• Zero Power – 25 µA Maximum Standby Power (Input Transition Detection)
• CMOS and TTL Compatible Inputs and Outputs
• Advanced Electrically-erasableTechnology
– Reprogrammable
– 100% Tested
• Latch Feature Holds Inputs to Previous Logic State
• High-reliability CMOS Process
– 20 Year Data Retention
– 100 Erase/Write Cycles
– 2,000V ESD Protection
– 200 mA Latchup Immunity
• Commercial and Industrial Temperature Ranges
• Dual-in-line and Surface Mount Standard Pinouts
• PCI Compliant
• Green Package Options (Pb/Halide-free/RoHS Compliant) Available
1.Desscription
The ATF22V10CZ/CQZ is a high-performance CMOS (electrically-erasable)
programmable logic device (PLD) which utilizes Atmel’s proven electrically-erasable
Flash memory technology. Speeds down to 12 ns with zero standby power dissipation
are offered. All speed ranges are specified over the full 5V ±10% range for industrial
temperature ranges; 5V ±5% for commercial range 5-volt devices. The
ATF22V10CZ/CQZ provides a low voltage and edge-sensing “zero” power CMOS
PLD solution with “zero” standby power (5 µA typical). The ATF22V10CZ/CQZ provides a “zero” power CMOS PLD solution with 5V operating voltages, powering down
automatically to the zero power-mode through Atmel’s patented Input Transition
Detection (ITD) circuitry when the device is idle, offering “zero” (25 µA worst case)
standby power. This feature allows the user to manage total system power to meet
specific application requirements and enhance reliability. Pin “keeper” circuits on input
and output pins eliminate static power consumed by pull-up resistors. The “CQZ” combines the low high-frequency I
The ATF22V10CZ/CQZ incorporates a superset of the generic architectures, which
allows direct replacement of the 22V10 family and most 24-pin combinatorial PLDs.
Ten outputs are each allocated 8 to 16 product terms. Three different modes of operation, configured automatically with software, allow highly complex logic functions to be
realized.
of the “Q” design with the “Z” feature.
CC
Highperformance
EE PLD
ATF22V10CZ
ATF22V10CQZ
0778J–PLD–11/07
Figure 1-1.Block Diagram
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CLK/IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
GND
VCC
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
IN
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CLK/IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
GND
VCC
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
IN
5
6
7
8
9
10
11
25
24
23
22
21
20
19
IN
IN
IN
GND*
IN
IN
IN
I/O
I/O
I/O
GND*
I/O
I/O
I/O
432
1
282726
12131415161718
IN
IN
GND
GND*
IN
I/O
I/O
ININCLK/IN
VCC*
VCC
I/O
I/O
2.Pin Configurations
Table 2-1.Pin Configurations (All Pinouts Top View)
Pin NameFunction
CLKClock
INLogic Inputs
I/OBi-directional Buffers
VCC+5V Supply
Figure 2-1.TSSOPFigure 2-2.DIP/SOIC
2
Figure 2-3.PLCC
Note:For PLCC, P1, P8, P15 and P22 can be
left unconnected. For superior performance, connect VCC to pin 1 and GND
to 8, 15, and 22.
ATF22V10C(Q)Z
0778J–PLD–11/07
ATF22V10C(Q)Z
3.Absolute Maximum Ratings*
Temperature Under Bias.................................. -40°C to +85°C
Storage Temperature ..................................... -65°C to +150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on Input Pins
with Respect to Ground
During Programming.....................................-2.0V to +14.0V
Programming Voltage with
Respect to Ground .......................................-2.0V to +14.0V
(1)
(1)
(1)
4.DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Ambient)0°C - 70°C-40°C - 85°C
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Note:1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns.
Maximum output pin voltage is V
which may overshoot to 7.0V for pulses of less
than 20 ns.
+ 0.75V DC,
CC
VCC Power Supply5V ± 5%5V± 10%
0778J–PLD–11/07
3
4.1DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
I
IH
Input or I/O Low
Leakage Current
Input or I/O High
Leakage Current
0 ≤ VIN ≤ V
IN
≤ V
3.5 ≤ V
(Max)
IL
CC
-10µA
10µA
CZ-12, 15Com90150mA
= Max
V
I
CC
Clocked Power
Supply Current
CC
Outputs Open,
f = 15 MHz
CZ-15Ind90180mA
CQZ-20Com4060mA
CQZ-20Ind4080mA
CZ-12, 15Com525µA
= Max
V
I
SB
Power Supply Current,
Standby
CC
= MAX
V
IN
Outputs Open
CZ-15Ind550µA
CQZ-20Com525µA
CQZ-20Ind550µA
(1)
I
OS
V
IL
V
IH
V
OL
Output Short Circuit
Current
V
= 0.5V-130mA
OUT
Input Low Voltage-0.50.8V
Input High Voltage2.0VCC + 0.75V
V
= VIH or V
Output Low Voltage
IN
VCC = Min,
IL
0.5V
IOL = 16 mA
V
= VIH or V
V
OH
Output High Voltage
V
IN
CCIO
= Min,
IL
2.4V
IOH = -4.0 mA
Note:1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
4
ATF22V10C(Q)Z
0778J–PLD–11/07
4.2AC Waveforms
INPUTS, I/O
REG. FEEDBACK
SYNCH. PRESET
CP
ASYNCH. RESET
REGISTERED
OUTPUTS
COMBINATORIAL
OUTPUTS
VALIDVALID
VALID
VALID
VALID
VALID
OUTPUT
DISABLED
OUTPUT
DISABLED
tS
tH
tWtW
tP
tAR
tAW
tAPtCO
tPD
tERtEA
tEAtER
ATF22V10C(Q)Z
4.3AC Characteristics
SymbolParameter
t
PD
t
CF
t
CO
t
S
t
H
t
W
f
MAX
t
EA
t
ER
t
PZX
t
PXZ
t
AP
t
SP
t
AW
t
AR
t
SPR
Note:1. See ordering information for valid part numbers.
(1)
-12-15-20
UnitsMinMaxMinMaxMinMax
Input or Feedback to Non-registered Output312315320 ns
Note:Similar competitors devices are specified with slightly different loads. These load differences may
affect output signals’ delay and slew rate. Atmel devices are tested with sufficient margins to meet
compatible device specification conditions.
4.5Pin Capacitance
Table 4-1.Pin Capacitance (f = 1 MHz, T = 25C
TypMaxUnitsConditions
C
IN
C
I/O
Note:1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100%
tested.
4.6Power-up Reset
The registers in the ATF22V10CZ/CQZ are designed to reset during power-up. At a point
delayed slightly from V
state will depend on the polarity of the buffer.
This feature is critical for state machine initialization. However, due to the asynchronous nature
of reset and the uncertainty of how V
required:
1. The V
rise must be monotonic and start below 0.7V.
CC
2. The clock must remain stable during T
3. After T
occurs, all input and feedback setup times must be met before driving the
PR
clock pin high.
4.7Preload of Register Outputs
The ATF22V10CZ/CQZ’s registers are provided with circuitry to allow loading of each register
with either a high or a low. This feature will simplify testing since any state can be forced into the
registers to control test sequencing. A JEDEC file with preload is generated when a source file
(1)
)
810 pFV
810 pFV
crossing V
CC
, all registers will be reset to the low state. The output
RST
actually rises in the system, the following conditions are
CC
.
PR
= 0V; f = 1.0 MHz
IN
= 0V; f = 1.0 MHz
OUT
6
ATF22V10C(Q)Z
0778J–PLD–11/07
with vectors is compiled. Once downloaded, the JEDEC file preload sequence will be done auto-
C
LOCK
V
RST
POWER
REGISTERED
OUTPUTS
t
S
t
PR
t
W
matically by most of the approved programmers after the programming.
5.Electronic Signature Word
There are 64 bits of programmable memory that are always available to the user, even if the
device is secured. These bits can be used for user-specific data.
6.Security Fuse Usage
A single fuse is provided to prevent unauthorized copying of the ATF22V10CZ/CQZ fuse patterns. Once programmed, fuse verify and preload are inhibited. However, the 64-bit User
Signature remains accessible. The security fuse should be programmed last, as its effect is
immediate.
7.Programming/Erasing
Programming/erasing is performed using standard PLD programmers. See CMOS PLD Programming Hardware & Software Support for information on software/programming.
Figure 7-1.Programming/Erasing Timing
ATF22V10C(Q)Z
8.Input and I/O Pull-ups
0778J–PLD–11/07
Table 7-1.Programming/Erasing
ParameterDescriptionTypMaxUnits
T
PR
V
RST
Power-up
Reset Time
Power-up
Reset Voltage
6001000ns
3.84.5V
All ATF22V10CZ/CQZ family members have internal input and I/O pin-keeper circuits. Therefore, whenever inputs or I/Os are not being driven externally, they will maintain their last driven
state. This ensures that all logic array inputs and device outputs are at known states. These are
relatively weak active circuits that can be easily overridden by TTL-compatible drivers (see input
and I/O diagrams below).
7
Figure 8-1.Input Diagram
100K
V
CC
ESD
PROTECTION
CIRCUIT
INPUT
100K
V
CC
V
CC
DATA
OE
I/O
INPUT
Figure 8-2.I/O Diagram
9.Compiler Mode Selection
Table 9-1.Compiler Mode Selection
Synario
WINCUPL
8
ATF22V10C(Q)Z
PAL M o de
(5828 Fuses)
ATF22V10C (DIP)
ATF22V10C (PLCC)
P22V10
P22V10LCC
GAL Mode
(5892 Fuses)
ATF22V10C DIP (UES)
ATF22V10C PLCC (UES)
G22V10
G22V10LCC
0778J–PLD–11/07
10. Functional Logic Diagram Description
The Functional Logic Diagram describes the ATF22V10CZ/CQZ architecture.
The ATF22V10CZ/CQZ has 12 inputs and 10 I/O macrocells. Each macrocell can be configured
into one of four output configurations: active high/low, registered/combinatorial output.The universal architecture of the ATF22V10CZ/CQZ can be programmed to emulate most 24-pin PAL
devices.
Unused product terms are automatically disabled by the compiler to decrease power consumption. A security fuse, when programmed, protects the contents of the ATF22V10CZ/CQZ. Eight
bytes (64 fuses) of User Signature are accessible to the user for purposes such as storing
project name, part number, revision or date. The User Signature is accessible regardless of the
state of the security fuse.
To use commercial product for Industrial temperature ranges, down-grade one speed grade
from the “I” to the “C” device (7 ns “C” = 10 ns “I”) and de-rate power by 30%.
Notes:1. This package conforms to JEDEC reference MS-018, Variation AB.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
A4.191–4.572
A12.286–3.048
A2 0.508––
D12.319–12.573
D111.430–11.582 Note 2
E12.319–12.573
E111.430–11.582 Note 2
D2/E29.906–10.922
B0.660–0.813
B10.330– 0.533
e1.270 TYP
12.128J – PLCC
ATF22V10C(Q)Z
0778J–PLD–11/07
15
12.224P3 – PDIP
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
24P3, 24-lead (0.300"/7.62 mm Wide) Plastic Dual
Inline Package (PDIP)
D
24P3
6/1/04
PIN
1
E1
A1
B
E
B1
C
L
SEATING PLANE
A
D
e
eB
eC
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
A – – 5.334
A1 0.381 – –
D 31.623 – 32.131 Note 2
E 7.620 – 8.255
E1 6.096 – 7.112 Note 2
B 0.356 – 0.559
B1 1.270 – 1.651
L 2.921 – 3.810
C 0.203 – 0.356
eB – – 10.922
eC 0.000 – 1.524
e 2.540 TYP
Notes: 1. This package conforms to JEDEC reference MS-001, Variation AF.
2. Dimensions D and E1 do not include mold Flash or Protrusion.
Mold Flash or Protrusion shall not exceed 0.25 mm (0.010").
16
ATF22V10C(Q)Z
0778J–PLD–11/07
12.324S – SOIC
0º ~ 8º
PIN 1 ID
PIN 1
06/17/2002
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
REV.
24S, 24-lead (0.300" body) Plastic Gull Wing Small Outline (SOIC)
B
24S
R
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
A––2.65
A10.10–0.30
D10.00–10.65
D17.40–7.60
E15.20–15.60
B0.33–0.51
L0.40–1.27
L10.23–0.32
e1.27 BSC
B
D
D1
e
E
A
A1
L1
L
ATF22V10C(Q)Z
0778J–PLD–11/07
17
12.424X – TSSOP
0.30(0.012)
0.19(0.007)
4.48(0.176)
4.30(0.169)
6.50(0.256)
6.25(0.246)
0.65(0.0256)BSC
7.90(0.311)
7.70(0.303)
0.15(0.006)
0.05(0.002)
0.20(0.008)
0.09(0.004)
0.75(0.030)
0.45(0.018)
0º ~ 8º
1.20(0.047)MAX
Dimensions in Millimeter and (Inches)*
JEDEC STANDARD MO-153 AD
Controlling dimension: millimeters
PIN 1
04/11/2001
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
24X, 24-lead (4.4 mm body width) Plastic Thin Shrink Small Outline
Package (TSSOP)
A
24X
18
ATF22V10C(Q)Z
0778J–PLD–11/07
13. Revision History
Version No./Release DateHistory
Revision I – November 2005
1. Added Green Package options
ATF22V10C(Q)Z
0778J–PLD–11/07
19
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