Com-Power PS-500 User Manual
Features
Complete Solution - Includes E and H eld probes
Contact tip probe - Make contact with the circuit
Locate Noise Source - Down to a pin with the ne tip
Lightweight - Easy to use and handle
Small Size - Allows easy access to corners
Sensitive to Tip Position - Ease of pinpointing source
Immune to Hand Position - For repeatable results
Optional preamplier
Near Field Probe Set
PS-500
Description
The PS-500 is a Near Field Probe set consist four
probes and a custom storage case. Performance and
ease of use were designed into this product. The unique
design allows easy access for tight or hard to reach
places while reducing the effect of hand position or
cable placement.
The ne tip and the contac tip probe are a precision
E-eld probes that features the ability to singularly
identify a problem trace or pin. The ne tip probe is
designed to be extremely sensitive to distance from
the source which allows easy discrimination between
traces on a PCB. The unique patented design allows
measurement on individual traces as narrow as 3 mils.
The contact tip probe allows direct electrical contact
with the circuit. It has wider frequency range than the
ne tip probe. Just like the ne tip probe the contact
tip probe allow nding noise source to a trace or pin.
The broadband probe is designed to identify E-elds
over a broad frequency range.
The H-eld probe's magnetic loop design makes it ideal
for isolating sources of magnetic noise. The shielded
loop construction allows measurement to minimize
the effect of electrical elds.
Application
The PS-500 Near Field Probe Set is designed to assist
in troubleshooting EMI problems both at the board
level and at the component level. It is used to detect
radiation from cables, cases, traces and ICs.
Typically the broadband probe is used to locate the
general area of emission. Then the tip probe is used
to isolate the source to a specic trace or pin. Further
analysis can be done using the contact tip probe by
making direct contact with the curcuit and then following the noisy trace to nd the cause of emissions such
as a broken transmission line or impedance mismatch.
A typical use for the H-eld probe is to verify the integrity of the chassis of your computer. This is done
by moving the probe along the seams of the chassis
which may be acting as slot antennas. This probe is
also very useful for detecting magnetic noise sources
such as large current switching circuits or transformers.
By utilizing the appropriate probes, potential certication problems can be discovered and addressed before
expensive compliance testing is done. This saves both
money and valuable time. The net result is a reduction
in testing costs and a decreased time to market.
Com-Power Corporation (949) 587 - 9800 www. com-power.com sales@com-power.com
Specications
Probe Loop Broadband Fine Tip Contact Tip
Frequency (MHz) 0.3-100 20 -1000 30-600 300-1500
Type H-eld E-eld E-eld E-eld
Connector BNC (f) BNC (f) BNC (f) BNC (f)
Dielectric breakdown 1 kV 1 kV 1 kV 1 kV
DC input at the tip N/A N/A N/A 50 VDC
Dimensions see below see below see below see below
Weight 4 oz / 113 g 4 oz / 113 g 4 oz / 113 g 4 / 113 g
Optional Preamplier
Model: PAP-501
Frequency Range: 10 MHz -1000 MHz
Nominal Gain: 21 dB ± 2
Pout @ 1 dB comp: + 10 dBm
Typical Noise Figure 6 dB
Output Impedance: 50 Ohm
I / O Connection: BNC (f) input, BNC (m) Output
Power Input: 6 VDC, 500 mA
Power input plug type: 2.1 (ID) x 5.5 (OD) center pin positve.
Weight: 1 lb. (0.45 kg)
Dimensions (L x W x H): 83 mm x 42 mm x 25 mm (3.27 " x 1.65" x 0.985")
Mechanical Outline
U.S. Patent # 5,132,607
Dimensions are given in inches
All values are typical unless specied
Specication are subject to change without notice
Com-Power Corporation 114 Olinda Drive, Brea California 92807 (714) 528 - 8800 www.com-power.com Rev 0108
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