Single Supply for Read and Write: 2.7V to 3.6 (BV), 3.0 to 3.6V (LV)
•
Fast Read Access Time - 70 ns
•
Internal Program Control and Timer
•
Sector Architecture
– One 16K Byte Boot Block with Programming Lockout
– Two 8K Byte Parameter Blocks
– Two Main Memory Blocks (32K, 64K) Bytes
•
Fast Erase Cycle Time - 10 seconds
•
Byte By Byte Programming - 30
•
Hardware Data Protection
•
DAT A Polling For End Of Program Detection
•
Low Power Dissipation
µµµµ
s/Byte Typical
– 25 mA Active Current
µµµµ
–50
A CMOS Standby Current
•
Typical 10,000 Write Cycles
Description
The AT49BV/LV001(N)(T) is a 3-volt-only in-system reprogrammable Flash Memory.
Its 1 megabit of memor y is orga nized as 13 1,072 wor ds by 8 bits . Manufact ured wit h
Atmel’s advanced nonvolatile CMOS technology, the device offers access times to 70
ns with power di ssipation of just 90 mW over the commer cial tempe rature ra nge.
When the device is deselected, the CMOS standby current is less than 50 µA. For the
AT49BV/LV001N T pin 1 for the DI P and PLCC pa ckages
and pin 9 for the TSOP package are don’t connect pins.
To allow for simple in-system reprogrammability, the
AT49BV/LV001(N)(T) does not require high input voltages
for programming. Three-volt-only commands determine the
read and programming operation of the devic e. Reading
data out of the device is similar to reading from an EPROM;
it has standard CE
, OE, and WE inputs to av oid bus contention. Reprogramming the AT49BV/LV001(N)(T) is performed by erasing a block of data and then programming
on a byte by byte basis. The byte programming time is a
fast 50 µs. The end of a program cycle can be optionally
detected by the DATA
polling feature. Once the end of a
byte program cycle h as be en dete cted, a new a ccess for a
read or program can begin. The typi cal num ber of progr am
and erase cycles is in excess of 10,000 cycles.
Block Diagram
DATA INPUTS/OUTPUTS
V
CC
GND
OE
WE
CE
RESET
ADDRESS
INPUTS
CONTROL
LOGIC
Y DECODER
X DECODER
The device is erased by execu ting the erase command
sequence; the device internally controls the erase operations. There are two 8K byte parameter block sect ions and
two main memory blocks.
The device has the capability to protect the data in the boot
block; this feature is enabled by a command sequence.
The 16K byte boot block se ct ion inc lu des a repro gr am min g
lock out feature to pr ov ide data in tegr i ty. Th e bo ot s ec tor is
designed to contai n user secu re code, and whe n the feature is enabled, the boot sector is protected from being
reprogrammed.
In the AT49BV/LV0 01N(T), once th e boot block programming lockout feature is enabled, the contents of the boot
block are perm anent and cannot be ch anged. In the
AT49BV/LV001(T), once the boot block programming lockout feature is enabled, the contents of the boot block cannot be changed with input voltage levels of 5.5 volts or less.
AT49BV/LV001(N)
I/O7 - I/O0
8
INPUT/OUTPUT
BUFFERS
PROGRAM
DATA LATCHES
Y-GATING
MAIN MEMORY
BLOCK 2
(64K BYTES)
MAIN MEMORY
BLOCK 1
(32K BYTES)
PARAMETER
BLOCK 2
(8K BYTES)
PARAMETER
BLOCK 1
(8K BYTES)
BOOT BLOCK
(16K BYTES)
1FFFF
10000
0FFFF
08000
07FFF
06000
05FFF
04000
03FFF
00000
AT49BV/LV001(N)T
DATA INPUTS/OUTPUTS
I/O7 - I/O0
8
INPUT/OUTPUT
BUFFERS
PROGRAM
DATA LATCHES
Y-GATING
BOOT BLOCK
(16K BYTES)
PARAMETER
BLOCK 1
(8K BYTES)
PARAMETER
BLOCK 2
(8K BYTES)
MAIN MEMORY
BLOCK 1
(32K BYTES)
MAIN MEMORY
BLOCK 2
(64K BYTES)
1FFFF
1C000
1BFFF
1A000
19FFF
18000
17FFF
10000
0FFFF
00000
2
AT49BV/LV001(N)(T)
Device Operation
READ:
EPROM. When CE
data stored at the memory location determined by the
address pins is asserted on the outputs. The outputs are
put in the high impedance state whenever CE
high. This dual-line con tr ol gi v es d esign er s fl ex ibi lit y in pr eventing bus contention.
COMMAND SEQUENCES:
ered on it will be reset to the read or standby mode
depending upon the state of the control line inputs. In order
to perform other device functions, a series of command
sequences are entered into the device. The command
sequences are shown in the Command Definitions table.
The command sequences are written by applying a low
pulse on the WE
tively) and OE
edge of CE
latched by the first rising edge of CE
microprocessor write timings are used. The address locations used in the command sequences are not affected by
entering the command sequences.
RESET:
tem application s. When RE SET
device is in its standa rd oper at ing mod e. A low l ev el on the
RESET
the outputs of the device in a high impedance state. If the
RESET
or erase operation, the operation may not be successfully
completed and the op eration wi ll have to be repeated af ter
a high level is applied to the RESET
is reasserted on the RESET
read or standby mode, depending upon the state of the
control inputs. By ap plying a 12 V ± 0 .5V in put si gnal t o th e
RESET
even if the boot block lock out feature has be en enabled
(see Boot Bl ock Prog rammi ng Locko ut Ov erride s ection ).
The RESET feature is not available on the
AT49BV/LV001N(T).
ERASURE:
memory block or parameter block which contains the byte
must be erased. The erased state of th e memory bits is a
logical “1”. The entir e device c an be erased at one time by
using a 6 byte software code. The software chip erase
code consists of 6 byte load commands to specific address
locations with a specific data pattern (please refer to the
Chip Erase Cycle Waveforms).
After the software c hi p e rase h as b een i niti ate d, the d evi c e
will internally time the er ase operation so that no e xternal
clocks are required. The maximum time needed to erase
the whole chip is t
been enabled, the data in the boot sector will not be
erased.
The AT49BV/LV 001(N)(T) is ac cessed like a n
and OE are low and WE is high, th e
or OE is
When the device is firs t pow-
or CE input with CE or WE low (respec-
high. The address is latched on the falling
or WE, whichever occurs last. The data is
or WE. Standard
A RESET
input halts the prese nt device oper ation and puts
pin makes a high to low transition during a program
pin, the boot block array can be reprogrammed
Before a byte can be reprogram med, the main
input pin is provided to ease some sys-
is at a logic high level, the
pin. When a high level
pin, the device returns to the
. If the boot block lockout feature has
EC
AT49BV/LV001(N)(T)
CHIP ERASE:
the Chip Erase function will erase Parameter Block 1,
Parameter Block 2, M ain Me mory B lock 1, a nd Mai n Memory Block 2 but not the boot block. If the Boot Block Lockout
has not been enabled, the Chip Erase function will erase
the entire chip. After the full chip erase the device will
return back to read mode. Any c omm and during chi p eras e
will be ignored.
SECTOR ERASE
device is organized into sectors that can be individually
erased. There are two 8K-byte parameter block sections
and two main memory blocks. The 8K-byte parameter
block sections can be independently erased and reprogrammed. The two main memory sections are designed to
be used as alternative memory sectors. That is, whenever
one of the blocks has been erased and reprogra mme d, th e
other block should be erased and r eprogrammed be fore
the first block is again erased. The Sector Erase command
is a six bus cycle operation. The sector address is latched
on the falling WE
input command is latched at the ris ing edge of WE
sector erase starts after the rising edge of WE
cycle. The erase op eration is in ternally contr olled; it wil l
automatically time to completion.
BYTE PROGRAMMING:
erased, the device is programmed (to a logical “0”) on a
byte-by-byte ba sis. Pl ease n ote tha t a data “0” c annot b e
programmed back to a “1”; only erase operations can convert “0”s to “1”s. Programming is accomplished via the
internal device command register and is a 4 bus cycle
operation (please refer to the Command Definitions table).
The device will automatic ally gen erate the required internal
program pulses.
The program cyc le has address es latched on the falling
edge of WE
latched on the rising edge of WE
first. Programming is completed after the specified t
time. The DATA
cate the end of a program cycle.
BOOT BLOCK PROGRAMMING LOCKOUT:
has one designated block that has a programming lockout
feature. This feature prevents programming of data in th e
designated block once the feature has been enabled. The
size of the block is 16K bytes. This block, referred to as the
boot block, can contain secure code that is used to bring up
the system. Enablin g the l ockou t feature w ill al low the boot
code to stay in the device while data in the rest of the
device is updated. This feature does not have to be activated; the boot block’ s u sag e as a wr i te pro t ected r eg io n is
optional to the user. The address range of the boot block is
00000 to 03FFF for the AT49BV/LV001(N) while the
If the boot block lockout has been enabled,
: As an alternative to a full chip erase, the
edge of the sixth cycle while the 30H data
. The
of the sixth
Once the memory array is
or CE, whichever occurs last, and the data
or CE, whichever occurs
cycle
polling feature may also be us ed to indi-
BP
The device
3
address range of the boot block is 1C000 to 1FFFF for the
AT49BV/LV001(N )T.
Once the feature is enabled, the data in th e boot blo ck ca n
no longer be erased or programmed with input voltage level
of 5.5V or less. Data in the ma in memory bl ock can still be
changed through the regular programming method. To activate the lockout feature, a series of six program commands
to specific addresses with specific data must be performed.
Please refer to the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION:
method is available to determine if programming of the boot
block section is locked out. When the device is in the software product ident ification mode (s ee Software Produ ct
Identification Entry and Exit sections) a read from address
location 00002H will s how if pro gramm ing the bo ot block is
locked out for the AT49BV/LV001(N ) and a read from
address 1C002H will show if programming the boot block is
locked out for the AT49BV/LV001(N)T. If the data on I/O0
is low, the boot block can be programmed; if the data on
I/O0 is high, the program lockout feature has been activated and the block cannot be programmed. The software
product identification code should be used to return to standard operation.
BOOT BLOCK PROGRAMMING LOCKOUT OVERRIDE:
The user can override the boo t block prog rammin g lockout
by taking the RESET
erase, sector erase or byte programming operation. When
the RESET
programming lockout feature is again active. This feature is
not available on the AT49BV/LV001N(T).
PRODUCT IDENTIFICATION:
mode identifies the device and manufacturer as Atmel. It
pin is brought back to TTL levels the boot block
pin to 12 volts during the entire chip
The product identification
A software
may be accessed by hardware or software operation. The
hardware operation mode can be used by an external programmer to identify the correct programming algorithm for
the Atmel product.
For details, see O perat ing Mode s (for ha rdware operat ion)
or Software Product Identification. The manufacturer and
device code is the same for both modes.
DATA POLLING:
polling to indicate the end of a program cycle. During
DATA
a program cycle an attempted read of the last byte loaded
will result in the complement of the loaded data on I/O7.
Once the program cycle has been completed, true data is
valid on all outputs and the next cycle may begin. DATA
polling may begin at any time during the program cycle.
TOGGLE BIT:
AT49BV/LV001(N)(T) provides another method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data
from the device will result in I/O6 toggling between one and
zero. Once the program cycle has completed, I/O6 will stop
toggling and valid data will be read . Examining the toggle
bit may begin at any time during a program cycle.
HARDWARE DATA PROTECTION:
protect against inadvertent programs to the
AT49BV/LV001(N)(T) in the following ways: (a) V
is below 1.8V (typic al), the pr ogra m function i s inhib-
if V
CC
ited. (b) Program inhi bit: holding a ny one of OE
high or WE high inhibits progr am cycles. (c) No ise filter:
pulses of less than 15 ns (typical) on the WE
will not initiate a program cycle.
The AT49BV/LV001(N)(T) features
In addition to DATA
polling the
Hardware features
sense:
CC
low, CE
or CE inputs
4
AT49BV/LV001(N)(T)
AT49BV/LV001(N)(T)
Cycle
(1)
OUT
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
IN
6th Bus
Cycle
(4)
Command Definition (in Hex)
1st Bus
Command
Sequence
Read1AddrD
Chip Erase65555AA2AAA555555805555AA2AAA55555510
Sector Erase65555AA2AAA555555805555AA2AAA55SA
Byte Program45555AA2AAA555555A0AddrD
Boot Block Lockout
Product ID Entry35555AA2AAA55555590
Product ID Exit
Product ID Exit
Notes: 1. The DATA FORMAT in each bus cycle is as follows: I/O7 - I/O0 (Hex)
2. The 16K byte boot sector has the address range 00000H to 03FFFH for the AT49BV/LV001(N) and
3. Either one of the Product ID Exit commands can be used.
4. SA = sector addresses:
(3)
(3)
1C000H to 1FFFFH for the AT49BV/LV001(N)T.
For the AT49BV/LV001(N):
SA = 10000 to 1FFFF for BOOT BLOCK
Nothing will happen and the device goes back to the read mode in 100 ns
SA = 04000 to 05FFF for PARAMETER BLOCK 1
SA = 06000 to 07FFF for PARAMETER BLOCK 2
SA = 08000 to 0FFFF for MAIN MEMORY ARRAY BLOCK 1
This command will erase - PB1, PB2 and MMB1
SA = 10000 to 1FFFF for MAIN MEMORY ARRAY BLOCK 2
Bus
Cycles
(2)
65555AA2AAA555555805555AA2AAA55555540
35555AA2AAA555555F0
1XXXXF0
AddrDataAddrDataAddrDataAddrDataAddrDataAddrData
30
For the AT49BV/LV001(N)T:
SA = 1C000 to 1FFFF for BOOT BLOCK
Nothing will happen and the device goes back to the read mode in 100 ns
SA = 1A000 to 1BFFF for PARAMETER BLOCK 1
SA = 18000 to 19FFF for PARAMETER BLOCK 2
SA = 10000 to 17FFF for MAIN MEMORY ARRAY BLOCK 1
This command will erase - PB1, PB2 and MMB1
SA = 00000 to 0FFFF for MAIN MEMORY ARRAY BLOCK 2
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to V
Voltage on OE
with Respect to Ground...................................-0.6V to +13.5V
+ 0.6V
CC
*NOTICE:Stresses beyond those listed under “Ab solute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended
periods may affect device reliability.