BDTIC www.bdtic.com/Semiconductor
AT93C56A/66A
(AT3552m/2k)
SPI EEPROM
Product Qualification
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2325 Orchard Parkway • San Jose CA 95131 •
The AT93C56A/66A Serial EEPROM is fabricated on the AT35000 CMOS process.
With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs
Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT93C56A/66A Serial EEPROM. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT93C56A/66A.
Package specific qualification data is provided separately.
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2325 Orchard Parkway • San Jose CA 95131 •
AT3552m/2k Product Qualification
ESD Characterization
Device: AT93C56A/66A
Lot Number: Lot#c3e5480/3e5480
Quantity Tested: 3/ lot per Voltage
Test Temperature: 25C
ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Model
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations
AT93C56A
c3e5480
HBM
Name
Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 2000
Hold Suspend Input Input 3/0 3/0 3/0 3/3 3/0 2000
SCK Serial Clock Input 3/0 3/0 3/0 3/3 3/0 2000
Failing Pin Not Identified
AT93C66A
3e5480
HBM
Name
Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 2000
Hold Suspend Input Input 3/0 3/0 3/0 3/3 3/0 2000
SCK Serial Clock Input 3/0 3/0 3/0 3/3 3/0 2000
Failing Pin Not Identified
3 Positive & 3 Negative Pulses per The Specified Pin
Pin
Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 2000
CS Chip Select Input 3/0 3/0 3/0 3/3 3/0 2000
SI Serial Data IN Input 3/0 3/0 3/0 3/3 3/0 2000
WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 2000
SO Serial Data OUT Output 3/0 3/0 3/0 3/3 3/0 2000
Functional Test Only
Pin
Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 2000
CS Chip Select Input 3/0 3/0 3/0 3/3 3/0 2000
SI Serial Data IN Input 3/0 3/0 3/0 3/3 3/0 2000
WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 2000
SO Serial Data OUT Output 3/0 3/0 3/0 3/3 3/0 2000
Functional Test Only
Function Tested As
3 Positive & 3 Negative Pulses per The Specified Pin
Function Tested As
Combinations
Max Passing
Voltage
Qty/Fail
500V
See Above 3/0 3/0 3/0 3/3 3/0 2000
Max Passing
Qty/Fail
500V
See Above 3/0 3/0 3/0 3/3 3/0 2000
Qty/Fail
1000V
Qty/Fail
1000V
Qty/Fail
2000V
Combinations
Qty/Fail
2000V
Qty/Fail
4000V
Qty/Fail
4000V
Qty/Fail Voltage
Voltage
Qty/Fail Voltage
•
2325 Orchard Parkway • San Jose CA 95131 •
AT3552M/2K Product Qualification
Latch-Up Characterization
Device: AT93C56A/66A
Lot Number: Lot#c3e5480/3e5480
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
AT93C56AAT93C66A-
Name
Vcc Power Vcc --- --- --- --- 7.0 250
Gnd Ground Gnd --- --- --- --- --- ---
Hold Suspend Input Input 200 200 7.0 --- --- ---
WP Write Protect Input 200 200 7.0 --- --- ---
SCK Serial Clock Input 200 200 7.0 --- --- ---
* 0 Fails for Latchup or Post Stress Functional Tests.
c3e5480
3e5480
Pin
CS Chip Select Input 200 200 7.0 --- --- ---
SI Serial Data IN Input 200 200 7.0 --- --- ---
SO Serial Data OUT Output 200 200 7.0 --- --- ---
Function
Tested As
Max Trigger Current Max Trigger Voltage
Passing*
-I (mA)
Passing*
+I (mA)
Compliance
Setting (V)
Passing*
-V (V)
Passing*
+V (V)
Compliance
Setting (mA)
Write Endurance Characterization
Device: AT93C56A/66A
Lot Number: Lot# 3g0848
Quantity Tested: 100
Test Temperature: 25C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 1.000,000
Cycles To First Failure: NA
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2325 Orchard Parkway • San Jose CA 95131 •
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