Features
•
Third Generation Programmable Logic Structure
– High-Density Replacement fo r Discrete Logic
•
High-Speed — Plus a New, Low-Power Version
•
Increased Logic Flexibility
– 42 Inputs and 20 Sum Terms
•
Flexible Output Logic
– 20 Flip-Flops - 10 Extra
– All Can Be Individually Buried or 10 Output Directly
– Each has Individual Asynchronous Reset and Clock Terms
•
Multiple Feedback Paths Provide for Buried State Machines
and I/O Bus Compatibility
•
Proven and Reliable High-Speed CMOS EPROM Process
– 2000V ESD Protection
– 200 mA Latchup Immunity
•
Reprogrammable
– Tested 100% for Programmability
•
24-pin, 300-mil Dual-In-line and 28-Lead Surface Mount Packages
Logic Diagram
High Density UV
Erasable
Programmable
Logic Device
ATV750
ATV750L
Description
The ATV750( L) is 10 0% mor e powe rful tha n mos t other progr ammab le logi c dev ices
in 24-pin packages. Increased product terms, sum terms, and flip-flops translate into
more usable gates.
Each of the AT V750(L) ’s t wenty- two lo gic pins can be us ed as an inpu t. Ten o f th ese
can be used as input, output, o r bi-di rectio nal I/O pins. A ll twen ty flip- flops c an be fe d
back into the array independently. This flexibility allows burying all of the sum terms
and flip-flops.
There are 171 product terms available. A variable format is used to assign between
four and eight produc t terms per sum term. There a re two sum term s per output, providing added flexibility.
(continued)
Pin Configurations
Pin Name Function
IN Logic Inputs
I/O Bidirectional Buffers
* No Internal Connection
VCC +5V Supply
GND
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
DIP/SOIC
1
2
3
4
5
6
7
8
9
10
11
12
24
VCC
23
I/O
22
I/O
21
I/O
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
13
IN
5
IN
6
IN
7
IN
8
*
9
IN
10
IN
11
IN
PLCC/LCC
(Top View)
INININ*VCC
432
12131415161718
IN
IN
GND
1
*
I/O
282726
IN
I/O
I/O
I/O
25
I/O
24
I/O
23
*
22
I/O
21
I/O
20
I/O
19
I/O
Rev. 0024E–05/98
1
The ATV750(L) has more flip-flops available than other
PLDs in this density range. Complex state machines are
easily implemented.
Product terms are avai lable providing asynchronous
one clock term are pro vided per flip-f lop, with one ena ble
term per output. On e product ter m provides a gl obal synchronous preset. Register preload simplifies testing. The
device has an internal power up clear function.
resets, flip-flop clocks, and output enables. One reset and
Absolute Maximum Ratings
Temperature Under Bias...............................-55°C to + 125°C
Storage Temperature.................................... -65°C to + 150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on Input Pins
with Respect to Ground
During Programming.....................................-2.0V to +14.0V
Programming Voltage with
Respect to Ground .......................................-2.0V to +14.0V
Integrated UV Erase Dose..............................7258 W.sec/cm
(1)
(1)
(1)
2
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the dev ice . This is a s tress rating only an d
functional oper ation of the devi ce at t hes e o r any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions f or e xtended periods ma y af fect de vice
reliability .
Note: 1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns. Maximum output pin voltage is Vcc + 0.75V DC,
which may overshoot to 7.0V for pulses of less
than 20 ns.
Logic Options
Combined Terms Separate Terms Combined Terms Separate Terms
Output Options
2
ATV750/L
DC and AC Operating Conditions
Com. 0°C - 70°C 0°C - 70°C
ATV750/L
ATV750-20 ATV750/750L-25
Operating Temperature (Case)
Ind. -40°C - 85°C -40°C - 85°C
Mil. -55°C - 125°C -55°C - 125°C
V
Power Supply 5V ± 10% 5V ± 10%
CC
DC Characteristics
Symbol Parameter Condition Min Typ Max Units
I
LI
I
LO
Input Load
Current
Output Leakage
Current
VIN = -0.1V to VCC + 1V
= -0.1V to VCC + 0.1V
V
OUT
Com. 120 mA
= MAX,
V
I
CC
Po wer Supply
Current
CC
= GND ,
V
IN
Outputs Open
ATV750
Ind.,Mil. 140 mA
Com. 1.0 1 2 mA
ATV750L
Ind.,Mil. 1.0 15 mA
(1)
I
OS
V
IL
V
IH
V
OL
V
OH
Output Short Circuit Current V
= 0.5V -120 mA
OUT
Input Low Voltage -0.6 0.8 V
Input High Voltage
Output Low Voltage
Output High Voltage
VIN = VIH or VIL,
V
= MIN
CC
= VIH or VIL,
V
IN
V
= MIN
CC
= 12 mA Com.,Ind. 0.5 V
I
OL
IOL = 8 mA Mil. 0.5 V
I
= 24 mA, Com. 1.0 V
OL
I
= -100 µAV
OH
IOH = -4.0 mA 2.4 V
2.0 V
- 0.3 V
CC
Note: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
10 µA
10 µA
+
CC
0.75
V
3
AC Waveforms
Note: 1. Timing measurement reference is 1.5V. Input AC driving levels are 0.0V and 3.0V, unless otherwise specified.
(1)
4
ATV750/L
AC Characteristics
Symbol Parameter
t
PD
t
EA
t
ER
t
CO
t
CF
t
S
t
SF
t
H
t
P
t
W
F
MAX
t
AW
t
AR
t
AP
t
SP
Input or Feedback to Non-Registered Output 20 25 ns
Input to Output Enable 20 25 ns
Input to Output Disable 20 25 ns
Clock to Output 20 22 ns
Clock to Feedback 5 10 5 10 ns
Input Setup Time 10 12 ns
Feedback Setup Time 5 7 ns
Hold Time 5 5 ns
Clock Period 18 22 ns
Clock Width 8 10 ns
Maximum Frequency 55 45 MHz
Asynchronous Reset Width 15 20 ns
Asynchronous Reset Recovery Ti me 15 20 ns
Asynchronous Reset to Registered Output Reset 20 25 ns
Setup Time, Synchronous Preset 12 15 ns
ATV750/L
ATV750-20 ATV750/750L-25
UnitsMin Max Min Max
Input Test Waveforms and
Measurement Levels
tR, tF < 5 ns (10% to 90%)
Output Test Loads
5