ATMEL AT29BV020-35JC, AT29BV020-25TI, AT29BV020-25TC, AT29BV020-25JI, AT29BV020-25JC Datasheet

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Features
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AT29BV020
0402B
Single Supply Voltage, Range 2.7V to 3.6V
Single Supply for Rea d an d Wri te
Software Protected Program ming
Fast Read Access Time - 250 ns
Low Power Dissipation
15 mA Active Current 20 µA CMOS Standby Curre nt
Sector Program Operatio n
Single Cycle Repro gra m (Eras e and Program) 1024 Sectors (256 bytes /s ec tor) Internal Address and Data Latches for 256-Bytes
Two 8 KB Boot Blocks with Lockout
Fast Sector Program Cycl e Ti me - 20 ms Max.
Internal Program Control and Timer
DATA Polling for End of Program Detec tio n
Typical Endurance > 10,000 Cycles
CMOS and TTL Compatible Inputs and Outputs
Commercial and Industrial Temperature Ranges
AT29BV020
2 Megabit (256K x 8) Single 2.7-volt
Battery-Voltage
CMOS Flash
Description
The AT29BV020 is a 2.7-volt-only in-system Flash Programmable and Erasable Read Only Memory (PEROM). Its 2 megabits of memory is organized as 262,144 words by 8 bits. Manufactured with Atmel’s advanced nonvolatile CMOS EEPROM technology, the device offers access times up to 250 ns, and a low 54 mW power dissipation. When the device is deselected, the CMOS standby current is less than 20 µA. The device endurance is such that any sector can typically be written to in excess of 10,000 times. The programming algorithm is compatible with other devices in Atmel’s Low Voltage Flash family of products.
Pin Configurations
Pin Name Function
A0 - A17 Addresses CE Chip Enable OE Output Enable WE Write Enable I/O0 - I/O7 Data Inputs/Outputs NC No Connect
TSOP Top View
Type 1
PLCC Top View
Memory
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Description (Continued)
To allow for simple in-system reprogrammability, the AT29BV020 does not require high input voltages for pro­gramming. The device can be operated with a single 2.7V to 3.6V supply. Reading data out of the device is similar to reading from an EPROM. Reprogramming the AT29BV020 is performed on a sector basis; 256-bytes of data are loaded into the device and then simultaneously programmed.
Block Diagram
During a reprogram cycle, the address locations and 256­bytes of data are captured at microprocessor speed and internally latched, freeing the address and data bus for other operations. Following the initiation of a program cy­cle, the device will automatically erase the sector and then program the latched data using an internal control timer. The end of a program cycle can be detected by ing of I/O7. Once the end of a program cycle has been detected, a new access for a read or program can begin.
DATA poll-
Device Operation
READ: The AT29BV020 is accessed like an EPROM.
CE and OE are low and WE is high, the data stored
When at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever line control gives designers flexibility in preventing bus contention.
SOFTWARE DATA PROTECTION PROGRAMMING:
The AT29BV020 has 1024 individual sectors, each 256­bytes. Using the software data protection feature, byte loads are used to enter the 256-bytes of a sector to be programmed. The AT29BV020 can only be programmed or reprogrammed using the software data protection fea­ture. The device is programmed on a sector basis. If a byte of data within the sector is to be changed, data for the en­tire 256-byte sector must be loaded into the device. The data in any byte that is not loaded during the programming of its sector will be indeterminate. The AT29BV020 auto­matically does a sector erase prior to loading the data into the sector. An erase command is not required.
Software data protection protects the devic e from inadver­tent programming. A series of three program commands to specific addresses with specific data must be presented to the device before programming may occur. The same three program commands must begin each program op­eration. All software program commands must obey the sector program timing specifications. Power transitions
CE or OE is high. This dual-
will not reset the software data protection feature, however the softw are feature will guard against i nadvertent pr o­gram cycles during power transitions.
Any attempt to write to the device without the 3-byte com­mand sequence will start the internal write timers. No data will be written to the device; however, for the duration of
, a read operation will effectively be a polling operation.
t
WC
After the software data protection’s 3-byte command code is given, a byte load is performed by applying a low pulse on the and CE or WE, whichever occurs last. The data is latched by the first rising edge of
The 256-bytes of data must be loaded into each sector. Any byte that is not loaded during the programming of its sector will be indeterminate. Once the bytes of a sector are loaded into the device, they are simultaneously pro­grammed during the internal programming period. After the first data byte has been loaded into the device, suc­cessive bytes are entered in the same manner. Each new byte to be programmed must have its high to low trans ition on WE (or CE) of the preceding byte. If a high to low transition is not detected within 150 µs of the last low to high transi­tion, the load period will end and the internal programming period will start. A8 to A17 specify the sector addr ess. The
WE or CE input with CE or WE low (respectively)
OE high. The address is latched on the falling edge of
CE or WE.
WE (or CE) within 150 µs of the low to high transition of
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4-14 AT29BV020
Device Operation (Continued)
sector address must be valid during each high to low tran­sition of within the sector. The bytes may be loaded in any order; sequential loading is not required.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs to the AT29BV020 in the following ways: (a) V (typical), the program function is inhibited. (b) V on delay— once V the device will automatically time out 10 ms (typical) be­fore programming. (c) Program inhibit— holding any one of Noise filter— pulses of less than 15 ns (typical) on the or
INPUT LEVELS: While operating with a 2.7V to 3.6V power supply, the address inputs and control inputs ( CE and WE) may be driven from 0 to 5.5V without ad­versely affecting the operation of the device. The I/O lines can only be driven from 0 to V
PRODUCT IDE NTIFICATION: The product identifica­tion mode identifies the device and manufacturer as At­mel. It may be accessed by hardware or software opera­tion. The hardware operation mode can be us ed by an ex­ternal programmer to identify the correct programming al­gorithm for the Atmel product. In addition, users may wish to use the software product identification mode to identify the part (i.e. using the device code), and have the system software use the appropriate sector size for program op­erations. In th is manner, the user can have a common board design for 256K to 4-megabit densities and, with each density’s sector size in a memory map, have the sys­tem software apply the appropriate sector size.
For details, see Operating Modes (for hardware operation) or Software Product Identification. The manufacturer and device code is the same for both methods of identification.
WE (or CE). A0 to A7 specify the byte address
sense— if VCC is below 2.0V
CC
power
CC
has reached the VCC sense level,
CC
OE low, CE high or WE high inhibits program cycles. (d)
WE
CE inputs will not initiate a program cycle.
OE,
+ 0.6V.
CC
Absolute Maximum Ratings*
Temperature Under Bias.................-55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on A9 (including NC Pins)
with Respect to Ground ................... -0.6V to +13.5V
+ 0.6V
CC
AT29BV020
DATA POLLING: The AT29BV020 features DATA poll-
ing to indicate the end of a program cycle. During a pro­gram cycle an attempted read of the last byte loaded will result in the complement of the loaded data on I/O7. Once the program cycle has been completed, true data is valid on all outputs and the next cycle may begin. may begin at any time during the program cycle.
TOGGLE BIT: In addition to AT29BV020 provides another method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the device will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time during a program cycle.
OPTIONAL CHIP E RASE MODES: The entire device may be erased by using a 6-byte software code. Please see Software Chip Erase application note for details.
BOOT BLOCK PROGRAMMING LOCKOUT: The AT29BV020 has two designated memory blocks that have a programming lockout feature. This feature prevents pro­gramming of data in the designated block once the feature has been enabled. Each of these blocks consists of 8K bytes; the programming lockout feature can be set inde­pendently for either block. While the lockout feature does not have to be activated, it can be activated for either or both blocks.
These two 8K memory sections are referred to as
. Secure code which will bring up a system can be
blocks
contained in a boot block. The AT29BV020 blocks are lo­cated in the first 8K bytes of memory and the last 8K bytes of memory. The boot block programming lockout feature can therefore support systems that boot from the lower addresses of memory or the higher addresses. Once the programming lockout feature has been activated, the data in that block can no longer be erased or programmed; data in other memory locations can st ill be changed through the regular programming methods. To activate the lockout feature, a series of seven program commands to specific addresses with specific data must be performed. Please see Boot Block Lockout Feature Enable Algorithm.
If the boot block lockout feature has been activated on either block, the chip erase function will be disabled.
*NOTICE: Stresses beyond those listed un der “Abso lute Maxi-
mum Ratings” may cause permanen t dama ge to th e de vice . This is a stress rating only and functional operation of the device at these or any other conditions beyond those indi­cated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
DATA p o l li n g th e
DATA polling
boot
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