Com-Power PS-400 User Manual

Features
Complete Solution - Includes E and H field probes Locate Noise Source - Down to a pin with the fine tip Lightweight - Easy to use and handle Small Size - Allows easy access to corners Sensitive to Tip Position - Ease of pinpointing source Immune to Hand Position - For repeatable results Optional preamplifier
Near Field Probe Set
PS-400
Optional Preamplifier
Description
The PS-400 is a Near Field Probe set consisting of a tip probe, a broadband probe, a H-field probe and a custom storage case. Performance and ease of use were designed into this product. The unique design allows easy access for tight or hard to reach places while reducing the effect of hand position or cable placement.
The broadband probe is designed to identify E-fields over a broad frequency range. In addition, it has more amplitude sensitivity than the tip probe. Therefore, it offers a quick and efficient diagnosis of an emission source allowing the designer to discover and isolate trouble areas quickly.
The H-field probe's magnetic loop design makes it ideal for isolating sources of magnetic noise. The shielded loop construction allows measurement to minimize the effect of electrical fields.
Com-Power Corporation (949) 587 - 9800 www. com-power.com sales@com-power.com
Application
The PS-400 Near Field Probe Set is designed to assist in troubleshooting EMI problems both at the board level and at the component level. It is used to detect radiation from cables, cases, traces and ICs.
Typically the broadband probe is used to locate the general area of emission. Then the tip probe is used to isolate the source to a specific trace or pin. Further analysis can be done by following the noisy trace to find the cause of emissions such as a broken transmis­sion line or impedance mismatch.
A typical use for the H-field probe is to verify the integrity of the chassis of your computer. This is done by moving the probe along the seams of the chassis which may be acting as slot antennas. This probe is also very useful for detecting magnetic noise sources such as large current switching circuits or transform­ers.
By utilizing these probes, potential certification prob­lems can be discovered and addressed before expen­sive compliance testing is done. This saves both money and valuable time. The net result is a reduction in testing costs and a decreased time to market.
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Specifications
Probe H-Field Loop E- Field Broadband E- Field- Tip
Frequency Range: 0.3 - 100 MHz 20 - 1000 MHz 30 - 600 MHz Dielectric Breakdown: 1kV typical 1kV typical 1kV typical Operating Temperature: 0 to 40°C 0 to 40°C 0 to 40°C Connector Type: BNC(f) BNC(f) BNC (f)
Optional Preamplifier
Model: PAP-501 Frequency Range: 10 MHz -1000 MHz Nominal Gain: 20 dB ± 1 Pout @ 1 dB comp: + 6 dBm Typical Noise Figure 6 dB Output Impedance: 50 Ohm I / O Connection: BNC (f) input, BNC (m) Output Power Input: 12 VDC, 200 mA Power input plug type: 2.1 (ID) x 5.5 (OD) center pin positve. Weight: 1 lb. (0.45 kg) Dimensions (L x W x H): 83 mm x 42 mm x 25 mm (3.27 " x 1.65" x 0.985")
Mechanical Outline
0.32 "
0.23 "
U.S. Patent # 5,132,607 Dimensions are given in inches All values are typical unless specified Specification are subject to change without notice
H-Field Probe Broadband Probe Tip Probe
0.6 "
1.2 "
4.3 "
4.8 "
0.23 "
0.6 "
2.3 "
3.4 "
3.9 "
0.1 "
1.7 "
3.3 "
3.8 "
0.6 "
Com-Power Corporation 20621 Pascal Way, Lake Forest, California 92630 (949) 587 - 9800 www.com-power.com Rev 1201
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