
ACPL-P346/W346
Isolated Power MOSFET Gate Driver Evaluation Board
User's Manual
Quick Start
Visual inspection is needed to ensure that the evaluation board is received in good condition.
All part references are designated with sux ‘a’ and ‘b’ to indicate the lower and the upper inverter arms, respectively. If
part references are made without suxes, then they are valid for both upper and lower inverter arms (except R6, which
is shared).
Figure 1 shows the default connections of the evaluation board:
1. Q1 and Q2 are not mounted. Actual Power MOSFET can be mounted at either Q1 (for TO-220 package) or Q2 (for TO247 package) or connected to the driver board through short wire connections from the holes provided at Q1 or Q2.
2. D4 and R7 are not mounted (on solder side). A 12 V Zener diode footprint at D4 is provided to allow for a single DC
power supply of 15 V ~25 V to be applied across V
Q2) can then be generated and it acts as the reference point at the source pin of each power MOSFET. V
stay at 12 V above the virtual ground VE. R7 is needed to generate the bias current across D4.
3. S2 and S3 jumpers are shorted by default to connect VE to VEE, assuming that a negative supply is not needed. Note:
If a negative supply is needed, then S2 and S3 jumpers must be removed.
4. Bootstrap diode D3b and resistor R6 are connected by default. These two components are provided to help generate
V
supply through bootstrapping assuming that V
CC2b
only when Q1 or Q2 are mounted in a half-bridge conguration and turned on and o through proper PWM driving
signals.
5. S1 is shorted by default to ground the IN- (or LED-, the cathode of LED) pin when V
removed if IN- cannot be grounded.
6. Upper and lower arms of the inverter will have common V
connected by solder between upper and lower inverter PCB portions (and GND1 on the solder side).
7. Provisions are also made to allow V
(and VEE) to be generated from V
CC2
this DC/DC converter is used, S2, S3 (and R6) should be disconnected.
and VEE if needed. A virtual ground VE (at Source pin of Q1 or
CC2
will then
CC2
supply is available. Note: Bootstrapping supply works
CC2a
is supplied. This short can be
CC1
(and GND1), a provision is made to allow V
CC1
through a DC/DC converter at IC2. When
CC1
CC1
to be
V
CC1b
V
CC1a
VCC1a and VCC1b (shorted)
GNDa and GNDb on solder side (also shorted)
S1 (shorted)
Figure 1. Actual ACPL-P346/W346 evaluation board showing default connections
S2 (shorted)
R6 mounted (shorted)
S3 on solder side (also shorted)

Once inspection is done, the evaluation board can be powered up in ve simple steps. Figure 2 shows you how to test
the top or the bottom half-bridge inverter arms in simulation mode without the need for an actual power MOSFET.
Testing both arms of the half-bridge inverter driver (without a power MOSFET)
1. Solder a 10 nF capacitor across the gate and emitter terminals of Q1 or Q2. This is to simulate actual gate capacitance
of a power MOSFET.
2. Connect a +5 V DC supply (DC supply 1) across the +5V and GND terminals of CON1.
3. Connect another DC supply (DC Supply 2 with voltage range from 12 V ~ 20 V) across V
5 of IC2) terminals of IC2a, respectively. This can be non-isolated for testing purposes.
4. Connect drive signals:
a. A 10 kHz 5 V DC pulse (at slightly < 50% duty) from a dual-output signal generator across IN1+ and IN1- pins of
CON1a to simulate microcontroller output to drive the lower arm of the half-bridge Inverter.
b. Another 10 kHz 5V DC pulse (at 180° out of phase to the signal in 4a) from the dual-output signal generator across
IN2+ and IN2- pins of CON1b to simulate microcontroller output to drive the upper arm of the half-bridge inverter.
5. Use a multi-channel digital oscilloscope to capture the waveforms at the following points:
a. LED signal at the IN1+ pin with reference to (w.r.t.) GND.
b. LED signal at the IN2+ pin w.r.t. GND.
Note: The V
components D3b and R6.
supply of voltage close to V
CC2b
should then be successfully generated through the built-in bootstrap
CC2a
c. VGa representing the output voltage of ACPL-P346/W346 (IC1a) at the gate pin of Q1a (or Q2a) w.r.t. VEa.
d. VGb (through an isolated probe) representing the output voltage of ACPL-P346/W346 (IC1b) at the gate pin of Q1b
(or Q2b) w.r.t. VEB.
(pin 7 of IC2) and VEE (pin
CC2
In2-
In2+
4b
5b
Signal Input
+-
V
CC2b
3
12~20 V
DC Supply 2
+-
4a
5a
In1-
In1+
Signal Input
DC Supply 1
2
+5V
Gnd
Figure 2. Simple Simulation Test Setup of Evaluation Board
10nF
10nF
5d
1
V
Eb
5c
1
V
Ea
2

Schematics
Figure 3 shows the schematics of the evaluation board:
IC1b
ACPL-P346
IC2b
LEDb+
LEDb-
V
CC1b
CON1b
S1b
R1b
249R
R2b
130R
NM
R3b
1
3
1
NM
GNDb
LEDa+
LEDa-
V
CC1a
GNDa
CON1a
S1a
R1a
249R
R2a
130R
NM
R3a
2
IC1a
1
3
1
2
ACPL-P346
IC2a
R05P212D/R8
6
C1b
0.1µF
5
4
V
7
6
5
6
C1a
0.1 µF
5
4
V
TP2a
7
TP3a
6
TP4a
5
EEb
TP2b
TP3b
TP4b
EEa
V
CC2b
D4b
R7b
NM
R4b
TP1b
4R7 1W
R5b
NM
V
CC2b
C2b
10 µF T
C3b
10 µF T
V
EEb
V
CC2a
TP1a
R5a
NM
V
CC2a
C2a
10µF T
C3a
10µF T
V
EEa
SS32
D1b
BYM26F
S3b
a
a
R7a
NM
R4a
4R7 1W
SS32
D1a
S2a
BYM26F
S3a
a
a
S2b
SMBJ11CA
D3b
SMBJ11CA
D3a
NM
D4a
NM
D2b
D2a
G
R6
4R7 1W
G
D
S
V
Eb
D
S
V
Ea
NM
TO220/TO247
Q1b/Q2b
NM
TO220/TO247
Q1a/Q2a
Figure 3. Schematics of ACPL-P346/W346 evaluation board
3