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Vishay High Power Products
Standard Recovery Diodes
VS230DM16CCB
PRODUCT SUMMARY
Junction size Square 230 mils
Wafer size 4"
class 1600 V
V
RRM
Passivation process Glassivated MOAT
Reference Vishay HPP
packaged part
40EPS Series
FEATURES
• 100 % tested at probe
• Bondable top metal
• Wafer in box, and die in chip carrier
MAJOR RATINGS AND CHARACTERISTICS
PARAMETER SYMBOL TEST CONDITIONS VALUES UNITS
Maximum forward voltage V
Maximum repetitive reverse voltage V
Notes
(1)
Nitrogen flow on die edge
(2)
Wafer and die probe test clamped at 1200 V to limit arcing. 1600 V BV testable only in encapsulated packages
RRM
TJ = 25 °C, IF = 20 A 1.05
FM
T
= 25 °C, IF = 40 A 1.20
J
(1)
TJ = 25 °C, I
= 100 µA 1600
RRM
(2)
RoHS
COMPLIANT
V
V
MECHANICAL DATA
Nominal back metal composition (thickness) Cr-Ni-Ag (1 kÅ - 4 kÅ - 6 kÅ)
Nominal front metal composition (thickness) 100 % Al (20 µm)
Chip dimensions 230 x 230 mils - see dimensions (link at the end of datasheet)
Wafer diameter 100 mm, with standard < 110 > flat
Wafer thickness 330 µm ± 10 µm
Maximum width of sawing line 45 µm
Reject ink dot size Ø 0.25 mm minimum
Ink dot location See dimensions (link at the end of datasheet)
Recommended storage environment Storage in original container, in desiccated nitrogen, with no contamination
Document Number: 93833 For technical questions, contact: die-wafer@vishay.com
Revision: 31-Mar-08 1
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