ATMEL AT93C86A User Manual

BDTIC www.bdtic.com/ATMEL

1. Features

• Medium-voltage and Standard-voltage Operation

– 2.7 (V

• Automotive Temperature Range –40°C to +125°C

• User Selectable Internal Organization

– 16K: 2048 x 8 or 1024 x 16

• 3-wire Serial Interface

• Sequential Read Operation

• Schmitt Trigger, Filtered Inputs for Noise Suppression

• 2 MHz Clock Rate (5V) Compatibility

• Self-timed Write Cycle (10 ms max)

• High Reliability

– Endurance: 1 Million Write Cycles
– Data Retention: 100 Years

• Lead-Free/Halogen-Free Devices Available

• 8-lead JEDEC SOIC and 8-lead TSSOP Packages

2. Description

The AT93C86A provides 16384 bits of serial electrically erasable programmable read
only memory (EEPROM), organized as 1024 words of 16 bits each when the ORG pin
is connected to V
device is optimized for use in many automotive applications where low-power and
low-voltage operations are essential. The AT93C86A is available in space saving 8­lead JEDEC SOIC and 8-lead TSSOP packages.

Table 2-1. Pin Configuration

Pin Name Function

= 2.7V to 5.5V)

CC

and 2048 words of 8 bits each when it is tied to ground. The

CC

8-lead SOIC

Three-wire
Automotive
Temperature
Serial
EEPROM

16K (2048 x 8 or 1024 x 16)

AT93C86A

CS Chip Select

SK Serial Data Clock

DI Serial Data Input

DO Serial Data Output

GND Ground

VCC Power Supply

ORG Internal Organization

DC Don’t Connect

The AT93C86A is enabled through the Chip Select pin (CS), and accessed via a
three-wire serial interface consisting of Data Input (DI), Data Output (DO), and Shift
Clock (SK). Upon receiving a Read instruction at DI, the address is decoded and the
data is clocked out serially on the data output pin DO. The write cycle is completely
self-timed and no separate erase cycle is required before Write. The write cycle is only
enabled when the part is in the Erase/Write Enable state. When CS is brought “high”
following the initiation of a write cycle, the DO pin outputs the Ready/Busy status of
the part. The AT93C86A is available in a 2.7V to 5.5V version.

CS
SK

DI

DO

CS
SK

DI

DO

1
2
3
4

8-lead TSSOP

1
2
3
4

VCC

8

DC

7

ORG

6

GND

5

8

VCC

7

DC

6

ORG

5

GND

Rev. 5096E–SEEPR–1/08

Absolute Maximum Ratings*

O

Operating Temperature..................................–55°C to +125°C

Storage Temperature .....................................–65°C to +150°C

Voltage on any Pin

with Respect to Ground ....................................–1.0V to +7.0V

Maximum Operating Voltage .......................................... 6.25V

DC Output Current........................................................ 5.0 mA

Figure 2-1. Block Diagram

Vcc GND

MEMORY ARRAY

RG

2048 x 8

1024 x 16

OR

*NOTICE: Stresses beyond those listed under “Absolute

Maximum Ratings” may cause permanent dam­age to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.

ADDRESS
DECODER

DATA

REGISTER

DI

CS

SK

MODE

DECODE

LOGIC

CLOCK

GENERATOR

OUTPUT
BUFFER

DO

Note: When the ORG pin is connected to Vcc, the x 16 organization is selected. When it is connected to ground, the x 8 organization

is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the internal 1
Meg ohm pullup, then the x 16 organization is selected.

Table 2-2. Pin Capacitance

(1)

Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted)

Symbol Test Conditions Max Units Conditions

C

OUT

C

IN

Note: 1. This parameter is characterized and is not 100% tested.

Output Capacitance (DO) 5 pF V

OUT

= 0V

Input Capacitance (CS, SK, DI) 5 pF VIN = 0V

2

AT93C86A

5096E–SEEPR–1/08

AT93C86A

Table 2-3. DC Characteristics

Applicable over recommended operating range from: T
noted)

Symbol Parameter Test Condition Min Typ Max Unit

= –40°C to +125°C, VCC = +2.7V to +5.5V (unless otherwise

A

V

CC1

V

CC2

Supply Voltage 2.7 5.5 V

Supply Voltage 4.5 5.5 V

READ at 1.0 MHz 0.5 2.0 mA

I

I

I

I

I

V
V

V
V

CC

SB1

SB2

IL

OL

IL1

IH1

OL1

OH1

(1)

(1)

Supply Current VCC = 5.0V

WRITE at 1.0 MHz 0.5 2.0 mA

Standby Current VCC = 2.7V CS = 0V 6.0 10.0 µA

Standby Current VCC = 5.0V CS = 0V 10.0 15.0 µA

Input Leakage VIN = 0V to VCC 0.1 3.0 µA

Output Leakage VIN = 0V to VCC 0.1 3.0 µA

Input Low Voltage
Input High Voltage

Output Low Voltage
Output High Voltage

2.7V ≤ VCC ≤ 5.5V

2.7V ≤ V

≤ 5.5V

CC

I

= 2.1 mA 0.4 V

OL

I

= –0.4 mA 2.4 V

OH

−−−−0.6 0.8 V

2.0 V

+ 1 V

CC

Note: 1. VIL min and VIH max are reference only and are not tested.

Table 2-4. AC Characteristics
Applicable over recommended operating range from T

= –40°C to +125°C, VCC = As Specified,

A

CL = 1 TTL Gate and 100 pF (unless otherwise noted)

Symbol Parameter Test Condition Min Typ Max Units

f

t

t

t

t

t

t

t

t

t

SK

SKH

SKL

CS

CSS

DIS

CSH

DIH

PD1

PD0

SK Clock
Frequency

SK High Time

SK Low Time

Minimum CS
Low Time

CS Setup Time Relative to SK

DI Setup Time Relative to SK

CS Hold Time Relative to SK 0 ns

DI Hold Time Relative to SK

Output Delay to ‘1’ AC Test

Output Delay to ‘0’ AC Test

4.5V ≤ VCC ≤ 5.5V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

4.5V ≤ VCC ≤ 5.5V

2.7V ≤ V

≤ 5.5V

CC

4.5V ≤ V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

4.5V ≤ V

2.7V ≤ V

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

0
0

250
250

250
250

250
250

50
50

100
100

100
100

2
1

250
500

250
500

MHz

ns

ns

ns

ns

ns

ns

ns

ns

5096E–SEEPR–1/08

3

Table 2-4. AC Characteristics (Continued)

Applicable over recommended operating range from T

= –40°C to +125°C, VCC = As Specified,

A

CL = 1 TTL Gate and 100 pF (unless otherwise noted)

Symbol Parameter Test Condition Min Typ Max Units

t

SV

t

DF

t

WP

Endurance

(1)

CS to Status Valid AC Test

CS to DO in High
Impedance

Write Cycle Time

5.0V, 25°C 1M Write Cycles

AC Test
CS = V

IL

4.5V ≤ V

2.7V ≤ V

4.5V ≤ VCC ≤ 5.5V

2.7V ≤ V

2.7V ≤ V

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V

CC

≤ 5.5V 0.1 4 10 ms

CC

250
250

100
150

Note: 1. This parameter is characterized and is not 100% tested.

Table 2-5. Instruction Set for the AT93C86A

Address Data

Instruction SB Op Code

Commentsx 8 x 16 x 8 x 16

ns

ns

READ 1 10 A

10

– A

0

A9 – A

0

Reads data stored in memory,
at specified address.

EWEN 1 00 11XXXXXXXXX 11XXXXXXXX Write enable must precede all

programming modes.

ERASE 1 11 A

WRITE 1 01 A

10

10

– A

– A

0

0

A9 – A

A9 – A

0

0

D7 – D0D

15

Erases memory location An – A0.

– D0Writes memory location An – A0.

ERAL 1 00 10XXXXXXXXX 10XXXXXXXX Erases all memory locations.

WRAL 1 00 01XXXXXXXXX 01XXXXXXXX D

– D0D

7

Valid only at V

– D0Writes all memory locations.

15

Val id w h e n V

= 4.5V to 5.5V.

CC

= 4.5V to 5.5V and

CC

Disable Register cleared.

EWDS 1 00 00XXXXXXXXX 00XXXXXXXX Disables all programming

instructions.

4

AT93C86A

5096E–SEEPR–1/08