Calogic SST5912 Datasheet

N-Channel JFET Monolithic Dual
SST5912
CORPORATION
FEATURES
High Gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . gfs > 6 mS
••
Low Leakage . . . . . . . . . . . . . . . . . . . . . . IG < 1pA typical
••
Low Noise
••
Surface Mou nt Package
••
APPLICATIONS
Differential Wi de band Amplifier
••
VHF/UHF Amplifie rs
••
T est and Measu rement
••
PIN CONFIGU R ATI O N
SO-8
DESCRIPTION
The SST5912 is a High Speed N-Channel Monolithic JFET pair encapsulated in a surface mount plastic SO-8 package. The device is designed for high gain (typically > 6000 mmhos), low leakage ( < 1pA typically) and low noise, The SST5912 is an excellent choice for differential wideband amplifiers, VHF/UHF amp lif iers and test and measur em e nt.
ORDERING INFORMATION Part Package Temperature Range
o
SST5912 Plastic SO-8 Package -55
NOTE: For Sorted Chips in Carriers, See 2N5911 Series
TOP VIEW
(1) S1 (2) D1
C to +150oC
N/C (8) G2 (7)
CJ1
(3) G1
(4) N/C
PRODUCT MARKING
SST5912 SST5912
D2 (6) S2 (5)
SST5912
CORPORATION
ABSOLUTE MAXIMUM RATINGS (TA = 25oC unless otherwise noted) Parameter/Test Conditio n Symbol Limit Unit
Gate-Drain Voltage V Gate-Source Voltage V Forward Gate Cur r ent I Power Dissipation (per side) P
GD GS
G
D
(total) 500 mW
Power Derating (per side) 2.4 mW/
(total) 4 mW/ Operating J unct ion Temper at ur e T Storage Tempera ture T Lead Temperature (1/ 16 " fr om case for 10 seconds) T
J
stg
L
ELECTRICAL CHARACTERISTIC S (TA = 25oC unless otherwise note d)
SST5912
SYMBOL CHARACTERISTCS TYP
STATIC
V
(BR)GSS
) Gate-Source Cut off Voltage -3.5 -1 -5 VDS = 10V, ID = 1nA
V
GS(OFF
I
DSS
I
GSS
I
G
V
GS
V
GS(F)
Gate-Source Breakdown Voltage -35 -25
Saturation Drain Current
2
Gate Reverse Current
Gate Operating Current
Gate-Source Voltage -1.5 -0.3 -4 Gate-Source Forward Voltage 0 .7 IG = 1mA, VDS = 0V
DYNAMIC
g
fs
g
os
g
fs
g
os
C
iss
C
rss
e
n
Common-Source Forward Transconductance 6 5 10 mS Common-Source Output Conductance 20 100 mS Common-Source Forward Transconductance 6 5 10 mS Common-Source Output Conductance 30 150 mS Common-Source Input Capacitance 3.5 5 Common-Sourc e Revers e T rans f er Capac it anc e 1 1.2 Equivale nt Inp ut Noise Voltage 4 20 nV/ Hz VDG = 10V, ID = 5mA, f = 10kHz
NF Noise Figure 0.1 1 dB V
MATCHING
- V
| V
D | V
GS1
GS1
| Differential Gate Source Voltage 7 15 mV VDG = 10V, ID = 5mA
GS2
- V
|DTGate Source Voltage Differential Change with
GS2
Temperature
I
DSS1
I
DSS2
g
fs1
g
fs2
| I
- I
G1
G2
Saturation Drain Curre nt Rati o 0.98 0.95 1 VDS = 10V, VGS = 0V
Transconductance Ratio 0.98 0.95 1 VDG = 10V, ID = 5mA, f = 1kHz
| Differential Gate Current 0.01 20 nA VDG = 10V, ID = 5mA, TA = 125oC
CMRR Common Mode Rejection Ratio 90 dB V
NOTES: 1. For design aid only, not subject to production testing.
2. Pulse test; PW = 300ms, duty cycle â 3%.
1
MIN MAX
UNIT TEST CONDITIONS
V
15 7 40 mA VDS = 10V, VGS = 0V
-1 -100 pA V
-0.2 nA T
-1 -100 pA V
-0.2 nA T
V
pF
10 40 10 40 T = 25 to 125
mV/
o
-25 V
-25 V 50 mA
300 mW
-55 to 150
-65 to 150 300
IG = -1mA, VDS = 0V
= -15V, VDS = 0V
GS
= 125oC
A
= 10V, ID = 5mA
DG
= 125oC
A
VDG = 10V, ID = 5mA
V
= 10V, ID = 5mA
DG
f = 1kHz V
= 10V, ID = 5mA
DG
f = 100MHz V
= 10V, ID = 5mA
DG
f = 1MHz
= 10V, ID = 5mA, f = 10kHz, RG = 100W
DG
T = -55 to 25
C
= 5 to 10V, ID = 5mA
DD
o
C
V
= 10V
o
DG
I
= 5mA
D
C
o
C
o
C
o
C
o
C
o
C
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