The OPA132 series of FET-input op amps provides highspeed and excellent dc performance. The combination of
high slew rate and wide bandwidth provide fast settling time.
Single, dual, and quad versions have identical specifications
for maximum design flexibility. High performance grades
are available in the single and dual versions. All are ideal for
general-purpose, audio, data acquisition and communications applications, especially where high source impedance
is encountered.
OPA132 op amps are easy to use and free from phase
inversion and overload problems often found in
common FET-input op amps. Input cascode circuitry provides excellent common-mode rejection and
maintains low input bias current over its wide input voltage
range. OPA132 series op amps are stable in unity gain and
provide excellent dynamic behavior over a wide range of
load conditions, including high load capacitance. Dual and
quad versions feature completely independent circuitry for
lowest crosstalk and freedom from interaction, even when
overdriven or overloaded.
Single and dual versions are available in 8-pin DIP and
SO-8 surface-mount packages. Quad is available in 14-pin
DIP and SO-14 surface-mount packages. All are specified
for –40°C to +85°C operation.
Offset Trim
–In
+In
V–
Out A
–In A
+In A
V–
Out A
–In A
+In A
V+
+In B
–In B
Out B
OPA132
1
2
3
4
8-Pin DIP, SO-8
OPA2132
1
A
2
3
4
8-Pin DIP, SO-8
1
2
3
4
5
6
7
AD
BC
14-Pin DIP
B
OPA4132
SO-14
8
7
6
5
8
7
6
5
Offset Trim
V+
Output
NC
V+
Out B
–In B
+In B
Out D
14
–In D
13
+In D
12
V–
11
+In C
10
–In C
9
Out C
8
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
For the most current package and ordering information,
see the Package Option Addendum located at the end
of this data sheet.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe proper handling and installation procedures can
cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage
because very small parametric changes could cause
the device not to meet its published specifications.
2
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OPA132, 2132, 4132
SBOS054A
SPECIFICATIONS
At TA = +25°C, VS = ±15V, unless otherwise noted.
OPA132P, U
OPA2132P, U
PARAMETERCONDITIONMINTYPMAXMINTYPMAXUNITS
OFFSET VOLTAGE
Input Offset Voltage±0.25±0.5±0.5±2mV
vs Temperature
vs Power SupplyV
Channel Separation (dual and quad)R
INPUT BIAS CURRENT
Input Bias Current
vs TemperatureSee Typical Curve✻
Input Offset Current
(1)
(2)
(2)
Operating Temperature Range±2±10✻✻µV/°C
= ±2.5V to ±18V515✻30µV/V
S
= 2kΩ0.2✻µV/V
L
V
= 0V+5±50✻✻ pA
CM
V
= 0V±2±50✻✻ pA
CM
NOISE
Input Voltage Noise
Noise Density, f = 10Hz23✻nV/√Hz
f = 100Hz10✻nV/√Hz
f = 1kHz8✻nV/√Hz
f = 10kHz8✻nV/√Hz
Current Noise Density, f = 1kHz3✻fA/√Hz
INPUT VOLTAGE RANGE
Common-Mode Voltage Range(V–)+2.5±13(V+)–2.5✻✻✻ V
Common-Mode RejectionV