se of creating custom sof tware and or firm ware in support of licen see product to be use d only in conjunction with a Cypress
integrated circuit as specified in th e applicable agreement. Any reproductio n, modification, translation, co mpilation, o r representati on of this Sour ce Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the ap plicati on or u se o f any pr oduct o r circui t descri bed h erein. Cypr ess does not aut horize it s product s for use a s critical compo nent s in life-support systems whe re
a malfunction or failure may reasonab ly be expected to resu lt in significant injury t o the user. The inclusion of Cypress’ prod uct in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-07970 Rev. *DRevised February 01, 2008Page 11 of 11
MoBL is a registered trademark and Mor e Battery Life is a trademark of Cypre ss Semiconductor. A ll product and company names mentioned in this document are the trademarks of their respective holders.
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