U421 – U426
CORPORATION
ABSOLUTE MAXIMUM RATINGS (TA = 25oC unless otherwise noted)
Gate-to-Gat e V olta ge. . . . . . . . . . . . . . . . . . . . . . . . . . . . ±40V
Gate-Drain or Gate -So urce Voltage . . . . . . . . . . . . . . . . -40V
Gate Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mA
Device Dissipation (Each Side), T
A
= 25oC
(Der ate 3.2 mW/
o
C to 150oC). . . . . . . . . . . . . . 400mW
Total Device D issipat ion, T
A
= 25oC
(Der ate 6.0 mW/
o
C to 150oC). . . . . . . . . . . . . 750 mW
Storage Temperatur e Ra nge. . . . . . . . . . . . . -65
o
C to +150oC
ELECTRICAL CHARACTERISTICS (2 5oC unless oth erw ise noted)
SYMBOL CHARACTERISTIC
U421-3 U424-6
UNIT TEST CONDITIONS
MIN TYP MAX MIN TYP MAX
STATIC
BV
GSS
Gate-Source Breakdown Voltage
-40 -60 -40
-60
V
IG = -1µA, VDS = 0
BV
G1G2
Gate-Gate Breakdown Voltage
±40 ±40
IG = -1µA, ID = 0, IS = 0
I
GSS
Gate Reverse Current
(1)
1.0 3.0 pA
T = +25
o
C
V
GS
= -20V,
V
DS
= 0
1.0 3. 0 nA
T = +125
o
C
I
G
Gate Operating Current
(1)
.25 0.5
pA
T = +25
o
C
V
DG
= 10V,
I
D
= 30µA
.250 -500
T = +125
o
C
V
GS (off)
Gate-Source Cutoff Voltage
-0.4 -2.0 -0.4 -2.0
V
VDS = 10V, ID = 1nA
V
GS
Gate-Source Voltage
-1.8 -2.9
VDG = 10V, ID = 30µA
I
DSS
Saturation Drain Current
60 1000 60 1800 µA
VDS = 10V, VGS = 0
DYNAMIC
g
fs
Common-Source Forward Transconductance
300 1500 300 1500
V
DS
= 10V,
V
GS
= 0
f = 1 kHz
g
os
Common-Source Output Conductance
10 10
C
iss
Common-Source Input Capacitance
3.0 3.0
pF
f = 1MHz
C
rss
Common-Source Reverse Transfer Capacitance
1.5 1.5
g
fs
Common-Source Forward Transconductance
120 350 120 350
V
DG
= 10V,
I
D
= 30µA
f = 1kHz
g
os
Common-Source Output Conductance
3.0 3.0
e
n
Equivalent Short Circuit Input
20 70 20 70
nV/ Hz
f = 10Hz
10 10
f = 1kHz
NF Noise Figure
1.0 1.0 dB
f = 10 Hz
R
G
= 10 MΩ
SYMBOL CHARACTERISTIC
U421,4 U422,5 U423,6
UNIT TEST CONDITIONS
MIN TYP MAX MIN TYP MAX MIN TYP MAX
MATCH
| V
GS1-VGS2
| Differential Gate-Sou r ce Voltage
10 15 25 mV
VDG = 10V, ID = 30µA
| V
GS1-VGS2
|
∆T
Differential Gate-Source Voltage
Change with Temperature
(2)
10 25 40 V/ oC
V
DG
= 10V, ID = 30µA,
T
A
= -55oC, TB = 25oC,
T
C
= 125oC
C
MRR
Common Mode Rejection Ratio
(3)
90 95 80 90 80 90 dB
I
D
= 30µA, VDG = 10 to 20 V
NOTES:
1. Approximately doubles for every 10
o
C increase in TA.
2. Measured at endpoints T
A
, TB and TC.
3. CMRR = 20log
10
[
] VDD = 10V.
4. Case lead not connected.
V
DD
V
GS1-VGS2
ELECTRICAL CHARACTERISTIC S (25oC Unless otherwise noted)