ATMEL AT49F004, AT49F004T, AT49F4096A, AT49F4096AT User Manual

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Features
Single Voltage Operation
–5V Read – 5V Programming
Fast Read Access Time - 55 ns
Sector Architecture
– One 8K Words (16K bytes) Boot Block with Programming Lockout – Two 4K Words (8K bytes) Parameter Blocks – One 240K Words (480K bytes) Main Memory Array Block
Fast Sector Erase Time - 10 seconds
Byte-by-Byte or Word-By-Word Programming - 10 µs Typical
Hardware Data Protection
DAT A Polling For End Of Program Detection
Low-Power Dissipation
– 50 mA Active Current – 300 µA CMOS Standby Curren t
Typical 10,000 Write Cycles
4-Megabit (512K x 8/ 256K x 16) CMOS Flash
Description
The AT49F004(T) and AT49F 4096A(T) are 5-volt, 4-megabit Flash Memori es orga­nized as 524,288 words of 8 bits each or 256K words of 16 bits each. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the devices offer access times to 55 ns with power dissipation of just 275 mW. When deselected, the CMOS standby current is less than 300 µA.
The device contains a user-enabled “boot block” protection feature. Two versions of the feature are available: the AT4 9F004/40 96A lo cates the boot bloc k at low est order addresses (“bottom boot”); the AT49F004T/4096AT locates it at highest o rder addresses (“top boot”).
To allow for simple in-system reprogrammability, the AT49F004(T)/4096A(T) does not require high input v ol tage s for p rogr amm in g. R ead ing data out of the devic e is s imil ar to reading from an EPROM; it has standard CE tention. Reprogramming the AT49F004(T)/4096A(T) is performed by first erasing a
, OE, and WE inputs to avoid bus con-
(continued)
Pin Configurations
Pin Name Function
A0 - A18 Addresses CE OE WE Write Enable
Chip Enable Output Enable
Memory
AT49F004 AT49F004T AT49F4096A AT49F4096AT Preliminary
RESET RDY/BUSY I/O0 - I/O14 Data Inputs/Outputs
I/O15(A-1)
BYTE NC No Connect
Reset Ready/Busy Output
I/O15 (Data Input/Output, Word Mode) A-1 (LSB Address Input, Byte Mode)
Selects Byte or Word Mode
Rev. 1167A–09/98
1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21
A16 A15 A14 A13 A12 A11
A9 A8
WE
RESET
NC
RDY/BUSY
A18
A7 A6 A5 A4 A3 A2 A1
A17 GND NC NC A10 I/O7 I/O6 I/O5 I/O4 VCC VCC NC I/O3 I/O2 I/O1 I/O0 OE GND CE A0
AT49F4096A(T) SOIC (SOP)
AT49F4096A(T) TSOP Top View
Type 1
AT49F004(T) TSOP Top View
Type 1
1
A15 A14 A13 A12 A11 A10
WE
RESET
A17
2 3 4 5 6 7
A9
8
A8
9
NC
10
NC
11 12 13
NC
14
NC
15
NC
16
NC
17 18
A7
19
A6
20
A5
21
A4
22
A3
23
A2
24
A1
A17
GND
I/O0 I/O8 I/O1 I/O9 I/O2
I/O10
I/O3
I/O11
NC NC
CE
OE
1 2 3 4
A7
5
A6
6
A5
7
A4
8
A3
9
A2
10
A1
11
A0
12 13 14 15 16 17 18 19 20 21 22
44
RESET
43
WE
42
A8
41
A9
40
A10
39
A11
38
A12
37
A13
36
A14
35
A15
34
A16
33
BYTE
32
GND
31
I/O15/A-1
30
I/O7
29
I/O14
28
I/O6
27
I/O13
26
I/O5
25
I/O12
24
I/O4
23
VCC
block of data an d then p rogrammi ng on a byte-by -byte or word-by-word basis.
The device is erased by executing the er ase command sequence; the device internally controls the erase opera­tion. The memory is divided into four bloc k s for eras e oper ­ations. There are two 4K word parameter block sections, the boot block, and the main memor y array blo ck. Th e typ i­cal number of program and erase cycles is in excess of 10,000 cycles.
The 8K word boot block section includes a reprogramming lock out feature to provide data integrity. This feature is enabled by a command sequence. Once the boot block programming lockout feature is enabled, the data in the
48
A16
47
BYTE
46
GND
45
I/O15 / A-1
44
I/O7
43
I/O14
42
I/O6
41
I/O13
40
I/O5
39
I/O12
38
I/O4
37
VCC
36
I/O11
35
I/O3
34
I/O10
33
I/O2
32
I/O9
31
I/O1
30
I/O8
29
I/O0
28
OE
27
GND
26
CE
25
A0
boot block cannot be chang ed when input levels of 5 .5 volts or less are used. The boot sector is designed to con­tain user secure code.
For the AT49F4096A(T), the BYTE
pin controls whether the device data I/O pi ns op er ate in the by te or wo rd c onfig­uration. If the BYTE
pin is set at a logi c “1” o r lef t ope n, the device is in word co nfigurat ion, I/O0 - I/O15 are activ e and controlled by CE
If the BYTE
and OE.
pin is set at logic “0”, the devi ce is in byte con­figuration, and only data I/O pins I/O 0 - I/O7 ar e active an d controlled by CE
and OE. The data I/O pins I/O8 - I/O14 are tri-stated and the I/O15 pin is used as an input for the LSB (A-1) address function.
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AT49F004(T)/4096A(T)
AT49F004(T) Block Diagram
V
CC
GND
OE
WE
CE
RESET
ADDRESS
INPUTS
CONTROL
LOGIC
Y DECODER
X DECODER
AT49F4096A(T) Block Diagram
V
CC
GND
OE
WE
CE
RESET
ADDRESS
INPUTS
CONTROL
LOGIC
Y DECODER
X DECODER
AT49F004 AT49F004T
DATA INPUTS/OUTPUTS
I/O0 - I/O7
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES Y-GATING
MAIN MEMORY
(480K BYTES) PARAMETER
BLOCK 2
8K BYTES
PARAMETER
BLOCK 1
8K BYTES
BOOT BLOCK
16K BYTES
AT49F4096A AT49F4096AT
DATA INPUTS/OUTPUTS
I/O0 - I/O15
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES Y-GATING
MAIN MEMORY (240K WORDS)
PARAMETER
BLOCK 2
4K WORDS
PARAMETER
BLOCK 1
4K WORDS
BOOT BLOCK
8K WORDS
AT49F004(T)/4096A(T)
DATA INPUTS/OUTPUTS
I/O0 - I/O7
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES
7FFFF 7FFFF
08000
07FFF 06000
05FFF
04000
03FFF 00000 00000
DATA INPUTS/OUTPUTS
3FFFF 3FFFF
04000
03FFF
03000
02FFF
02000
01FFF 00000 00000
Y-GATING
BOOT BLOCK
16K BYTES
PARAMETER
BLOCK 1
8K BYTES
PARAMETER
BLOCK 2
8K BYTES
MAIN MEMORY
480K BYTES
I/O0 - I/O15
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES Y-GATING
BOOT BLOCK
8K WORDS
PARAMETER
BLOCK 1
4K WORDS
PARAMETER
BLOCK 2
4K WORDS
MAIN MEMORY (240K WORDS)
7C000 7BFFF
7A000 79FFF
78000 77FFF
3E000 3DFFF
3D000
3CFFF
3C000
3BFFF
Device Operation
READ:
EPROM. When CE data stored at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever CE high. This dual-line con tr ol gi v es d esign er s fl ex ibi lit y in pr e­venting bus contention.
COMMAND SEQUENCES:
ered on it will be reset to the read or standby mode depending upon the state of the control line inputs. In order to perform other device functions, a series of command sequences are entered into the device. The command
The AT49F004(T)/4096A(T) is accessed like an
and OE are low and WE is high, th e
or OE is
When the device is first pow-
sequences are shown in the Com mand Definition s table (I/O8 - I/O15 are don’t care inputs for the command codes). The command sequences are written by applying a low pulse on the WE tively) and OE edge of CE latched by the first rising edge of CE
or CE input with CE or WE low (respec-
high. The address is latched on the falling
or WE, whichever occurs last. The data is
or WE. Standard microprocessor write timings are used. The address loca­tions used in the command sequences are not affected by entering the command sequences.
RESET:
A RESET
tem applications. When RESET
input pin is prov ided to eas e so me s ys-
is at a logic high level, the
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device is in its standa rd oper at ing mod e. A low l ev el on the RESET the outputs of the de vice in a hi gh imped ance stat e. When a high level is reasse rted on the RES ET returns to the Read or Standby mod e, depending upon the state of the control inputs. By applying a 12V ± 0.5V input signal to the RE SE T grammed even if the boot block program lockout feature has been enable d (see Boot B lock Pr ogrammi ng Lock out Override section).
ERASURE:
must be erased. The erased state of memory bits is a logi­cal “1”. The entire device can be erased by using the Chip Erase command or individual sectors can be erased by using the Sector Erase commands.
CHIP ERASE:
by using the 6-byte chip erase software code. After the chip erase has been initiated, the device will internally time the erase operation so that no external clocks are required. The maximum time to erase the chip is t
If the boot block lockou t has be en enabled, the Ch ip Eras e will not erase the data in t he boot block; it wil l erase the main memory block and the parameter blocks only. After the chip erase, the de vi ce wi ll retu rn to the read or standby mode.
SECTOR ERASE:
device is organized into four sectors that can be individually erased. There are two 4K word parameter block sections, one boot block, and the main memory array block. The Sector Erase command is a six bus cycle operation. The sector address is latched on the falling WE sixth cycle while the 30 H data in put com mand is la tched at the rising edge of WE ing edge of WE internally controlled; it will automatically time to completion. Whenever the main memory block is erased and repro­grammed, the two parame ter bloc ks should be erased and reprogrammed before the main memory block is erased again. Whenever a parameter block is erased and repro­grammed, the other parameter block should be erased and reprogrammed before the first parameter block is erased again. Whenever the boot block is erased and repro­grammed, the ma in memory block and th e parameter blocks should be erased and reprogrammed before the boot block is erased again.
BYTE/WORD PROGRAMMING:
erased, it is programmed (to a logical “0”) on a byte-by-byte or word-by-word bas is. Progr amming is accom plished via the internal device command register and is a 4 bus cycle operation. The device will automatically generate the required internal program pulses.
Any commands written to the c hip during the em bedded programming cycle will be ignored. If a hardware reset hap-
input halts the prese nt device oper ation and puts
pin, the device
pin the boot blo ck ar ray c an b e r epro-
Before a byte or word can be reprogrammed, it
The entire device can be erased at one time
.
EC
As an alternative to a full chip erase, the
edge of the
. The sector erase s tar ts after the ris-
of the sixth cycle. The erase o peration is
Once a memory block is
pens during programming, the data at the location being programmed will be corrupted. Please note that a data “0” cannot be programmed back to a “1”; only erase operations can convert “ 0”s to “ 1”s. Pro grammi ng is co mplete d after the specified t also be used to indicate the end of a program cycle.
BOOT BLOCK PROGRAMMING LOCKOUT:
has one designated block that has a programming lockout feature. This feature prevents programming of data in th e designated block once the feature has been enabled. The size of the block is 8K words. Thi s blo ck, refe rred to a s the boot block, can contain secure code that is used to bring up the system. Enablin g the l ockou t feature w ill al low the boot code to stay in the device while data in the rest of the device is updated. This feature does not have to be acti­vated; the boot block’ s u sag e as a wr i te pro t ected r eg io n is optional to the user. The address range of the boot block is 00000H to 03FFFH for the AT49F004; 7C000H to 7FFFFH for the AT49F004T; 00000H to 01FFFH for the AT49F4096A; and 3E000H to 3FFFFH for the AT49F4096AT.
Once the feature is enabled, the data in the boot blo ck ca n no longer be erased or programmed when input levels of
5.5V or less are u sed. Dat a in the ma in memo ry bloc k can still be changed through the regular programming method. To activate the lockout feature, a series of six program commands to specific addresses with specific data must be performed. Please refer to the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION:
method is available to determine if programming of the boot block section is locked out. When the device is in the soft­ware product identification mode (see Software Product Identification Entry and Exit section s) a read from the fol­lowing address location will show if programming the boot block is locked out—00002H for AT49F004 and AT49F4096A; 7C002 for the AT49F004T; and 3E002H for the AT49F4096AT. If the data on I/O0 is low, the boot block can be programmed; if the data on I/O0 is high, the pro­gram lockout featu re has been en abled an d the block can­not be programmed. The software product identification exit code should be used to return to standard operation.
BOOT BLOCK PROGRAMMING LOCKOUT OVERRIDE:
The user can override th e boot blo ck progr amming lo ckout by taking the RESET erase, sector erase or word pro grammin g oper ation. W hen the RESET programming lockout feature is again active.
PRODUCT IDENTIFICATION:
mode identifies the device and manufacturer as Atmel. It may be accessed by hardware or software operation. The hardware operation mode can be used by an external pro­grammer to identify the correct programming algorithm for the Atmel product.
cycle time. The DATA polling feature may
BP
The device
A software
pin to 12 volts during the entire chip
pin is brought back to TTL levels the boot block
The product identification
4
AT49F004(T)/4096A(T)
AT49F004(T)/4096A(T)
For details, see O peratin g Modes (for har dware operatio n) or Software Product Identification. The manufacturer and device code is the same for both modes.
DATA POLLING:
polling to indic ate the en d o f a program cycle. Dur in g
DATA
The AT49F004(T)/4096A(T) features
a program cycle an attempted read of the last byte loaded will result in the complement of the loaded data on I/O7. Once the program cycle has been completed, true data is valid on all outputs and th e next cyc le may be gin. Du ring a chip or sector erase operation, an attempt to read the device will give a “0” on I/O7. Once the program or erase cycle has completed, true data will be read from the device.
polling may begi n at any ti me during the program
DATA cycle.
TOGGLE BIT:
In addition to DATA
polling the AT49F004(T)/4096A(T) p rovi des another method for deter­mining the end of a program or erase cycle. During a pro­gram or erase o pera tion, succe ssiv e atte mpts to r ead data from the device will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop
toggling and valid data will be read . Examining the toggle bit may begin at any time during a program cycle.
READY/BUSY
drain READY/BUSY
:
For the AT49F004 (T), pin 12 is an open
output pin whic h provides anot her method of detecting the end of a program or erase opera­tion. RDY/BUSY
is actively pulled low during the internal program and erase cycles and it is rele ased at the co mple­tion of the cycle. The open drain connec tion allow s for OR­tying of several devices to the same RDY/BUSY
HARDWARE DATA PROTECTION:
Hardware features
line.
protect against inadvertent programs to the AT49F004(T)/4096A(T ) in the following wa ys: (a) V
CC
sense: if VCC is below 3.8V (typical), the program function is inhibited. (b) V the V
sense level, the device will automaticall y time out
CC
power on delay: onc e VCC has reached
CC
10 ms (typical) before programming. (c) Program inhibit: holding any one of OE
low, CE high or WE h igh inhi bits program cycles. (d) Noise filter: pulses o f less than 15 ns (typical) on the WE
or CE inputs will not initiate a program
cycle.
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