BSI BS616LV4017 User Manual

Page 1
查询BD616LV4017AC-55供应商
Very Low Power/Voltage CMOS SRAM
BSI
256K X 16 bit
FEATURES
• Wide Vcc operation voltage : 2.4~5.5V
• Very low power consumption : Vcc = 3.0V C-grade: 26mA (@55ns) operating current
I-grade: 27mA (@55ns) operating current
C-grade: 21mA (@70ns) operating current
I-grade: 22mA (@70ns) operating current
0.45uA (Typ.) CMOS standby current
Vcc = 5.0V C-grade: 63mA (@55ns) operating current
I-grade: 65mA (@55ns) operating current
C-grade: 53mA (@70ns) operating current
I-grade: 55mA (@70ns) operating current
2.0uA (Typ.) CMOS standby current
• High speed access time :
-55 55ns
-70 70ns
• Automatic power down when chip is deselected
• Three state outputs and TTL compatible
• Fully static operation
PRODUCT FAMILY
PRODUCT FAMILY
BS616LV4017DC
BS616LV4017EC
BS616LV4017AC BS616LV4017DI
BS616LV4017EI BS616LV4017AI
OPERATING
TEMPERATURE
+0O C to +70O C
2.4V ~ 5.5V 55 /70
-40O C to +85O C 2.4V ~ 5.5V 55 /70
PIN CONFIGURATIONS
GND
1
A4
2
A3
3
A2
4
A1
5
A0
6
CE
7
DQ0
8
DQ1
9
DQ2
10
DQ3 VCC
DQ4 DQ5 DQ6 DQ7
BS616LV4017EC
11 12
BS616LV4017EI
13 14 15 16 17 18 19 20 21 22
44
A5
43
A6
42
A7
41
OE
40
UB
39
LB
38
DQ15
37
DQ14
36
DQ13
35
DQ12
34
GND
33
VCC
32
DQ11
31
DQ10
30
DQ9
29
DQ8
28
NC
27
A8
26
A9
25
A10
24
A11
23
A12
Vcc
RANGE
BS616LV4017
• Data retention supply voltage as low as 1.5V
• Easy expansion with CE and OE options
• I/O Configuration x8/x16 selectable by LB and UB pin
DESCRIPTION
The BS616LV4017 is a high performance, very low power CMOS Static Random Access Memory organized as 262,144 words by 16 bits and operates from a wide range of 2.4V to 5.5V supply voltage. Advanced CMOS technology and circuit techniques provide both high speed and low power features with a typical CMOS standby current of
0.45uA at 3.0V/25oC and maximum access time of 55ns at 3.0V/85oC. Easy memory expansion is provided by an active LOW chip enable (CE) ,active LOW output enable(OE) and three-state output drivers. The BS616LV4017 has an automatic power down feature, reducing the power consumption significantly when chip is deselected. The BS616LV4017 is available in DICE form, JEDEC standard 44-pin TSOP Type II package and 48-ball BGA package.
SPEED
(
ns )
55ns :3.0~5.5V 70ns :2.7~5.5V
BLOCK DIAGRAM
POWER DISSIPATION
STANDBY
CCSB1
( I
, Max ) ( ICC, Max )
3.0V
5uA
10uA
A4 A3 A2
A1
A0
. . . .
. . . .
Vcc=
30uA
60uA
Address
Input
Buffer
16
16
Vcc= 5.0V
A17
A16
A15 A14 A13 A12
DQ0
DQ15
Operating
Vcc =
3.0V
70ns 70ns
21mA
22mA 55mA
22
Row
Decoder
Data
Input
Buffer
Data
Output
Buffer
16
Vcc =
53mA
2048
16
5.0V
Memory Array
2048 x 2048
Write Driver
Column Decoder
PKG TYPE
DICE
TSOP2-44 BGA-48-0608 DICE TSOP2-44 BGA-48-0608
2048
Column I/O
Sense Amp
128
CE
Vcc
Gnd
WE
OE UB
LB
Control
Address Input Buffer
A10
A11
Brilliance Semiconductor, Inc. reserves the right to modify document contents without notice.
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14
A9 A8 A7
A5
A6
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BSI
PIN DESCRIPTIONS
Name Function
BS616LV4017
A0-A17 Address Input
CE Chip Enable Input
WE Write Enable Input
OE Output Enable Input
LB and UB Data Byte Control Input
DQ0 - DQ15 Data Input/Output
These 18 address inputs select one of the 262,144 x 16-bit words in the RAM.
CE is active LOW. Chip enables must be active when data read from or write to the
device. if chip enable is not active, the device is deselected and is in a standby power
mode. The DQ pins will be in the high impedance state when the device is deselected.
The write enable input is active LOW and controls read and write operations. With the
chip selected, when WE is HIGH and OE is LOW, output data will be present on the
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the
selected memory location.
The output enable input is active LOW. If the output enable is active while the chip is
selected and the write enable is inactive, data will be present on the DQ pins and they
will be enabled. The DQ pins will be in the high impedance state when OE is inactive.
Lower byte and upper byte data input/output control pins.
These 16 bi-directional ports are used to read data from or write data into the RAM.
Ports
Vcc
Gnd
Power Supply
Ground
TRUTH TABLE
MODE CE WE OE LB UB D0~D7 D8~D15 Vcc CURRENT
Not selected
(Power Down) X
Output Disabled
Read L H L
Write L L X
H
L
X X X X High Z High Z I
X X H H High Z High Z I
XX
L
H H X X High Z High Z I
H
H
L L Dout Dout I
H L High Z Dout I
L H Dout High Z I
LL Din Din I
HL X Din I
LH Din X I
High Z
High Z
CCSB
CCSB
, I
CCSB1
, I
CCSB1
I
CC
CC
CC
CC
CC
CC
CC
CC
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BS616LV4017
ABSOLUTE MAXIMUM RATINGS
(1)
OPERATING RANGE
SYMBOL PAR AME TER RATING UNITS
TERM
V
BIAS
T
STG
T
PT
OUT
I
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Terminal Voltage with Respect to GND
Temperature Under Bias -40 to +85
Storage Temperature
Power Dissipation
DC Output Current 20 mA
-0.5 to
Vcc+0.5
-60 to +150
1.0 W
V
O
C
O
C
CAPACITANCE
1. This parameter is guaranteed and not 100% tested.
DC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85
PARAMETER
NAME
IL
V
IH
V
IL
I
LO
I
OL
V
OH
V
(5)
CC
I
PARAMETER TEST CONDITIONS MIN. TYP.
Guaranteed Input Low Voltage
Guaranteed Input High Voltage
Input Leakage Current Vcc = Max, V
Output Leakage Current
Output Low Voltage
Output High Voltage
Supply Current
(2)
(2)
Operating Power
IN
= 0V to Vcc -- -- 1 uA
Vcc = Max, CE = V
= 0V to Vcc
V
I/O
, or OE = VIH,
IH
Vcc = Max, IOL= 2.0mA
Vcc = Min, I
CE=V
IL
F=Fmax
= -1.0mA
OH
,IDQ= 0mA,
(3)
70ns
70ns
RANGE
Commercial 0O C to +70O C 2.4V ~ 5.5V
Industrial -40O C to +85O C 2.4V ~ 5.5V
SYMBOL PARAMETER CONDITIONS MAX. UNIT
IN
C
DQ
C
o
C )
Vcc=3.0V
Vcc=5.0V
Vcc=3.0V
Vcc=5.0V
AMBIENT
TEMPERATURE
(1)
Input Capacitance Input/Output Capacitance
-0.5
2.0
2.2
Vcc
(TA = 25oC, f = 1.0 MHz)
VIN=0V 6 pF
I/O
V
=0V 8 pF
(1)
MAX.
--
0.8
0.8
--
Vcc+0.3
UNITS
-- -- 1 uA
Vcc=3.0V
Vcc=5.0V
Vcc=3.0V
Vcc=5.0V
Vcc=3.0V
Vcc=5.0V
--
2.4
2.4
--
--
--
--
0.4
0.4
--
22
55
V
V
V
V
mA
CCSB
I
CCSB1
I
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
3. Fmax = 1/t
4. IccSB1_MAX. is 5uA/30uA at Vcc=3.0V/5.0V and TA=70oC.
5. Icc_MAX. is 27mA(@3.0V)/65mA(@5.0V) under 55ns operation.
R0201-BS616LV4017
Standby Current-TTL
(4)
Standby Current-CMOS
.
RC
IH
CE = V
, IDQ= 0mA
CE ≧Vcc-0.2V,
IN
Vcc - 0.2V or V
V
IN
3
Vcc=3.0V 0.5
--
Vcc=5.0V
0.2V
Vcc=3.0V
Vcc=5.0V
--
--
0.45
2.0 60
mA
1.0
10
uA
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BSI
BS616LV4017
DATA RETENTION CHARACTERISTICS ( TA = -40 to + 85
o
C )
SYMBOL PARAMETER TEST CONDITIONS MIN. TYP.
V
DR
I
CCDR
t
CDR
t
R
1. Vcc = 1.5V, TA= + 25OC
2. tRC= Read Cycle Time
3. IccDR_MAX. is 0.8uA at TA=70OC.
Vcc for Data Retention
(3)
Data Retention Current
Chip Deselect to Data Retention Time
Operation Recovery Time
CE ≧Vcc - 0.2V
IN
V
Vcc - 0.2V or V
CE ≧Vcc - 0.2V
IN
V
Vcc - 0.2V or V
See Retention Waveform
IN
IN
0.2V
0.2V
1.5 -- -- V
T
RC
LOW VCCDATA RETENTION WAVEFORM ( CE Controlled )
Data Retention Mode
Vcc
CE
Vcc
t CDR
VDR 1.5V
CE Vcc - 0.2V
(1)
MAX. UNITS
-- 0.3 1.3 uA
0---- ns
(2)
-- -- ns
Vcc
t R
VIHVIH
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BS616LV4017
AC TEST CONDITIONS
(Test Load and Input/Output Reference)
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Level
Output Load
Vcc / 0V
1V/ns
0.5Vcc
CL = 30pF+1TTL C
= 100pF+1TTL
L
AC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS OUTPUTS
o
C )
MUST BE STEADY
MAY CHANGE FROM H TO L
MAY CHANGE FROM L TO H
,
DON T CARE: ANY CHANGE PERMITTED
DOES NOT APPLY
MUST BE STEADY
WILL BE CHANGE FROM H TO L
WILL BE CHANGE FROM L TO H
CHANGE : STATE UNKNOWN
CENTER LINE IS HIGH IMPEDANCE ”OFF ”STATE
READ CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
AVQV
t
ELQV
t
BA
t
GLQV
t
E1LQX
t
BE
t
GLQX
t
EHQZ
t
BDO
t
GHQZ
t
AXOX
PARAMETER
NAME
t
RC
t
AA
t
ACS
(1)
t
BA
t
OE
t
CLZ
t
BE
t
OLZ
t
CHZ
t
BDO
t
OHZ
t
OH
DESCRIPTION
Read Cycle Time
Address Access Time
Chip Select Access Time
Data Byte Control Access Time
Output Enable to Output Valid
Chip Select to Output Low Z
Data Byte Control to Output Low Z
Output Enable to Output in Low Z
Chip Deselect to Output in High Z
Data Byte Control to Output High Z
Output Disable to Output in High Z
Data Hold from Address Change
(LB,UB)----35----30ns
(LB,UB) 5 -- -- 5 -- -- ns
(LB,UB) -- -- 35 -- -- 30 ns
CYCLE TIME : 70ns
(Vcc = 2.7~5.5V)
MIN. TYP. MAX.
70 -- -- 55 -- -- ns
-- -- 70 -- -- 55 ns
-- -- 70 -- -- 55 ns
-- -- 35 -- -- 30 ns
10 -- -- 10 -- -- ns
5----5---- ns
-- -- 35 -- -- 30 ns
-- -- 30 -- -- 25 ns
10 -- -- 10 -- -- ns
NOTE :
1. tBA is 35ns/30ns (@speed=70ns/55ns) with address toggle. ; tBA is 70ns/55ns (@speed=70ns/55ns) without address toggle.
CYCLE TIME : 55ns
(Vcc = 3.0~5.5V)
MIN. TYP. MAX.
UNIT
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SWITCHING WAVEFORMS (READ CYCLE)
READ CYCLE1
ADDRESS
D
(1,2,4)
t AA
t OH
OUT
BS616LV4017
t RC
t OH
READ CYCLE2
CE
LB,UB
D
OUT
READ CYCLE3
ADDRESS
OE
CE
LB,UB
(1,3,4)
(1,4)
t CLZ
(5)
t ACS
t CLZ
t BA
(5)
t BE
t BDO
t CHZ
t RC
t AA
t OE
t OH
t OLZ
(5)
t ACS
(5)
t OHZ
t CHZ
(1,5)
t BA
t BE
t BDO
D
OUT
NOTES:
1. WE is high in read Cycle.
2. Device is continuously selected when CE = V
3. Address valid prior to or coincident with CE transition low.
4. OE = VIL .
5. The parameter is guaranteed but not 100% tested.
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BS616LV4017
AC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85
o
C )
WRITE CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
E1LWH
t
AVWL
t
AVWH
t
WLWH
t
WHAX
t
BW
t
WLQZ
t
DVWH
t
WHDX
t
GHQZ
t
WHOX
NOTE :
1. tBW is 30ns/25ns (@speed=70ns/55ns) with address toggle. ; tBW is 70ns/55ns (@speed=70ns/55ns) without address toggle.
PARAMETER
NAME
t
WC
t
CW
t
AS
t
AW
t
WP
t
WR
(1)
t
BW
t
WHZ
t
DW
t
DH
t
OHZ
t
OW
DESCRIPTION
Write Cycle Time
Chip Select to End of Write
Address Setup Time
Address Valid to End of Write
Write Pulse Width
Write recovery Time
Date Byte Control to End of Write
Write to Output in High Z
Data to Write Time Overlap
Data Hold from Write Time
Output Disable to Output in High Z
End of Write to Output Active
(CE,WE)
(LB,UB) 30 -- -- 25 -- -- ns
CYCLE TIME : 70ns
(Vcc = 2.7~5.5V)
MIN. TYP. MAX.
70 -- -- 55 -- -- ns
70
-- -- 55 -- -- ns
0 -- -- 0 -- -- ns
70 -- -- 55 -- -- ns
35 -- -- 30 -- -- ns
0 -- -- 0 -- -- ns
-- -- 30 -- -- 25 ns
30 -- -- 25 -- -- ns
0 -- -- 0 -- -- ns
-- -- 30 -- -- 25 ns
5 -- -- 5 -- -- ns
CYCLE TIME : 55ns
(Vcc = 3.0~5.5V)
MIN. TYP. MAX.
SWITCHING WAVEFORMS (WRITE CYCLE)
WRITE CYCLE1
(1)
t WC
UNIT
ADDRESS
OE
CE
LB,UB
WE
D
D
R0201-BS616LV4017
IN
OUT
t AS
(4,11)
t OHZ
(3)
t WR
(10)
(5)
t CW
t BW
t AW
t WP
(2)
(3)
t DH
t DW
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BS616LV4017
WRITE CYCLE2
ADDRESS
CE
LB,UB
WE
D
OUT
D
IN
(1,6)
t AS
(5)
(4,11)
t WHZ
t AW
t WC
t CW
t WP
t BW
(10)
t WR
(3)
(2)
t OW
(7) (8)
t DW
t DH
(8,9)
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write.
WR is measured from the earlier of CE or WE going high at the end of write cycle.
3. T
4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied.
5. If the CE low transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state.
6. OE is continuously low (OE = V
OUT is the same phase of write data of this write cycle.
7. D
8. D
OUT is the read data of next address.
9. If CE is low during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them.
10. TCW is measured from the later of CE going low to the end of write.
11. The parameter is guaranteed but not 100% tested.
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BS616LV4017
ORDERING INFORMATION
BS616LV4017 X X Z Y Y
SPEED
55: 55ns 70: 70ns
PKG MATERIAL
-: Normal G: Green P: Pb free
GRADE
C: +0oC ~ +70oC
I: -40oC ~ +85oC
PACKAGE
E: TSOP2-44 A: BGA-48-0608 D: DICE
Note: BSI (Brilliance Semiconductor Inc.) assumes no responsibility for the application or use of any product or circuit described herein. BSI does not authorize its products for use as critical components in any application in which the failure of the BSI product may be expected to result in significant injury or death, including life-support systems and critical medical instruments.
PACKAGE DIMENSIONS
TSOP2-44
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PACKAGE DIMENSIONS (continued)
BS616LV4017
0.05
±
0.25
NOTES:
1: CONTROLLING DIMENSIONS ARE IN MI LLIMETERS. 2: PIN#1 DOT MARKING BY LASER OR PAD PRINT. 3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.
1.4 Max.
e
VIEW A
SIDE VIEW
D0.1
D1
48 mini-BGA (6 x 8mm)
N ED
48 8. 0 6.0
E1
±
E0.1
E1D1
3.755.25
SOLDER BALL 0.3 5±0.05
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