ATMEL ATF16V8BQL-25XI, ATF16V8BQL-25XC, ATF16V8BQL-25SI, ATF16V8BQL-25SC, ATF16V8BQL-25PI Datasheet

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1
Features
Industry Standard Architecture
– Emulates Many 20-Pin PALs
®
– Low Cost Easy-to-Use Software Tools
– 7.5 ns Maximum Pin-to-Pin Delay
Several Power Saving Options
CMOS and TTL Compatible Inputs and Outputs
– Input and I/O Pull-Up Resistors
Advanced Flash Technology
– Reprogrammable – 100% Tested
High Reliability CMOS Process
– 20 Year Data Retention – 100 Erase/Write Cycles – 2,000V ESD Protection – 200 mA Latchup Immunity
Commercial, and Industrial Temperature Ranges
Dual-in-Line and Surface Mount Packages in Standard Pinouts
Block Diagram
Device ICC, Stand-By ICC, Active
ATF16V8B 50 mA 55 mA ATF16V8BQ 35 mA 40 mA ATF16V8BQL 5 mA 20 mA
Rev. 0364E–07/98
High­Perf ormance Flash PLD
ATF16V8B
Pin Configurations
Pin Name Function
CLK Clock I Logic Inputs I/O Bidirectional Buffers OE
Output Enable
V
CC
+5 V Supply
TSSOP Top View
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12 11
I/CLK
I1 I2 I3 I4 I5 I6 I7 I8
GND
VCC I/O I/O I/O I/O I/O I/O I/O I/O I9/OE
DIP/SOIC PLCC Top View
ATF16V8B
2
Description
The ATF16V8B is a high performance CMOS (Elec trically Erasable) Programmable Logic Device (PLD) which utilizes Atmel’s proven electrically erasable Flash memory technol­ogy. Speeds do wn to 7 .5 ns a re offe red. Al l s peed rang es are specified over the full 5V ± 10% range for industrial temperature ranges, and 5V ± 5% for commercial tempera­ture ranges.
Several low power options allow selection of the best solu­tion for various types of power-limited applications. Each of
these options significantly reduces total system power and enhances system reliability.
The ATF16V8Bs incorporate a superset of the generic architectures, wh ich allows direct repl acemen t of the 16R8 family and most 20-pin combinatorial PLDs. Eight outputs are each allocated eight pr oduct terms. Three different modes of operation, configured automatically with soft­ware, allow highly complex logic functions to be realized.
Absolute Maximum Ratings*
Temperature Under Bias.................................-55oC to +125oC
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam­age to the dev ice. Th is is a s tress rating only an d functional oper ati on of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions f or e xtended periods ma y af fect dev ice reliability .
Note: 1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns. Max­imum output pin voltage is V
CC
+ 0.75V DC, which may overshoot to 7.0V for pulses of less than 20 ns.
Storage Temperature......................................-65
o
C to +150oC
Voltage on Any Pin with
Respect to Ground .......................................-2.0 V to +7.0 V
(1)
Voltage on Input Pins with Respect to Ground
During Programming...................................-2.0 V to +14.0 V
(1)
Programming Voltage with
Respect to Ground .....................................-2.0 V to +14.0 V
(1)
DC and AC Operating Conditions
Commercial Industrial
Operating Temperature (Case) 0
o
C - 70oC-40
o
C - 85oC
V
CC
Power Supply 5V ± 5% 5V ± 10%
ATF16V8B
3
Note: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
DC Characteristics
Symbol Parameter Condition Min Typ Max Units
I
IL
Input or I/O Low Leakage Current
0 ≤ V
IN
≤ VIL(MAX) -35 -100 µA
I
IH
Input or I/O High Leakage Current
3.5 ≤ VIN ≤ V
CC
10 µA
I
CC
Power Supply Current, Standby
V
CC
= MAX,
V
IN
= MAX,
Outputs Open
B-7, -10
Com. 55 85 mA Ind. 55 95 mA
B-15, -25
Com. 50 75 mA Ind. 50 80 mA
BQ-10 Com. 35 55 mA
BQL-15, -25
Com. 5 10 mA Ind. 5 15 mA
I
CC2
Clocked Power Supply Current
V
CC
= MAX, Outputs Open, f=15 MHz
B-7, -10
Com. 60 90 mA Ind. 60 100 mA
B-15, -25
Com. 55 85 mA Ind. 55 95 mA
BQ-10 Com. 40 55 mA
BQL-15, -25
Com. 20 35 mA Ind. 20 40 mA
I
OS
(1)
Output Short Circuit Current
V
OUT
= 0.5 V -130 mA
V
IL
Input Low Voltage -0.5 0.8 V
V
IH
Input High Voltage 2.0 VCC+0.75 V
V
OL
Output High Voltage
V
IN=VIH
or VIL,
V
CC
=MIN
I
OL
= -24 mA
Com., Ind.
0.5 V
V
OH
Output High Voltage
V
IN=VIH
or VIL,
V
CC
=MIN
I
OH
= -4.0 mA 2.4 V
ATF16V8B
4
AC Waveforms
(1)
Note: 1. Timing measurement reference is 1.5V. Input AC driving levels are 0.0V 3.0V, unless otherwise specified.
Notes: 1. See ordering information for valid part numbers and speed grades.
2. Recommend ATF16V8C -7.
AC Characteristics
(1)
Symbol Parameter
-7
(2)
-10 -15 -25 UnitsMin Max Min Max Min Max Min Max
t
PD
Input or Feedback to Non-Registered Output
8 outputs switching 3 7.5 3 10 3 15 3 25 ns 1 output switching 7 ns
t
CF
Clock to Feedback 3 6 8 10 ns
t
CO
Clock to Output 2527210212ns
t
S
Input or Feedback Setup Time
5 7.5 12 15 ns
t
H
Hold Time 0000ns
t
P
Clock Period 8 121624 ns
t
W
Clock Width 4 6 8 12 ns
F
MAX
External Feedback 1/(tS+tCO) 100 68 45 37 MHz Internal Feedback 1/(t
S
+ tCF) 125 74 50 40 MHz
No Feedback 1/(t
P
) 125 83 62 41 MHz
t
EA
Input to Output Enable — Product Term
3 9 3 10 3 15 3 20 ns
t
ER
Input to Output Disable — Product Term
2 9 2 10 2 15 2 20 ns
t
PZX
OE pin to Output Enable 2 6 2 10 2 15 2 20 ns
t
PXZ
OE pin to Output Disable 1.5 6 1.5 10 1.5 15 1.5 20 ns
ATF16V8B
5
Input Test Waveforms and Measurement Levels:
tR, tF < 5 ns (10% to 90%)
Output Test Loads:
Commercial
Note: 1. Typical values for nominal supply voltage. This param eter is only sampled and is not 100% tested.
Power Up Reset
The registers in the ATF16V8Bs are design ed to reset dur ­ing power up. At a point delayed slightly from V
CC
crossing
V
RST
, all registers will be re set to th e low state . As a r esult,
the registered output state will always be high on power-up. This feature is critical for state machine initialization. How-
ever, due to the asynchronous nature of reset and the uncertainty of h ow V
CC
actually rises in the sys tem, the fo l-
lowing conditions are required:
1) The V
CC
rise must be monotonic,
2) After reset occurs, all input and feedback setup times must be met before driving the clock pin high, and
3) The clock must remain stable during t
PR
.
Preload of Registered Outputs
The ATF16V8B’s registers are provided with circuitry to allow loading of each register with either a high or a low. This feature will simplify testing since an y state can be forced into the registers to control test seq uencing. A JEDEC file with preload is generated whe n a source fil e with vectors is compiled. Once downloaded, the JEDEC file preload sequence will be done automatically by most of the approved programmers after the programming.
Security Fuse Usage
A single fuse is provided to prevent unauthoriz ed copying of the ATF16V8B fuse patterns. Once programmed, fuse verify and preload are inhibited. However, the 64-bit User Signature remains accessible.
The security fuse should be programmed last, as its effect is immediate.
Pin Capacitance
f = 1 MHz, T = 25°C
(1)
T yp Max Units Conditions
C
IN
58 pFV
IN
= 0 V
C
OUT
68 pFV
OUT
= 0 V
Parameter Description Typ Max Units
t
PR
Power-Up Reset Time
600 1,000 ns
V
RST
Power-Up Reset Voltage
3.8 4.5 V
ATF16V8B
6
Electronic Signature Word
There are 64 bits of programmable memory that are always available to the user, even if the device is secured. These bits can be used for user-specific data.
Programming/Erasing
Programming/erasing is performed using standard PLD programmers. See
CMOS PLD Programming Hardware
and Software Suppor
t for information on software/program-
ming.
Input and I/O Pull-Ups
All ATF16V8B family members have internal input and I/O pull-up resistors. Therefore, whenever inputs or I/Os are not being driven externally, they will float to V
CC
. This ensures that all logi c array inputs are at kn own states. These are relatively weak active pull-ups that can easily be overdriven by TTL-compatible driver s (see input and I/O diagrams below).
Input Diagram I/O Diagram
Functional Logic Diagram Description
The Logic Option and Fu nctional Diagrams des cribe the ATF16V8B architec ture. Eig ht configur able ma crocell s can be configured as a registered output, combinatorial I/O, combinatorial output, or dedicated input.
The ATF16V8B can b e conf igured in one o f three dif feren t modes. Each mode makes the ATF16V8B look like a differ­ent device. Most PLD compilers can choose the right mode automatically. The user can also force the selection by supplying the compiler with a mode selection. The deter­mining factors would be the usage of register versus com­binatorial ou tputs and dedic ated output s versus outpu ts with output enable control.
The ATF16V8B universal architectur e can be pro grammed to emulate many 20-pin PAL devi ces. The se architectu ral
subsets can be found in eac h of the con figuratio n modes described in the foll owing pages. The user can downl oad the listed sub set device JEDEC progr amming fil e to the PLD programmer, and the ATF16V8 B c an be c onfigu re d to act like the chosen device. Check with your programmer manufacturer for this capability.
Unused product terms a re automatic ally disabled by the compiler to decrease power consumption. A Security Fuse, when programmed, protects the cont ent of the ATF16V8B . Eight bytes (64 fuses) of User Signature are accessible to the user for purposes such as storing project name, part number, revision, or date. The User Signature is accessible regardless of the state of the Security Fuse.
Note: 1. Only applicable for version 3.4 or lower.
Compiler Mode Selection
Registered Complex Simple Auto Select
ABEL, Atmel-ABEL
P16V8R P16V8C P16V8AS P16V8
CUPL
G16V8MS G16V8MA G16V8AS G16V8
LOG/iC
GAL16V8_R
(1)
GAL16V8_C7
(1)
GAL16V8_C8
(1)
GAL16V8
OrCAD-PLD
“Registered” “Com pl ex” “Simple” GAL16V8A
PLDesigner
P16V8R P16V8C P16V8C P16V8A
Tango-PLD
G16V8R G16V8C G16V8AS G16V8
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