Datasheet AT28LV256-20TC, AT28LV256-20SI, AT28LV256-20SC, AT28LV256-20PI, AT28LV256-20PC Datasheet (ATMEL)
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AT28LV256
256K (32K x 8)
Low Voltage
CMOS
E2PROM
Features
0273E
Fast Read Access Time - 200 ns
•
Automatic Page Write Operation
•
Internal Address and Data Latches for 64-Bytes
Internal Control Timer
Fast Write Cycle Tim es
•
Page Write Cycle Tim e: 10 ms Ma xi mum
1 to 64-Byte Page Write Opera tio n
Low Power Dissipation
•
15 mA Active Current
20 µA CMOS Standby Current
Hardware and Software Data Protection
•
DATA Polling for End of Write Dete cti on
•
High Reliabili ty C MOS Technology
•
Endurance: 10,000 Cycles
Data Retention: 10 Years
Single 3.3V ± 5% Supply
•
JEDEC Approved Byte-Wid e Pin ou t
•
Commercial and Industrial Temperature Ranges
•
Description
The AT28LV256 is a high-performance Electrically Erasable and Programmable
Read Only Memory. Its 256K of memory is organized as 32,768 words by 8 bits.
Manufactured with Atmel’s advanced nonvolatile CMOS technology , the device offers
access times to 200 ns with power dissipation of just 54 mW. When the device is
deselected, the CMOS standby current is less than 200 µA.
The AT28LV256 is accessed like a Static RAM for the read or write cycle without the
need for external components. The device contains a 64-byte page register to allow
writing of up to 64-bytes simultaneously. During a write cycle, the addresses and 1 to
Pin Configurations
Pin Name Function
A0 - A14 Addresses
CE Chip Enable
OE Output E nable
WE Write Enable
I/O0 - I/O7 Data Inputs/Outputs
NC No Connect
DC Don’t Connec t
PDIP, SOIC
Top View
(continued)
AT28LV256
Note: PLCC package pins 1 and
17 are DON’T CONNECT.
PLCC
Top View
TSOP
Top View
2-145
Description (Continued)
64-bytes of data are internally latched, freeing the address
and data bus for other operations. Following the initiation
of a write cycle, the device will automatically write the
latched data using an internal control timer. The end of a
write cycle can be detected by
the end of a write cycle has been detected a new access
for a read or write can begin.
DATA polling of I/O7. Once
Block Diagram
Atmel’s 28LV256 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correc tion for extended endurance and improved
data retention characteristics. An optional software data
protection mechanism is available to guard against inadvertent writes. The device also includes an extra 64-bytes
2
PROM for device identification or tracking.
of E
Absolute Maximum Ratings*
Temperature Under Bias.................-55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
2-146 AT28LV256
+ 0.6V
CC
*NOTICE: Stresses beyond those listed un der “Abso lute Maxi-
mum Ratings” may cause permanen t dama ge to th e de vice .
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
Device Operation
READ: The AT28LV256 is accessed like a Static RAM.
CE and OE are low and WE is high, the data stored
When
at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high
impedance state when either
line control gives designers flexibility in preventing bus
contention in their system.
BYTE WRITE: A low pulse on the
WE low (respectively) and OE high initiates a write cy-
or
cle. The address is latched on the falling edge of
WE, whichever occurs last. The data is latched by the firs t
rising edge of
started it will automatically time itself to completion. Once
a programming operation has been initiated and for the
duration of t
ing operation.
PAGE WRITE: The page write operation of the
AT28LV256 allows 1 to 64-bytes of data to be written into
the device during a single internal programming period. A
page write operation is initiated in the same manner as a
byte write; the first byte written can then be followed by 1
to 63 additional bytes. Each successive byte must be written within 150 µs (t
limit is exc eeded the AT28LV256 will cease accepting
data and commence the internal programming operation.
All bytes during a page write operation must reside on the
same page as defined by the state of the A6 - A14 inputs.
For each
operation, A6 - A14 must be the same.
The A0 to A5 inputs are used to specify which bytes within
the page are to be written. The bytes may be loaded in any
order and may be altered within the same load period.
Only bytes which are specified for writing will be written;
unnecessary cycling of other bytes within the page does
not occur.
DATA POLLING: The AT28LV256 features DATA Polling
to indicate the end of a write cycle. During a byte or page
write cycle an attempted read of the last byte written will
result in the complem ent of the written data to be presented on I/O7. Once the write cycle has been completed,
true data is valid on all outputs, and the next write cycle
may begin.
write cycle.
TOGGLE BIT: In addition to
provides another method for determining the end of a write
cycle. During the write operation, successive attempts to
read data from the device will result in I/O6 toggling between one and zero. Once the write has completed, I/O6
will stop toggling and valid data will be read. Reading the
toggle bit may begin at any time during the write cycle.
CE or WE. Once a byte write has been
, a read operation will effectively be a poll-
WC
BLC
WE high to low transition during the page write
DATA Polling may begin at anytime during the
CE or OE is high. This dual-
WE or CE input with CE
CE or
) of the previous byte. If the t
DATA Polling the AT28LV256
BLC
AT28LV256
DATA PROTECTION: If precautions are not taken, inad-
vertent writes may occur during transitions of the host system power supply. Atmel has incorporated both hardware
and software features that will protect the memory against
inadvertent writes.
HARDWARE PROTECTION: Hardware features protect
against inadvertent writes to the AT28LV256 in the following ways: (a) V
1.8V (typical) the device will automatically time out 10 ms
(typical) before allowing a write: (b) write inhibit - holding
any one of
cles; (c) noise filter - pulses of less than 15 ns (typical) on
WE or CE inputs will not initiate a write cycle.
the
SOFTWARE DATA PROTECTION: A software-control-
led data protection feature has been implemented on the
AT28LV256. Software data protection (SDP) helps prevent inadvertent writes from corrupting the data in the device. SDP can prevent inadvertent writes during power-up
and power-down as well as any other potential periods of
system instability.
The AT28LV256 can only be written using the software
data protection feature. A series of three write commands
to specific addresses with specific data must be presented
to the device before writing in the byte or page mode. T he
same three write commands must begin each write operation. All software write commands must obey the page
mode write timing specifications. The data in the 3-byte
command sequence is not written to the device; the address in the command sequence can be utilized just like
any other location in the device.
Any attempt to write to the device without the 3-byte sequence will start the internal write timers. No data will be
written to the device; however, for the duration of t
read operations will effectively be polling operations.
DEVICE IDENTIFICATION: An extra 64-bytes of
2
PROM memory are available to the user for device
E
identification. By raising A9 to 12V ± 0.5V and using address locations 7FC0H to 7FFFH the additional bytes may
be written to or read from in the same manner as the regular memory array.
power-on delay - once VCC has reached
CC
OE low, CE high or WE high inhibits write cy-
WC
,
2-147
DC and AC Operating Range
AT28LV256-20 AT28LV256-25
Operating
Temperature (Case)
Power Supply 3.3V ± 5% 3.3V ± 5%
V
CC
Com. 0°C - 70°C 0°C - 70°C
Ind. -40°C - 85°C -40°C - 85°C
Operating Modes
Mode CE OE WE I/O
Read V
(2)
Write
Standby/Write Inhibit V
IL
V
IL
IH
V
V
X
IL
IH
(1)
Write Inhibit X X V
Write Inhibit X V
Output Disable X V
Chip Erase V
Notes: 1. X can be V
2. Refer to AC Programming Waveforms.
or VIH.
IL
IL
IL
IH
(3)
VH
3. VH = 12.0V ± 0.5V.
V
IH
V
IL
X High Z
IH
X
X High Z
VIL High Z
D
D
OUT
IN
DC Characteristics
Symbol Parameter Condition Min Max Units
I
LI
I
LO
I
SB
I
CC
V
IL
V
IH
V
OL
V
OH
2-148 AT28LV256
Input Load Current VIN = 0V to VCC + 1V 10 µA
Output Leakage Current V
VCC Standby Current CMOS CE = V
= 0V to V
I/O
CC
CC
- 0.3V to VCC + 1V
10 µA
Com. 20 µA
Ind. 50 µA
V
Active Current f = 5 MHz; I
CC
= 0 mA 15 mA
OUT
Input Low Voltage 0.6 V
Input High Voltage 2.0 V
Output Low Voltage IOL = 1.6 mA 0.3 V
Output High Voltage IOH = -100 µA 2.0 V
AC Read Characteristics
AT28LV256
AT28LV256-20 AT28LV256-25
Symbol Parameter
t
ACC
t
CE
t
OE
t
DF
t
OH
(1)
(2)
(3, 4)
Address to Output Delay 200 250 ns
CE to Output Delay 200 250 ns
OE to Output Delay 0 80 0 100 ns
CE or OE to Output Float 0 55 0 60 ns
Output Hold from OE, CE or
Address, whichever occurred first
AC Read Waveforms
(1, 2, 3, 4)
Min Max Min Max
Units
00ns
Notes: 1. CE may be delayed up to t
transition without impact on t
OE may be delayed up to tCE - tOE after the falling
2.
edge of
after an address change without impact on t
CE without impact on tCE or by t
- tCE after the address
ACC
.
ACC
ACC
- tOE
.
ACC
Input Test Waveforms and
Measurement Level
tR, tF < 20 ns
Pin Capacitance (f = 1 MHz, T = 25° C)
Typ Max Units Conditions
C
IN
C
OUT
Note: 1. This parameter is characterized and is not 100% tested.
46pFV
812pFV
(1)
is specified from OE or CE whichever occu r s first
3. t
DF
= 5 pF).
(C
L
4. This parameter is characterized and is not 100% tested.
Output Test Load
= 0V
IN
= 0V
OUT
2-149
AC Write Characteristics
Symbol Parameter Min Max Units
, t
t
AS
OES
t
AH
t
CS
t
CH
t
WP
t
DS
, t
t
DH
OEH
t
DV
Note: 1. NR = No Restriction
Address, OE Set-up Time 0 ns
Address Hold Time 50 ns
Chip Select Set-up Time 0 ns
Chip Select Hold Time 0 ns
Write Pulse Width (WE or CE) 200 ns
Data Set-up Time 50 ns
Data, OE Hold Time 0 ns
Time to Data Valid NR
AC Write Waveforms
WE Controlled
(1)
CE Controlled
2-150 AT28LV256
AT28LV256
Page Mode Characteristic s
Symbol Parameter Min Max Units
t
WC
t
AS
t
AH
t
DS
t
DH
t
WP
t
BLC
t
WPH
Write Cycle Time 10 ms
Address Set-up Time 0 ns
Address Hold Time 50 ns
Data Set-up Time 50 ns
Data Hold Time 0 ns
Write Pulse Width 200 ns
Byte Load Cycle Time 150 µs
Write Pulse Width High 100 ns
Programming Algorithm
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA XX
TO
ANY ADDRESS
(3)
WRITES ENABLED
Notes:
1. Data Format: I/O7 - I/O0 (Hex );
Address Format: A14 - A0 (Hex).
2. Data protect state will be re-activated at the end of program
cycle.
3. 1 to 64-bytes of data are loaded.
(2)
LOAD LAST BYTE
TO
LAST ADDRESS
(3)
ENTER DATA
PROTECT STATE
Software Prot ec te d Wr ite Cyc le Wa veforms
Notes: 1. A0 - A14 must conform to the addressing sequence for
the first three bytes as shown above.
2. A6 through A14 must speci fy the same pa ge add res s du rin g
each high to low transition of
code has been entered.
OE must be high only when WE and CE are both low.
3.
(1, 2, 3)
WE (or CE) after the software
2-151
Data Polling Characteristics
(1)
Symbol Parameter Min Typ Max Units
t
DH
t
OEH
t
OE
t
WR
Notes: 1. These parameters are characterized and not 100% tested. 2. See AC Read Characteristics.
Data Hold Time 0 ns
OE Hold Time 0 ns
OE to Output Delay
(2)
Write Recovery Time 0 ns
Data Polling Waveforms
Toggle Bit Characteristic s
(1)
ns
Symbol Parameter Min Typ Max Units
t
DH
t
OEH
t
OE
t
OEHP
t
WR
Notes: 1. These parameters are characterized an d no t 10 0% tested. 2. See AC Read Characteristics.
Data Hold Time 10 ns
OE Hold Time 10 ns
OE to Output Delay
(2)
OE High Pulse 150 ns
Write Recovery Time 0 ns
Toggle Bit Waveforms
Notes: 1. Toggl ing either OE or CE or both OE and CE wil l
operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the
address should not vary.
ns
2-152 AT28LV256
AT28LV256
2-153
Ordering Informati o n
(1)
t
ACC
(ns)
Active Standby
I
CC
(mA)
Ordering Code
Package Operation Range
200 80 0.2 AT28LV256-20JC 32J Commercial
AT28LV256-20PC 28P6 (0°C to 70°C)
AT28LV256-20SC 28S
AT28LV256-20TC 28T
80 0.2
AT28LV256-20JI 32J Industrial
AT28LV256-20PI 28P6 (-40°C to 85°C)
AT28LV256-20SI 28S
AT28LV256-20TI 28T
250 80 0.2 AT28LV256-25JC 32J Commercial
AT28LV256-25PC 28P6 (0°C to 70°C)
AT28LV256-25SC 28S
AT28LV256-25TC 28T
80 0.2
AT28LV256-25JI 32J Industrial
AT28LV256-25PI 28P6 (-40°C to 85°C)
AT28LV256-25SI 28S
AT28LV256-25TI 28T
Note: 1. See Valid Part Number table below.
Valid Part Numbers
The following table lists standard Atmel products that can be ordered.
Device Numbers Speed Package and Temperature Combinations
AT28LV256
AT28LV256
20
25
32J 32 Lead, Plastic J-L ea ded Chip Carrier (PLCC)
28P6 28 Lead, 0.600" Wide, Plast ic Dual Inlin e Pac kage (PDIP)
28S 28 Lead, 0.300" Wide, Pla stic Gull Wing Small Outlin e (SOIC)
28T 28 Lead, Plastic Thin Small Outline Package (TSOP)
JC, JI, PC, PI, SC, SI, TC, TI
JC, JI, PC, PI, SC, SI, TC, TI
Package Type
2-154 AT28LV256
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