The AT27C080 chip is a low-power, high-performance 8,388,608-bit ultraviolet erasable programmable read only memory (EPROM) organized as 1M by 8 bits. The
AT27C080 requires only one 5 V power supply i n normal r ead mod e operation . Any
byte can be accessed in less than 90 ns, eliminating the need for speed reducing
WAIT states on high-performance microprocessor systems.
Atmel’s scaled CMOS technology provides low active power consumption and fast
programming. Power consum ption is typical ly 10 m A in activ e mode and less than 10
The AT27C080 is available in a choice of packages, includ-
µ
µ
µ
µ
ing; one-time programmable (OTP) plastic PLCC, PDIP,
SOIC (SOP), and TSOP, as well as windowe d ceramic
Cerdip. All devices feature two-line control (CE
, OE) to give
designers the flexibility to prevent bus contention.
With high density 1M byte storage capability, the
AT27C080 allows firmware to be stored reliably and to be
accessed by the system without the delays of mass storage
media.
Atmel’s 27C080 has addi tional features to ensure high
quality and efficient production use. The Rapid
™
Programming Algorithm reduces the time required to program the
part and guarantees reliable programming. Programming
time is typically only 50
s/byte. The Integrated Prod uct
Identification Code electronically identifies the dev ice and
manufacturer . This featur e is used by industry sta ndard
programming eq uipmen t to select the prop er program ming
algorithms and voltages.
Erasure Characteristics
The entire memory array of the AT27C080 is erased (all
outputs re ad as V
wavelength of 2,537Å. Complete erasur e is as su red after a
minimum of 20 minutes of exposure using 12,000
intensity lamps spaced one inch away from the chip. Minimum erase time for lamps at other intensity ratings can be
calculated from the minimum integrated erasure dose of 15
W.sec/cm
2
. To prevent unintentional erasure, an opaque
label is recommended to cover the clear window on any UV
erasable EPROM that will be s ubjected to conti nuous
flourescent indoor lighting or sunlight.
) after exposure to ultraviolet light at a
OH
W/cm
System Considerations
Switching between active and standby conditions via the
Chip Enable pin may produce transient voltage excursions.
Unless accommodated by the system design, these transients may exceed data sheet limits, resulting in device
non-conformance. At a minimum, a 0.1
low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor should be connec ted
between the V
and Ground terminals of the device, as
CC
close to the device as possible. Additionally, to stabilize the
supply voltage level on printed circuit boards with large
EPROM arrays, a 4.7
F bulk electrolytic capacitor should
be utilized, again connected between the V
terminals. This capacitor should be positioned as close as
possible to the point where the power supply is connected
to the array.
2
F high frequency,
and Ground
CC
2
AT27C080
Block Diagram
Absolute Maximum Ratings*
AT27C080
Temperature Under Bias ...................-55°C to +125°C
*NOTICE:Stresses beyond those listed under “Absolute
Storage Temperature.........................-65°C to +150°C
Voltage on Any Pin with
Respect to Ground ............................-2.0V to +7.0V
(1)
Voltage on A9 with
Respect to Ground .........................-2.0V to +14.0V
(1)
Note:1.Minimum voltage is -0.6V DC which may
VPP Supply Voltage with
Respect to Ground ..........................-2.0V to +14.0V
4. Two identifier bytes may be selected. All Ai inputs are held low (VIL), except A9 which is set to VH and A0 which is toggled
low (V
(4)
IH.
) to select the Manufacturer’s Identification byte and high (VIH) to select the Device Code byte.
IL
IL
IH
V
IL
IL
IH
V
IL
Maximum Ratings” may cause permanent
damage to the device. This is a stress rating
only and functional operation of the device at
these or any other conditions beyond those
indicated in the operational sections of this
specification is not implied. Expo sure to absolute maximum rating conditions for extended
periods may affect device reliability.
undershoot to -2.0V for pulses of less than 20
ns. Maximum output pin voltage is V
CC
+
0.75V DC which may overshoot to +7.0V for
pulses of less than 20 ns.
A 50 µs CE pulse width is used to program. The address is
set to the first loc ation . V
raised to 13.0V. Each address is first programmed with one
s CE pulse without verification. Then a v erification
50
reprogramming loop is executed for each address. In the
event a byte fails to pass verification, up to 10 successive
s pulses are applied with a verification after each
50
is raised to 6.5V and OE/VPP is
CC
pulse. If the byte fails to verify after 10 pulses have been
applied, the par t is c on si dered failed. After the b yt e verifies
properly, the next address is selected until all have been
checked. OE
bytes are read again and compared with the original data to
determine if the device passes or fails.