ATMEL AT29LV1024-25TI, AT29LV1024-25TC, AT29LV1024-25JI, AT29LV1024-25JC, AT29LV1024-20TI Datasheet

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1 Megabit (64K x 16) 3-volt Only CMOS Flash Memory
Features
0564A
Single Voltage, Range 3V to 3.6V Supply
3-Volt-Only Read and Write Operation
Software Protected Program ming
Fast Read Access Time - 150 ns
Low Power Dissipation
15 mA Active Current 50 µA CMOS Standby Curre nt
Sector Program Operatio n
Single Cycle Repro gra m (Eras e and Program) 512 Sectors (128 words/sec tor) Internal Address and Data Latches for 128 Words
Fast Sector Program Cycl e Ti me - 20 ms
Internal Program Control and Timer
DATA Polling for End of Program Detec tio n
Typical Endurance > 10,000 Cycles
CMOS and TTL Compatible Inputs and Outputs
Commercial and Industrial Temperature Ranges
Description
The AT29LV1024 is a 3-volt-only in-system Flash programmable and erasable read only memory (PEROM). Its 1 megabit of memory is organized as 65,536 words by 16 bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers access times to 150 ns with power dissipation of just 54 mW. When the device is deselected, the CMOS standby current is less than 50 µA. The device endurance is such that any sector can typically be written to in excess of 10,000 times.
To allow for simple in-system reprogrammability, the AT29LV1024 does not require high input voltages for programming. Three-volt-only commands determine the opera­tion of the device. Reading data out of the device is similar to reading from an
AT29LV1024
Pin Configurations
Pin Name Function
A0 - A15 Addresses CE Chip Enable OE Output E nable WE Write Enable
I/O0 - I/O15 NC No Connect
DC Don’t Connec t
Data Inputs/Outputs
PLCC Top View
TSOP Top View
Type 1
(continued)
AT29LV1024
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Description (Continued)
EPROM. Reprogramming the AT29LV1024 is performed on a sector basis; 128 words of data are loaded into the device and then simultaneously programmed.
During a reprogram cycle, the address locations and 128 words of data are internally latched, freeing the address and data bus for other operations. Following the initiation of a program cycle, the device will automatically eras e the
Block Diagram
Device Operation
READ: The AT29LV1024 is accessed like an EPROM.
CE and OE are low and WE is high, the data stored
When at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever line control gives designers flexibility in preventing bus contention.
SOFTWARE DATA PROTECTION PROGRAMMING:
The AT29LV1024 has 512 individual sectors, each 128 words. Using the software data protection feature, word loads are used to enter the 128 words of a sector to be programmed. The AT29LV1024 can only be programmed or reprogrammed using the software data protection fea­ture. The device is programmed on a sector basis. If a word of data within the sector is to be changed, data for the entire 128 word sector must be loaded into the device. The AT29LV1024 automatically does a sector erase prior to loading the data into the sector. An erase command is not required.
Software data protection protects the devic e from inadver­tent programming. A series of three program commands to specific addresses with specific data must be presented to the device before programming may occur. The same three program commands must begin each program op­eration. All software program commands must obey the sector program timing specifications. Power transitions will not reset the software data protection feature, however the softw are feature will guard against i nadvertent pro­gram cycles during power transitions.
CE or OE is high. This dual-
sector and then program the latched data using an internal control timer. The end of a program cycle can be detected
DATA polling of I/O7 or I/O15. Once the end of a pro-
by gram cycle has been detected, a new access for a read or program can begin.
Any attempt to write to the device without the 3 word com­mand sequence will start the internal write timers. No data will be written to the device; however, for the duration of
, a read operation will effectively be a polling operation.
t
WC
After the software data protection’s 3 word command code is given, a word load is performed by applying a low puls e on the and CE or WE, whichever occurs last. The data is latched by the first rising edge of
The 128 words of data must be loaded into each sector. Any word that is not loaded during the programming of its sector will be erased to read FFFFH. Once the words of a sector are loaded into the device, they are simultaneously programmed during the internal programming period. Af­ter the first data word has been loaded into the device, successive words are entered in the same manner. Each new word to be programmed must have its high to low transition on transition of low transition is not detected within 150 µs of the last low to high transition, the load period will end and the internal programming period will start. A7 to A15 specify the sector address. The sector address must be valid during each high to low transition of word address within the sector. The words may be loaded in any order; sequential loading is not required. Once a programming operation has been initiated, and for the du-
WE or CE input with CE or WE low (respectively)
OE high. The address is latched on the falling edge of
CE or WE.
WE (or CE) within 150 µs of the low to high
WE (or CE) of the preceding word. If a high to
WE (or CE). A0 to A6 specify the
(continued)
4-64 AT29LV1024
Device Operation (Continued)
ration of tWC, a read operation will effectively be a polling operation.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs to the AT29LV1024 in the following ways: (a) V (typical), the program function is inhibited. (b) V on delay— once V the device will automatically time out 10 ms (typical) be­fore programming. (c) Program inhibit— holding any one
OE low, CE high or WE high inhibits program cycles. (d)
of Noise filter— pulses of less than 15 ns (typical) on the
CE inputs will not initiate a program cycle.
or INPUT LEVELS: While operating with a 3.3V ±10%
power supply, the address inputs and control inputs ( CE and WE) may be driven from 0 to 5.5V without ad­versely affecting the operation of the device. The I/O lines can be driven from 0 to 3.6V.
PRODUCT IDE NTIFICATION: The product identifica­tion mode identifies the device and manufacturer as At­mel. It may be accessed by hardware or software opera­tion. The hardware operation mode can be us ed by an ex­ternal programmer to identify the correct programming al­gorithm for the Atmel product. In addition, users may wish to use the software product identification mode to identify the part (i.e. using the device code), and have the system software use the appropriate sector size for program op­erations. In th is manner, the user can have a common
has reached the VCC sense level,
CC
sense— if VCC is below 1.8V
CC
CC
power
WE
OE,
AT29LV1024
board design for various Flash densities and, with each density’s sector size in a memory map, have the system software apply the appropriate sector size.
For details, see Operating Modes (for hardware operation) or Software Product Identification. The manufacturer and device code is the same for both modes.
DATA POLLING: The AT29LV1024 features DATA polling to indicate the end of a program cycle. During a program cycle an attempted read of the last word loaded will result in the complement of the loaded data on I/O7 and I/O15. Once the program cycle has been completed, true data is valid on all outputs and the next cycle may
DATA polling may begin at any time during the pro-
begin. gram cycle.
TOGGLE BIT: In addition to AT29LV1024 provides another method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the device will result in I/O6 and I/O14 toggling between one and zero. On ce the program cycle has completed, I/O6 and I/O14 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time dur­ing a program cycle.
OPTIONAL CHIP ERASE MODE: The entire device can be erased by using a 6-byte software code. Please see Software Chip Erase application note for details.
DATA p o l li n g th e
Absolute Maximum Ratings*
Temperature Under Bias.................-55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on
with Respect to Ground ................... -0.6V to +13.5V
OE
+ 0.6V
CC
*NOTICE: Stresses beyond those listed un der “Abso lute Maxi-
mum Ratings” may cause permanen t dama ge to th e de vice . This is a stress rating only and functional operation of the device at these or any other conditions beyond those indi­cated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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