0.5 to 3 ±0.2
over 3 to 6 ±0.3
over 6 to 30 ±0.5
over 30 to 120 ±0.8
over 120 to 400 ±1. 2
R
X
AC
MAB
F
V
AD
Dual IGBTMOD™
NFH-Series Module
600 Amperes/600 Volts
Description:
Powerex IGBTMOD™ Modules
are designed for use in high
frequency applications; 30 kHz
for hard switching applications
and 60 to 70 kHz for soft switching
applications. Each module
consists of two IGBT Transistors
in a half-bridge configuration with
each transistor having a reverseconnected super-fast recovery
free-wheel diode. All components
and interconnects are isolated from
the heat sinking baseplate, offering
simplified system assembly and
thermal management.
Features:
£ Low V
£ Low E
£ Discrete Super-Fast Recovery
£ Isolated Baseplate for Easy
Applications:
£ Power Supplies
£ Induction Heating
£ Welders
Ordering Information:
Example: Select the complete
part module number you desire
from the table below -i.e.
CM600DU-12NFH is a 600V
(V
Absolute Maximum Ratings, Tj = 25 °C unless otherwise specied
Item Symbol Rating Units
Collector-Emitter Voltage (G-E Short-circuited) V
Gate-Emitter Voltage (C-E Short-circuited) V
Collector Current (Operation)*5 IC 600 Amperes
Collector Current (Operation)*5 I
Collector Current (Pulse, Repetitive)*4 I
Total Power Dissipation (TC = 25°C)
Total Power Dissipation (TC' = 25°C)
*2,*5
P
*3,*5
P
Emitter Current (Free Wheeling Diode Forward Current, Operation)*5 I
Emitter Current (Free Wheeling Diode Forward Current, Operation)*5 I
Emitter Current (Free Wheeling Diode Forward Current, Operation, Pulse, Repetitive)*4 I
Junction Temperature Tj –40 to 150 °C
Storage Temperature T
Isolation Voltage (Terminals to Baseplate, RMS, f = 60Hz, AC 1 min.) V
*1 Represent ratings and characteristics of the anti-parallel, emitter-to-collector free wheeling diode (FWDi).
*2 Case temperature (TC) and heatsink temperature (Ts) is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
*3 Case temperature (TC') and heatsink temperature (Ts') is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance {R
*4 Pulse width and repetition rate should be such that device junction temperature (Tj)
does not exceed T
*5 Junction temperature (Tj) should not increase beyond maximum junction
temperature (T
j(max)
j(max)
) rating.
rating.
} should be measured just under the chips.
th(s-a)
600 Volts
CES
±20 Volts
GES
400 Amperes
C(rms)
1200 Amperes
CRM
1130 Watts
tot
' 2350 Watts
tot
*1
600 Amperes
E
*1
400 Amperes
E(rms)
*1
1200 Amperes
ERM
–40 to 125 °C
stg
2500 Volts
ISO
29.4
0
00
32.0
44.4
0
Each mark points to the center position of each chip.
Fall Time tf Inductive Load Switching Operation — — 150 ns
Emitter-Collector Voltage V
Reverse Recovery Time t
Reverse Recovery Charge Q
Turn-on Switching Energy per Pulse Eon VCC = 600V, IC = IE = 600A, — 11 — mJ
Turn-off Switching Energy per Pulse E
Reverse Recovery Energy per Pulse E
Internal Gate Resistance rg Per Switch — 0.8 — Ω
*1 Represent ratings and characteristics of the anti-parallel, emitter-to-collector free wheeling diode (FWDi).
*6 Pulse width and repetition rate should be such as to cause negligible temperature rise.
Flatness of Baseplate ec On Centerline X, Y*8 -100 — +100 µm
Recommended Operating Conditons, Ta = 25°C
(DC) Supply Voltage VCC Applied Across C1-E2 — 300 400 Volts
Gate (-Emitter Drive) Voltage V
External Gate Resistance RG Per Switch 1.0 — 10 Ω
*2 Case temperature (TC) and heatsink temperature (Ts) is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance should be measured just under the chips.
*3 Case temperature (TC') and heatsink temperature (Ts') is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance {R
*7 Typical value is measured by using thermally conductive grease of λ = 0.9 [W/(m • K)].
*8 Baseplate (mounting side) flatness measurement points (X, Y) are shown in the figure below.
} should be measured just under the chips.
th(s-a)
Applied Across G1-Es1 / G2-Es2 13.5 15.0 16.5 Volts
GE(on)
29.4
0
00
32.0
44.4
44.2
Tr2
Tr2
Di2
Di2
77.2
Tr1
Di1
Di1
Tr1
27.3
G2E2E1G1
42.1
Y
BOTTOM
LABEL SIDE
+ CONVEX
BOTTOM
– CONCAVE
X
– CONCAVE
+ CONVEX
3 mm
BOTTOM
4
C2E1C1E2
0
Each mark points to the center position of each chip.