ATF20V8B50 mA55 mA
ATF20V8BQ35 mA40 mA
ATF20V8BQL5 mA20 mA
•
CMOS and TTL Compatible Inputs and Outputs
•
Input and I/O Pull-Up Resistors
•
Advanced Flash Technology
– Reprogrammable
– 100% Tested
•
High Reliability CMOS Process
– 20 Year Data Retention
– 100 Erase/Write Cycles
– 2,000V ESD Protection
– 200 mA Latchup Immunity
•
Commercial and Industrial Temperature Ranges
•
Dual-in-Line and Surface Mount Packages in Standard Pinouts
®
HighPerformance
EE PLD
ATF20V8B
Block Diagram
Pin Configurations
Pin NameFunction
CLKClock
IL ogi c Inpu ts
I/OBidirectional Buffers
OEOutput Enable
*No Internal Connection
V
CC
+5V Supply
TSSOP Top View
1
CLK/IN
GND
2
IN
3
IN
4
IN
5
IN
6
IN
7
IN
8
IN
9
IN
10
IN
11
IN
12
24
VCC
23
IN
22
I/O
21
I/O
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
IN
13
OE/IN
DIP/SOICPLCC Top View
Rev. 0407E–05/98
1
Description
The ATF20V8B is a high performance CMOS (Elec trically
Erasable) Programmable Logic Device (PLD) which utilizes
Atmel’s proven electrically erasable Flash memory technology. Speeds down to 7.5 ns and power dissipation as low
as 10 mA are offered. All speed ranges are specified over
the full 5V ± 10% range for industrial temperature ranges,
and 5V ± 5% for commercial temperature ranges.
Several low power options allow selection of the best solution for various types of power-limited applications. Each of
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature.....................................-65°C to +150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on Input Pins
with Respect to Ground
During Programming.....................................-2.0V to +14.0V
Programming Voltage with
Respect to Ground .......................................-2.0V to +14.0V
(1)
(1)
(1)
these options significantly reduces total system power and
enhances system reliability.
The ATF20V8Bs incorporate a superset of the generic
architectures, wh ich allows direct repl acemen t of the 20R8
family and most 24-pin combinatorial PLDs. Eight outputs
are each allocated eight pr oduct terms. Three different
modes of operation, configured automatically with software, allow highly complex logic functions to be realized.
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions f or e xte nded p eriods may affect dev ice
reliability .
Note:1.Minimum voltage is -0.6V DC which may under-
shoot to -2.0V for pulses of less than 20 ns.Maximum output pin voltage is V
may overshoot to 7.0V for pulses of less than 20
ns.
+ 0.75V DC which
CC
DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Case)0°C - 70°C-40°C - 85°C
Power Supply5V ± 5%5V ± 10%
V
CC
2
ATF20V8B
ATF20V8B
DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
Input or I/O Low
Leakage Current
≤ VIL(MAX)-35-100µA
0 ≤ V
IN
I
IH
I
CC
I
CC2
IOS
Input or I/O High
Leakage Current
3.5 ≤ VIN ≤ V
CC
10µA
Com.6090mA
B-7, -10
Ind.60100mA
Com.6080mA
Ind.6090mA
Power Supply
Current, Standby
= MAX,
V
CC
= MAX,
V
IN
Outputs Open
B-15, -25
BQ-10Com.3555mA
Com.510mA
BQL-15, -25
Ind.515mA
Com.80110mA
B-7, -10
Ind.80125mA
Com.6090mA
Ind.60105mA
Clock ed Power
Supply Current
= MAX,
V
CC
Outputs Open,
f = 15 MHz
B-15, -25
BQ-10Com.4055mA
Com.2035mA
BQL-15, -25
Ind.2040mA
(1)
Output Short
Circuit Current
= 0.5V-130mA
V
OUT
V
IL
V
IH
V
OL
V
OH
Input Low Voltage-0.50.8V
Input High Voltage2.0VCC + 0.75V
Com.,
Ind.
0.5V
Output Low Voltage
Output High Voltage
= VIH or VIL,
V
IN
= MIN
V
CC
= VIH or VIL,
V
IN
= MIN
V
CC
IOL = 24 mA
= 16 mA 0.5V
I
OL
= -4.0 mA2.4V
I
OH
Note:1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
3
AC Waveforms
(1)
Note:1.Timing measurement reference is 1.5V. Input AC driving levels are 0.0V and 3.0V, unless otherwise specified.
AC Characteristics
SymbolParameter
t
PD
t
CF
t
CO
t
S
t
H
t
P
t
W
F
MAX
t
EA
t
ER
Input or Feedback to
Non-Registered Output
Clock to Feedback36810ns
Clock to Output2527210212ns
Input or Feedback
Setup Time
Hold Time0000ns
Clock Period8 121624 ns
Clock Width46812ns
External Feedback 1/(tS + tCO)100684537MHz
Internal Feedback 1/(t
No Feedback 1/(tP)125836241MHz
Input to Output
allow loading of each register with either a high or a low.
This feature will simplify testing since an y state can be
forced into the registers to control test seq uencing. A
JEDEC file with preload is generated whe n a source fil e
with vectors is compiled. Once downloaded, the JEDEC file
preload sequence will be done automatically by most of the
approved programmers after the programming.
Security Fuse Usage
A single fuse is provided to prevent unauthoriz ed copying
of the ATF20V8B fuse patterns. Once programmed, fuse
verify and preload are inhibited. However, the 64-bit User
Signature remains accessible.
The security fuse should be programmed last, as its effect
is immediate.
Electronic Signature Word
There are 64 bits of programmable memory that are always
available to the user, even if the device is secured. These
bits can be used for user-specific data.
Programming/Erasing
Programming/erasing is performed using standard PLD
programmers. For further information, see the Configurable
Logic Databook, section titled, “CMOS PLD Programming
Hardware and Software Support.”
5
Input and I/O Pull-Ups
All ATF20V8B family members have internal input and I/O
pull-up resistors. Therefore, whenever inputs or I/Os are
not being driven externa lly, they will float to V
ensures that all lo gic array inputs are at kn own states.
. This
CC
These are relatively weak active pull-ups that can easily be
overdriven by TTL-compatible dr ivers (see input and I/O
diagrams below).
Input DiagramI/O Diagram
Functional Logic Diagram Description
The Logic Option and Fu nctional Diagrams des cribe the
ATF20V8B architec ture. Eig ht confi gurable ma crocell s can
be configured as a registered output, combinatorial I/O,
combinatorial output, or dedicated input.
The ATF20V8B can b e conf igured in one o f three di fferen t
modes. Each mode makes the ATF20V 8B look like a different device. Most PLD compilers can choose the right
mode automatic all y. The u ser ca n al so f orc e the se lect ion
by supplying the compiler with a mode selection. The determining factors would be the usage of register versus combinatorial ou tputs and ded icated output s versus outpu ts
with output enable control.
The ATF20V8B universal architect ure can be pro grammed
to emulate many 24-pin PAL devices. These architectural
subsets can be found in ea ch of the con figurat ion modes
described in the following pages. The user can download
the listed sub set device JEDEC progr amming fi le to the
PLD programmer, and the ATF20 V8B c an be c onfi gu red to
act like the chosen device. Check with your programmer
manufacturer for this capability.
Unused product terms a re automatic ally disabled by the
compiler to decrease power con sumption. A Security
Fuse, when programmed, protects the content of the
ATF20V8B. Eight bytes (6 4 fuses) of User Sig nature are
accessible to the user for purposes such as storing project
name, part number, revision, or date. The User Signature
is accessible regardless of the state of the Security Fuse.
6
ATF20V8B
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