ATMEL ATF1502ASL-20QC44, ATF1502ASL-20JI44, ATF1502ASL-20JC44, ATF1502ASL-20AI44, ATF1502ASL-20AC44 Datasheet

Features

•

High Density, High Performance Electrically Erasable Complex Programmable Logic
Device

– 32 Macrocells
– 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell
– 44 pin
– 7.5 ns Maximum Pin-to-Pin Delay
– Registered Operation Up To 125 MHz
– Enhanced Routing Resources

•

In-System Programmabi lity (ISP) via JTAG

•

Flexible Logic Macrocell

– D/T/Latch Configurable Flip Flops
– Global and Individual Register Control Signals
– Global and Individual Output Enable
– Programmable Output Slew Rate
– Programmable Output Open Collector Option
– Maximum Logic utilization by burying a register with a COM output

•

Advanced Power Management Features

– Automatic 3 mA Stand-By for “L” Version
– Pin-Controlled 4 mA Stand-By Mode (Typical)
– Programmable Pin-Keeper Inputs and I/Os
– Reduced-Power Feature Per Macrocell

•

Available in Commercial and Industrial Temperature Ranges

•

Available in 44-pin PLCC; TQFP; and PQFP

•

Advanced EEPROM Technology

– 100% Tested
– Completely Reprogr ammable
– 100 Program/Erase Cyc le s
– 20 Year Data Retention
– 2000V ESD Protection
– 200 mA Latch-Up Immunity

•

JTAG Boundary-Scan Testing to IEEE Std. 1149.1-1990 and 1149.1a-1993 Supported

•

PCI-compliant

•

3.3 or 5.0V I/O pins

•

Security Fuse Feature

High
Performance
E2PROM CPLD

ATF1502AS
Preliminary

Enhanced Features

•

Improved Connectivity (Additional Feedback Routing, Alternate Input Routing)

•

Output Enable Product Terms

•

D - Latch Mode

•

Combinatorial Output with Registered Feedback within any Macrocell

•

Three Global Clock Pins

•

ITD (Input Transition Detection) Circuits on Global Clocks, Inputs and I/O

•

Fast Registered Input from Product Term

•

Programmable “Pin-Keeper” Option

•

VCC Power-Up Reset Option

•

Pull-Up Option on JTAG Pins TMS and TDI

•

Advanced Power Management Features

– Edge Controlled Power Down “L”
– Individual Macrocell Power Option
– Disable ITD on Global Clocks, Inputs and I/O

Rev. 0995A–04/98

1

44-Lead TQFP/PQFP

Top View

I/O

I/O

I/O/PD1

VCC/PD2

I/OE2/GCK2

GCLR/I

I/OE1

GCK1/I

GND

GCK3

I/O

4443424140393837363534

33

I/O

I/O

32

I/O/TDO

31

I/O

30

I/O

29

VCC

28

I/O

27

I/O

26

I/O/TCK

25

I/O

24

GND

23

I/O

I/O/TDI

I/O
I/O

GND

PD1/I/O

I/O

TMS/I/O

I/O

VCC

I/O
I/O

1
2
3
4
5
6
7
8
9
10
11

1213141516171819202122

I/O

I/O

I/O

I/O

VCC

GND

I/O

I/O

I/O

I/O

Description

The ATF1502AS is a high pe rforman ce, hig h densi ty Com­plex Programmable Logic Device (CPLD) which utilizes
Atmel’s proven electric ally erasable techn ology. With 32
logic macrocell s and up to 36 inputs, it ea sily integra tes
logic from several TTL, SSI,MSI, LSI and classic PLDs.
The ATF1502AS’s enhanced routing switch matrices
increase usable gate count, and the odds of successful pin­locked design modifications.

44-Lead PLCC

Top View

I/O

I/O

I/O/PD1

VCC/PD2

GCK2/OE2/I

GCLR/I

OE1/I

GCK1/I

GND

I/O/GCLK3

I/O

TDI/I/O

I/O
I/O

GND

PD1/I/O

I/O

I/O/TMS

I/O

VCC

I/O
I/O

65432

7
8
9
10
11
12
13
14
15
16
17

1819202122232425262728

I/O

I/O

I/O

I/O

GND

1

VCC

4443424140

I/O

I/O

I/O

PD2/I/O

39
38
37
36
35
34
33
32
31
30
29

I/O

I/O
I/O/TDO
I/O
I/O
VCC
I/O
I/O
I/O/TCK
I/O
GND
I/O

The ATF1502AS has up to 32 bi-directional I/O pins and 4
dedicated input pins, depending on the type of device pack­age selected. Each dedicated pin can also serve as a glo­bal control signal; reg ister clock, r egister reset or outp ut
enable. Each of these con trol sig nals can be select ed for
use individually within each macrocell.

Block Diagram

32

Each of the 32 macrocells generates a buried feedback,
which goes to the gl obal bus . Each in put and I/O pin also

B

feeds into the global bus. The switch matrix in each logic
block then selects 40 individual signals from the global bus.

2

ATF1502AS

ATF1502AS

Each macrocell also generates a foldback logic term, which
goes to a regional bus. Cas cade logi c betwe en macroc ells
in the ATF1502AS allows fast, effi cient ge nerati on of com­plex logic functions. The ATF1502AS contains four such
logic chains, each capable of creating sum term logic with a
fan in of up to 40 product terms.

The ATF1502AS macrocell shown in Figure 1, is flexible
enough to suppor t h igh ly co m ple x lo gi c func ti ons o per at ing
at high speed. The ma crocell consists of five sections :
product terms and product term select multiplexer;
OR/XOR/CASCADE logic; a flip-flop; output sel ect and
enable; and logic array inputs.

Unused product terms are automatic ally disabled by the
compiler to decrease power consumption. A Security Fuse,

Figure 1.

ATF1502AS Macrocell

when programmed, protects the contents of the
ATF1502AS. Two bytes (16-bits) of User Signature are
accessible to the user for purposes such as storing project
name, part number, revision or date . Th e Use r Sig natu re is
accessible regardless of the state of the Security Fuse.

The ATF1502AS device is an In-System Programmable
(ISP) device. It us es the industry stan dard 4-pin JTAG
interface (IEEE Std. 1149.1), and is fully compliant with
JTAG’s Boundary Scan Description Language (BSDL). ISP
allows the device to b e programmed with out removing it
from the printed circuit board. In addition to simplifying the
manufacturing flow, ISP also allows design modifications to
be made in the field via software.

Product Terms and Select MUX

Each ATF1502AS macrocell has five product terms. Each
product term recei v es as its i nputs all signals fr om both the
global bus and regional bus.

The product term selec t multi plex er (PTMU X) allo cates the
five product terms as needed to the macrocel l logic g ates
and control signals. The PTMUX programming is deter­mined by the design compiler, wh ich sel ects the opti mum
macrocell configuration.

OR/XOR/CASCADE Logic

The ATF1502AS’s logic structure is designed to efficiently
support all types of logic. Within a single macrocell, all the
product terms can be routed to the OR gate, creating a 5­input AND/OR sum term. With the addition of the CASIN
from neighboring macrocells, this can be expanded to as

many as 40 product terms with a very small additional
delay.

The macrocell’s XOR gate allows efficient implementation
of compare and arithmeti c function s. One inpu t to the XOR
comes from the OR sum term. The other XOR input can be
a product term or a fixed high or low level. For combinato­rial outputs, the fixe d level in put allows pol arity sele ction.
For registered func tions, the fi xed levels al low DeMorgan
minimization of product terms. The XOR gate is also used
to emulate T- and JK-type flip-flops.

Flip Flop

The ATF1502AS’s flip flop has very flexible data and con­trol functions. The data input can come from either the XOR
gate, from a separate product term or directly from the I/O
pin. Selectin g the se parat e produc t term allows c reatio n of
a buried registered feedback within a combinatorial output

3

macrocell. (This feature is automatically implemented by
the fitter softwa re). In add ition to D, T , JK and SR op era­tion, the flip flop can also be configured as a flow-through
latch. In this mode, data passes through when the clock is
high and is latched when the clock is low.

The clock itself c an eit her be on e o f the Glo bal CLK Sig nal
GCK[0 : 2] or an indi vidual product term . The flip flop
changes state on the clock’s rising edge. When the GCK
signal is used as the clock, one of the macrocell product
terms can be selecte d as a clock e nable . When t he cloc k
enable function is active and the enable signal (product
term) is low, all clock edges are ignored. The flip flop’s
asynchronous reset signal (AR) can be either the Global
Clear (GCLEAR), a product term, or always off. AR can
also be a logic OR of GCLEAR with a prod uct term. The
asynchronous pres et ( AP ) can be a pr odu ct te rm or al ways
off.

Output Select and Enable

The ATF1502AS ma crocel l outpu t can be s electe d as reg­istered or combinatorial. The buried feedback signal can be
either combinatorial or registered signal regardless of
whether the output is combinatorial or registered.

The output enable multiplexer (MOE) controls the output
enable signals . Any buffer ca n be per manen tly en abled for
simple output operation. Buffers can also be permanently
disabled to allow use of the pin as an inp ut. In this config u­ration all the ma croce ll r eso urces ar e st ill avai labl e, i nclud­ing the buried feedback, exp ander and CASCADE log ic.
The output enabl e for each macroce ll can be se lected as
either of the two dedicated OE input pins as an I/O pin con­figured as an input, or as an individual product term.

Global Bus/Switch Matrix

The global bus contains all input and I/O pin signals as well
as the buried feedback si gnal from a ll 32 macroc ells. The
Switch Matrix in each Logic Block receives as its inputs all
signals from the global bus. Unde r software control, up to
40 of these signals can be selected as inputs to the Logic
Block.

Foldback Bus

Each macrocell a lso genera tes a foldback product term .
This signal goes to the regional bus and is available to 4
macrocells. The foldback is an inverse polarity of one of the
macrocell’s product terms. The 4 foldback terms in each
region allows generation of high fan-in sum terms (up to 9
product terms) with a small additional delay.

Programmable Pin-Keeper Option for
Inputs and I/Os

The ATF1502AS offers the op tion o f pro grammin g a ll inpu t
and I/O pins so that pin keep er circuits can be utilized .
When any pin is driven high or low and then subsequently
left floating, it will stay at that previous high or low level .

This circuitry prev ents unused input and I/O lines from
floating to i nterme diate v olt age l eve ls, which cau se u nnec ­essary power consumption and system noise. The keeper
circuits eliminate the need for external pull-up resistors and
eliminate their DC power consumption.

Input Diagram

I/O Diagram

Speed/Power Management

The ATF1502AS has several built-in speed and power
management features. The ATF1502AS contains circuitry
that automatically puts the device into a low power stand­by mode when no logic trans itions are oc curring. This not
only reduces power consumption during inactive periods,
but also prov ides a p roportion al power savings for most
applications runni ng at system sp eed s below 50 MHz. This
feature may be selected as a design option.

To further reduce power, each ATF1502AS macrocell has
a Reduced Power bit feat ur e. Th is fe atur e allows i ndiv idu al
macrocells to be c onfigur ed for maxi mum pow er sav ings.
This feature may be selected as a design option.

The ATF1502ASs also has an op tional po wer down mo de.
In this mode, current d rops to below 10 m A. When t he
power down option is selected, either PD1 or PD2 pins (or
both) can be used to power down the part. The power down

4

ATF1502AS

ATF1502AS

option is selecte d in the de sign sour ce file . When ena bled,
the device goes into power down when either PD1 or PD2
is high. In the power down mo de, all internal logic signa ls
are latched and held, as are any enabled outputs.

All pin transitions are ignored until the PD pin is brought
low. When the power down feature is enabled, the PD1 or
PD2 pin cannot be used as a logic input or output. How­ever, the pin’s macr ocell m ay st ill be used to gen erate bur ­ied foldback and cascade logic signals.

All Power-Down AC Ch aracteristic parameters are com­puted from external input or I/O pins, with Reduced Power
Bit turned on. For mac rocells in reduced- power mode
(Reduced power bit turned on), the reduced power adder,
tRPA, must be added to the AC param eters, whic h include
the data paths t

LAD

LAC

, tIC, t

ACL

, t

ACH

and t

SEXP

.

, t

The ATF1502AS macrocell also has an option whereby the
power can be reduced on a per macrocell basis. By
enabling this power down option, macrocells that are not
used in an application can be turned down thereby reduc­ing the overall power consumption of the device.

Each output also ha s i ndi vi dua l s lew r ate co n trol. This may
be used to reduce system noise by slowing down outputs
that do not need to operate at maximum speed. Outputs
default to slow switching , and may be speci fied as fast
switching in the design file.

Design Software Support

ATF1502AS des igns are su pported by s everal thi rd party
tools. Automated fitters allow logic synthesis using a variety
of high level description languages and formats.

Power Up Reset

The ATF1502AS has a power-up reset option at two differ­ent voltage trip levels when the device is being powered
down. Within the fitter, or during a conversion, if the
“power-reset” option is turned “on” (which is the default
option), the trip levels during power up or power down is at

2.8V. The user can change this default option from “on” to
“off” (within the fitter or specify it as a switch during conver­sion). When th is is done, the volt age trip level duri ng
power-down changes from 2.8V to 0.7V. This is to ensure a
robust operating environment.

The registers in the A TF1502AS are designed to r es et dur­ing power up. At a point delayed slightl y from V
Vrst, all registers will be reset to the low state. The output
state will depend on the polarity of the buffer.

This feature is critical for state machine initialization. How­ever, due to the asynchronous nature of reset and the
uncertainty of how V

actually rises in the sy stem, the fol -

CC

lowing conditions are required:

crossing

CC

1. The V

rise must be monotonic,

CC

2. After reset occurs, all input and feedback setup
times must be met before driving the clock pin­high, and,

3. The clock must remain stable during T

.

D

Security Fuse Usage

A single fuse is provided to preven t unauthorized copy ing
of the ATF1502AS fuse patterns. Once programmed, fuse
verify is inhibited. However, the 16-bit User Signature
remains accessible.

Programming

ATF1502AS devices are In-System Programmable (ISP)
devices utilizing the 4-pin JTAG protocol. This capability
eliminates package handling normally r equir ed fo r p ro gra m
and facilitates rapid design iterations and field changes.

Atmel provides ISP hardware and so ftware to allow pro­gramming of the ATF1502AS v ia the PC. ISP is perfo rmed
by using either a downlo ad cab le, or a compar able b oard
tester or a simple microprocessor interface.

When using the ISP hardware or S/W to program the
ATF1502AS devices, fo ur I/0 pi ns mus t b e res er ved for the
JTAG interface. However, the logic features the macrocells
associated with these I/0 pins are still available to the
design for burned logic functions.

To facilitate ISP program ming by the Automated Test
Equipment (ATE) vendors. Serial Vector Format (SV F) file s
can be created by Atmel provided Software utilities.

ATF1502AS devices can also be programmed using stan­dard 3rd party programmers. With 3rd party programmer
the JTAG ISP port can be disabled thereby allowing 4 addi­tional I/O pins to be used for logic.

Contact your local Atmel representatives or Atmel PLD
applications for details.

ISP Programming Protection

The ATF1502AS has a special feature which locks the
device and pr events the in puts a nd I/O from drivin g if t he
programming process is interrupted due to any reason. The
inputs and I/O default to high-Z state during such a c ondi­tion. In addition, th e pin keeper option pr eserve s the previ­ous state of the input and I/0 PMS during programming.

All ATF1502AS devices are initially shipped in the erased
state thereby making them ready to use for ISP.

Note: For more information refer to the “Designing for In-Sys-

tem Programmability with Atmel CPLDs” application
note.

5

JTAG-BST/ISP Overview

The JTAG boundary-scan testing is controlled by the Test
Access Port (TAP) controller in the ATF1502AS. The
boundary-scan technique invol ves the inc lusion of a sh ift­register stage (con tained in a bound ary-s can c ell) adj acen t
to each component so that signals at component bound­aries can be controlled a nd observed u sing scan test ing
methods. Each input pin and I/O pin has its own boundary
scan cell (BSC) to s upport boundar y scan testing. Th e
ATF1502AS does not include a Test Reset (TRST) input
pin because the TAP controller is automatically reset at
power up. The five JTAG modes supported include: SAM­PLE/PRELOAD, EXTEST, BYPASS, IDCODE and HIGHZ.
The ATF1502AS’s ISP can be fully described using JTAG’s
BSDL as described in IE EE S tandar d 114 9.1b. Th is a llows
ATF1502AS progr amming to be descri bed and imple­mented using any on e of the 3 rd par ty developm ent tools
supporting this standard.

The ATF1502AS has the opti on of using fou r JTAG-s tan­dard I/O pins for boundary s can testing (BST) and in -sys­tem programming (ISP) purposes. The ATF1502AS is
programmable through the four JTAG pins using the IEEE
standard JTAG programmi ng protocol establ ished by IEEE
Standard 1149.1 using 5V TTL-level programming signals
from the ISP interface fo r in-system programming. T he
JTAG feature is a progr ammable opt ion. If JTAG (BS T or
ISP) is not needed, then the four JTAG control pins are
available as I/O pins.

BSC Configuration for Input and I/O
Pins (except JTAG TAP Pins)

Note: The ATF1502AS has pull-up option on TMS and TDI

pins. This feature is selected as a design option.

DC and AC Operating Conditions

Commercial Industrial

Operating Temperature (Case) 0°C - 70°C-40°C - 85°C
V

or V

CCINT

Supply

(3.3V) Power Supply 3.0V - 3.6V 3.0V - 3.6V

V

CCIO

(5V) Power

CCIO

5V ± 5% 5V ± 10%

JTAG Boundary Scan Cell (BSC)
Testing

The ATF1502AS contains up to 32 I/O pins and 4 input
pins, depe nding on th e an d pac kage type sele cted. Each
input pin and I/O pin has its ow n bound ary scan cell (BSC)
in order to sup port bou ndary scan t esting a s desc ribed in
detail by IEEE Standard 1149.1. Typical BSC consists of
three capture register s or scan regis ters and up to two
update registers. There are two types of BSCs, one for
input or I/O pin, and on e for the macroce lls. The BSCs in
the device are chaine d togeth er thro ugh the captur e regis ­ters. Input to the capture register chain is fed in from the
TDI pin while the output is directed to the TDO pin. Capture
registers are used to capture active device data signals, to
shift data in and out of the de vice an d to load data into the
update regist ers. Contr ol signals are gener ated inte rnally
by the JTAG TAP con troller . The B SC config urati on for the
input and I/O pins and macrocells are shown below.

6

ATF1502AS