• Low volt age rang e :
—2.7V–3.6V (CY62128V)
—2.3V–2.7V (CY62128V25)
—1.6V–2.0V (CY62128V18)
• Low active power and standby power
• Easy memory expansion wit h CE
and OE fe atures
• TTL-compatible inputs and outputs
• Aut om atic power-d ow n when deselected
• CMOS for optimum speed/power
Functional Description
The CY62128V f ami ly i s com posed of three hi gh-per formanc e
CMOS static RAMs organized as 131,072 words by 8 bits.
Easy memory expansion is provided by an active LOW Chip
Enabl e ( CE
), an active HIGH Chip Enable (CE2), an active
1
Logic Block Diagram
I/O
I/O1
I/O
I/O
I/O
I/O
I/O
I/O
62128V-1
CE
CE
WE
OE
INPUT BUFFER
A
0
A
1
A
2
A
3
A
4
A
5
A
6
ROW DECODER
A
7
A
8
1
2
512x256x 8
ARRAY
COLUMN
DECODER
11
10
9
A
A
A
SENSE AMPS
POWER
DOWN
14
15
12
16
A
A
A
A13A
LOW Output Enable (OE
) and three-state drivers. These devices have an automatic power-down feature, reducing the
power consumption by over 99% when deselected. The
CY62128V family is available in the standard 450-mil-wide
SOIC, 32-lead TSOP-I, and STSOP packages.
Writing to the device is accomplished by taking Chip Enable
one (CE
Enable two (CE
) and Write Enable (WE) inputs LOW and the Chip
1
) input HIGH. Data on the eig ht I/O pins (I/O
2
through I/O7) is then written into the location specified on the
address pins (A
through A16).
0
Reading from the device is accomplished by taking Chip Enable one (CE
Write Enable (WE
) and Output Enable (OE) LOW whil e forcing
1
) and Chip Enable two (CE2) HIGH. Under
these conditions, the contents of the memory location specified by the address pins will appear on the I/O pins.
The eight input/output pins (I/O
high-impedance state when the device is deselected (CE
through I/O7) are placed in a
0
HIGH or CE2 LOW), the outputs are disabled (OE HIGH), or
during a write oper ation ( CE
0
2
3
4
5
6
7
LOW , CE2 HIGH, and W E LOW) .
1
Pin
Configurations
Top View
SOIC
NC
A
A
A
I/O
I/O
I/O
GND
1
16
2
3
14
4
12
5
A
7
A
6
6
A
5
7
A
8
4
A
9
3
A
10
2
A
1
11
A
12
0
0
13
1
14
2
15
16
V
32
CC
31
A
15
30
CE
2
29
WE
28
A
13
27
A
8
26
A
9
25
A
11
24
OE
23
A
10
22
CE
1
I/O
21
7
I/O
6
20
I/O
5
19
I/O
4
18
17
I/O
62128V-2
3
0
1
A
4
16
A
5
15
A
14
6
A
13
7
A
12
12
V
CE
A
A
NC
A
WE
A
A
11
14
10
16
9
CC
8
7
15
2
6
5
13
4
A
8
3
A
9
2
1
11
TSOP I
Reverse Pinout
Top View
(not to scale)
Cypress Semiconductor Corporation
A
CE
V
A
WE
A
NC
A
A
A
1
11
2
A
9
3
A
8
4
13
5
6
2
7
15
8
CC
9
10
16
11
14
12
12
A
13
7
A
14
6
15
A
5
16
A
4
TSOP I / STSOP
Top View
(not to scale)
A
17
3
A
18
2
A
19
1
A
20
0
I/O
21
0
I/O
22
1
I/O
23
2
GND
24
I/O
3
25
I/O
4
26
I/O
5
27
I/O
6
28
I/O
7
29
CE
1
30
A
10
31
OE
32
62128V-3
32
OE
31
A
10
30
CE
1
29
I/O
7
28
I/O
6
27
I/O
5
26
I/O
4
25
I/O
3
24
GND
23
I/O
2
I/O
22
1
I/O
21
0
20
A
0
A
19
1
18
A
2
A
17
3
62128V-4
•3901 North First Street•San Jose•CA 95134•408-943-2600
March 27, 2000
CY62128V Family
Maximum Ratings
(Abov e which the useful life may be impair ed. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage .......... ................................ >2001V
3. Tested initially and after any design or process changes that may affect these parameters.
Input CapacitanceTA = 25°C, f = 1 MHz,
V
= 3.0V
Output Capacitance8pF
CC
6pF
3
AC Test Loads and Waveforms
CY62128V Family
V
CC
OUTPUT
INCLUDING
JIG AND
Equivalent to:THÉ VENIN EQUIVALENT
R1
50 pF
SCOPE
OUTPUTV
R2
62128V–5
R
TH
1.8V
GND
<5ns
10%
ALL INPUT PULSES
90%
90%
10%
<5ns
62128V–6
Parameters3.3V2.5V1.8VUnit
R112131590910800Ohms
R2137844874154Ohms
R
TH
V
TH
Data Rete n ti o n C h ar acteristics
ParameterDescriptionConditions
V
DR
I
CCDR
t
CDR
t
R
[3]
VCC for Da ta Rete ntion1.6V
Data Retention CurrentCom ’l LVCC = 2V
Chip Deselect to Data Retention Time0ns
Operation Recov ery Timet
64535003000Ohms
1.75V0.55V0.50VVolts
(Over the Operating Range)
[4]
Min.Typ.
[2]
0.410
CE
LL,
XL
Ind’lL20
LL20
> VCC – 0.3V,
V
> VCC – 0.3V or
IN
V
< 0.3V
IN
No input may exceed
V
+0.3V
CC
RC
Max.Unit
µA
10
µA
µA
µA
ns
Data Retention Waveform
V
CC
CE
Note:
4. No input may exceed V
CC
+0.3V.
t
CDR
DATA RETENTION MODE
VDR> 1.6 V
4
1.8V1.8V
t
R
C62128V–7
CY62128V Family
Data Retention Current Graph
Switching Characteristics
(for “L” version only)
DATA RETENTION
vs. SUPPLY VOLTAGE
80
70
A)
60
µ
(
50
40
30
20
10
SUPPLY CURRENT
0
1.6
SUPPLY VOLTAGE (V)
Over the Operating Range
CURRENT
T
=25°C
A
2.6
[5]
3.6
62128V-5562128V-7062128V25-10062128V18-200
ParameterDescriptionMin. Max. Min. Max.Min.Max.Min.Max.Unit
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
WRIT E CYCLE
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
5. Tes t conditions assume signal transition time of 5 ns or less timing reference levels of 1.5V , input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 100-pF load c apa citance .
6. At any given temperature and voltage condition, t
7. t
8. The internal write time of the memory is defined by the overlap of CE1 LOW , CE2 HIGH, and WE LOW . CE1 and WE signals must be LOW and CE2 HIGH to initiate a
9. The minimum write cycle time for write cycle #3 (WE
, t
HZCE
, and t
HZOE
write and either signal c an terminate a write by goin g HIGH. The data i nput set- up and hold timi ng should be r eferenc ed to the rising edge of the signal t hat terminates the write.
Read Cycle Time5570100200ns
Address to Data Valid5570100200ns
Data Hold from Address Change5101010ns
CE LOW to Data Valid5570100200ns
OE LOW to Data Valid203575125ns
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
[6]
[6]
[6, 7]
[6, 7]
10101010ns
20255075ns
10101010ns
20255075ns
CE LOW to Po wer-Up0000ns
CE HIGH to Power-Down5570100200ns
[8, 9]
Write Cycle Time5570100200ns
CE LOW to Write End4560100190ns
Address Set-Up to Write End4560100190ns
Address Hold from Write End0000ns
Address Set-Up to Write Start0000ns
WE Pu l s e W idth455590125ns
Data Set -U p to Write End253060100ns
Data Hold from Write End0000ns
WE LOW to High Z
WE HIGH to Low Z
are specified with CL = 5 pF as in pa rt (b) of A C Test Loads. Transition is measured ±200 mV from s teady-st ate v oltage .
HZWE
[6, 7]
[6]
is less than t
HZCE
controlled, OE LOW) is the sum of t
551015ns
, t
LZCE
202550100ns
HZOE
is less than t
HZWE
LZOE
and tSD.
, and t
HZWE
is less than t
for any given device.
LZWE
5
Switching Waveforms
CY62128V Family
Read Cycle No.1
[10, 11]
ADDRESS
t
OHA
DATA OUTPREVIOUS DATA VALID
Read Cycle No. 2 (OE Controll ed)
[11, 12]
ADDRESS
CE
1
CE
2
t
ACE
OE
t
t
LZCE
LZOE
50%
DATA OUT
V
CC
SUPPLY
HIGH IMPEDANCE
t
PU
CURRENT
Write Cycle No. 1 (CE1 or CE2 Controlled)
t
DOE
[13,14]
t
RC
t
AA
DATA VALID
62128V–8
t
RC
t
HZOE
t
DATA VALID
HZCE
t
PD
50%
HIGH
IMPEDANCE
62128V-9
I
CC
I
SB
ADDRESS
CE
1
CE
2
WE
DATA I/O
Notes:
10. Device is continuously selected. OE
11. WE
is HIGH for read cycle.
12. Address valid prior to or coincident with CE
13. Data I/O is high impedance if OE
14. If CE
goes HIGH or CE2 goes LOW si multane ously w ith WE HIGH, the output rem ains in a high- impedance st ate.
1
, CE = V
= VIH.
t
WC
t
SA
t
AW
IL, CE2=VIH
1
.
transition LOW and CE2 transition HIGH.
t
PWE
6
t
SCE
t
SCE
t
SD
DATA VALID
t
HA
t
HD
62128V-10
CY62128V Family
Switching Waveforms
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)
(continued )
[13, 14]
t
WC
ADDRESS
t
SCE
CE
1
CE
2
t
SCE
t
AW
t
SA
WE
OE
DATA I/O
Note:
15. During this period, the I/Os are in output state and input signals should not be applied.