Cypress CY62146E User Manual

CY62146E MoBL
®
4-Mbit (256K x 16) Static RAM

Features

256K x 16
RAM Array
IO
0
–IO
7
ROW DECODER
A
8
A
7
A
6
A
5
A
2
COLUMN DECODER
A
11
A12A
13
A
14
A
15
SENSE AMPS
DATA IN DRIVERS
OE
A
4
A
3
IO8–IO
15
CE
WE
BHE
A
16
A
0
A
1
A
9
A
10
BLE
A
17
Logic Block Diagram
Very high speed: 45 ns
Ultra low standby powerTypical standby current: 1 μAMaximum standby current: 7 μA
Ultra low active power Typical active current: 2 mA at f = 1 MHz
Easy memory expansion with CE and OE features
Automatic power down when deselected
CMOS for optimum speed and power
Available in Pb-free 44-pin TSOP II package

Functional Description

The CY62146E is a high performance CMOS static RAM organized as 256K words by 16 bits. This device features advanced circuit design to provide ultra low active current. It is ideal for providing More Battery Life (MoBL cations such as cellular telephones. The device also has an automatic power down feature that reduces power consumption when addresses are not toggling. Placing the device into standby
®
) in portable appli-
mode reduces power consumption by more than 99% when deselected (CE
) are placed in a high impedance state when:
IO
15
Deselected (CE HIGH)
Outputs are disabled (OE HIGH)
Both Byte High Enable and Byte Low Enable are disabled
(BHE
, BLE HIGH)
Write operation is active (CE LOW and WE LOW)
To write to the device, take Chip Enable (CE (WE
) inputs LOW. If Byte Low Enable (BLE) is LOW, then data from IO pins (IO specified on the address pins (A Enable (BHE
HIGH). The input and output pins (IO0 through
) and Write Enable
through IO7) is written into the location
0
) is LOW, then data from IO pins (IO8 through IO15)
through A17). If Byte High
0
is written into the location specified on the address pins (A through A17).
To read from the device, take Chip Enable (CE Enable (OE Byte Low Enable (BLE
) LOW while forcing the Write Enable (WE) HIGH. If
) is LOW, then data from the memory location specified by the address pins appea rs on IO Byte High Enable (BHE appears on IO of read and write modes.
to IO15. See Table 1 for a complete description
8
) is LOW, then data from memory
) and Output
to IO7. If
0
For best practice recommendations, refer to the Cypress application note AN1064, SRAM System Guidelines.
0
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600 Document Number: 001-07970 Rev. *D Revised February 01, 2008
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Pin Configuration

1 2 3 4 5 6 7 8 9
11
14
31
32
36 35 34 33
37
40 39 38
12 13
41
44 43 42
16
15
29
30
A
5
18
17
20
19
27
28
25
26
22
21
23
24
A
6
A
7
A
4
A
3
A
2
A
1
A
0
A
15
A
16
A
8
A
9
A
10
A
11
A
13
A
14
A
12
OE BHE BLE
CE
WE
IO
0
IO
1
IO
2
IO
3
IO
4
IO
5
IO
6
IO
7
IO
8
IO
9
IO
10
IO
11
IO
12
IO
13
IO
14
IO
15
V
CC
V
CC
V
SS
V
SS
NC
10
A
17
Notes
1. NC pins are not connected on the die.
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
CC
= V
CC(typ)
, TA = 25°C.
Figure 1. 44-Pin TSOP II (Top View)
[1]

Product Portfolio

Product Range
VCC Range (V)
Min Typ
[2]
Max Typ
CY62146ELL Ind’l/Auto-A 4.5 5.0 5.5 45 2 2.5 15 20 1 7
Document Number: 001-07970 Rev. *D Page 2 of 11
Speed
(ns)
Power Dissipation
Operating ICC, (mA)
f = 1 MHz f = f
[2]
Max Typ
[2]
max
Max Typ
Standby, I
(μA)
[2]
SB2
Max
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Maximum Ratings

Notes
3. V
IL
(min) = –2.0V for pulse durations less than 20 ns for I < 30 mA.
4. V
IH
(max) = VCC + 0.75V for pulse durations less than 20 ns.
5. Full Device AC operation assumes a minimum of 100 μs ramp time from 0 to V
CC
(min) and 200 μs wait time after VCC stabilization.
6. Only chip enable (CE
) and byte enables (BHE and BLE) is tied to CMOS levels to meet the I
SB2
/ I
CCDR
spec. Other inputs are left floating.
Exceeding maximum ratings may impair the useful life of th e device. These user guidelines are not tested.
Storage Temperature.................................. –65°C to +150°C
Ambient Temperature with
Power Applied ............................................–55°C to +125°C
DC Input Voltage
Output Current into Outputs (LOW).............................20 mA
Static Discharge Voltage............................................>2001V
(MIL-STD-883, Method 3015)
Latch up Current............................................... .......>200 mA

Operating Range

Supply Voltage to Ground Potential..................–0.5V to 6.0V
DC Voltage Applied to Outputs in High-Z State
[3, 4]
..........................................–0.5V to 6.0V

Electrical Characteristics

Over the Operating Range
Parameter Description Test Conditions
V V V V I
IX
I
OZ
I
CC
I
SB2
OH OL IH IL
[6]
Output HIGH Voltage IOH = –1.0 mA 2.4 V Output LOW Voltage IOL = 2.1 mA 0.4 V Input HIGH Voltage 4.5 < VCC < 5.5 2.2 V Input LOW Voltage 4.5 < VCC < 5.5 –0.5 0.8 V Input Leakage Current GND < VI < V
CC
Output Leakage Current GND < VO < VCC, Output Disabled –1 +1 μA VCC Operating Supply
Current Automatic CE Power
down Current — CMOS
f = f
= 1/t
max
RC
f = 1 MHz 2 2.5 CE
> VCC – 0.2V, VIN > VCC – 0.2V or VIN < 0.2V,
f = 0, V
CC
V
=
CC(max)
VCC = V I
OUT
Inputs
[3, 4]
.......................................–0.5V to 6.0V
Device Range
Ambient
Temperature
[5]
V
CC
CY62146ELL Ind’l/Auto-A –40°C to +85°C 4.5V–5.5V
45 ns (Ind’l/Auto-A)
[2]
Max
+ 0.5 V
CC
UnitMin Typ
–1 +1 μA
CCmax
15 20 mA
= 0 mA, CMOS levels
17μA

Capacitance

Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions Max Unit
C C
IN OUT
Input Capacitance TA = 25°C, f = 1 MHz,
V
= V
CC
Output Capacitance 10 pF
CC(typ)
10 pF

Thermal Resistance

Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions TSOP II Unit
Θ
Θ
Thermal Resistance
JA
(Junction to Ambient) Thermal Resistance
JC
(Junction to Case)
Still Air, soldered on a 3 × 4.5 inch, two layer printed circuit board
77 °C/W
13 °C/W
Document Number: 001-07970 Rev. *D Page 3 of 11
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Figure 2. AC Test Loads and Waveforms
VCC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUT V
Equivalent to: THÉ VENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
TH
Notes
7. T ested initially and after any design or process changes that may affect these parameters.
8. Full device operation requires linear V
CC
ramp from V
DR
to V
CC(min)
> 100 μs or stable at V
CC(min)
> 100 μs.
V
CC(min)
V
CC(min)
t
CDR
VDR> 2.0V
DATA RETENTION MODE
t
R
V
CC
CE
Parameters 5.0V Unit
R1 1800 Ω R2 990 Ω
R
TH
V
TH
639 Ω
1.77 V

Data Retention Characteristics

Over the Operating Range
Parameter Description Conditions Min Typ
V
DR
I
CCDR
t
CDR
[8]
t
R
[7]
VCC for Data Retention 2 V
[6]
Data Retention Current
= 2V, CE > VCC – 0.2V,
V
CC
VIN > VCC – 0.2V or VIN < 0.2V
Chip Deselect to Data
0ns
Retention Time Operation Recovery Time t
RC
[2]
Max Unit
17μA
ns
Figure 3. Data Retention Waveform
Document Number: 001-07970 Rev. *D Page 4 of 11
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Switching Characteristics

Notes
9. T est conditions for all p arameters other than tri-st ate paramet ers assume signal transi tion time of 3 ns (1V/ns) or le ss, timing reference le vels of 1.5V, input pulse levels of 0 to 3V, and output loading of the specified I
OL/IOH
as shown in AC Test Loads and Waveforms on page 4.
10.AC timing parameters are subject to byte enable signals (BHE
or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.
11.At any temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZBE
is less than t
LZBE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any device.
12.t
HZOE
, t
HZCE
, t
HZBE
, and t
HZWE
transitions are measured when the outputs enter a high-impedance state.
13.The internal write time of the memory is defined by the overlap of WE
, CE = VIL, BHE, BLE or both = VIL. All signals must be active to initiate a write and any of th ese
signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
Over the Operating Range
Parameter Description
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
BW
t
SD
t
HD
t
HZWE
t
LZWE
Read Cycle Time 45 ns Address to Data Valid 45 ns Data Hold from Address Change 10 ns CE LOW to Data Valid 45 ns OE LOW to Data Valid 22 ns OE LOW to LOW-Z OE HIGH to High-Z CE LOW to Low-Z CE HIGH to High-Z CE LOW to Power Up 0 ns CE HIGH to Power Down 45 ns BLE/BHE LOW to Data Valid 22 ns BLE/BHE LOW to Low-Z BLE/BHE HIGH to HIGH-Z
[13]
Write Cycle Time 45 ns CE LOW to Write End 35 ns
Address Setup to Write End 35 ns Address Hold from Write End 0 ns
Address Setup to Write Start 0 ns WE Pulse Width 35 ns BLE/BHE LOW to Write End 35 ns
Data Setup to Write End 25 ns Data Hold from Write End 0 ns WE LOW to High-Z WE HIGH to Low-Z
[9, 10]
[11] [11, 12]
[11]
[11, 12]
[11]
[11, 12]
[11, 12] [11]
45 ns (Ind’l/Auto-A)
Min Max
Unit
5ns
18 ns
10 ns
18 ns
5ns
18 ns
18 ns
10 ns
Document Number: 001-07970 Rev. *D Page 5 of 11
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Switching Waveforms

PREVIOUS DATA VALID DATA VALID
RC
t
AA
t
OHA
t
RC
ADDRESS
DATA OUT
50%
50%
DATA VALID
t
RC
t
ACE
t
LZBE
t
LZCE
t
PU
HIGH IMPEDANCE
I
CC
t
HZOE
t
HZCE
t
PD
t
HZBE
t
LZOE
t
DBE
t
DOE
IMPEDANCE
HIGH
I
SB
DATA OUT
OE
CE
V
CC
SUPPLY
CURRENT
BHE
/BLE
ADDRESS
Notes
14.The device is continuously selected. OE
, CE = VIL, BHE, BLE, or both = VIL.
15.WE
is HIGH for read cycle.
16.Address valid before or similar to CE
, BHE, BLE transition LOW.
Figure 4. Read Cycle No.1: Address Transition Controlled.
[14, 15]
Figure 5. Read Cycle No. 2: OE Controlled
[15, 16]
Document Number: 001-07970 Rev. *D Page 6 of 11
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Switching Waveforms (continued)
t
HD
t
SD
t
PWE
t
SA
t
HA
t
AW
t
WC
t
HZOE
DATA
IN
NOTE 19
t
BW
t
SCE
DATA IO
ADDRESS
CE
WE
OE
BHE/BLE
t
HD
t
SD
t
PWE
t
HA
t
AW
t
SCE
t
WC
t
HZOE
DATA
IN
t
BW
t
SA
CE
ADDRESS
WE
DATA IO
OE
BHE/BLE
NOTE 19
Notes
17.Data IO is high impedance if OE
= VIH.
18.If CE
goes HIGH simultaneously with WE = VIH, the output remains in a high impedance state.
19.During this period, the IOs are in output state. Do not apply input signals.
Figure 6. Write Cycle No 1: WE
Controlled
[13, 17, 18]
Figure 7. Write Cycle 2: CE Controlled
[13, 17, 18]
Document Number: 001-07970 Rev. *D Page 7 of 11
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Switching Waveforms (continued)
DATAIN
t
HD
t
SD
t
LZWE
t
PWE
t
SA
t
HA
t
AW
t
SCE
t
WC
t
HZWE
t
BW
NOTE 19
CE
ADDRESS
WE
DATA IO
BHE
/BLE
t
HD
t
SD
t
SA
t
HA
t
AW
t
WC
DATA
IN
t
BW
t
SCE
t
PWE
t
HZWE
t
LZWE
NOTE 19
DATA IO
ADDRESS
CE
WE
BHE
/BLE
Figure 8. Write Cycle 3: WE
controlled, OE LOW
[18]
Figure 9. Write Cycle 4: BHE/BLE Controlled, OE LOW
Document Number: 001-07970 Rev. *D Page 8 of 11
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Table 1. Truth Table
CE WE OE BHE BLE Inputs/Outputs Mode Power
H X X X X High-Z Deselect/Power down Standby (I L X X H H High-Z Output Disabled Active (I L H L L L Data Out (IO LHLHLData Out (IO
IO
–IO
8
L H L L H Data Out (IO8–IO15);
–IO7 in High-Z
IO
0
–IO15) Read Active (ICC)
0
in High-Z
15
–IO7);
0
Read Active (I
Read Active (I
L H H L L High-Z Output Disabled Active (I L H H H L High-Z Output Disabled Active (I L H H L H High-Z Output Disabled Active (I L L X L L Data In (IO L L X H L Data In (IO
IO
–IO
8
L L X L H Data In (IO8–IO15);
IO
–IO7 in High-Z
0
–IO15) Write Active (ICC)
0 0
in High-Z
15
–IO7);
Write Active (I
Write Active (I
CC
CC
CC
CC CC CC
CC
CC

Ordering Information

Speed
(ns)
Ordering Code
45 CY62146ELL-45ZSXI 51-85087 44-pin Thin Small Outline Package II (Pb-free) Industrial
CY62146ELL-45ZSXA 51-85087 44-pin Thin Small Outline Package II (Pb-free) Automotive-A
Contact your local Cypress sales representative for availability of these parts.
Package Diagram
Package Type
Operating
)
SB
)
)
)
) ) )
)
)
Range
Document Number: 001-07970 Rev. *D Page 9 of 11
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Package Diagrams

51-85087-*A
Figure 10. 44-Pin TSOP II, 51-85087
Document Number: 001-07970 Rev. *D Page 10 of 11
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Document History Page

Document Title: CY62146E MoBL® 4-Mbit (256K x 16) Static RAM Document Number: 001-07970
REV. ECN NO. Issue Date
** 463213 See ECN NXR New Data Sheet
*A 684343 See ECN VKN Added Preliminary Auto motive-A Information
*B 925501 See ECN VKN Added footnote #8 related to I
*C 1045260 See ECN VKN Converted Automotive-A specs from preliminary to final *D 2073548 See ECN VKN/AESA Corrected typo in the Data Retention Waveform and removed its irrelevant
Orig. of
Change Description of Change
Updated Ordering Information Table
Added footnote #13 related AC timing parameters
footnote
SB2
and I
CCDR
© Cypress Semiconductor Corporation, 2006-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life sa vin g, critical control or safety applications, unless pursuant to an express written agreement with C ypr ess. Fur th ermo r e, Cyp r ess d oe s no t a uth or iz e its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States co pyright la ws and inte rnatio na l tre aty prov isi ons. Cyp ress he reby g rant s to lice nsee a p erson al, no n-ex clusi ve, non-tra nsferable license to copy, use, modify , create de rivative works of , and compile the Cypress Source Code and derivative works for the sole purpo se of creating custom sof tware and or firm ware in support of licen see product to be use d only in conjunction with a Cypress integrated circuit as specified in th e applicable agreement. Any reproductio n, modification, translation, co mpilation, o r representati on of this Sour ce Code except as specified above is prohibited without the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the ap plicati on or u se o f any pr oduct o r circui t descri bed h erein. Cypr ess does not aut horize it s product s for use a s critical compo nent s in life-support systems whe re a malfunction or failure may reasonab ly be expected to resu lt in significant injury t o the user. The inclusion of Cypress’ prod uct in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-07970 Rev. *D Revised February 01, 2008 Page 11 of 11
MoBL is a registered trademark and Mor e Battery Life is a trademark of Cypre ss Semiconductor. A ll product and company names mentioned in this document are the trademarks of their respective holders.
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