ATMEL AT45D011-XI, AT45D011-XC, AT45D011-SI, AT45D011-SC, AT45D011-JI Datasheet
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Features
•
Single 4.5V - 5.5V Supply
•
Serial Interface Arch itec ture
•
Page Program Operation
– Single Cycle Reprogram (Erase and Program)
– 512 Pages (264 Bytes/Page) Main Memory
•
Optional Page and Block Erase Operations
•
One 264-Byte SRAM Data Buffer
•
Internal Program and Control Timer
•
Fast Page Program Time – 7 ms Typical
µµµµ
•
120
s Typical Page to Buffer Transfer Time
•
Low-Power Dissipation
– 15 mA Active Read Current Typical
µµµµ
–10
A CMOS Standby Current Typical
•
15 MHz Max Clock Frequency
•
Hardware Data Protection Feature
•
Serial Peripheral Interface (SPI) Compatible – Modes 0 and 3
•
CMOS and TTL Compatible Inputs and Outputs
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Commercial and Industrial Temperature Ranges
1-Megabit
5.0-volt Only
Serial
DataFlash
®
Description
The AT45D011 is a 5.0- volt only, serial interfac e Fl as h m emo ry s ui table for in-system
reprogramming. Its 1,081,344 bit s of memory are organized as 512 pag es of 264
bytes each. In additi on to the mai n memory, the AT45D 011 also co ntains on e SRAM
data buffer o f 26 4 byte s. U nlik e c onven tiona l Fl ash m em ories tha t are acc essed ra ndomly with multiple ad dres s l in es and a pa rall el inte r fac e, th e Dat aFla sh uses a serial
interface to sequentially access its data. The si mple serial inter face facilitates hard-
(continued)
Pin Configurations
Pin Name Function
CS
SCK Serial Clock
SI Serial Input
SO Serial Output
WP
RESET Chip Reset
RDY/BUSY Ready/Busy
SCK
SI
SO
NC
NC
NC
NC
NC
NC
Note: PLCC package pins 16
and 17 are DON’T CONNECT
Chip Select
Hardware Page
Write Protect Pin
PLCC
CSNCNC
GND
432
5
6
7
8
9
10
11
12
13
1
14151617181920
NCNCDCDCNCNCNC
VCCNCNC
323130
29
28
27
26
25
24
23
22
21
WP
RESET
RDY/BUSY
NC
NC
NC
NC
NC
NC
SI
SCK
RESET
CS
RDY/BUSY
RESET
WP
VCC
GND
SCK
SO
SOIC
1
2
3
4
TSSOP Top View
Type 1
1
2
3
4
5
6
7
SO
8
GND
7
VCC
6
WP
5
14
CS
13
NC
12
NC
11
NC
10
NC
9
NC
8
SI
AT45D011
Preliminary
AT45DB011
Preliminary 16Megabit 2.7-volt
Only Serial
DataFlash
Rev. 1123A–08/98
1
ware layout, increases system reli ability, mini mizes sw itching noise, and reduces package size and active pin count.
The device is optimized for use in many commercial and
industrial applications where high density, low pin count,
low voltage, and low power are essential. Typical applications for the DataFlash are digital voice storage, image
storage, and data storage. The device operates at clock
frequencies up to 15 MHz with a typica l activ e read cu rrent
consumption of 15 mA.
Block Diagram
To allow for simple in-system reprogrammability, the
AT45D011 does not require high input voltages for programming. The devi ce operate s from a s ingle po wer supply, 4.5V to 5.5V, for both the program and read
operations. The AT45D011 is enabled through the chip
select pin (CS
) and accessed via a three-wire interface
consisting of the Serial Input (SI), Serial Output (SO), and
the Serial Clock (SCK).
All programming cycles are self-timed, and no separate
erase cycle is required before programming.
WP
PAGE (264 BYTES)
BUFFER (264 BYTES)
SCK
CS
RESET
V
CC
GND
RDY/BUSY
Memory Array
To provide optimal flexibility, the memory array of the
AT45D011 is divided into three levels of granularity comprising of sectors, bl ocks, and page s. The Memory Arch itecture Diagram illustrates the breakdown of each level and
FLASH MEMORY ARRAY
I/O INTERFACE
SOSI
details the number of pages per sector and block. All pr ogram operations to the DataFlash occur on a page by page
basis; however, the optional erase operations can be performed at the block or page level.
2
AT45DB011
Memory Architecture Diagram
AT45DB011
SECTOR ARCHITECTURE
SECTOR 0 = 2112 BYTES (2K + 64)
SECTOR 1 = 65,472 BYTES (62K + 1984)
SECTOR 2 = 67,584 BYTES (64K + 2K)
SECTOR 0
BLOCK ARCHITECTURE PAGE ARCHITECTURE
8 Pages
BLOCK 0
BLOCK 1
PAGE 14
PAGE 15
PAGE 16
PAGE 17
PAGE 18
PAGE 509
PAGE 510
PAGE 511
Page = 264 bytes
SECTOR 1SECTOR 2
BLOCK 0
BLOCK 1
BLOCK 2
BLOCK 3
BLOCK 29
BLOCK 30
BLOCK 31
BLOCK 32
BLOCK 33
BLOCK 34
BLOCK 61
BLOCK 62
BLOCK 63
Block = 2112 bytes
(2K + 64)
PAGE 0
PAGE 1
PAGE 6
PAGE 7
PAGE 8
PAGE 9
(256 + 8)
Device Operation
The device operation is controlled by instructions from the
host processor. The l is t o f in st ru cti on s a nd thei r as so ci ated
opcodes are contained in T able 1 and Table 2. A valid
instruction starts with the falling edge of CS
appropriate 8-bit opcode and the desired buffer or main
memory address loc ati on. Whi le the CS
the SCK pin controls the loading of the opcode and the
desired buffer or main memory address location through
the SI (serial input) pin. All instructions, addresses, and
data are transferred with the most significant bit (MSB) first.
Read
By specifying the appropriate opcode, data can be read
from the main memory or from the data buffer.
MAIN MEMORY PAGE READ:
the user to read data directly from any one of the 512
pages in the main memory, bypassing the data buffer and
leaving the contents of the buffer unchanged. To start a
page read, the 8-bit opcode, 52H, is followed by 24
address bits and 32 don’t care bits . In the AT45D011, the
first six address bits are reserved for larger density devices
(see Notes on page 10), the next nine address bits (PA8PA0) specify the page address, and the next nine address
bits (BA8-BA0) specify the starting byte address within the
page. The 32 don’t care bits which follow the 24 address
A main memory read allows
followed by the
pin is low, toggl in g
bits are sent to initialize the read operation. Following the
32 don’t car e bit s, ad diti onal puls es o n SCK res ult i n se ria l
data being output on the SO (serial output) pin. The CS
pin
must remain low during the loading of the opcode, the
address bits, and the reading of data. When the end of a
page in main memory is reached during a m ain memory
page read, the device will continue reading at the beginning
of the same page. A low to high transition on the CS
pin will
terminate the read operation and tri-state the SO pin.
BUFFE R RE AD:
Data can be read from the data buffer
using an opcode of 54H. To perform a buffer read, the eight
bits of the opcode m ust be foll owed by 15 don ’t care bits,
nine address bits, and eight don't care bits. Since the buffer
size is 264-bytes, nine address bits (BFA8-BFA0) are
required to specify the firs t b yte of data to be re ad f ro m th e
buffer. The CS
pin must remain low during the loading of
the opcode, the address bits, the don’t care bits, and the
reading of data. When the end of the buf fer is rea ched, the
device will continue reading back at the beginning of the
buffer. A low to high t ransi tion on th e CS
pin will ter minat e
the read operation and tri-state the SO pin.
MAIN MEMORY PAGE TO BUFFER TRANSFER:
A page
of data can be tran sf er re d f rom t he main memory to buf fer .
An 8-bit opcode of 53H is followed b y the si x res er ve d b its,
nine address bits (PA 8-PA0) which specify the page in
3
main memory that is to be transferred, and nine don’t care
bits. The CS
pin must be low while toggling the S CK pin t o
load the opcode , the ad dress bi ts, and the don’t care b its
from the SI pin. The tran sfer of the pag e of data from th e
main memory to the buffer wi ll beg in when the CS
pin transitions from a low to a h igh state. During t he transfer of a
page of data (t
), the status register can be read to deter-
XFR
mine whether the transfer has been completed or not.
MAIN MEMORY PAGE TO BUFFER COMPARE:
A page of
data in main memor y can be compa red to the da ta in the
buffer. An 8-bit opcode of 60H is followed by 24 address
bits consisting of the six reserved bits, nine address bits
(PA8-PA0) which specify the page in the main memory that
is to be compared to the buffer, and nine don’t care bits.
The loading of the opcode and the address bits is the same
as described previously. The CS
pin must be low while toggling the SCK pin to load the opcode, the address bits, and
the don't care bits from the SI pin. On the low to high transition of the C S
pin, the 264 bytes in the selected main memory page will be co mpared wi th the 2 64 by tes in the buf fer.
During this time (t
), the status register will indicate that
XFR
the part is busy. On completion of the compare operation,
bit 6 of the status register is updated with the result of the
compare.
Program
BUFFER WRITE:
into the data buffer. To load data into the buffer, an 8-bit
opcode of 84H is followed by 15 don’t care bits and nine
address bits (BFA 8-BFA0). T he nine addre ss bits spe cify
the first byte in the buffer to be written. The data is ente red
following the address bits. If the end of the data buffer is
reached, the device wil l w ra p arou nd b ac k to the beg inn in g
of the buffer. D ata wi ll con tinue to be loaded i nto t he bu ffer
until a low to high transition is detected on the CS
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH
BUILT-IN ERASE:
grammed into the main me mory. An 8-bit opcode of 83H is
followed by the six rese rved bits, nine ad dress bits (PA 8PA0) that specify the page in the main memory to be written, and nine additional don ’t car e bits. When a low to high
transition occurs on the CS
selected page in main memory to all 1s and then program
the data stored in the buffer into the spe cified page in the
main memory. Both the erase and the programming of the
Data can be shif ted in from the SI pi n
pin.
Data written into the buffer can be pro-
pin, the part will first erase the
page are internally self timed and should take place in a
maximum time of t
. During this time, the status register
EP
will indicate that the part is busy.
BUFFER TO MAIN MEMORY PAGE PROGRAM WITHOUT BUILT-IN ERASE:
A previously erased page within
main memory ca n be program med w ith th e co ntents of th e
buffer. An 8-bit opcode of 88H is followed by the six
reserved bits, nine address bits (PA8-PA0) that specify the
page in the main me mor y to be written, and nine addi ti ona l
don’t care bits. When a lo w to high tran sitio n occurs on the
pin, the part will program the data stored in the buffer
CS
into the specified pag e in the main memory. It is nec es sary
that the page in main memory that is being programmed
has been previously er ased. The pr ogram ming of the pag e
is internally self timed and should take place in a maximum
time of t
. During this time, the status register will indicate
P
that the part is busy.
PAGE ERASE:
The optional Page Erase comma nd can b e
used to individually er ase any page in the main memory
array allowing the Buffer to Main Memory Page Program
without Built-In Erase command to be utilized at a later
time. To perform a P age E rase , an op co de of 8 1H must be
loaded into the device, followed by six reser ved bits, nine
address bits (PA8 -PA0), and ni ne don’t c are bits. The nine
address bits are used to specify whi ch page of the memo ry
array is to be erased. Wh en a low to hig h transiti on occu rs
on the CS
pin, the part will erase the selected page to 1s.
The erase operation is internally self-timed and should take
place in a maximum time of t
. During this time, the status
PE
register will indicate that the part is busy.
BLOCK ERASE:
A block of eight pages can be erased at
one time allowing the Buffer to Main Me mory Page Program without Built-In Erase command to be utilized to
reduce programming times when writing large amounts of
data to the device. To perform a Block Erase, an opcode of
50H must be loaded into the device, followed by six
reserved bits, six address bits (PA8-PA3), and 12 don’t
care bits. The six address bits are used to specify which
block of eight pages is to be erased. When a low to high
transition occurs on the CS
pin, the part will erase the
selected block o f eigh t pages to 1s. The er ase oper ation is
internally self -timed an d should tak e place in a max imum
time of t
. During this time, the stat us re giste r will in dica te
BE
that the part is busy.
4
AT45DB011
AT45DB011
Block Erase Addressing
PA8 PA7 PA6 PA5 PA4 PA3 PA2 PA1 PA0 Block
000000XXX0
000001XXX1
000010XXX2
000011XXX3
•
•
•
111100XXX60
111101XXX61
111110XXX62
111111XXX63
MAIN MEMORY PAGE PROGRAM:
combination of the Buffer Write and Buffer to Main Memory
Page Program with Built-In Erase ope rations. Data is first
shifted into the buffer from the SI pin and then programmed
into a specified page in the main memo ry. An 8-bi t opcode
of 82H is followed by the six reserved bits and 18 address
bits. The ni ne most si gnificant address b its (PA8-P A0)
select the page in the main memory wher e data is to be
written, and the next n ine ad dr ess bits (BFA8-BFA0) sel ect
the first byte in the buffer to be written. After all address bits
are shifted in, the part will take data fro m the SI pin an d
store it in the data buffer. If the end of the buffer is reached,
the device will wrap around back to the beginning of th e
buffer. When there is a low to high transition on the CS
the part will first erase the selected page in main memory to
all 1s and then program the data stored in the buffer into
the specified page in the main memory. Both the erase and
the programming of the page are internally self timed and
should take place in a maximum of time t
time, the status register will indicate that the part is busy.
AUTO PAGE REWRITE:
ple bytes within a page or mu ltiple pag es of data are mod ified in a random fashion. This mode is a combination of two
operations : Main Mem ory Page to B uffer Tran sfer and
Buffer to Main Memory Page Program with Built-In Erase.
A page of data is first transf erred fr om the main me mory to
the data buffer, and th en t he sa me data ( from the buffer) is
programmed back into its original page of main memory.
An 8-bit opcode of 58H is followed b y the si x r ese r ved bi ts,
nine address bits (PA8-PA0) that specify the page in main
memory to be re writte n, and n ine a ddi tio nal d on’ t care bits.
When a low to high transition occurs on the CS
will first transfer da ta from the p age i n main memory to th e
buffer and then program the data from the buffer back into
same page of main memory. The operation is internally
•
•
•
•
•
•
•
•
•
This operation is a
EP
This mode is only needed if multi-
•
•
•
pin,
. During this
pin, the part
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•
•
•
•
•
•
•
•
•
•
self-timed and s hould t ake pl ace in a maxi mum ti me of t
During this time, the status register w ill indicate that th e
part is busy.
If a sector is programmed or reprogrammed sequentially
page by page, then the programming algorithm shown in
Figure 1 is recommended. Otherwise, if multiple bytes in a
page or several pa ges are programmed randoml y i n a se ctor, then the programming algorithm shown in Figure 2 is
recommended.
STATUS REGISTER:
The status register can be used to
determine the device’s ready/busy status, the result of a
Main Memory Page to Buffer Compa re operation, or the
device density. To read the status register, an opcode of
57H must be loaded in to th e d ev ice. A fte r the las t b it of th e
opcode is shifted in, the eig ht bits of the status register,
starting with the MSB (bit 7), will be shifted out on the SO
pin during the next eight clock cycles. The five most-significant bits of the status register will contain device infor mation, while the remaining three least-significant bits are
reserved for future use and will have undefined values.
After bit 0 of the status register has been shifted out, the
sequence will repeat itse lf (as long as CS
remains lo w an d
SCK is being toggled ) startin g again wit h bit 7. The data in
the status register is constantly updated, so each repeating
sequence will output new data.
Ready/busy status is indicated using bit 7 of the status register. If bit 7 is a 1, th en the device is not bus y and is re ady
to accept the next comman d. If bit 7 i s a 0, then the devic e
is in a busy state. The user can continuously poll bit 7 of the
status register by stopping SCK once bit 7 has been output.
The status of bit 7 will continue to b e o utp ut o n the SO pi n,
and once the device is no longer busy, the state of SO will
change from 0 to 1. There are eight operations which can
cause the device to be in a busy state: Main Memo ry Page
•
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•
.
EP
5
to Buffer Transfer, Main Memory Page to Buffer Compare,
Buffer to Main Memory Page Program with Built-In Erase,
Buffer to Main Memory Page Program without Built-In
Erase, Page Erase, Block Erase, Main Memory Page Program, and Auto Page Rewrite.
The result of the mos t recent Ma in Memor y Page to B uffer
Compare opera tion is indic ated using bi t 6 of the status
register. If bit 6 is a 0, then the data in the main memory
page matches the data in the buffer. If bit 6 is a 1, then at
least one bit of the data in the main memory page does not
match the data in the buffer.
The device density is indicate d using bits 5, 4, and 3 of the
status register. For the AT45D011, the three bits are 0, 0,
and 1. The decimal value of these three binary bits does
not equate to th e dev ice d ensi ty; th e thr ee b its re presen t a
combinational code r elating to di ffering den sities of Ser ial
DataFlash devices, allowing a total of eight different density
configurations.
HARDWARE PAGE WRITE PROTECT:
If the WP
pin is
held low, the first 256 pages of the main memory cannot be
reprogrammed. The only way to reprogram the first 256
pages is to first dri ve the prot ect pin high and then us e the
program commands previo usly mentioned. T he WP
pin is
internally pulled high; therefore, in low pin count applications, connection of the WP
pin is not necessary if this pin
and feature will not be utilized. However, it is recommended that the WP
pin be driven high externally when-
ever possible.
RESET
:
A low state on the reset pin (RESET
) will terminate
the operation in progress and reset the internal state
machine to an idle state. The device will remain in the reset
condition as long as a low level is pr esent on the RESE T
pin. Normal operation can resume once the RESET pin is
brought back to a high level.
The device incorporates an internal power-on reset circuit,
so there are no restrictions on the RESET
power-on sequences. The RESET
pin is also internally
pin during
pulled high; therefore, in low pin count applications, connection of the RESET
pin is not necessary if this pin and
feature will not be utilized. However, it is recommended
that the RESET
pin be driven high externally whenever
possible.
READY/BUSY
:
This open dra in output pin will be dri ven
low when the device is busy in an internally self-timed operation. This pin, which is normally in a high state (through an
external pull-up resistor), will be pulled low during programming operations, compare operations, and during page-tobuffer transfers.
The busy status indic at es that the Flas h m emo ry a rray an d
the buffer cannot be accessed.
Power On/Reset State
When power is first applied to the device, o r w hen recovering from a reset conditio n, the device will defau lt to SPI
mode 3. In addition, the SO pin will be in a high im peda nc e
state, and a high to low transition on the CS
required to start a valid instruction. The SPI mode will be
automatically select ed on ever y falling ed ge of CS
pling the inactive clock state.
pin will be
by sam-
Status Register Format
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
RDY/BUSY
COMP001XXX
Absolute Maximum Ratings*
Temperature Under Bias................................-55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to V
+ 0.6V
CC
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the dev ice . This is a s tress rating only an d
functional oper ation of the de vi ce at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions f or e xtended periods ma y af fect de vice
reliability .
6
AT45DB011
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