ATMEL AT49F008-90TI, AT49F008-90TC, AT49F008-15TI, AT49F008-15TC, AT49F008-12TC Datasheet

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Features
Single Voltage Operation
– 5V Read – 5V Reprogramming
Fast Read Access Time - 90 ns
16K bytes Boot Block With Lockout
Fast Erase Cycle Time - 10 seconds
Byte-By-Byte Programming - 10 µs/Byte Typical
Hardware Data Protection
DAT A Polling For End Of Program Detection
Low Power Dissipation
– 50 mA Active Current – 100 µA CMOS Standby Current
Typical 10,000 Write Cycles
8-Megabit (1M x 8) 5-volt Only
Description
The AT49F008 is a 5-volt-o nly in-sys tem Flash Me mory devi ce. Its 8- megabits of memory is organized as 1,024,576 words by 8-bits. Manufactured with Atmel’s advanced nonvol atile CMOS technology, the de vi ce of fer s ac ce ss t ime s to 90 ns wi th power dissipatio n of just 27 5 mW ove r the co mmercia l temper atur e range . When the device is deselected, the CMOS standby current is less than 100 µA.
(continued)
Pin Configurations
Pin Name Function
A0 - A19 Addresses CE OE WE Write Enable RESET RDY/BUSY I/O0 - I/O7 Data Inputs/Outputs NC No Connect
Chip Enable Output Enable
Reset Ready/Busy Output
TSOP Top VIew
Type 1
Flash Memory
AT49F008
A16 A15 A14 A13 A12 A11
RESET
RDY/BUSY
A18
1 2 3 4 5 6 7
A9
8
A8
9
WE
10 11
NC
12 13 14
A7
15
A6
16
A5
17
A4
18
A3
19
A2
20
A1
40
A17
39
GND
38
NC
37
A19
36
A10
35
I/O7
34
I/O6
33
I/O5
32
I/O4
31
VCC
30
VCC
29
NC
28
I/O3
27
I/O2
26
I/O1
25
I/O0
24
OE
23
GND
22
CE
21
A0
Rev. 0972A–03/98
1
To allow for simple in-system reprogrammability, the AT49F008 does not require high input voltages for pro­gramming. 5-volt-only commands determine the read and programming operation of the device. Reading data out of the device is similar to reading from an EPROM. Repr o­gramming the AT49F008 is performed by erasing the entire 8 megabits of memory and then programming on a byte-by­byte basis. The typical byte programming time is a fast 10 µs. The end of a program cycle can be optionally detected by the DATA
polling feature. Once the end of a byte pro-
Block Diagram
V
CC
GND
OE
WE
CE
ADDRESS
INPUTS
OE, CE, AND WE
LOGIC
Y DECODER
X DECODER
gram cycle has been detected, a new access for a read or program can begin. The typical number of program and erase cycles is in excess of 10,000 cycles
The optional 16K bytes boot block section includes a repro­gramming write lock out feature to provide data integrity. The boot sector is design ed to contai n user secur e code, and when the featur e is en abled , the b oot s ector i s perma ­nently protected from being reprogrammed.
DATA INPUTS/OUTPUTS
I/O7 - I/O0
8
DATA LATCH
INPUT/OUTPUT
BUFFERS Y-GATING
MAIN MEMORY
(1008K BYTES)
OPTIONAL BOOT
BLOCK (16K BYTES)
FFFFFH
03FFFH
00000H
Device Operation
READ:
CE memory location determined by the address pins is asserted on the outputs . The outputs ar e put in the high impedance state whenever CE control gives designers flexibility in preventing bus conten­tion.
ERASURE:
1024K bytes memo ry array (or 1008K bytes if the boot block featured is used) must be erased. The erased state of the memory bits is a logical “1”. The entire device can be erased at one time by using a 6-byte software code. The software chi p erase code c onsists of 6-b yte load co m­mands to specific address locations with a specific data pattern (please refer to the Chip Erase Cycle Waveforms).
After the software chip erase has been ini tiated , the devi ce will internally time the eras e operatio n so that no ex ternal clocks are required. The maximum time needed to erase the whole chip is t been enabled, the data in the boot sector will not be erased.
BYTE PROGRAMMING:
erased, the device is programmed (to a logical “0”) on a byte-by-byte bas is. Please note th at a data “0” ca nnot be
The AT49F008 is accessed like an EPROM. When
and OE are low and WE is hi gh, the data st ored at the
or OE is high. This dual-line
Before a byte can be reprogrammed, the
. If the boot block lockout feature has
EC
Once the memory array is
programmed ba ck to a “1”; only era se oper ation s can con ­vert “0”s to “1 ”s. Programmi ng is accom plished via the internal device command register and is a 4 bus cycle oper­ation (plea se refer to the Co mmand Defini tions ta ble). The device will automatically generate the required internal pro­gram pulses.
The program cycle has addresses latched on the falling edge of WE latched on the rising edge of WE first. Programming is completed after the specified t
or CE, whichever occurs last, and the data
or CE, whichever occurs
BP
cycle time. The DATA polling feature may also be used to indicate the end of a program cycle.
BOOT BLOCK PROGRAMMING LOCKOUT:
The device has one designated block that has a programming lockout feature. This feature prevents programmin g of data in the designated block once the feature has been enabled. The size of the block is 16K bytes. This block, referred to as the boot block, can contain secure code that is used to bring up the system. Enablin g the l ocko ut feature will allow t he boot code to stay in the device while data in the rest of the device is updated. This feature does not have to be acti­vated; the boot block’ s u sa ge a s a write protected region is optional to the user. The address range of the AT49F008 boot block is 00000H to 03FFFH.
2
AT49F008
AT49F008
To activate the lockout feature, a series of six program commands to specific addresses with specific data must be performed. Please refer to the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION:
method is available to determine if programming of the boot block section is locked out. When the device is in the soft­ware product iden tification mode (see Soft ware Produc t Identification Entry and Exit sections) a read from address location 00002H will sho w if progra mming th e boot blo ck is locked out. If the d ata on I /O 0 i s low, the boo t bl oc k ca n be programmed; if the data on I/O0 is high, the program lock­out feature has been activated and the block cannot be programmed. The software product identification exit code should be used to return to standard operation.
BOOT BLOCK PROGRAMMING LOCKO UT OV ERRIDE:
The user can override the boot block programming lockout by taking the RESET tected boot block data can be altered through a chip erase, or byte programming. When the RESET to TTL levels, the boot block programming lockout feature is again active.
PRODUCT IDENTIFICATION:
mode identifies the device and manufacturer as Atmel. It may be accessed by hardware or software operation. The hardware oper ation mode can be used by an exte rnal pro­grammer to identify the correct programming algorithm for the Atmel product.
For details, see Operating Modes (for hardware operation) or Software Product Identification. The manufacturer and device code is the same for both modes.
DATA POLLING:
indicate the end of a program cycle. During a program cycle an attempted read of the last byte loaded will result in the complement of the loaded data on I/O7. Once the pro­gram cycle has been com pleted, true data is valid on all outputs and the next cycle may begin . DATA begin at any time during the program cycle.
pin to 12V ± 0.5V. By doing this, pr o-
The product identification
The AT49F008 features DATA
A software
pin is brought back
polling to
polling may
TOGGLE BIT:
provides another method for determining the end of a pro­gram or erase cycle. During a pro gram or er ase opera tion, successive attempts to read data from the device will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time during a program cycle.
RDY/BUSY
vides another method of detecting the end of a program or erase operation. RDY/BUSY the internal program and erase cycles and is released at the completion of the cycle. The open drain connection allows for OR - tying of sever al devices to the same RDY/BUSY
RESET:
tem applications. When RESET device is in its sta nda rd ope ra tin g mo de. A lo w level on the RESET outputs of the device in a high impedance state, and reduces the curr ent draw n by the p art to a mi nimum . If the RESET or erase operation, the operation may not be successfully completed and the oper ati on wil l ha ve t o be rep eated afte r a high level is applied to the RESET is reasserted on the RESET read or standby mode, depending upon the state of the control inputs. By applying a 12V ± 0.5V input signal to the RESET even if the boot block lockout feature has been enabled (see Boot Block Programming Lockout Override section).
HARDWARE DATA PROTECTION:
protect against inadvertent programs to the AT49F008 in the following ways: (a) V (typical), the program function is inhibited. (b) Program inhibit: holding any one of OE inhibits program cycles. (c) Noise filter: pulses of less than 15 ns (typical) on the WE gram cycle.
input halts the presen t device opera tion, puts the
pin makes a high to low transition during a program
pin, the boot block array can be reprogrammed
In addition to DATA
:
An open drain READY/BUSY
line.
A RESET
input pin is provided to eas e some sys -
pin, the device returns to the
CC
or CE inputs will not i ni t ia t e a pro-
polling, the AT49F008
output pin pro-
is actively pulled low during
is at a l ogic high le ve l, t he
pin. When a high level
Hardware features
sense: if VCC is below 3.8V
low, CE high or WE high
3
Command Definition (in Hex)
1st Bus
Command Sequence
Read 1 Addr D Chip Erase 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 10
Bus
Cycles
Cycle
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
OUT
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
6th Bus
Cycle
Byte Program 4 5555 AA 2AAA 55 5555 A0 Addr D
(2) (2)
(1)
6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 40
3 5555 AA 2AAA 55 5555 F0 1 XXXX F0
Boot Block Lockout Product ID Entry 3 5555 AA 2AAA 55 5555 90 Product ID Exit Product ID Exit
Notes: 1. The 16K byte boot sector has the address range 00000H to 03FFFH.
2. Either one of the Product ID Exit commands can be used.
Absolute Maximum Ratings*
Temperature Under Bias................................-55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground............................-0.6V to V
Voltage on OE
with Respect to Ground...................................-0.6V to +13.5V
+ 0.6V
CC
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam­age to the dev ice . This is a s tress rating only an d functional oper ation of the device at thes e o r any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions f or e xtended periods ma y af fect de vice reliability .
IN
4
AT49F008
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