BK Precision BK Precision 575A Manual

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Model 575ADigital IC Tester

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MODEL 575A HANDHELD

DIGITAL IC TESTER

OPERATOR’S MANUAL

Model 575ADigital IC Tester

CONTENTS

1. introduction 1

2. DC input 1

3. battery eliminator 2

4. switching on 3

5. operating modes 4

6. entering test numbers 4

7. testing the IC 5

8. test results 6

9. testing further ICs 7

10. continuoustesting 8

11. search mode 8

12. self test mode 9

13. CompactLinkmode 10

14. specifications 11

15. IC support list 12 introduction 12

15.2. series54/74 TTL ICs 12

15.3. CMOS ICs 14

15.4. memory ICs 15

15.5. interface, peripheral, microprocessorand LSI ICs 16

15.6. notes on TTL ICs 18

15.7. notes on CMOS ICs 18

15.8. notes on memory ICs 18

Model 575ADigital IC Tester

15.9. notes on interface ICs 19

16. Service Information 20

17. Limited One-Year Warranty 21

Model 575ADigital IC Tester

1. introduction

Thank you for purchasing the B & K Precision Model 575A Hand Held Digital IC Tester.

The basic function of the B & K Model 575A Digital IC Tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. The B & K Model 575A applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the expected states. Any discrepancy results in a FAIL indication and the faulty pins are shown on the integral display. Additional facilities are also provided, amongst them test loops that can be used for goods inwards inspection, detecting intermittent faults or simply providing a rapid method of exercising any IC for demonstration or educational purposes. Since the B & K Model 575A contains an extensive IC library, it is not necessary to program the unit yourself other than to key in the IC number. It isalso capable of identifying an unknown IC using the SEARCH mode - this isa feature that many userswill find extremely valuable.

The B & K Model 575A is provided with an RS-232 interface enabling it to be connected to a companion software package called CompactLink running on a PC. CompactLink allows test programs for ICsnot included in the internal library to be developed and downloaded into the B & K Model 575A memory to enhance the library according to your wishes.

2. DC input

The B & K Model 575A is powered by four AA batteries or by the use of the battery eliminator input at the rearof the case. To insert the batteries, turn the unit upside down and remove the battery

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cover by removing the two cross head screws holding it in place. The batteries must be inserted in the correct orientation, as indicated by the drawing within the battery compartment. Incorrect insertion of batteries will not allow the unit to operate. Replace the battery cover and insert the screws. If the battery voltage falls too low, a low battery warning symbol will be displayed at the top left hand cell of the display in normal operating mode. A low battery warning will also be displayed during a result display. Test results may be inconsistent under these conditions.

3. battery eliminator

An external battery eliminator is available for prolonged use of the B & K Model 575A. Many bipolar LSI ICsconsume a large amount of current when powered up, and battery life can be conserved by using the eliminator. There isno need to remove the batteriesprior to inserting the battery eliminator. However, please note that during prolonged periods of non-use batteries are prone to leakage and should be removed. Note that to avoid damage to the unit we strongly advise that you only use the recommended battery eliminator that is available by contacting your distributor. Note that using an incorrect battery eliminator voltage may damage the unit and invalidate the warranty.

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Model 575ADigital IC Tester

4. switching on

To switch the unit on, simply pressthe 'ON' key. To preserve battery life, the unit powers itself off after approximately 3 minutes of nonuse or when “Sw Off” is selected from the main menu. When the unit is switched on, it first performs a self-diagnosistest. Therefore, before switching on, check that the test socket is empty to prevent interference with the diagnostics. If the unit passes the self-test, a pass result will be displayed on the screen. Pressa key to enter the main operating mode - the display will be as follows:

NO:

MODE:Single:RDY

When this initial display is obtained the B & K Model 575A isready for use. If, however, the message SELF-TEST FAIL: is displayed along with a fault message, this indicates that a self-test diagnostic fault has been detected. Any detected faultswill be displayed one at a time. Pressing the TEST/EXEC key will then revert to the opening menu as above, but of course operation of the unit will then be suspect. Before contacting your distributor, check that the test socket iscompletely empty.

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Model 575ADigital IC Tester

5. operating modes

The B & K Model 575A has a number of test modes that are selected using the MODE/CLEAR key from the initial screen. The test modesare asfollows:

Single - execute a single test on the IC in the socket. Loop - execute test repeatedly, regardlessof the result. P Loop - execute test repeatedly, provided the result was PASS. F Loop -execute test repeatedly, provided the result was FAIL. Search - identify the number of the IC in the socket. Diags - execute the diagnostic self-test. CmLink - enter remote mode for CompactLinksoftware. Sw Off - turn off the unit.

6. entering test numbers

Pressthe MODE/CLEAR key until the desired test mode isdisplayed. Enter the number of the IC you wish to test. Pressing the MODE/CLEAR key will clear the last digit from the display if a mistake is made.

Note: The NUMERIC information only is entered, leaving out the manufacturers prefixes and suffixes and IC family information. As an example, all the following TTL ICs should be entered as 7, 4, 0, 0 on the keypad:

e.g. DM74LS00J, N74LS00N, N74S00N, N7400N, 74ALS00N, SN74HCT00

A very small number of ICs have differing pin-outs for different IC families - in these cases, the most popular pin-out only issupported. The CMOS 4000 seriesisalso supported and the IC numbersfor this family should all begin with "4", so that with for example Motorola ICs beginning MC14... the initial "1" should be omitted. The same principles apply also to memory ICs, which are mostly four digit numbers. With interface ICs of the 8T series the "T" should be omitted. A complete list of all ICs supported by the B & K Model 575A is contained in the IC SUPPORT LIST at the end of this

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manual together with notes on any special requirementsfor certain ICs.

Note that if you have stored a user library using CompactLink, an IC in the user library with the same number as one in the internal library will take precedence. Thisallowsa new test to be written for an existing IC. If you wish both teststo be available, use a different number for your user test.

7. testing the IC

Insert the IC to be tested in the front of the 40 pin Zero Insertion Force socket with pin 1 towardsthe display as shown below:

Ensure that the operating lever on the socket isin the open (i.e. up) position before inserting the IC. Close the socket by lowering the lever, making sure that the IC is firmly seated in the socket and making good contact. Pressthe TEST/EXEC key to activate the test sequence for the IC. If an invalid IC type number was entered, or if the IC you have requested isnot supported the message "Unknown" will be displayed. Simply entering another IC type number will automatically clear this error message. If a valid type number was entered, the IC test will begin and the message "BUSY" will be displayed while the test proceeds. Many of the tests, however, execute so quickly that this message isnot noticeable.

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8. test results

A pre-determined sequence of signalsisapplied to the inputsof the IC and the IC outputsare monitored forthe correct logic levels. The unit uses TTL or CMOS logic thresholds(depending on the selected IC) when evaluating the response of the IC outputs. If all the outputs respond correctly, the result PASS will be displayed at the top right of the display. A scrolling message will contain the IC function and power pin information.

If a short circuit between the power pins of the IC is detected, a warning ‘SHT!' will appear on the top right of the display and, since no valid test isthen possible, the result will FAIL. If the IC under test takes an excessive amount of current when power is applied, a warning 'ICC!' will appear. Press the TEST/EXEC key to continue with the test, or MODE/CLEAR to abandon. Depending on the condition of the batteries there may also be a ‘BAT!’ warning which indicates that the batteries are incapable of supplying the current required by the IC under test. You can continue with the test by pressing the TEST/EXEC key, but the unit may malfunction because of a drop in battery voltage. To avoid this, change the batteriesor use a battery eliminator. Note that a faulty IC may demand more operating current and therefore will quickly drain the batteries.

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Model 575ADigital IC Tester

In the case of a FAIL result, the error conditions at all the nonfunctional pins of the IC will be scrolled on the display, and the IC function will be shown. The various failure conditions that can be displayed are asfollows:

LOW - the output was LOW when HIGH was expected. MID LOW - the output wasLOW, but not a valid logic level. HIGH - the output was HIGH when LOW was expected. MID HIGH - the output was HIGH, but not a valid logic level. LOAD 0V - the input cannot be driven HIGH. LOAD 5V - the input cannot be driven LOW.

In some cases, the scrolling test results may include one or more WARNING indications. These warningsindicate conditions that may result in an incorrect test result, and are asfollows:

D/F - result may be invalid because last self-test failed. BAT - battery voltage too low during test. ICC - large current taken by IC undertest.

Before discarding a failed IC check that the correct IC type number was entered and also check that the IC pins are clean and making good contact with the test socket. Note that there is no way of stopping a test once it has commenced, but see the description of loop functionslater in thismanual.

9. testing further ICs

After a test is completed, the test result will be displayed. To test another IC of the same type, simply insert the next IC and pressthe TEST/EXEC key again. To test a different IC, enter the new IC type number in the usual way, noticing that pressing the first digit of the new number automatically clears the previous number from the display. Remember that the MODE/CLEAR key can be used if an error ismade during the entry of the IC type number.

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Model 575ADigital IC Tester

10. continuous testing

It is possible to test the same IC repeatedly to detect intermittent or temperature-related faults, or to rapidly test a batch of identical ICs. There are three typesof test loop modes:

Loop - execute a test repeatedly, regardlessof the result. P Loop - execute a test repeatedly, provided the result isPASS. F Loop - execute a test repeatedly, provided the result was

FAIL.

The B & K Model 575A is configured into one of the loop modes using the MODE/CLEAR key as described earlier. Insert the IC and press TEST/EXEC in the usual way to start the continuous test process. The result of each test isdisplayed asPASS orFAIL on the top right of the display. In LOOP mode, thisallowsa large batch of identical ICs to be tested, without any action on the part of the operator other than inserting the IC. When the IC is inserted, sufficient time must be allowed for the test to take place before the result status is updated, so if in doubt the IC should be tested in single mode so that the approximate test time can be determined. It will be found that high throughput can be obtained using this mode.

To stop any of the test loops, pressMODE/CLEAR, but note that the test in progress is completed before the command is obeyed. The effect of this is usually unnoticeable, but where the test takes a reasonable time to execute there will be a delay before the instrument respondsto the MODE/CLEAR key.

Note: Testing high current ICs in loop mode will drain the batteries quickly, and it is recommended that a battery eliminator is used if you wish to perform loop tests.

11. search mode

This feature allows the type number of an unknown IC to be determined, provided the IC is actually contained in the B & K

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Model 575ADigital IC Tester

Model 575A library, and it isa correctly functioning IC. Thisfacility isuseful when the IC type number isillegible or hasbeen removed.

Use the MODE/CLEAR key to choose SEARCH mode, insert the unknown IC into the socket and pressthe TEST/EXEC key. You will be prompted to choose the number of pins of the IC you wish to identify - use the MODE/CLEAR key to select from 8 to 40 pins or 'QUIT' to abandon this mode. Press the TEST/EXEC key again to start the SEARCH or to quit asrequired.

During the identification process the display will indicate the number of ICs identified (IDENT:) and will show graphically how far through the library the SEARCH has progressed. At the end of the SEARCH, a list of all the similarICswill be scrolled onto the display. The list may be scrolled again by pressing the TEST/EXEC key.

If the IC cannot be identified the message "Not in Library" will be displayed. This means either that the IC is not in the library or it is non-functional. Note that if the B & K Model 575A detects excessive supply current (ICC! or BAT! warnings), the IC will not be identified during the SEARCH, but can still be tested in SINGLE mode.

If you have a user library present the search will extend to userICsin that library also. However, CompactLink contains a facility for excluding ICs from the search if required.

12. self test mode

This feature allows you to check the integrity of the unit, including the pin drivers and receivers, power supplies and other internal hardware. The test executesautomatically at switch on, but you can if you wish perform a self-test at any time by selecting Self-Test (DIAGS) mode using the MODE/CLEAR key and pressing TEST/EXEC.

If a fault isdiscovered a brief description will be displayed which will help our engineers to locate and rectify the fault. This message

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Model 575ADigital IC Tester

should be noted and quoted in any correspondence relating to a unit fault. Contact your distributor in the event of a self-test fail, but first of all ensure that the socket was empty when the diagnostics were run.

13. CompactLink mode

The B & K Model 575A is provided with an RS-232 interface to connect to a PC with a serial COM port or using a USB to RS-232 converter. A companion software package CompactLinkisavailable which provides library management, test development and debugging and user library update facilities. You can also use CompactLink to update the software of your B & K Model 575A without replacing the internal memory or opening the case.

To enter CompactLink mode, user the MODE/CLEAR key to enter CMLINK mode, then press TEST/EXEC. Press TEST/EXEC again to confirm that you wish to enter CompactLink mode, and the display will show “Not Connected”. Run the CompactLink software on your PC, connect the serial cable and follow the CompactLink manual instructionsto connect to the B & K Model 575A.

For comprehensive instructions on using CompactLink please refer to the manual and built-in help supplied with the software.

Note that in CompactLinkmode, including waiting for a connection, the normal power down timeout isdisabled and the unit will remain on for ever. We recommend using a battery eliminator when using CompactLinkmode to develop test programs.

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Model 575ADigital IC Tester

14. specifications

SPECIFICATIONS

Batteries 4X AA size DC input 6V, 850mAmax,center positive,regulated Power consumption Power off 10Amax

Standby 30mA Testing IC dependent

Testthresholds (internal library) TTL low 0.5Vmax

TTL switching 1.2V TTL high 2.4V min CMOS low 0.5Vmax CMOS switching 2.4V

CMOS high 3.8V min Testthresholds (user library) Programmable 0V to 5V(using CompactLink) RS-232 settings 38400 baud,8data bits, 1 stopbit,noparity Dimensions 200mmX100mmX55mmapprox. LibraryICs TTL,CMOS,VLSI, Interface,Memory, User

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Model 575ADigital IC Tester

Software Version No.

15. IC support list

BK575A 2.02

15.1. introduction

This section is a complete list of the ICs supported by the B & K Model 575A. If there are any special requirements necessary for a particular IC, there will be a number in brackets referring to the notes at the end of this manual. Always consult this list before testing an IC you have not tested before, particularly when there isa note to refer to.

15.2. series 54/74 TTL ICs

7400 7401 7402 7403 7404 7405 7406 7407 7408 7409 7410 7411 7412 7413 7414 7415 7416 7417 7418 7419 7420 7421 7422 7423 7424 7425 7426 7427 7428 7430

7431 7432 7433 7437 7438 7439 7440 7442 7443 7444 7445 7446 7447 7448 7449 7450(1) 7451(2) 7453(1) 7454(2) 7455 7456 7457 7460 7464 7465 7470 7472 7473 7474 7475

7476 7477 7478 7480 7482 7483 7485 7486(2) 7489 7490 7491 7492 7493 7494 7495 7496 7497 74100 74104 74105 74107 74109 74110 74111 74112 74113 74114 74116 74118 74119

74120 74122 (3) 74123 (3) 74125 74126 74128 74132 74133 74134 74135 74136 74137 74138 74139 74140 74143 74144 74145 74147 74148 74150 74151 74152 74153 74154 74155 74156 74157 74158 74159

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Model 575ADigital IC Tester

74160 74161 74162 74163 74164 74165 74166 74167 74168 74169 74170 74171 74173 74174 74175 74176 74177 74178 74179 74180 74181 74182 74183 74184 74185 74188 (6) 74189 74190 74191 74192 74193 74194 74195 74196 74197 74198 74199 74200 74201 74224 74225 74230 74231 74237 74238 74240

74241 74242 74243 74244 74245 74246 74247 74248 74249 74251 74253 74257 74258 74259 74260 74261 74265 74266 74273 74276 74278 74279 74280 74281 74283 74284 74285 74287 (6) 74288 (6) 74289 74290 74293 74295 74298 74299 74300 74301 74322 74323 74347 74348 74350 74351 74352 74353 74354

74355 74356 74357 74363 74364 74365 74366 74367 74368 74373 74374 74375 74376 74377 74378 74379 74381 74382 74384 74385 74386 74387 (6) 74390 74393 74395 74398 74399 74408 74412 74415 74422 (3) 74423 (3) 74425 74426 74436 74437 74440 74441 74442 74443 74444 74445 74446 74447 74448 74449

74465 74466 74467 74468 74470 (6) 74471 (6) 74472 (6) 74473 (6) 74474 74475 74490 74518 74519 74520 74521 74522 74533 74534 74540 74541 74543 74560 74561 74563 74564 74568 74569 74573 74574 74576 74580 74590 74591 74592 74593 74595 74596 74597 74604 74605 74606 74607 74620 74621 74622 74623

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Model 575ADigital IC Tester

74638 74639 74640 74641 74642 74643 74644 74645 74646 74647 74648 74649 74651 74652 74653 74654 74657 74666 74667 74668 74669

4000 4001 4002 4006 4007 4008 4009 4010 4011 4012 4013 4014 4015 4016 4017 4018 4019 4020 4021 4022 4023

74670 74671 74672 74682 74683 74684 74685 74688 74689 74690 74691 74692 74693 74696 74697 74698 74699 74760 74804 74805 74808

74832 74867 75869 74873 74874 74876 74878 74879 74880 74906 74907 74929 741000 741002 741003 741004 741005 741008 741010 741011 741020

741032 741035 741240 741241 741242 741243 741244 741245 741620 741621 741622 741623 741638 741639 741640 741641 741642 741643 741644 741645

15.3. CMOS ICs

Note: 74C/HC/HCT ICs are listed in the TTL section

4024 4025 4026 4027 4028 4029 4030 4031 4032 4035 4038 4040 4041 4042 4043 4044 4049 4050 4051 4052 4053

4056 4060 4063 4066 4067 4068 4069 4070 4071 4072 4073 4075 4076 4077 4078 4081 4082 4085 4086 4089 4093

4094 4098(3) 4099 4104 4106 4160 4161 4162 4163 4174 4175 4192 4193 4194 4195 4240 4244 4245 4373 4374 4501

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Model 575ADigital IC Tester

4502 4506 4507 4508 4510 4511 4512 4514 4515 4516 4517 4518 4519 4520 4522 4526 4527

15.4. memory ICs

1220 2k* 8 1403 16k * 1 2015 2k* 8 2016 2k* 8 2102 1k* 1 2111 256 * 4 2112 256 * 4 2114 1k* 4 2141 4k* 1 2142 1k* 4 2147 4k* 1 2148 1k* 4 2149 1k* 4 2600 64K * 1 2700 256 * 1 2703 16* 4 3101 16* 4 4164 64k * 1 41256 256k * 1 41257 256k * 1 41464 64k* 4 4256 256k* 1 4416 16k * 4 4464 8k* 8 4532 32K * 1(5) 4816 16k * 1 5110 1024k * 1

4528(3) 4530 4531 4532 4538(3) 4539 4541 4543 4544 4547 4555 4556 4557 4558 4559 4560 4561

4572 4583 4584 4585(4) 4599 4724 4731 40085 40097 40098 40102 40103 40104 40106 40107 40109 40160

5256 256k* 4 5516 2k* 8 5517 2k* 8 5518 2k* 8 6104 4K * 1 6116 2k* 8 6167 16k * 1 62256 32k* 8 6264 8k* 8 6810 128 * 8 7164 16k * 4 7185 8k* 8 7186 8k* 8 7489 16* 4 74189 16* 4 74200 256* 1 74201 256* 1 74289 16* 4 74300 256* 1 74301 256* 1 74929 1k* 1 8225 16* 4 2716 2k* 8 EPROM (6) 2732 4K * 8 EPROM (6) 2764 8K * 8 EPROM (6) 27128 16K * 8 EPROM (6) 27256 32K * 8 EPROM (6)

40161 40162 40163 40174 40175 40181 40192 40193 40194 40195 40240 40244 40245 40373 40374 5029 22100

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27512 64K * 8 EPROM (6) 27101 128K * 8EPROM (6) 271001 128K * 8 EPROM (6) 1410 256 * 4PROM (6) 1822 256 * 8PROM (6) 1830 32* 8 PROM (6) 1842 512 * 8PROM (6) 1846 512 * 8PROM (6) 74188 32* 8PROM (6) 74287 256* 4 PROM (6)

15.5. interface, peripheral, microprocessor and LSI ICs

75...SERIES 75113 75114 75121 75122 75123 75124 75125 75127 75128 75129 75136 75138 75146 75151 75153 75158 75159 75160 75161 75163 75172 75173 75174 75175 75183 75189 75192 75194 75195 75401 75402 75403 75404

75416 75417 75418 75419 75451 75452 75453 75454 75465 75466 75468 75469 75476 75477 75478 75479 75491 75492

ULN2...SERIES 2001 2003 2004 2005 2064 2065 2066 2067 2068 2069 2070

DS88..SERIES 8815

74288 32* 8PROM (6) 74387 256* 4 PROM (6) 74470 256* 8 PROM (6) 74471 256* 8 PROM (6) 74472 512* 8 PROM (6) 74473 512* 8 PROM (6) 74474 512* 8 PROM (6) 74475 512* 8 PROM (6)

8830 8831 8837 8838 8881 8885

8T SERIES 8T13 use 813 8T14 use 814 8T23 etc 8T24 8T26 8T28 8T38 8T97 8T98 8T127 8T128 8T129

82...SERIES 8234 8251 8266 8273

25/26/29...SERIES 2510 2514 2515 2518 2522 2595

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252517 252521 252536 252568 252569 2610 2611 2631 2632 2633 2901 2902 2907 2908 2911 2918 2922 2924 29821 29822 29823 29824 29825 29826 29841 29842 29843 29844 29845 29846

MC68... SERIES 6800 6802 6805(12) 6818 6820 6821 6845 6850 6880 6887 6888 6889 68681

MC34... SERIES 3438 3446 3486 3487

Z80...SERIES 780 Z80CPU 8400 Z80CPU 8420 Z80PIO 8430 Z80CTC 8440 Z80SIO 8442 Z80SIO-2 8470 Z80DART

MC65... SERIES 6502 6510 6520 6522 6545 6551

INTEL SERIES 8031 8032 8039(9) 8040(9) 8042(8) 8085 8088(7) 8155 8156 8212 8216 8226 8228 8237 8243 8250 8253 8254 8255 8259 8279 8282

8283 8286 8287 8288 8289 8755(6)

MISCELLANEOUS 1005 1006 1489 384 491 492 5452 54563 54564 58167 6595 7641 8131 8136 8160 8230 8252 8262 8277 8641 9014 9301 9309 9312 9314 9324 9328 9338 9347 9348 9614 9640 9641 9901 9902(10) 9995(11)

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Model 575ADigital IC Tester

15.6. notes on TTL ICs

Note 1: The 7450 and 7453 ICs have non-TTL compatible expander inputs that are often not used in designs. These inputs are not tested.

Note 2: The 74LS51 and 74LS54 have differing pin connections and functions from the standard 7451 and 7454 ICs. The test assumes that the 'LS version is being tested - to test the standard version use the numbers 7450 and 7453 respectively. In addition, the 74L86 IC has a different pin out to the standard 7486 ICs, but it can be tested using the 74386 test.

Note 3: When testing these ICs the warning "EXT" will appear on the LCD display. This means that external timing components are required to test the IC. The timing components should be inserted into the socket as given in following table:

IC COMPONENTS

74122/74422 2.2F betweenpins 24and26of theZIF socket, +vetopin 26 74123/74423 2.2F betweenpins 18and19of theZIF socket, +vetopin 19

2.2F betweenpins 27and26of theZIF socket, +vetopin 27

4528/4538/4098 0.22F betweenpins13and 14oftheZIF socket.

0.22F betweenpins27and26oftheZIFsocket.

15.7. notes on CMOS ICs

Note 4: Certain differences exist between manufacturers parts with this IC which may cause a FAIL result with ICsother than (Motorola) MC14585 ICs. Consult the data sheets for full details.

15.8. notes on memory ICs

Note 5: The 4532 32kDRAM isin fact a partially non-functional 64k DRAM. Four types exist, manufactured by OKI and TI who each supply two types. The type numbers45321 and 45322 are used for OKI types, and 45323 and 45324 are used for TI types. The first number in each case is for the low array version, and the second number for the high array version. See the IC data sheets for further details.

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Model 575ADigital IC Tester

Note 6: The ROM/EPROM tests perform a blank check and checksum on the IC, and display the contents of the first 16 locations. These tests cannot confirm the integrity of an IC, or identify it in SEARCH mode, since they have no knowledge of the intended contents of the EPROM. Please be patient when testing EPROMs in this way - some of the larger ICs take a long time to read.

15.9. notes on interface ICs

Note 7: The MOS version of this IC is internally dynamic, and the test may FAIL after a prolonged in-circuit LOOP test. The CMOS version, however, iscompletely static.

Note 8: The 8742 EPROM version of this IC must have the erase window covered otherwise the test may FAIL.

Note 9: The 8039 and 8040 ICs should be tested in FAIL LOOP mode due to the power down mode of the ICs affecting tester synchronization.

Note 10: ThisIC should only be tested in SINGLE MODE with a 1uF decoupling CAPACITOR connected across the supply and ground pins 29 and 20 of the ZIF socket (IC pins 18 and 9) due to itshigh supply current requirement.

Note 11: This IC requires a 1uF decoupling CAPACITOR to be connected across the supply and ground pins 10 and 31 of the ZIF socket due to itshigh supply current requirement.

Note 12: ThisIC may need to be tested in FAIL LOOP MODE.

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BK Precision BK Precision 575A Manual

Specifications and Main Features

Frequently Asked Questions

User Manual